ATE520144T1 - Vorrichtung und verfahren zum nachweis von spuren organischer bestandteile - Google Patents

Vorrichtung und verfahren zum nachweis von spuren organischer bestandteile

Info

Publication number
ATE520144T1
ATE520144T1 AT02733305T AT02733305T ATE520144T1 AT E520144 T1 ATE520144 T1 AT E520144T1 AT 02733305 T AT02733305 T AT 02733305T AT 02733305 T AT02733305 T AT 02733305T AT E520144 T1 ATE520144 T1 AT E520144T1
Authority
AT
Austria
Prior art keywords
detecting
ion
detection apparatus
laser irradiation
molecular beam
Prior art date
Application number
AT02733305T
Other languages
English (en)
Inventor
Yoshihiro Deguchi
Norihiro Fukuda
Shinsaku Dobashi
Junichiro Hori
Takahiro Kubota
Matsuhei Noda
Akio Hiraki
Original Assignee
Mitsubishi Heavy Ind Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2001170753A external-priority patent/JP3593064B2/ja
Priority claimed from JP2001170778A external-priority patent/JP3477457B2/ja
Priority claimed from JP2001170784A external-priority patent/JP2002367559A/ja
Priority claimed from JP2001198574A external-priority patent/JP3785060B2/ja
Priority claimed from JP2001340487A external-priority patent/JP3626930B2/ja
Priority claimed from JP2001340495A external-priority patent/JP3593088B2/ja
Priority claimed from JP2002045801A external-priority patent/JP3616060B2/ja
Application filed by Mitsubishi Heavy Ind Ltd filed Critical Mitsubishi Heavy Ind Ltd
Application granted granted Critical
Publication of ATE520144T1 publication Critical patent/ATE520144T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622—Ion mobility spectrometry
    • G01N27/623—Ion mobility spectrometry combined with mass spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/64—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
    • G01N33/0036—General constructional details of gas analysers, e.g. portable test equipment concerning the detector specially adapted to detect a particular component
    • G01N33/0047—Organic compounds
    • G01N33/0049—Halogenated organic compounds
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/162—Direct photo-ionisation, e.g. single photon or multi-photon ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Toxicology (AREA)
  • Molecular Biology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
AT02733305T 2001-06-06 2002-06-05 Vorrichtung und verfahren zum nachweis von spuren organischer bestandteile ATE520144T1 (de)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
JP2001170753A JP3593064B2 (ja) 2001-06-06 2001-06-06 有機微量成分の検出装置
JP2001170778A JP3477457B2 (ja) 2001-06-06 2001-06-06 有機ハロゲン化物分解処理システム
JP2001170784A JP2002367559A (ja) 2001-06-06 2001-06-06 有機微量成分の検出装置
JP2001198574A JP3785060B2 (ja) 2001-06-29 2001-06-29 有機ハロゲン化物の検出装置
JP2001340487A JP3626930B2 (ja) 2001-11-06 2001-11-06 レーザ測定装置及び方法
JP2001340495A JP3593088B2 (ja) 2001-11-06 2001-11-06 有害物質計測装置
JP2002045801A JP3616060B2 (ja) 2002-02-22 2002-02-22 有機ハロゲン化物濃度校正装置
PCT/JP2002/005527 WO2002101376A1 (en) 2001-06-06 2002-06-05 Device and method for detecting trace amounts of organic components

Publications (1)

Publication Number Publication Date
ATE520144T1 true ATE520144T1 (de) 2011-08-15

Family

ID=27567048

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02733305T ATE520144T1 (de) 2001-06-06 2002-06-05 Vorrichtung und verfahren zum nachweis von spuren organischer bestandteile

Country Status (7)

Country Link
US (1) US20040036018A1 (de)
EP (2) EP2107594A3 (de)
KR (1) KR20030038681A (de)
AT (1) ATE520144T1 (de)
CA (1) CA2429886A1 (de)
NO (1) NO20030574L (de)
WO (1) WO2002101376A1 (de)

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FR2879744B1 (fr) * 2004-12-16 2007-04-20 Univ Claude Bernard Lyon Dispositif et analyse en masse de molecules mettant en oeuvre une photodissociation par faisceau laser uv ou visible
JP4547507B2 (ja) * 2006-02-15 2010-09-22 国立大学法人京都大学 イオンビーム検出器
US8193487B2 (en) * 2007-03-16 2012-06-05 Inficon, Inc. Portable light emitting sampling probe
ATE548637T1 (de) * 2007-09-24 2012-03-15 Univ Potsdam Messanordnung für ein optisches spektrometer
CN102426164A (zh) * 2011-08-22 2012-04-25 东南大学 一种强激光照射下物质分解或转化产物的收集及检测方法
AU2015298380A1 (en) * 2014-08-05 2017-02-16 Dh Technologies Development Pte. Ltd. Methods for distinguishing dioleinates of aged and non-aged olive oil
CN105300748B (zh) * 2015-11-24 2018-05-01 北京大方科技有限责任公司 气体采集设备及系统
US10717936B2 (en) 2016-08-01 2020-07-21 Sabic Global Technologies B.V. Catalytic process of simultaneous pyrolysis of mixed plastics and dechlorination of the pyrolysis oil
US20180052893A1 (en) * 2016-08-22 2018-02-22 Eung Joon JO Database management using a matrix-assisted laser desorption/ionization time-of-flight mass spectrometer
CN107589170B (zh) * 2017-10-10 2023-08-08 浙江富春江环保科技研究有限公司 用于二噁英检测设备的痕量有机物检测自动化气路系统
CN107655728B (zh) * 2017-11-09 2024-05-07 中国华能集团清洁能源技术研究院有限公司 适用于对烟气中低挥发性痕量元素取样监测的装置及方法
JP7259873B2 (ja) * 2019-02-07 2023-04-18 株式会社島津製作所 分析方法、分析装置およびプログラム
CN110146349B (zh) * 2019-06-06 2020-06-05 中国气象科学研究院 一种加压式空气采样设备及其采样方法

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US2714164A (en) * 1954-02-23 1955-07-26 John W Riggie Mass spectrometer sampling system
JPS5342878A (en) * 1976-09-30 1978-04-18 Wako Kk Soot concentration measuring apparatus
US5504326A (en) * 1994-10-24 1996-04-02 Indiana University Foundation Spatial-velocity correlation focusing in time-of-flight mass spectrometry
JPH09243601A (ja) * 1996-03-07 1997-09-19 Nkk Corp 排ガス中の微量有機化合物の測定装置
US5977541A (en) * 1996-08-29 1999-11-02 Nkk Corporation Laser ionization mass spectroscope and mass spectrometric analysis method
ID20425A (id) * 1996-12-30 1998-12-10 Honda Motor Co Ltd Sistem pembakaran untuk fasilitas yang menimbulkan asap berjelaga
KR100251645B1 (ko) 1997-03-21 2000-04-15 윤종용 반도체 공정용 가스 평가장치에 결합되는 샘플가스 분배 장치 및 구동방법
US6432278B2 (en) * 1997-03-26 2002-08-13 The Institute Of Physical And Chemical Research Method for controlling refractive index of silica glass
JPH10265243A (ja) * 1997-03-26 1998-10-06 Rikagaku Kenkyusho シリカガラスの屈折率制御方法
US6067864A (en) * 1997-11-25 2000-05-30 Peterson; Roger Multiport valve system through which sample gas continuously flows in selected and non selected ports
AU2463299A (en) * 1998-01-23 1999-08-09 Analytica Of Branford, Inc. Mass spectrometry from surfaces
JPH11224645A (ja) * 1998-02-09 1999-08-17 Hitachi Ltd イオントラップ質量分析装置
JP3664867B2 (ja) * 1998-03-13 2005-06-29 三菱重工業株式会社 Ｐｃｂ分解反応容器
JPH11344477A (ja) * 1998-06-02 1999-12-14 Japan Organo Co Ltd 有害有機物質の分解処理装置の排水のモニタリング方法及び装置
JP3495616B2 (ja) * 1998-10-28 2004-02-09 三菱重工業株式会社 含塩素有機化合物の熱水分解方法
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JP2000301126A (ja) * 1999-04-14 2000-10-31 Kunio Murata 移動式有害有機塩素系物質処理設備
JP3860933B2 (ja) 1999-05-10 2006-12-20 三菱重工業株式会社 分子同定装置、分子同定方法、及び、イオントラップ
JP3652922B2 (ja) * 1999-05-21 2005-05-25 三菱重工業株式会社 化学物質の検出装置
JP4703801B2 (ja) * 1999-06-15 2011-06-15 オルガノ株式会社 ホルモン様活性を有する化学物質を含む液体の処理方法及び処理装置
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JP4105348B2 (ja) * 1999-11-19 2008-06-25 株式会社日立製作所 試料分析用モニタ装置及びそれを用いた燃焼制御システム
US6627883B2 (en) * 2001-03-02 2003-09-30 Bruker Daltonics Inc. Apparatus and method for analyzing samples in a dual ion trap mass spectrometer

Also Published As

Publication number Publication date
CA2429886A1 (en) 2002-12-19
EP1394537A1 (de) 2004-03-03
US20040036018A1 (en) 2004-02-26
KR20030038681A (ko) 2003-05-16
NO20030574D0 (no) 2003-02-05
NO20030574L (no) 2003-04-03
EP2107594A2 (de) 2009-10-07
WO2002101376A1 (en) 2002-12-19
EP1394537A4 (de) 2007-08-15
EP1394537B1 (de) 2011-08-10
EP2107594A3 (de) 2010-07-21

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