ATE500609T1 - Verfahren zur herstellung eines bipolartransistors - Google Patents
Verfahren zur herstellung eines bipolartransistorsInfo
- Publication number
- ATE500609T1 ATE500609T1 AT06728019T AT06728019T ATE500609T1 AT E500609 T1 ATE500609 T1 AT E500609T1 AT 06728019 T AT06728019 T AT 06728019T AT 06728019 T AT06728019 T AT 06728019T AT E500609 T1 ATE500609 T1 AT E500609T1
- Authority
- AT
- Austria
- Prior art keywords
- trench
- bipolar transistor
- region
- producing
- aligned
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title abstract 3
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D10/00—Bipolar junction transistors [BJT]
- H10D10/01—Manufacture or treatment
- H10D10/051—Manufacture or treatment of vertical BJTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/13—Semiconductor regions connected to electrodes carrying current to be rectified, amplified or switched, e.g. source or drain regions
- H10D62/137—Collector regions of BJTs
Landscapes
- Bipolar Transistors (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Bipolar Integrated Circuits (AREA)
- Element Separation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP05103583 | 2005-04-29 | ||
| PCT/IB2006/051262 WO2006117712A1 (en) | 2005-04-29 | 2006-04-24 | Method of fabricating a bipolar transistor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE500609T1 true ATE500609T1 (de) | 2011-03-15 |
Family
ID=36741404
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT06728019T ATE500609T1 (de) | 2005-04-29 | 2006-04-24 | Verfahren zur herstellung eines bipolartransistors |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US7605027B2 (de) |
| EP (1) | EP1878046B1 (de) |
| JP (1) | JP2008539579A (de) |
| CN (1) | CN100565822C (de) |
| AT (1) | ATE500609T1 (de) |
| DE (1) | DE602006020430D1 (de) |
| TW (1) | TWI376750B (de) |
| WO (1) | WO2006117712A1 (de) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110084356A1 (en) * | 2008-06-02 | 2011-04-14 | Nxp B.V. | Local buried layer forming method and semiconductor device having such a layer |
| US8020128B2 (en) * | 2009-06-29 | 2011-09-13 | International Business Machines Corporation | Scaling of bipolar transistors |
| CN101719508B (zh) * | 2009-11-10 | 2013-09-04 | 上海宏力半导体制造有限公司 | 一种薄soi纵向双极型晶体管及其制造方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4519128A (en) * | 1983-10-05 | 1985-05-28 | International Business Machines Corporation | Method of making a trench isolated device |
| GB8507624D0 (en) * | 1985-03-23 | 1985-05-01 | Standard Telephones Cables Ltd | Semiconductor devices |
| US4887144A (en) * | 1985-07-26 | 1989-12-12 | Texas Instruments Incorporated | Topside substrate contact in a trenched semiconductor structure and method of fabrication |
| US5583368A (en) * | 1994-08-11 | 1996-12-10 | International Business Machines Corporation | Stacked devices |
| KR0171000B1 (ko) * | 1995-12-15 | 1999-02-01 | 양승택 | 자동 정의된 베이스 전극을 갖는 바이폴라 트랜지스터 구조 및 그 제조방법 |
| WO1998042019A1 (en) * | 1997-03-18 | 1998-09-24 | Telefonaktiebolaget Lm Ericsson (Publ) | Trench-isolated bipolar devices |
| US6521974B1 (en) * | 1999-10-14 | 2003-02-18 | Hitachi, Ltd. | Bipolar transistor and manufacturing method thereof |
| US6506657B1 (en) * | 2000-04-19 | 2003-01-14 | National Semiconductor Corporation | Process for forming damascene-type isolation structure for BJT device formed in trench |
| US20030082882A1 (en) * | 2001-10-31 | 2003-05-01 | Babcock Jeffrey A. | Control of dopant diffusion from buried layers in bipolar integrated circuits |
| US6759731B2 (en) * | 2002-06-05 | 2004-07-06 | United Microelectronics Corp. | Bipolar junction transistor and fabricating method |
| FR2845522A1 (fr) * | 2002-10-03 | 2004-04-09 | St Microelectronics Sa | Circuit integre a couche enterree fortement conductrice |
-
2006
- 2006-04-24 DE DE602006020430T patent/DE602006020430D1/de active Active
- 2006-04-24 AT AT06728019T patent/ATE500609T1/de not_active IP Right Cessation
- 2006-04-24 WO PCT/IB2006/051262 patent/WO2006117712A1/en not_active Ceased
- 2006-04-24 JP JP2008508376A patent/JP2008539579A/ja not_active Withdrawn
- 2006-04-24 CN CNB2006800143210A patent/CN100565822C/zh not_active Expired - Fee Related
- 2006-04-24 EP EP06728019A patent/EP1878046B1/de not_active Not-in-force
- 2006-04-24 US US11/913,049 patent/US7605027B2/en not_active Expired - Fee Related
- 2006-04-26 TW TW095114928A patent/TWI376750B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| EP1878046B1 (de) | 2011-03-02 |
| JP2008539579A (ja) | 2008-11-13 |
| WO2006117712A1 (en) | 2006-11-09 |
| TW200644125A (en) | 2006-12-16 |
| DE602006020430D1 (de) | 2011-04-14 |
| CN100565822C (zh) | 2009-12-02 |
| CN101180713A (zh) | 2008-05-14 |
| US7605027B2 (en) | 2009-10-20 |
| EP1878046A1 (de) | 2008-01-16 |
| US20080233688A1 (en) | 2008-09-25 |
| TWI376750B (en) | 2012-11-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |