ATE501432T1 - Frequenzdomänenlumineszenzinstrumentierung - Google Patents

Frequenzdomänenlumineszenzinstrumentierung

Info

Publication number
ATE501432T1
ATE501432T1 AT04785225T AT04785225T ATE501432T1 AT E501432 T1 ATE501432 T1 AT E501432T1 AT 04785225 T AT04785225 T AT 04785225T AT 04785225 T AT04785225 T AT 04785225T AT E501432 T1 ATE501432 T1 AT E501432T1
Authority
AT
Austria
Prior art keywords
phase lag
instrumentation
frequency domain
luminescence
calibration
Prior art date
Application number
AT04785225T
Other languages
English (en)
Inventor
Nathan Baltz
J D Sheldon Danielson
Original Assignee
Photosense L L C
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Photosense L L C filed Critical Photosense L L C
Application granted granted Critical
Publication of ATE501432T1 publication Critical patent/ATE501432T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Reinforced Plastic Materials (AREA)
  • Phenolic Resins Or Amino Resins (AREA)
AT04785225T 2003-09-29 2004-09-29 Frequenzdomänenlumineszenzinstrumentierung ATE501432T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US50681303P 2003-09-29 2003-09-29
PCT/US2004/031877 WO2005033746A2 (en) 2003-09-29 2004-09-29 Frequency domain luminescence instrumentation

Publications (1)

Publication Number Publication Date
ATE501432T1 true ATE501432T1 (de) 2011-03-15

Family

ID=34421559

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04785225T ATE501432T1 (de) 2003-09-29 2004-09-29 Frequenzdomänenlumineszenzinstrumentierung

Country Status (6)

Country Link
US (1) US20090283699A1 (de)
EP (1) EP1678482B1 (de)
JP (2) JP4885721B2 (de)
AT (1) ATE501432T1 (de)
DE (1) DE602004031749D1 (de)
WO (1) WO2005033746A2 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0416732D0 (en) * 2004-07-27 2004-09-01 Precisense As A method and apparatus for measuring the phase shift induced in a light signal by a sample
AT502194B1 (de) * 2005-12-16 2007-02-15 Joanneum Res Forschungsgmbh Verfahren und vorrichtung zur bestimmung der fluoreszenz einer probe sowie verwendung derselben
US7781221B2 (en) * 2006-08-18 2010-08-24 Ric Investments, Llc System and method of compensating for system delay in analyte analyzation
US8021615B2 (en) * 2006-10-06 2011-09-20 Ric Investments, Llc Sensor that compensates for deterioration of a luminescable medium
DE102008033214A1 (de) * 2008-07-15 2010-01-21 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG Verfahren zur optischen Bestimmung einer Messgröße eines Messmediums
JP4564566B2 (ja) * 2009-02-13 2010-10-20 三井造船株式会社 蛍光検出装置及び蛍光検出方法
JP4564567B2 (ja) 2009-02-13 2010-10-20 三井造船株式会社 蛍光検出装置及び蛍光検出方法
JP5324487B2 (ja) * 2010-01-21 2013-10-23 三井造船株式会社 蛍光検出用較正装置、蛍光検出用較正方法、および蛍光検出装置
US8760631B2 (en) * 2010-01-27 2014-06-24 Intersil Americas Inc. Distance sensing by IQ domain differentiation of time of flight (TOF) measurements
JP5443404B2 (ja) * 2011-02-08 2014-03-19 三井造船株式会社 蛍光検出装置、蛍光検出装置の診断方法、および蛍光検出方法
WO2013053381A1 (de) * 2011-10-11 2013-04-18 Argos Messtechnik Gmbh Verfahren und vorrichtung zur bestimmung einer stoffkonzentration mittels fluoreszenzspektroskopie
JP2014115121A (ja) * 2012-12-06 2014-06-26 Sony Corp 微小粒子分析装置及び微小粒子分析方法
WO2016032048A1 (ko) * 2014-08-28 2016-03-03 엘지전자 주식회사 근접 센서 및 이의 제어 방법
WO2016056886A1 (en) * 2014-10-09 2016-04-14 Mimos Berhad A system and method for measuring a fluorescence emission signal with phase correction in phase fluorometric
US10579833B1 (en) 2014-12-16 2020-03-03 Thales Esecurity, Inc. Tamper detection circuit assemblies and related manufacturing processes
EP3301655B1 (de) * 2016-09-30 2023-11-15 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement Lumineszierendes sicherheitsmerkmal
CN111007374B (zh) * 2019-10-10 2021-01-01 北京理工大学 用于测量瞬态电致发光的系统和方法
DE102020110192A1 (de) 2020-04-14 2021-10-14 UMS - Umwelt-, Membran- und Sensortechnik GmbH & Co. KG Verfahren und Vorrichtung zur störquellenunabhängigen lumineszenzbasierten Messung eines Analyten
EP4208076A4 (de) * 2020-09-01 2024-10-02 The General Hospital Corporation Systeme und verfahren zur überwachung eines analyten oder parameters für einen patienten
DE102022122092A1 (de) * 2022-08-31 2024-02-29 Pyroscience Gmbh Referenz-Messung

