ATE520970T1 - Präparathaltevorrichtung - Google Patents

Präparathaltevorrichtung

Info

Publication number
ATE520970T1
ATE520970T1 AT03719634T AT03719634T ATE520970T1 AT E520970 T1 ATE520970 T1 AT E520970T1 AT 03719634 T AT03719634 T AT 03719634T AT 03719634 T AT03719634 T AT 03719634T AT E520970 T1 ATE520970 T1 AT E520970T1
Authority
AT
Austria
Prior art keywords
main body
supporting surface
restraining element
specimen
specimen supporting
Prior art date
Application number
AT03719634T
Other languages
English (en)
Inventor
Paul Fischione
Jeff Gronsky
Original Assignee
E A Fischione Instr Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by E A Fischione Instr Inc filed Critical E A Fischione Instr Inc
Application granted granted Critical
Publication of ATE520970T1 publication Critical patent/ATE520970T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2007—Holding mechanisms
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/202—Movement
    • H01J2237/20207—Tilt
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/204—Means for introducing and/or outputting objects

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
AT03719634T 2002-04-08 2003-04-07 Präparathaltevorrichtung ATE520970T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US37084302P 2002-04-08 2002-04-08
PCT/US2003/010670 WO2003087018A2 (en) 2002-04-08 2003-04-07 Specimen holding apparatus

Publications (1)

Publication Number Publication Date
ATE520970T1 true ATE520970T1 (de) 2011-09-15

Family

ID=29250593

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03719634T ATE520970T1 (de) 2002-04-08 2003-04-07 Präparathaltevorrichtung

Country Status (5)

Country Link
US (1) US7219565B2 (de)
EP (1) EP1497635B1 (de)
JP (1) JP4542786B2 (de)
AT (1) ATE520970T1 (de)
WO (1) WO2003087018A2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE520970T1 (de) * 2002-04-08 2011-09-15 E A Fischione Instr Inc Präparathaltevorrichtung
EP1796131A3 (de) * 2005-12-09 2010-10-13 Contrel Technology Co., Ltd. Kontrollplatte für ultra-dünnen Flüssigkeitsfilm und Kombination aus dieser Kontrollplatte mit einem Behälter für die Elektronenmikroskopie
JP2008159513A (ja) * 2006-12-26 2008-07-10 Jeol Ltd 電子顕微鏡用試料ホルダー
US9312097B2 (en) * 2007-05-09 2016-04-12 Protochips, Inc. Specimen holder used for mounting samples in electron microscopes
JP5462859B2 (ja) 2008-03-17 2014-04-02 プロトチップス，インコーポレイテッド 電子顕微鏡にサンプルを装着するために用いられる標本ホルダ
US8059271B2 (en) 2009-02-04 2011-11-15 The United States Of America As Represented By The Secretary Of The Army Reusable sample holding device permitting ready loading of very small wet samples
WO2011011661A2 (en) * 2009-07-24 2011-01-27 Omniprobe, Inc. Method and apparatus for the monitoring of sample milling in a charged particle instrument
US8178851B2 (en) * 2010-07-30 2012-05-15 E.A. Fischione Instruments, Inc. In situ holder assembly
AT510799B1 (de) * 2010-11-29 2012-12-15 Leica Microsystems Schweiz Ag Halterung für einen elektronenmikroskopischen probenträger
JP6137801B2 (ja) * 2012-09-27 2017-05-31 株式会社メルビル 試料ホルダー先端部、及び前記試料ホルダー先端部を有する試料ホルダー
DK2835653T3 (da) * 2013-08-06 2023-01-09 Univ Basel Prøveholder til en AFM
JP6279636B2 (ja) * 2016-03-03 2018-02-14 株式会社メルビル カートリッジ、試料ホルダー先端部、及び前記試料ホルダー先端部を有する試料ホルダー
US10373801B2 (en) * 2016-04-22 2019-08-06 Board Of Regents, The University Of Texas System Systems and methods for measuring magnetic fields produced within microscopes
EP3699948A1 (de) * 2019-02-21 2020-08-26 FEI Company Probenhalter für ein ladungsträgerteilchenmikroskop
CN113994957B (zh) * 2021-12-10 2022-05-31 内蒙古农业大学 一种园林植物标本夹及其连接结构
CN118925824B (zh) * 2024-08-30 2025-09-09 上海品峰医疗科技有限公司 样品转移装置及其控制方法、可读存储介质和程序产品、样本处理设备

Family Cites Families (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2368900A (en) * 1943-03-15 1945-02-06 Richard L Templin Compression testing jig
US4103643A (en) * 1973-03-26 1978-08-01 The Perkin-Elmer Corporation Aerosol-reducing slide holder system
JPS52126744U (de) * 1976-03-24 1977-09-27
JPS5638446Y2 (de) * 1977-02-14 1981-09-08
JPS5836118Y2 (ja) * 1978-08-28 1983-08-15 日本真空技術株式会社 サンプルホルダの傾動装置
JPS57164954U (de) * 1981-04-13 1982-10-18
JPS6324619Y2 (de) * 1981-04-13 1988-07-06
JPS5831538U (ja) * 1981-08-26 1983-03-01 三菱重工業株式会社 顕微鏡試料観察装置
JPS58169762A (ja) * 1982-03-30 1983-10-06 Internatl Precision Inc 電子線装置
JPS59500688A (ja) * 1982-04-20 1984-04-19 ザ　ユニバ−シテイ　コ−ト　オブ　ザ　ユニバ−シテイ　オブ　グラスゴ− 微量分析のための低温ステ−ジ
JPS6049314U (ja) * 1983-09-14 1985-04-06 横河電機株式会社 ガラス板ホルダ−
JPH0310603Y2 (de) * 1984-08-31 1991-03-15
US4672797A (en) * 1985-06-21 1987-06-16 Gatan, Inc. Method and apparatus for securing and transferring grid specimens
US4662229A (en) * 1985-08-26 1987-05-05 Curtis John M Grip assembly
JPS62188721U (de) * 1986-05-21 1987-12-01
DE3628170A1 (de) * 1986-08-20 1988-02-25 Max Planck Gesellschaft Verstellbare praeparathalterung fuer ein korpuskularstrahlenmikroskop
GB2197489B (en) * 1986-10-21 1990-12-19 British Aerospace Laminate compression tester
JPH034457U (de) * 1989-05-31 1991-01-17
US4954712A (en) * 1989-10-16 1990-09-04 Wilcox Harry P Specimen retaining ring system for an electron microscope
EP0504972A1 (de) * 1991-03-18 1992-09-23 Koninklijke Philips Electronics N.V. Präparathalter zur Verwendung in einer Ladungsteilchenbündelanordnung
US5297441A (en) * 1992-08-14 1994-03-29 The Boeing Company Apparatus for supporting a test specimen for compression testing
JP2781320B2 (ja) * 1993-01-18 1998-07-30 株式会社蛋白工学研究所 電子顕微鏡等の試料ホルダ
JPH0660050U (ja) * 1993-01-25 1994-08-19 日本電子株式会社 電子顕微鏡用試料ホルダ
JP2740628B2 (ja) * 1993-11-04 1998-04-15 株式会社エス・テイ・ジャパン 試料ホルダ
JP2846562B2 (ja) * 1993-11-04 1999-01-13 株式会社エス・テイ・ジャパン 顕微分析用試料ホルダ
US5463223A (en) * 1994-01-24 1995-10-31 Patwong Technologies, Inc. Disposable all purpose micro sample holder
JPH08212957A (ja) * 1995-02-02 1996-08-20 Canon Inc 電子顕微鏡用試料ホルダー
US5528942A (en) * 1995-06-13 1996-06-25 Baratta; Francis I. Apparatus for maximizing critical buckling loads for compression testing
US5965823A (en) * 1996-08-22 1999-10-12 The United States Of America As Represented By The Secretary Of The Army Specimen holder for thermal mechanical testing machine
US5877432A (en) * 1996-11-26 1999-03-02 The University Of Dayton Magnetostrictive actuator
US5945607A (en) * 1997-06-12 1999-08-31 Mts Systems Corporation Test specimen holder
US5877427A (en) * 1997-06-30 1999-03-02 Chrysler Corporation Weatherstrip resiliency test fixture
JPH11202213A (ja) * 1998-01-08 1999-07-30 Nikon Corp 顕微鏡の標本ホルダ
JPH11304433A (ja) * 1998-04-15 1999-11-05 Sony Corp 膜厚測定用サンプル・フィルムの保持装置
US6388262B1 (en) * 1998-08-12 2002-05-14 Gatan, Inc. Double tilt and rotate specimen holder for a transmission electron microscope
JP2001084939A (ja) * 1999-09-17 2001-03-30 Canon Inc 走査電子顕微鏡の試料ホルダ
ATE520970T1 (de) * 2002-04-08 2011-09-15 E A Fischione Instr Inc Präparathaltevorrichtung

