ATE527526T1 - Photonenzählvorrichtung - Google Patents
PhotonenzählvorrichtungInfo
- Publication number
- ATE527526T1 ATE527526T1 AT06744324T AT06744324T ATE527526T1 AT E527526 T1 ATE527526 T1 AT E527526T1 AT 06744324 T AT06744324 T AT 06744324T AT 06744324 T AT06744324 T AT 06744324T AT E527526 T1 ATE527526 T1 AT E527526T1
- Authority
- AT
- Austria
- Prior art keywords
- detector
- capacitance
- sensor element
- potential difference
- photon
- Prior art date
Links
- 238000001514 detection method Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J1/46—Electric circuits using a capacitor
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
- H04N25/773—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Light Receiving Elements (AREA)
- Investigating Or Analysing Biological Materials (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB0510758A GB2426575A (en) | 2005-05-27 | 2005-05-27 | Photon detector using controlled sequences of reset and discharge of a capacitor to sense photons |
| PCT/GB2006/050122 WO2006126026A1 (en) | 2005-05-27 | 2006-05-26 | Photon counting apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE527526T1 true ATE527526T1 (de) | 2011-10-15 |
Family
ID=34834681
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT06744324T ATE527526T1 (de) | 2005-05-27 | 2006-05-26 | Photonenzählvorrichtung |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8017900B2 (de) |
| EP (1) | EP1883794B1 (de) |
| JP (1) | JP2008542706A (de) |
| AT (1) | ATE527526T1 (de) |
| GB (1) | GB2426575A (de) |
| WO (1) | WO2006126026A1 (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11566939B2 (en) | 2019-02-27 | 2023-01-31 | Sony Semiconductor Solutions Corporation | Measurement device, distance measurement device, electronic device, and measurement method |
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| ATE510222T1 (de) | 2007-06-25 | 2011-06-15 | Koninkl Philips Electronics Nv | Photodioden-selbsttest |
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| EP2176686B1 (de) | 2007-08-08 | 2014-05-21 | Koninklijke Philips N.V. | Auslösernetzwerk für einen silicium-bildvervielfacher |
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| JP5681176B2 (ja) * | 2009-06-22 | 2015-03-04 | トヨタ モーター ヨーロッパ ナームロゼ フェンノートシャップ/ソシエテ アノニム | パルス光による光学式距離計 |
| FI20096067A0 (fi) | 2009-10-15 | 2009-10-15 | Valtion Teknillinen | Raman-säteilyn mittaus |
| US8330093B2 (en) * | 2009-11-17 | 2012-12-11 | Sharp Kabushiki Kaisha | Apparatus and method for preventing charge pumping in series connected diode stacks |
| US8766161B2 (en) * | 2009-12-02 | 2014-07-01 | Nucript LLC | System for controling and calibrating single photon detection devices |
| GB0921354D0 (en) * | 2009-12-05 | 2010-01-20 | Univ Nottingham | Improvements in and relating to optical sensors and optical sensing |
| US8742316B2 (en) | 2009-12-09 | 2014-06-03 | Electronics And Telecommunications Research Institute | Photo detector having coupling capacitor |
| KR101344027B1 (ko) * | 2009-12-09 | 2013-12-24 | 한국전자통신연구원 | 커플링 커패시터를 포함하는 광검출기 |
| US8306273B1 (en) | 2009-12-28 | 2012-11-06 | Ball Aerospace & Technologies Corp. | Method and apparatus for LIDAR target identification and pose estimation |
| US8736818B2 (en) | 2010-08-16 | 2014-05-27 | Ball Aerospace & Technologies Corp. | Electronically steered flash LIDAR |
| JP5644294B2 (ja) * | 2010-09-10 | 2014-12-24 | 株式会社豊田中央研究所 | 光検出器 |
| EP2437484B1 (de) * | 2010-10-01 | 2017-02-15 | Sony Semiconductor Solutions Corporation | Abbildungsvorrichtung und Kamerasystem |
| CN203708355U (zh) * | 2010-12-23 | 2014-07-09 | 菲力尔系统公司 | 焦平面阵列的单元和包含焦平面阵列的单元的红外照相机 |
| KR101814603B1 (ko) * | 2011-06-16 | 2018-01-05 | 삼성전자주식회사 | 픽셀 소자, 및 이를 포함하는 방사성 측정 모듈과 장치 |
| JP5791461B2 (ja) | 2011-10-21 | 2015-10-07 | 浜松ホトニクス株式会社 | 光検出装置 |
| JP5832852B2 (ja) | 2011-10-21 | 2015-12-16 | 浜松ホトニクス株式会社 | 光検出装置 |
| JP5926921B2 (ja) * | 2011-10-21 | 2016-05-25 | 浜松ホトニクス株式会社 | 光検出装置 |
| US8744126B1 (en) | 2012-03-07 | 2014-06-03 | Ball Aerospace & Technologies Corp. | Morphology based hazard detection |
| JP5741769B2 (ja) * | 2012-03-29 | 2015-07-01 | 株式会社島津製作所 | 半導体光電子増倍素子 |
| WO2014029427A1 (de) * | 2012-08-22 | 2014-02-27 | Siemens Aktiengesellschaft | Verfahren und anordnung zum betreiben einer leuchtdiode |
| EP2708913A1 (de) * | 2012-09-18 | 2014-03-19 | Sick Ag | Optoelektronischer Sensor und Verfahren zur Objekterfassung |
| EP2708914A1 (de) * | 2012-09-18 | 2014-03-19 | Sick Ag | Optoelektronischer Sensor und Verfahren zur Erfassung einer Tiefenkarte |
| US9048370B1 (en) | 2013-03-14 | 2015-06-02 | Google Inc. | Dynamic control of diode bias voltage (photon-caused avalanche) |
| US9160949B2 (en) * | 2013-04-01 | 2015-10-13 | Omnivision Technologies, Inc. | Enhanced photon detection device with biased deep trench isolation |
| DE102013012691A1 (de) | 2013-07-31 | 2015-02-05 | Gerd Reime | Verfahren und Schaltung zum Energie sparenden Betrieb einer Photodiode |
| US9568620B2 (en) * | 2014-09-22 | 2017-02-14 | General Electric Company | Solid state photomultiplier |
| JP5989872B2 (ja) * | 2015-08-04 | 2016-09-07 | 浜松ホトニクス株式会社 | 光検出装置の接続構造 |
| JP5911629B2 (ja) * | 2015-08-04 | 2016-04-27 | 浜松ホトニクス株式会社 | 光検出装置 |
| WO2017058901A1 (en) | 2015-09-28 | 2017-04-06 | Ball Aerospace & Technologies Corp. | Differential absorption lidar |
| JP5927334B2 (ja) * | 2015-10-28 | 2016-06-01 | 浜松ホトニクス株式会社 | 光検出装置 |
| TWI646821B (zh) | 2016-01-30 | 2019-01-01 | 原相科技股份有限公司 | 可獲取較高影像亮度動態範圍的影像感測電路及方法 |
| US10193628B2 (en) * | 2016-02-01 | 2019-01-29 | California Institute Of Technology | Optical communication systems |
| JP6318190B2 (ja) * | 2016-04-25 | 2018-04-25 | 浜松ホトニクス株式会社 | 光検出装置 |
| DE102016220492A1 (de) * | 2016-10-19 | 2018-04-19 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Ladungslawinen-Photodetektor-System |
| EP3419168B1 (de) * | 2017-06-23 | 2020-12-02 | ams AG | Lawinendiodenanordnung und verfahren zur steuerung einer lawinendiodenanordnung |
| JP6924085B2 (ja) * | 2017-06-27 | 2021-08-25 | キヤノン株式会社 | 光検出装置及び撮像システム |
| EP3570534B1 (de) | 2017-10-31 | 2021-12-01 | Sony Semiconductor Solutions Corporation | Bildgebungsvorrichtung und bildgebungssystem |
| WO2019146723A1 (ja) * | 2018-01-26 | 2019-08-01 | 浜松ホトニクス株式会社 | 光検出装置 |
| JP7089390B2 (ja) | 2018-03-30 | 2022-06-22 | キヤノン株式会社 | 光電変換装置及びその駆動方法 |
| US10921245B2 (en) | 2018-06-08 | 2021-02-16 | Ball Aerospace & Technologies Corp. | Method and systems for remote emission detection and rate determination |
| JP2020024138A (ja) * | 2018-08-07 | 2020-02-13 | ソニーセミコンダクタソリューションズ株式会社 | 時間計測デバイスおよび時間計測装置 |
| JP7145454B2 (ja) | 2018-08-28 | 2022-10-03 | パナソニックIpマネジメント株式会社 | フォトセンサ、イメージセンサ及びフォトセンサの駆動方法 |
| JP2020112495A (ja) * | 2019-01-15 | 2020-07-27 | ソニーセミコンダクタソリューションズ株式会社 | 受光装置および測距装置 |
| JP7218191B2 (ja) * | 2019-01-30 | 2023-02-06 | キヤノン株式会社 | 光電変換装置、撮像システム、移動体 |
| TWI846805B (zh) * | 2019-03-07 | 2024-07-01 | 日商索尼半導體解決方案公司 | 受光裝置及測距裝置 |
