ATE516923T1 - Verfahren und vorrichtung zum beidseitigen polieren von halbleiterscheiben - Google Patents

Verfahren und vorrichtung zum beidseitigen polieren von halbleiterscheiben

Info

Publication number
ATE516923T1
ATE516923T1 AT09161077T AT09161077T ATE516923T1 AT E516923 T1 ATE516923 T1 AT E516923T1 AT 09161077 T AT09161077 T AT 09161077T AT 09161077 T AT09161077 T AT 09161077T AT E516923 T1 ATE516923 T1 AT E516923T1
Authority
AT
Austria
Prior art keywords
wafers
grinding
multiple wafers
sides
centers
Prior art date
Application number
AT09161077T
Other languages
English (en)
Inventor
Yasunori Yamada
Kazushige Takaishi
Yuichi Kakizono
Original Assignee
Sumco Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumco Corp filed Critical Sumco Corp
Application granted granted Critical
Publication of ATE516923T1 publication Critical patent/ATE516923T1/de

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/28Work carriers for double side lapping of plane surfaces

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Grinding Of Cylindrical And Plane Surfaces (AREA)
AT09161077T 2008-05-28 2009-05-26 Verfahren und vorrichtung zum beidseitigen polieren von halbleiterscheiben ATE516923T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008139963A JP2009285768A (ja) 2008-05-28 2008-05-28 半導体ウェーハの研削方法および研削装置

Publications (1)

Publication Number Publication Date
ATE516923T1 true ATE516923T1 (de) 2011-08-15

Family

ID=41009313

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09161077T ATE516923T1 (de) 2008-05-28 2009-05-26 Verfahren und vorrichtung zum beidseitigen polieren von halbleiterscheiben

Country Status (4)

Country Link
US (1) US20090298397A1 (de)
EP (1) EP2127810B1 (de)
JP (1) JP2009285768A (de)
AT (1) ATE516923T1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010013519B4 (de) * 2010-03-31 2012-12-27 Siltronic Ag Verfahren zum Polieren einer Halbleiterscheibe
DE102010063179B4 (de) 2010-12-15 2012-10-04 Siltronic Ag Verfahren zur gleichzeitigen Material abtragenden Bearbeitung beider Seiten mindestens dreier Halbleiterscheiben
KR101285897B1 (ko) 2012-02-28 2013-07-12 주식회사 엘지실트론 웨이퍼 연마장치 및 웨이퍼를 연마하는 방법
JP5924409B2 (ja) * 2012-06-25 2016-05-25 株式会社Sumco ワークの研磨方法およびワークの研磨装置
JP6056793B2 (ja) * 2014-03-14 2017-01-11 信越半導体株式会社 両面研磨装置用キャリアの製造方法及び両面研磨方法
CN111261542A (zh) * 2018-11-30 2020-06-09 有研半导体材料有限公司 一种碱腐蚀去除晶圆表面损伤的装置与方法
CN109926873B (zh) * 2019-01-25 2023-07-21 辽宁科技大学 一种用于非导磁薄板类零件的研磨抛光装置及方法
CN110193761B (zh) * 2019-06-05 2020-07-07 威海志赉塑料模具有限公司 一种磨砂面塑料材料的打磨装置
CN110253370B (zh) * 2019-06-28 2021-09-17 肇庆市第二机床厂有限公司 一种电压力锅内缸上口翻边圆周抛光装置
CN111633496B (zh) * 2020-06-12 2022-02-18 上海伟奕传动轴配件有限公司 一种离合器传动轴智能加工处理系统
CN111673554A (zh) * 2020-07-01 2020-09-18 上海光和光学制造大丰有限公司 一种提高盘片寿命的治具
CN113231957A (zh) * 2021-04-29 2021-08-10 金华博蓝特电子材料有限公司 基于双面研磨设备的晶片研磨工艺及半导体晶片
CN113894635B (zh) * 2021-11-03 2022-06-21 安徽格楠机械有限公司 基于自学习的智能硅基晶圆超精密研磨抛光机
CN114743913B (zh) * 2022-05-17 2025-09-16 深圳威思派技术有限公司 一种可供多种晶圆的转盘装置
CN116394092B (zh) * 2023-04-20 2023-09-29 恒亦达智能设备(苏州)有限公司 一种全自动半导体研磨设备
CN117532480B (zh) * 2023-11-14 2024-04-16 苏州博宏源机械制造有限公司 一种晶圆双面抛光机的太阳轮调节装置

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4996798A (en) * 1989-05-31 1991-03-05 Moore Steven C Ultra-precision lapping apparatus
US6080042A (en) * 1997-10-31 2000-06-27 Virginia Semiconductor, Inc. Flatness and throughput of single side polishing of wafers
JPH11254304A (ja) * 1998-03-10 1999-09-21 Super Silicon Kenkyusho:Kk センサを組み込んだ定盤
JPH11333707A (ja) * 1998-05-26 1999-12-07 Toshiba Ceramics Co Ltd キャリア
JP4384742B2 (ja) * 1998-11-02 2009-12-16 Sumco Techxiv株式会社 半導体ウェーハのラッピング装置及びラッピング方法
DE10023002B4 (de) * 2000-05-11 2006-10-26 Siltronic Ag Satz von Läuferscheiben sowie dessen Verwendung
JP2002046058A (ja) * 2000-08-02 2002-02-12 Super Silicon Kenkyusho:Kk 両面研磨用研磨布のドレッシング方法
DE10060697B4 (de) * 2000-12-07 2005-10-06 Siltronic Ag Doppelseiten-Polierverfahren mit reduzierter Kratzerrate und Vorrichtung zur Durchführung des Verfahrens
JP3991598B2 (ja) 2001-02-26 2007-10-17 株式会社Sumco ウエーハ研磨方法
DE10132504C1 (de) * 2001-07-05 2002-10-10 Wacker Siltronic Halbleitermat Verfahren zur beidseitigen Material abtragenden Bearbeitung von Halbleiterscheiben und seine Verwendung
KR100932741B1 (ko) * 2002-03-28 2009-12-21 신에쯔 한도타이 가부시키가이샤 웨이퍼의 양면연마장치 및 양면연마방법
JP2004058201A (ja) * 2002-07-29 2004-02-26 Hoya Corp ワークの研磨方法および電子デバイス用基板の製造方法
JP2004071833A (ja) * 2002-08-06 2004-03-04 Sumitomo Mitsubishi Silicon Corp 半導体ウェーハの両面研磨方法
KR100797734B1 (ko) * 2003-12-05 2008-01-24 가부시키가이샤 섬코 편면 경면 웨이퍼의 제조 방법
JP4343020B2 (ja) * 2003-12-22 2009-10-14 株式会社住友金属ファインテック 両面研磨方法及び装置
JP4198607B2 (ja) * 2004-01-13 2008-12-17 Hoya株式会社 磁気ディスク用ガラス基板の製造方法及び磁気ディスクの製造方法
JP2005238413A (ja) * 2004-02-27 2005-09-08 Yachiyo Microscience Inc ラップ盤用回転定盤
JP4860192B2 (ja) * 2004-09-03 2012-01-25 株式会社ディスコ ウェハの製造方法
JP4727218B2 (ja) * 2004-12-10 2011-07-20 株式会社住友金属ファインテック 両面研磨用キャリア
DE102006032455A1 (de) * 2006-07-13 2008-04-10 Siltronic Ag Verfahren zum gleichzeitigen beidseitigen Schleifen mehrerer Halbleiterscheiben sowie Halbleierscheibe mit hervorragender Ebenheit
JP5507799B2 (ja) 2007-06-22 2014-05-28 株式会社Sumco 半導体ウェーハ研磨装置および研磨方法

Also Published As

Publication number Publication date
EP2127810A1 (de) 2009-12-02
JP2009285768A (ja) 2009-12-10
US20090298397A1 (en) 2009-12-03
EP2127810B1 (de) 2011-07-20

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