ATE527526T1 - Photonenzählvorrichtung - Google Patents

Photonenzählvorrichtung

Info

Publication number
ATE527526T1
ATE527526T1 AT06744324T AT06744324T ATE527526T1 AT E527526 T1 ATE527526 T1 AT E527526T1 AT 06744324 T AT06744324 T AT 06744324T AT 06744324 T AT06744324 T AT 06744324T AT E527526 T1 ATE527526 T1 AT E527526T1
Authority
AT
Austria
Prior art keywords
detector
capacitance
sensor element
potential difference
photon
Prior art date
Application number
AT06744324T
Other languages
English (en)
Inventor
Alan Mathewson
John Carlton Jackson
Original Assignee
Sensl Technologies Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sensl Technologies Ltd filed Critical Sensl Technologies Ltd
Application granted granted Critical
Publication of ATE527526T1 publication Critical patent/ATE527526T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • G01J1/46Electric circuits using a capacitor
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H04N25/773Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Light Receiving Elements (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Measurement Of Radiation (AREA)
AT06744324T 2005-05-27 2006-05-26 Photonenzählvorrichtung ATE527526T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0510758A GB2426575A (en) 2005-05-27 2005-05-27 Photon detector using controlled sequences of reset and discharge of a capacitor to sense photons
PCT/GB2006/050122 WO2006126026A1 (en) 2005-05-27 2006-05-26 Photon counting apparatus

Publications (1)

Publication Number Publication Date
ATE527526T1 true ATE527526T1 (de) 2011-10-15

Family

ID=34834681

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06744324T ATE527526T1 (de) 2005-05-27 2006-05-26 Photonenzählvorrichtung

Country Status (6)

Country Link
US (1) US8017900B2 (de)
EP (1) EP1883794B1 (de)
JP (1) JP2008542706A (de)
AT (1) ATE527526T1 (de)
GB (1) GB2426575A (de)
WO (1) WO2006126026A1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11566939B2 (en) 2019-02-27 2023-01-31 Sony Semiconductor Solutions Corporation Measurement device, distance measurement device, electronic device, and measurement method

Families Citing this family (70)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2290721C2 (ru) 2004-05-05 2006-12-27 Борис Анатольевич Долгошеин Кремниевый фотоэлектронный умножитель (варианты) и ячейка для кремниевого фотоэлектронного умножителя
CN100561896C (zh) * 2006-10-20 2009-11-18 华为技术有限公司 一种雪崩光电二极管接收机供电装置及方法
ATE510222T1 (de) 2007-06-25 2011-06-15 Koninkl Philips Electronics Nv Photodioden-selbsttest
CN102763005B (zh) 2007-08-08 2016-10-19 皇家飞利浦电子股份有限公司 硅光电倍增器读出电路
EP2176686B1 (de) 2007-08-08 2014-05-21 Koninklijke Philips N.V. Auslösernetzwerk für einen silicium-bildvervielfacher
GB2451678A (en) * 2007-08-10 2009-02-11 Sensl Technologies Ltd Silicon photomultiplier circuitry for minimal onset and recovery times
RU2360326C1 (ru) * 2007-12-21 2009-06-27 Федеральное Государственное Унитарное Предприятие "Научно-Производственное Предприятие "Пульсар" Твердотельный гейгеровский детектор с активной схемой восстановления
US8119971B2 (en) * 2008-01-17 2012-02-21 Ball Corporation Pulse data recorder in which a value held by a bit of a memory is determined by a state of a switch
US8077294B1 (en) 2008-01-17 2011-12-13 Ball Aerospace & Technologies Corp. Optical autocovariance lidar
US8723132B2 (en) 2008-03-19 2014-05-13 Koninklijke Philips N.V. Single photon radiation detector
DE102008020201B4 (de) * 2008-04-23 2013-11-28 Wenglor sensoric elektronische Geräte GmbH Messvorrichtung
US7961301B2 (en) * 2008-05-09 2011-06-14 Ball Aerospace & Technologies Corp. Flash LADAR system
US9041915B2 (en) 2008-05-09 2015-05-26 Ball Aerospace & Technologies Corp. Systems and methods of scene and action capture using imaging system incorporating 3D LIDAR
US7929215B1 (en) 2009-02-20 2011-04-19 Ball Aerospace & Technologies Corp. Field widening lens
JP5681176B2 (ja) * 2009-06-22 2015-03-04 トヨタ モーター ヨーロッパ ナームロゼ フェンノートシャップ/ソシエテ アノニム パルス光による光学式距離計
FI20096067A0 (fi) 2009-10-15 2009-10-15 Valtion Teknillinen Raman-säteilyn mittaus
US8330093B2 (en) * 2009-11-17 2012-12-11 Sharp Kabushiki Kaisha Apparatus and method for preventing charge pumping in series connected diode stacks
US8766161B2 (en) * 2009-12-02 2014-07-01 Nucript LLC System for controling and calibrating single photon detection devices
GB0921354D0 (en) * 2009-12-05 2010-01-20 Univ Nottingham Improvements in and relating to optical sensors and optical sensing
US8742316B2 (en) 2009-12-09 2014-06-03 Electronics And Telecommunications Research Institute Photo detector having coupling capacitor
KR101344027B1 (ko) * 2009-12-09 2013-12-24 한국전자통신연구원 커플링 커패시터를 포함하는 광검출기
US8306273B1 (en) 2009-12-28 2012-11-06 Ball Aerospace & Technologies Corp. Method and apparatus for LIDAR target identification and pose estimation
US8736818B2 (en) 2010-08-16 2014-05-27 Ball Aerospace & Technologies Corp. Electronically steered flash LIDAR
JP5644294B2 (ja) * 2010-09-10 2014-12-24 株式会社豊田中央研究所 光検出器
EP2437484B1 (de) * 2010-10-01 2017-02-15 Sony Semiconductor Solutions Corporation Abbildungsvorrichtung und Kamerasystem
CN203708355U (zh) * 2010-12-23 2014-07-09 菲力尔系统公司 焦平面阵列的单元和包含焦平面阵列的单元的红外照相机
KR101814603B1 (ko) * 2011-06-16 2018-01-05 삼성전자주식회사 픽셀 소자, 및 이를 포함하는 방사성 측정 모듈과 장치
JP5791461B2 (ja) 2011-10-21 2015-10-07 浜松ホトニクス株式会社 光検出装置
JP5832852B2 (ja) 2011-10-21 2015-12-16 浜松ホトニクス株式会社 光検出装置
JP5926921B2 (ja) * 2011-10-21 2016-05-25 浜松ホトニクス株式会社 光検出装置
US8744126B1 (en) 2012-03-07 2014-06-03 Ball Aerospace & Technologies Corp. Morphology based hazard detection
JP5741769B2 (ja) * 2012-03-29 2015-07-01 株式会社島津製作所 半導体光電子増倍素子
WO2014029427A1 (de) * 2012-08-22 2014-02-27 Siemens Aktiengesellschaft Verfahren und anordnung zum betreiben einer leuchtdiode
EP2708913A1 (de) * 2012-09-18 2014-03-19 Sick Ag Optoelektronischer Sensor und Verfahren zur Objekterfassung
EP2708914A1 (de) * 2012-09-18 2014-03-19 Sick Ag Optoelektronischer Sensor und Verfahren zur Erfassung einer Tiefenkarte
US9048370B1 (en) 2013-03-14 2015-06-02 Google Inc. Dynamic control of diode bias voltage (photon-caused avalanche)
US9160949B2 (en) * 2013-04-01 2015-10-13 Omnivision Technologies, Inc. Enhanced photon detection device with biased deep trench isolation
DE102013012691A1 (de) 2013-07-31 2015-02-05 Gerd Reime Verfahren und Schaltung zum Energie sparenden Betrieb einer Photodiode
US9568620B2 (en) * 2014-09-22 2017-02-14 General Electric Company Solid state photomultiplier
JP5989872B2 (ja) * 2015-08-04 2016-09-07 浜松ホトニクス株式会社 光検出装置の接続構造
JP5911629B2 (ja) * 2015-08-04 2016-04-27 浜松ホトニクス株式会社 光検出装置
WO2017058901A1 (en) 2015-09-28 2017-04-06 Ball Aerospace & Technologies Corp. Differential absorption lidar
JP5927334B2 (ja) * 2015-10-28 2016-06-01 浜松ホトニクス株式会社 光検出装置
TWI646821B (zh) 2016-01-30 2019-01-01 原相科技股份有限公司 可獲取較高影像亮度動態範圍的影像感測電路及方法
US10193628B2 (en) * 2016-02-01 2019-01-29 California Institute Of Technology Optical communication systems
JP6318190B2 (ja) * 2016-04-25 2018-04-25 浜松ホトニクス株式会社 光検出装置
DE102016220492A1 (de) * 2016-10-19 2018-04-19 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Ladungslawinen-Photodetektor-System
EP3419168B1 (de) * 2017-06-23 2020-12-02 ams AG Lawinendiodenanordnung und verfahren zur steuerung einer lawinendiodenanordnung
JP6924085B2 (ja) * 2017-06-27 2021-08-25 キヤノン株式会社 光検出装置及び撮像システム
EP3570534B1 (de) 2017-10-31 2021-12-01 Sony Semiconductor Solutions Corporation Bildgebungsvorrichtung und bildgebungssystem
WO2019146723A1 (ja) * 2018-01-26 2019-08-01 浜松ホトニクス株式会社 光検出装置
JP7089390B2 (ja) 2018-03-30 2022-06-22 キヤノン株式会社 光電変換装置及びその駆動方法
US10921245B2 (en) 2018-06-08 2021-02-16 Ball Aerospace & Technologies Corp. Method and systems for remote emission detection and rate determination
JP2020024138A (ja) * 2018-08-07 2020-02-13 ソニーセミコンダクタソリューションズ株式会社 時間計測デバイスおよび時間計測装置
JP7145454B2 (ja) 2018-08-28 2022-10-03 パナソニックIpマネジメント株式会社 フォトセンサ、イメージセンサ及びフォトセンサの駆動方法
JP2020112495A (ja) * 2019-01-15 2020-07-27 ソニーセミコンダクタソリューションズ株式会社 受光装置および測距装置
JP7218191B2 (ja) * 2019-01-30 2023-02-06 キヤノン株式会社 光電変換装置、撮像システム、移動体
TWI846805B (zh) * 2019-03-07 2024-07-01 日商索尼半導體解決方案公司 受光裝置及測距裝置
JP7422451B2 (ja) 2019-07-19 2024-01-26 キヤノン株式会社 光電変換装置、光電変換システム、および移動体
US11906354B2 (en) 2019-07-19 2024-02-20 Avago Technologies International Sales Pte. Limited Recharge circuit for digital silicon photomultipliers
JP7562570B2 (ja) * 2020-01-10 2024-10-07 ソニーセミコンダクタソリューションズ株式会社 受光装置および測距装置
CN111351586B (zh) * 2020-03-20 2021-03-30 山东大学 一种集成化的低延时主动淬灭近红外单光子探测器
KR20230062638A (ko) 2020-09-11 2023-05-09 센스 포토닉스, 인크. 클록킹된 능동 퀀치/재충전 및 이득 셀 메모리 픽셀
CN116457687A (zh) * 2020-09-11 2023-07-18 感应光子公司 时钟主动猝灭/再充电和增益单元存储器像素
JP7482447B2 (ja) 2020-09-29 2024-05-14 パナソニックIpマネジメント株式会社 フォトディテクタ、フォトディテクタアレイおよび駆動方法
JP7488799B2 (ja) 2021-09-03 2024-05-22 株式会社東芝 光検出装置、電子装置及び光検出方法
CN114184276B (zh) * 2021-11-05 2025-03-14 深圳华迈兴微医疗科技有限公司 一种基于光纤的多通道采光方法及装置
JP2024157144A (ja) * 2023-04-25 2024-11-07 キヤノン株式会社 光電変換装置及び光検出システム
CN116558639B (zh) * 2023-05-11 2025-11-18 北京卓立汉光仪器有限公司 光谱测量的光子计数数据处理方法、装置及系统
CN116878671B (zh) * 2023-09-06 2023-11-21 杭州智屹科技有限公司 单光子探测器及其方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5214274A (en) * 1992-07-24 1993-05-25 President And Fellows Of Harvard College Image sensor array with threshold voltage detectors and charged storage capacitors
JP2953297B2 (ja) * 1994-03-30 1999-09-27 日本電気株式会社 受光素子およびその駆動方法
US5929434A (en) * 1997-08-13 1999-07-27 Rockwell Science Center, Llc Ultra-low noise high bandwidth interface circuit for single-photon readout of photodetectors
US6246436B1 (en) * 1997-11-03 2001-06-12 Agilent Technologies, Inc Adjustable gain active pixel sensor
GB9930257D0 (en) * 1999-12-22 2000-02-09 Suisse Electronique Microtech Optoelectronic sensor
IT1316793B1 (it) * 2000-03-09 2003-05-12 Milano Politecnico Circuito monolitico di spegnimento attivo e ripristino attivo perfotodiodi a valanga
US6642503B2 (en) * 2001-06-13 2003-11-04 Texas Instruments Incorporated Time domain sensing technique and system architecture for image sensor
WO2003032394A1 (en) * 2001-10-09 2003-04-17 Photonfocus Ag Optoelectronic sensor
US6720588B2 (en) * 2001-11-28 2004-04-13 Optonics, Inc. Avalanche photodiode for photon counting applications and method thereof
JP4340751B2 (ja) * 2003-07-09 2009-10-07 独立行政法人情報通信研究機構 微弱光検出器の製造方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11566939B2 (en) 2019-02-27 2023-01-31 Sony Semiconductor Solutions Corporation Measurement device, distance measurement device, electronic device, and measurement method

Also Published As

Publication number Publication date
GB0510758D0 (en) 2005-06-29
EP1883794B1 (de) 2011-10-05
EP1883794A1 (de) 2008-02-06
JP2008542706A (ja) 2008-11-27
GB2426575A (en) 2006-11-29
US8017900B2 (en) 2011-09-13
US20080290259A1 (en) 2008-11-27
WO2006126026A1 (en) 2006-11-30

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