| JP7422451B2 (ja) | 2019-07-19 | 2024-01-26 | キヤノン株式会社 | 光電変換装置、光電変換システム、および移動体 |
| US11906354B2 (en) | 2019-07-19 | 2024-02-20 | Avago Technologies International Sales Pte. Limited | Recharge circuit for digital silicon photomultipliers |
| JP7562570B2 (ja) * | 2020-01-10 | 2024-10-07 | ソニーセミコンダクタソリューションズ株式会社 | 受光装置および測距装置 |
| CN111351586B (zh) * | 2020-03-20 | 2021-03-30 | 山东大学 | 一种集成化的低延时主动淬灭近红外单光子探测器 |
| KR20230062638A (ko) | 2020-09-11 | 2023-05-09 | 센스 포토닉스, 인크. | 클록킹된 능동 퀀치/재충전 및 이득 셀 메모리 픽셀 |
| CN116457687A (zh) * | 2020-09-11 | 2023-07-18 | 感应光子公司 | 时钟主动猝灭/再充电和增益单元存储器像素 |
| JP7482447B2 (ja) | 2020-09-29 | 2024-05-14 | パナソニックIpマネジメント株式会社 | フォトディテクタ、フォトディテクタアレイおよび駆動方法 |
| JP7488799B2 (ja) | 2021-09-03 | 2024-05-22 | 株式会社東芝 | 光検出装置、電子装置及び光検出方法 |
| CN114184276B (zh) * | 2021-11-05 | 2025-03-14 | 深圳华迈兴微医疗科技有限公司 | 一种基于光纤的多通道采光方法及装置 |
| JP2024157144A (ja) * | 2023-04-25 | 2024-11-07 | キヤノン株式会社 | 光電変換装置及び光検出システム |
| CN116558639B (zh) * | 2023-05-11 | 2025-11-18 | 北京卓立汉光仪器有限公司 | 光谱测量的光子计数数据处理方法、装置及系统 |
| CN116878671B (zh) * | 2023-09-06 | 2023-11-21 | 杭州智屹科技有限公司 | 单光子探测器及其方法 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5214274A (en) * | 1992-07-24 | 1993-05-25 | President And Fellows Of Harvard College | Image sensor array with threshold voltage detectors and charged storage capacitors |
| JP2953297B2 (ja) * | 1994-03-30 | 1999-09-27 | 日本電気株式会社 | 受光素子およびその駆動方法 |
| US5929434A (en) * | 1997-08-13 | 1999-07-27 | Rockwell Science Center, Llc | Ultra-low noise high bandwidth interface circuit for single-photon readout of photodetectors |
| US6246436B1 (en) * | 1997-11-03 | 2001-06-12 | Agilent Technologies, Inc | Adjustable gain active pixel sensor |
| GB9930257D0 (en) * | 1999-12-22 | 2000-02-09 | Suisse Electronique Microtech | Optoelectronic sensor |
| IT1316793B1 (it) * | 2000-03-09 | 2003-05-12 | Milano Politecnico | Circuito monolitico di spegnimento attivo e ripristino attivo perfotodiodi a valanga |
| US6642503B2 (en) * | 2001-06-13 | 2003-11-04 | Texas Instruments Incorporated | Time domain sensing technique and system architecture for image sensor |
| WO2003032394A1 (en) * | 2001-10-09 | 2003-04-17 | Photonfocus Ag | Optoelectronic sensor |
| US6720588B2 (en) * | 2001-11-28 | 2004-04-13 | Optonics, Inc. | Avalanche photodiode for photon counting applications and method thereof |
| JP4340751B2 (ja) * | 2003-07-09 | 2009-10-07 | 独立行政法人情報通信研究機構 | 微弱光検出器の製造方法 |
-
2005
- 2005-05-27 GB GB0510758A patent/GB2426575A/en not_active Withdrawn
-
2006
- 2006-05-26 AT AT06744324T patent/ATE527526T1/de not_active IP Right Cessation
- 2006-05-26 US US11/915,541 patent/US8017900B2/en active Active
- 2006-05-26 EP EP06744324A patent/EP1883794B1/de not_active Not-in-force
- 2006-05-26 JP JP2008512931A patent/JP2008542706A/ja active Pending
- 2006-05-26 WO PCT/GB2006/050122 patent/WO2006126026A1/en not_active Ceased
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11566939B2 (en) | 2019-02-27 | 2023-01-31 | Sony Semiconductor Solutions Corporation | Measurement device, distance measurement device, electronic device, and measurement method |
Also Published As
| Publication number | Publication date |
|---|---|
| GB0510758D0 (en) | 2005-06-29 |
| EP1883794B1 (de) | 2011-10-05 |
| EP1883794A1 (de) | 2008-02-06 |
| JP2008542706A (ja) | 2008-11-27 |
| GB2426575A (en) | 2006-11-29 |
| US8017900B2 (en) | 2011-09-13 |
| US20080290259A1 (en) | 2008-11-27 |
| WO2006126026A1 (en) | 2006-11-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |