ATE556333T1 - Szintillationsdetektor mit erhitzbarem eingangsfenster - Google Patents
Szintillationsdetektor mit erhitzbarem eingangsfensterInfo
- Publication number
- ATE556333T1 ATE556333T1 AT08844141T AT08844141T ATE556333T1 AT E556333 T1 ATE556333 T1 AT E556333T1 AT 08844141 T AT08844141 T AT 08844141T AT 08844141 T AT08844141 T AT 08844141T AT E556333 T1 ATE556333 T1 AT E556333T1
- Authority
- AT
- Austria
- Prior art keywords
- camera sensor
- fiber optic
- spectrum changing
- visible light
- optic bundle
- Prior art date
Links
- 238000001228 spectrum Methods 0.000 abstract 4
- 239000000835 fiber Substances 0.000 abstract 3
- 230000005494 condensation Effects 0.000 abstract 1
- 238000009833 condensation Methods 0.000 abstract 1
- 238000001816 cooling Methods 0.000 abstract 1
- 238000010438 heat treatment Methods 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- X-Ray Techniques (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/928,638 US7684545B2 (en) | 2007-10-30 | 2007-10-30 | X-ray window and resistive heater |
| PCT/US2008/079623 WO2009058542A1 (en) | 2007-10-30 | 2008-10-10 | Scintillation detector with heatable entrance window |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE556333T1 true ATE556333T1 (de) | 2012-05-15 |
Family
ID=40219283
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT08844141T ATE556333T1 (de) | 2007-10-30 | 2008-10-10 | Szintillationsdetektor mit erhitzbarem eingangsfenster |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7684545B2 (de) |
| EP (1) | EP2205992B1 (de) |
| JP (1) | JP2011502262A (de) |
| AT (1) | ATE556333T1 (de) |
| CA (1) | CA2704351A1 (de) |
| WO (1) | WO2009058542A1 (de) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9305735B2 (en) | 2007-09-28 | 2016-04-05 | Brigham Young University | Reinforced polymer x-ray window |
| US8498381B2 (en) | 2010-10-07 | 2013-07-30 | Moxtek, Inc. | Polymer layer on X-ray window |
| US8080791B2 (en) * | 2008-12-12 | 2011-12-20 | Fei Company | X-ray detector for electron microscope |
| US8929515B2 (en) | 2011-02-23 | 2015-01-06 | Moxtek, Inc. | Multiple-size support for X-ray window |
| US8989354B2 (en) * | 2011-05-16 | 2015-03-24 | Brigham Young University | Carbon composite support structure |
| US9076628B2 (en) | 2011-05-16 | 2015-07-07 | Brigham Young University | Variable radius taper x-ray window support structure |
| US9174412B2 (en) | 2011-05-16 | 2015-11-03 | Brigham Young University | High strength carbon fiber composite wafers for microfabrication |
| JP5807589B2 (ja) * | 2012-02-29 | 2015-11-10 | 株式会社大真空 | シンチレータ素子保持モジュールおよび当該シンチレータ素子保持モジュールを用いた放射光発生装置 |
| US10588178B1 (en) | 2015-06-25 | 2020-03-10 | Amazon Technologies, Inc. | Window heater system |
| US10365671B1 (en) * | 2015-06-25 | 2019-07-30 | Amazon Technologies, Inc. | Sensor window heating apparatus |
| US20180061608A1 (en) * | 2017-09-28 | 2018-03-01 | Oxford Instruments X-ray Technology Inc. | Window member for an x-ray device |
| US11432375B2 (en) * | 2017-10-31 | 2022-08-30 | Adasky, Ltd. | Protective window for resistive heating |
| JP7046698B2 (ja) * | 2018-04-24 | 2022-04-04 | 浜松ホトニクス株式会社 | 放射線検出器、放射線検出器の製造方法、及び画像処理方法 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3676671A (en) * | 1968-10-01 | 1972-07-11 | Sheldon Edward E | Devices of fiberoptic and vacuum tube construction |