Also Published As

Publication number Publication date
EP1497635A2 (de) 2005-01-19
WO2003087018A3 (en) 2004-08-19
JP2005522833A (ja) 2005-07-28
US20040003666A1 (en) 2004-01-08
EP1497635A4 (de) 2009-01-07
EP1497635B1 (de) 2011-08-17
WO2003087018A2 (en) 2003-10-23
JP4542786B2 (ja) 2010-09-15
US7219565B2 (en) 2007-05-22

Similar Documents

Publication Publication Date Title
ATE520970T1 (de) Präparathaltevorrichtung
ATE417244T1 (de) Haltevorrichtung für einen wabenstrukturkörper und prüfvorrichtung für einen wabenstrukturkörper
DE60317515D1 (de) Abnehmbare vorrichtung zum sicheren greifen
EP3738714A4 (de) Polierwerkzeughalter und poliervorrichtung
DE50112910D1 (de) Navigationsverfahren und -vorrichtung
DE60108573D1 (de) Vorrichtung zur Planheitsmessung an Bändern
DE60101279D1 (de) Selbstangetriebenes Gerät zum Greifen, Festmachen und Bewegen eines Unterwasserfahrzeuges oder ähnliches
DE69802185D1 (de) Vorrichtung mit zwei spiegeln für einen interferometrisch kontrollierten positioniertisch
DE60210821D1 (de) Einrichtung zum reduzieren der stossempfindlichkeit eines artikels
ATE370386T1 (de) Abtastbaueinheit einer positionsmesseinrichtung
ITMI20031819A1 (it) Dispositivo per la lavorazione di pezzi sostanzialmente piatti.
EP1312916A4 (de) Zerstörungsfreie untersuchungsvorrichtung
NO20013308D0 (no) Apparat for söking på Internett
DE50104573D1 (de) Vorrichtung zum Entfernen von Beulen
DE50113658D1 (de) Justierbarer Bauteilhalter
DE69912439D1 (de) Grö enverstellbare Halteringvorrichtung
FR2844527B1 (fr) Appareil de reglage pour banc d'etirage
DE502005010974D1 (de) Stützeinheit
DE50114924D1 (de) Vorrichtung zum bereitstellen von material an arbeitsplätzen
DE50202517D1 (de) Vorrichtung zum Führen flächiger Exemplare in Falzapparaten
ITCA20010001A0 (it) Apparato per affilare oggetti
IT1305490B1 (it) Dispositivo perfezionato per la misura di precisione di grandezze emetodo di verifica di buon funzionamento del dispositivo
DE60000149D1 (de) Mikrovorrichtungsverarbeitungsverfahren
ATE378157T1 (de) Trennvorrichtung
FR2880298B1 (fr) Dispositif pour maintenir fermement buches ou fagots en porte-a-faux pendant leur tronconnage

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties