ATE521901T1 - Verfahren und system zur erkennung von takteigenschaften in einem kommunikationssystem - Google Patents

Verfahren und system zur erkennung von takteigenschaften in einem kommunikationssystem

Info

Publication number
ATE521901T1
ATE521901T1 AT09735610T AT09735610T ATE521901T1 AT E521901 T1 ATE521901 T1 AT E521901T1 AT 09735610 T AT09735610 T AT 09735610T AT 09735610 T AT09735610 T AT 09735610T AT E521901 T1 ATE521901 T1 AT E521901T1
Authority
AT
Austria
Prior art keywords
test
counter
system clock
internal signal
cycles
Prior art date
Application number
AT09735610T
Other languages
English (en)
Inventor
Peter Anderson
Jacqueline Bickerstaff
Xianri Huang
Original Assignee
St Ericsson Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by St Ericsson Sa filed Critical St Ericsson Sa
Application granted granted Critical
Publication of ATE521901T1 publication Critical patent/ATE521901T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G01R31/31726—Synchronization, e.g. of test, clock or strobe signals; Signals in different clock domains; Generation of Vernier signals; Comparison and adjustment of the signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)
  • Manipulation Of Pulses (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Time-Division Multiplex Systems (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
AT09735610T 2008-04-25 2009-04-21 Verfahren und system zur erkennung von takteigenschaften in einem kommunikationssystem ATE521901T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0807625.9A GB0807625D0 (en) 2008-04-25 2008-04-25 Method and system for detecting timing characteristics in a communications system
PCT/GB2009/001027 WO2009130460A1 (en) 2008-04-25 2009-04-21 Method and system for detecting timing characteristics in a communications system

Publications (1)

Publication Number Publication Date
ATE521901T1 true ATE521901T1 (de) 2011-09-15

Family

ID=39522610

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09735610T ATE521901T1 (de) 2008-04-25 2009-04-21 Verfahren und system zur erkennung von takteigenschaften in einem kommunikationssystem

Country Status (5)

Country Link
US (1) US8677172B2 (de)
EP (1) EP2279424B1 (de)
AT (1) ATE521901T1 (de)
GB (1) GB0807625D0 (de)
WO (1) WO2009130460A1 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009250807A (ja) * 2008-04-07 2009-10-29 Seiko Epson Corp 周波数測定装置及び測定方法
JP2010271091A (ja) * 2009-05-20 2010-12-02 Seiko Epson Corp 周波数測定装置
JP5517033B2 (ja) * 2009-05-22 2014-06-11 セイコーエプソン株式会社 周波数測定装置
JP5440999B2 (ja) * 2009-05-22 2014-03-12 セイコーエプソン株式会社 周波数測定装置
JP5582447B2 (ja) * 2009-08-27 2014-09-03 セイコーエプソン株式会社 電気回路、同電気回路を備えたセンサーシステム、及び同電気回路を備えたセンサーデバイス
JP5815918B2 (ja) * 2009-10-06 2015-11-17 セイコーエプソン株式会社 周波数測定方法、周波数測定装置及び周波数測定装置を備えた装置
JP5876975B2 (ja) * 2009-10-08 2016-03-02 セイコーエプソン株式会社 周波数測定装置及び周波数測定装置における変速分周信号の生成方法
JP5883558B2 (ja) 2010-08-31 2016-03-15 セイコーエプソン株式会社 周波数測定装置及び電子機器
US9401722B2 (en) * 2011-06-20 2016-07-26 Texas Instruments Incorporated Autoconfigurable phase-locked loop which automatically maintains a constant damping factor and adjusts the loop bandwidth to a constant ratio of the reference frequency
US8664934B2 (en) 2012-01-27 2014-03-04 Covidien Lp System and method for verifying the operating frequency of digital control circuitry
US8847646B2 (en) * 2013-02-27 2014-09-30 Kabushiki Kaisha Toshiba Semiconductor integrated circuit
US9504516B2 (en) 2013-05-31 2016-11-29 Covidien LLP Gain compensation for a full bridge inverter
US9553717B2 (en) * 2014-03-18 2017-01-24 Analog Devices Global Systems and methods for clock and data recovery
US9749125B2 (en) 2014-12-12 2017-08-29 Analog Devices Global Apparatus and method for clock generation
EP3416254B1 (de) * 2017-06-14 2020-04-22 ABB Schweiz AG Elektronische schutzvorrichtung
TWI668962B (zh) * 2018-10-02 2019-08-11 新唐科技股份有限公司 時脈調整裝置及其傳輸系統和方法
DE102018220398A1 (de) * 2018-11-28 2020-05-28 Robert Bosch Gmbh Verfahren zum Abschalten einer Kommunikation und korrespondierende Kommunikationsanordnung
US10802534B2 (en) * 2019-01-24 2020-10-13 Arm Limited Clock circuitry with fault detection

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4929890A (en) * 1986-08-11 1990-05-29 Bell Microsensors, Inc. System for obtaining digital outputs from multiple transducers
JPH0240573A (ja) * 1988-08-01 1990-02-09 Fujitsu Ltd 雑音検出装置
JP2931637B2 (ja) * 1990-06-11 1999-08-09 株式会社東芝 受信機のデータ処理装置
JP2600598B2 (ja) * 1993-12-10 1997-04-16 日本電気株式会社 パルス幅判別回路
US5481563A (en) * 1994-03-14 1996-01-02 Network Systems Corporation Jitter measurement using a statistically locked loop
US6247138B1 (en) * 1997-06-12 2001-06-12 Fujitsu Limited Timing signal generating circuit, semiconductor integrated circuit device and semiconductor integrated circuit system to which the timing signal generating circuit is applied, and signal transmission system
US5915108A (en) * 1997-06-30 1999-06-22 Delco Electronics Corporation Method of measurement and compensation of an inaccurate clock signal
US6295315B1 (en) * 1999-04-20 2001-09-25 Arnold M. Frisch Jitter measurement system and method
JP2001013179A (ja) * 1999-06-29 2001-01-19 Mitsubishi Electric Corp リングオシレータクロック周波数測定方法、リングオシレータクロック周波数測定回路、およびマイクロコンピュータ
EP1172960A3 (de) * 2000-07-10 2003-08-13 International Business Machines Corporation Vorrichtung und Verfahren zum Ermitteln der Qualität eines digitalen Signals
US7545858B2 (en) * 2004-06-29 2009-06-09 Agilent Technologies, Inc. Method of measuring jitter frequency response
KR100667154B1 (ko) * 2004-10-26 2007-01-12 한국전자통신연구원 주파수 락 검출기
JP4819400B2 (ja) * 2005-05-26 2011-11-24 株式会社リコー クロック生成回路のテスト回路

Also Published As

Publication number Publication date
EP2279424B1 (de) 2011-08-24
WO2009130460A8 (en) 2010-07-01
US8677172B2 (en) 2014-03-18
US20110068828A1 (en) 2011-03-24
GB0807625D0 (en) 2008-06-04
WO2009130460A1 (en) 2009-10-29
EP2279424A1 (de) 2011-02-02

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