| US4604649A (en) * | 1981-11-24 | 1986-08-05 | Vought Corporation | Radiographic inspection means and method |
| US4672207A (en) | 1985-08-21 | 1987-06-09 | The United States Of America As Represented By The United States Department Of Energy | Readout system for multi-crystal gamma cameras |
| US4879465A (en) | 1986-09-30 | 1989-11-07 | Siemens Gammasonics, Inc. | Detector module for scintillation cameras |
| US4810885A (en) | 1986-09-30 | 1989-03-07 | Siemens Gammasonics, Inc. | Heated scintillator |
| US4825078A (en) * | 1987-10-22 | 1989-04-25 | Atlas Electric Devices Co. | Radiation sensor |
| JPH0312582A (ja) * | 1989-06-09 | 1991-01-21 | Jeol Ltd | X線分光検出器の窓部結露防止装置 |
| JPH04287580A (ja) * | 1991-03-18 | 1992-10-13 | Hitachi Ltd | X線撮像方法とその装置並びに蛍光板および冷却型ccdカメラ |
| JP3187581B2 (ja) * | 1992-02-10 | 2001-07-11 | キヤノン株式会社 | X線装置、x線露光装置及び半導体デバイス製造方法 |
| JP2930466B2 (ja) * | 1992-02-14 | 1999-08-03 | 三菱重工業株式会社 | 2次元像放射線検出器 |
| FI93680C (fi) * | 1992-05-07 | 1995-05-10 | Outokumpu Instr Oy | Ohutkalvon tukirakenne ja menetelmä sen valmistamiseksi |
| US5329569A (en) * | 1993-02-18 | 1994-07-12 | Sandia Corporation | X-ray transmissive debris shield |
| US5519752A (en) * | 1994-10-13 | 1996-05-21 | Sandia Corporation | X-ray transmissive debris shield |
| JPH09229877A (ja) * | 1996-02-20 | 1997-09-05 | Konica Corp | X線−光変換部材用粒状度測定方法及び装置 |
| AU1173099A (en) * | 1997-11-19 | 1999-06-07 | Hamamatsu Photonics K.K. | Photodetector and image pickup device employing it |
| US6448544B1 (en) * | 1998-06-08 | 2002-09-10 | Brandeis University | Low noise, high resolution image detection system and method |
| GB2387435B (en) | 2000-06-15 | 2005-01-05 | Schlumberger Technology Corp | Nuclear detector for multiphase fluid sensing |
| JP2003014860A (ja) * | 2001-06-29 | 2003-01-15 | Toshiba Corp | 放射線検出器および放射線検査装置 |
| JP2004163272A (ja) * | 2002-11-13 | 2004-06-10 | Hamamatsu Photonics Kk | 冷却式光検出装置 |
| FR2848677B1 (fr) * | 2002-12-17 | 2005-04-15 | Trixell Sas | Detecteur de rayonnement x a l'etat solide |
| JP2005003411A (ja) * | 2003-06-10 | 2005-01-06 | Sii Nanotechnology Inc | 超伝導放射線検出器 |
| US7199369B1 (en) * | 2003-07-16 | 2007-04-03 | Met One Instruments, Inc. | Low threshold level radiation detector |
| US7378664B1 (en) * | 2006-05-12 | 2008-05-27 | Thermo Electron Scientific Instruments Llc | Deicing of radiation detectors in analytical instruments |
| US7916834B2 (en) * | 2007-02-12 | 2011-03-29 | Thermo Niton Analyzers Llc | Small spot X-ray fluorescence (XRF) analyzer |
-
2007
- 2007-10-30 US US11/928,638 patent/US7684545B2/en not_active Expired - Fee Related
-
2008
- 2008-10-10 EP EP08844141A patent/EP2205992B1/de not_active Not-in-force
- 2008-10-10 JP JP2010532115A patent/JP2011502262A/ja active Pending
- 2008-10-10 CA CA2704351A patent/CA2704351A1/en not_active Abandoned
- 2008-10-10 AT AT08844141T patent/ATE556333T1/de active
- 2008-10-10 WO PCT/US2008/079623 patent/WO2009058542A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2009058542A1 (en) | 2009-05-07 |
| EP2205992A1 (de) | 2010-07-14 |
| US7684545B2 (en) | 2010-03-23 |
| JP2011502262A (ja) | 2011-01-20 |
| CA2704351A1 (en) | 2009-05-07 |
| US20090110151A1 (en) | 2009-04-30 |
| EP2205992B1 (de) | 2012-05-02 |
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