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JPS58160340A (ja) * 1982-03-18 1983-09-22 Mitsubishi Rayon Co Ltd 重合物表面保護用フイルム
JPS58160340U (ja) * 1982-04-21 1983-10-25 工業技術院長 微量成分の定量装置
US4716363A (en) * 1987-05-08 1987-12-29 Hewlett-Packard Company Exponential decay time constant measurement using frequency of offset phase-locked loop: system and method
US4845368A (en) * 1987-06-26 1989-07-04 The United States Of America As Represented By The United States Department Of Energy Method for the substantial reduction of quenching effects in luminescence spectrometry
JPH01102340A (ja) * 1987-10-16 1989-04-20 Shimadzu Corp 吸光光度分析方法
GB9000740D0 (en) * 1990-01-12 1990-03-14 Univ Salford Measurement of luminescence
US5315993A (en) * 1990-02-16 1994-05-31 The Boc Group, Inc. Luminescence monitoring with modulation frequency multiplexing
US5196709A (en) * 1991-05-03 1993-03-23 University Of Maryland Systems Fluorometry method and apparatus using a semiconductor laser diode as a light source
US5281825A (en) * 1991-09-05 1994-01-25 The University Of Maryland School Of Medicine Phase fluorometry using a modulated electroluminescent lamp as a light source
JP3364333B2 (ja) 1994-09-19 2003-01-08 浜松ホトニクス株式会社 減衰特性測定装置
US5646734A (en) * 1995-08-28 1997-07-08 Hewlett-Packard Company Method and apparatus for independently measuring the thickness and index of refraction of films using low coherence reflectometry
JP3274049B2 (ja) * 1995-11-15 2002-04-15 アークレイ株式会社 多孔性材料中の液体の光学的測定法
US5757013A (en) * 1995-12-06 1998-05-26 American Research Corporation Of Virginia Fluorescence decay measurement by calculation of inner product
US6602716B1 (en) * 1997-08-01 2003-08-05 Presens Precision Sensing Gmbh Method and device for referencing fluorescence intensity signals
JPH11304707A (ja) * 1998-04-20 1999-11-05 Bunshi Bio Photonics Kenkyusho:Kk 蛍光測定装置
US6157037A (en) * 1998-12-04 2000-12-05 Photosense, Llc Sensing device and method for measuring emission time delay during irradiation of targeted samples
US6673626B1 (en) * 2000-10-31 2004-01-06 Science & Technology Corporation University Of New Mexico Optoelectronic circuit for detecting changes in fluorescence lifetime
DE10058579A1 (de) * 2000-11-18 2002-06-13 Sentronic Gmbh Ges Fuer Optisc Vorrichtung und Verfahren zur optischen Messung von Konzentrationen eines Stoffes
JP3576523B2 (ja) * 2000-12-26 2004-10-13 オリンパス株式会社 蛍光輝度測定方法及び装置

Also Published As

Publication number Publication date
JP2007512504A (ja) 2007-05-17
DE602004031749D1 (de) 2011-04-21
US20090283699A1 (en) 2009-11-19
WO2005033746A2 (en) 2005-04-14
JP4885721B2 (ja) 2012-02-29
WO2005033746A3 (en) 2005-08-11
EP1678482A2 (de) 2006-07-12
EP1678482A4 (de) 2008-09-24
JP2012018187A (ja) 2012-01-26
EP1678482B1 (de) 2011-03-09

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