ATE526612T1 - Ablagerungsminderungsvorrichtung mit drehbarer folienfalle - Google Patents
Ablagerungsminderungsvorrichtung mit drehbarer folienfalleInfo
- Publication number
- ATE526612T1 ATE526612T1 AT09714245T AT09714245T ATE526612T1 AT E526612 T1 ATE526612 T1 AT E526612T1 AT 09714245 T AT09714245 T AT 09714245T AT 09714245 T AT09714245 T AT 09714245T AT E526612 T1 ATE526612 T1 AT E526612T1
- Authority
- AT
- Austria
- Prior art keywords
- driving
- mitigation device
- debris mitigation
- casing
- gap
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70916—Pollution mitigation, i.e. mitigating effect of contamination or debris, e.g. foil traps
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16C—SHAFTS; FLEXIBLE SHAFTS; ELEMENTS OR CRANKSHAFT MECHANISMS; ROTARY BODIES OTHER THAN GEARING ELEMENTS; BEARINGS
- F16C33/00—Parts of bearings; Special methods for making bearings or parts thereof
- F16C33/72—Sealings
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Atmospheric Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- High Energy & Nuclear Physics (AREA)
- Mechanical Engineering (AREA)
- X-Ray Techniques (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP08102119 | 2008-02-28 | ||
| PCT/IB2009/050742 WO2009107063A1 (en) | 2008-02-28 | 2009-02-25 | Debris mitigation device with rotating foil trap and drive assembly |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE526612T1 true ATE526612T1 (de) | 2011-10-15 |
Family
ID=40589550
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT09714245T ATE526612T1 (de) | 2008-02-28 | 2009-02-25 | Ablagerungsminderungsvorrichtung mit drehbarer folienfalle |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8338797B2 (de) |
| EP (1) | EP2250535B1 (de) |
| JP (1) | JP5475693B2 (de) |
| KR (1) | KR101606436B1 (de) |
| CN (1) | CN101960386B (de) |
| AT (1) | ATE526612T1 (de) |
| WO (1) | WO2009107063A1 (de) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2496282C1 (ru) * | 2012-02-15 | 2013-10-20 | Общество С Ограниченной Ответственностью "Эуф Лабс" | Устройство и способ для генерации излучения из разрядной плазмы |
| US9268031B2 (en) | 2012-04-09 | 2016-02-23 | Kla-Tencor Corporation | Advanced debris mitigation of EUV light source |
| JP6151525B2 (ja) * | 2013-02-05 | 2017-06-21 | ギガフォトン株式会社 | ガスロック装置及び極端紫外光生成装置 |
| US8901523B1 (en) * | 2013-09-04 | 2014-12-02 | Asml Netherlands B.V. | Apparatus for protecting EUV optical elements |
| JP6135410B2 (ja) * | 2013-09-06 | 2017-05-31 | ウシオ電機株式会社 | ホイルトラップ及びこのホイルトラップを用いた光源装置 |
| US10222701B2 (en) | 2013-10-16 | 2019-03-05 | Asml Netherlands B.V. | Radiation source, lithographic apparatus device manufacturing method, sensor system and sensing method |
| JP5983594B2 (ja) * | 2013-12-25 | 2016-08-31 | ウシオ電機株式会社 | 光源装置 |
| US9609731B2 (en) | 2014-07-07 | 2017-03-28 | Media Lario Srl | Systems and methods for synchronous operation of debris-mitigation devices |
| CN106527062B (zh) * | 2017-01-11 | 2018-11-27 | 惠科股份有限公司 | 一种曝光机及其图像偏移防治方法和系统 |
| US10877190B2 (en) * | 2018-08-17 | 2020-12-29 | Taiwan Semiconductor Manufacturing Co., Ltd. | Extreme ultraviolet radiation source |
| JP7107334B2 (ja) * | 2020-06-12 | 2022-07-27 | ウシオ電機株式会社 | 極端紫外光光源装置 |
| JP7264119B2 (ja) * | 2020-06-12 | 2023-04-25 | ウシオ電機株式会社 | 極端紫外光光源装置 |
| EP4167030A4 (de) | 2020-06-12 | 2024-08-21 | Ushio Denki Kabushiki Kaisha | Lichtquellenvorrichtung für extreme uv-strahlung |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6241472A (ja) * | 1985-08-15 | 1987-02-23 | Fujitsu Ltd | 回転体の塵埃発生防止装置 |
| JPH01320322A (ja) * | 1988-06-17 | 1989-12-26 | Matsushita Electric Ind Co Ltd | 非接触型密封装置及び電動機 |
| JPH0599176A (ja) | 1991-10-01 | 1993-04-20 | Ebara Corp | スクリユー式ドライ真空ポンプ |
| JPH0643348U (ja) * | 1992-11-24 | 1994-06-07 | 新明和工業株式会社 | エアスピンドル |
| JP2000018395A (ja) * | 1998-06-29 | 2000-01-18 | Toyoda Mach Works Ltd | 回転軸のシール装置 |
| DE19962160C2 (de) | 1999-06-29 | 2003-11-13 | Fraunhofer Ges Forschung | Vorrichtungen zur Erzeugung von Extrem-Ultraviolett- und weicher Röntgenstrahlung aus einer Gasentladung |
| US6714624B2 (en) | 2001-09-18 | 2004-03-30 | Euv Llc | Discharge source with gas curtain for protecting optics from particles |
| WO2003034153A2 (en) | 2001-10-12 | 2003-04-24 | Koninklijke Philips Electronics N.V. | Lithographic apparatus and device manufacturing method |
| JP3883836B2 (ja) * | 2001-10-24 | 2007-02-21 | 株式会社荏原製作所 | 差動排気シール装置 |
| US7134668B2 (en) | 2001-10-24 | 2006-11-14 | Ebara Corporation | Differential pumping seal apparatus |
| CN101255892B (zh) * | 2001-11-13 | 2011-11-16 | Ntn株式会社 | 流体轴承装置 |
| US6963071B2 (en) | 2002-11-25 | 2005-11-08 | Intel Corporation | Debris mitigation device |
| TWI230847B (en) | 2002-12-23 | 2005-04-11 | Asml Netherlands Bv | Contamination barrier with expandable lamellas |
| US7302043B2 (en) | 2004-07-27 | 2007-11-27 | Gatan, Inc. | Rotating shutter for laser-produced plasma debris mitigation |
| US7145132B2 (en) * | 2004-12-27 | 2006-12-05 | Asml Netherlands B.V. | Lithographic apparatus, illumination system and debris trapping system |
| WO2006134512A2 (en) | 2005-06-14 | 2006-12-21 | Philips Intellectual Property & Standards Gmbh | Debris mitigation system with improved gas distribution |
| US7397056B2 (en) | 2005-07-06 | 2008-07-08 | Asml Netherlands B.V. | Lithographic apparatus, contaminant trap, and device manufacturing method |
| US7332731B2 (en) * | 2005-12-06 | 2008-02-19 | Asml Netherlands, B.V. | Radiation system and lithographic apparatus |
| US7368733B2 (en) | 2006-03-30 | 2008-05-06 | Asml Netherlands B.V. | Contamination barrier and lithographic apparatus comprising same |
| US7442948B2 (en) | 2006-05-15 | 2008-10-28 | Asml Netherlands B.V. | Contamination barrier and lithographic apparatus |
| US7889312B2 (en) | 2006-09-22 | 2011-02-15 | Asml Netherlands B.V. | Apparatus comprising a rotating contaminant trap |
-
2009
- 2009-02-25 AT AT09714245T patent/ATE526612T1/de not_active IP Right Cessation
- 2009-02-25 KR KR1020107021645A patent/KR101606436B1/ko active Active
- 2009-02-25 US US12/918,827 patent/US8338797B2/en active Active
- 2009-02-25 EP EP09714245A patent/EP2250535B1/de active Active
- 2009-02-25 WO PCT/IB2009/050742 patent/WO2009107063A1/en not_active Ceased
- 2009-02-25 JP JP2010548232A patent/JP5475693B2/ja active Active
- 2009-02-25 CN CN200980106737.9A patent/CN101960386B/zh active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP2250535A1 (de) | 2010-11-17 |
| KR101606436B1 (ko) | 2016-03-28 |
| US8338797B2 (en) | 2012-12-25 |
| CN101960386A (zh) | 2011-01-26 |
| WO2009107063A1 (en) | 2009-09-03 |
| JP5475693B2 (ja) | 2014-04-16 |
| JP2011515022A (ja) | 2011-05-12 |
| KR20100119580A (ko) | 2010-11-09 |
| CN101960386B (zh) | 2013-02-06 |
| EP2250535B1 (de) | 2011-09-28 |
| US20110002569A1 (en) | 2011-01-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |