ATE498145T1 - Vorrichtung zum erhalten eines dreidimensionalen bildes und verarbeitungsvorrichtung damit - Google Patents

Vorrichtung zum erhalten eines dreidimensionalen bildes und verarbeitungsvorrichtung damit

Info

Publication number
ATE498145T1
ATE498145T1 AT09158022T AT09158022T ATE498145T1 AT E498145 T1 ATE498145 T1 AT E498145T1 AT 09158022 T AT09158022 T AT 09158022T AT 09158022 T AT09158022 T AT 09158022T AT E498145 T1 ATE498145 T1 AT E498145T1
Authority
AT
Austria
Prior art keywords
dimensional image
obtaining
measured
measurement point
specimen
Prior art date
Application number
AT09158022T
Other languages
English (en)
Inventor
Tohoru Hayashi
Shozo Ishizaka
Original Assignee
Rinsoken Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rinsoken Co Ltd filed Critical Rinsoken Co Ltd
Application granted granted Critical
Publication of ATE498145T1 publication Critical patent/ATE498145T1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/086—Condensers for transillumination only

Landscapes

  • Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)
AT09158022T 2008-04-21 2009-04-16 Vorrichtung zum erhalten eines dreidimensionalen bildes und verarbeitungsvorrichtung damit ATE498145T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008110769A JP4236123B1 (ja) 2008-04-21 2008-04-21 三次元画像取得装置

Publications (1)

Publication Number Publication Date
ATE498145T1 true ATE498145T1 (de) 2011-02-15

Family

ID=40506401

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09158022T ATE498145T1 (de) 2008-04-21 2009-04-16 Vorrichtung zum erhalten eines dreidimensionalen bildes und verarbeitungsvorrichtung damit

Country Status (6)

Country Link
US (1) US8237797B2 (de)
EP (1) EP2112543B1 (de)
JP (1) JP4236123B1 (de)
CN (1) CN101576505B (de)
AT (1) ATE498145T1 (de)
DE (1) DE602009000708D1 (de)

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DK2270423T3 (da) * 2009-06-26 2014-06-30 Siemens Medical Instr Pte Ltd System og fremgangsmåde til tredimensional rekonstruktion af et anatomisk aftryk
CN101867709B (zh) * 2010-05-17 2012-06-06 哈尔滨工业大学 球面成像装置及其成像方法
JP5957825B2 (ja) * 2011-08-09 2016-07-27 株式会社リコー ラマン分光装置およびラマン分光測定法
CN103096141B (zh) * 2011-11-08 2019-06-11 华为技术有限公司 一种获取视觉角度的方法、装置及系统
JP6048950B2 (ja) * 2012-06-15 2016-12-21 セイコーエプソン株式会社 濃度測定装置
EP2874700B1 (de) * 2012-07-18 2020-04-08 The Trustees of Princeton University Multiskalare spektrale nanoskopie
JP6020123B2 (ja) 2012-12-17 2016-11-02 富士通株式会社 画像処理装置、画像処理方法及びプログラム
FR3013128B1 (fr) * 2013-11-13 2016-01-01 Univ Aix Marseille Dispositif et methode de mise au point tridimensionnelle pour microscope
EP3037861A1 (de) * 2014-12-23 2016-06-29 Commissariat à l'Énergie Atomique et aux Énergies Alternatives Bildgebungsverfahren und System zum Erhalt eines hochauflösenden Bildes eines Objekts
CN113421652B (zh) * 2015-06-02 2024-06-28 推想医疗科技股份有限公司 对医疗数据进行分析的方法、训练模型的方法及分析仪
CN105136062B (zh) * 2015-08-25 2018-02-27 上海集成电路研发中心有限公司 基于衰减光的三维扫描装置及三维扫描方法
US10453650B2 (en) * 2015-11-25 2019-10-22 Hitachi High-Technologies Corporation Charged particle beam apparatus, observation method using charged particle beam apparatus, and program
JP6843585B2 (ja) * 2016-10-28 2021-03-17 株式会社日立エルジーデータストレージ 走査型画像計測装置及び走査型画像計測方法
EP3538941B1 (de) 2016-11-10 2025-04-23 The Trustees of Columbia University in the City of New York Schnelles hochauflösendes bildgebungsverfahren für grosse proben
DE102017122858A1 (de) * 2017-10-02 2019-04-04 Carl Zeiss Microscopy Gmbh Konfokalmikroskop mit hoher Auflösung
CN109725700A (zh) * 2017-10-29 2019-05-07 上海寒武纪信息科技有限公司 动态调压调频装置和方法
JP7298993B2 (ja) 2018-04-09 2023-06-27 浜松ホトニクス株式会社 試料観察装置及び試料観察方法
CN112861786B (zh) * 2021-03-09 2022-12-02 南开大学 人脸篡改视频检测方法和人脸篡改视频检测装置
WO2025189030A1 (en) * 2024-03-07 2025-09-12 Stellaromics, Inc. Methods and systems for volumetric imaging

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JP3506749B2 (ja) 1993-12-28 2004-03-15 オリンパス株式会社 顕微鏡及びその光学的断層像表示方法及び光学的断層像表示プログラムを記録した記録媒体
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JP2869479B2 (ja) 1995-12-21 1999-03-10 小池精機株式会社 透過型レーザー顕微鏡による特定物質撮像方法
JPH09297269A (ja) 1996-05-01 1997-11-18 Olympus Optical Co Ltd 走査型画像入力装置及び走査型プローブ顕微鏡
JPH09304178A (ja) 1996-05-09 1997-11-28 Ando Electric Co Ltd 透光率測定装置および方法
US5991437A (en) * 1996-07-12 1999-11-23 Real-Time Geometry Corporation Modular digital audio system having individualized functional modules
US6166853A (en) * 1997-01-09 2000-12-26 The University Of Connecticut Method and apparatus for three-dimensional deconvolution of optical microscope images
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JP4686147B2 (ja) * 2003-07-31 2011-05-18 株式会社東芝 画像データ処理装置
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JP4566685B2 (ja) * 2004-10-13 2010-10-20 株式会社トプコン 光画像計測装置及び光画像計測方法
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JP5751470B2 (ja) * 2008-08-20 2015-07-22 国立大学法人東北大学 形状・傾斜検知及び／又は計測光学装置及び方法並びにその関連装置
JP5945226B2 (ja) * 2009-09-22 2016-07-05 ビセン メディカル， インコーポレイテッド 拡散媒質の仮想屈折率整合のためのシステムおよび方法

Also Published As

Publication number Publication date
CN101576505B (zh) 2011-11-16
US8237797B2 (en) 2012-08-07
CN101576505A (zh) 2009-11-11
EP2112543B1 (de) 2011-02-09
JP2009264752A (ja) 2009-11-12
DE602009000708D1 (de) 2011-03-24
US20090262183A1 (en) 2009-10-22
JP4236123B1 (ja) 2009-03-11
EP2112543A1 (de) 2009-10-28

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