ATE556333T1 - Szintillationsdetektor mit erhitzbarem eingangsfenster - Google Patents

Szintillationsdetektor mit erhitzbarem eingangsfenster

Info

Publication number
ATE556333T1
ATE556333T1 AT08844141T AT08844141T ATE556333T1 AT E556333 T1 ATE556333 T1 AT E556333T1 AT 08844141 T AT08844141 T AT 08844141T AT 08844141 T AT08844141 T AT 08844141T AT E556333 T1 ATE556333 T1 AT E556333T1
Authority
AT
Austria
Prior art keywords
camera sensor
fiber optic
spectrum changing
visible light
optic bundle
Prior art date
Application number
AT08844141T
Other languages
English (en)
Inventor
Michael Damento
Hugh Garvey
Original Assignee
Rigaku Innovative Technologies
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Innovative Technologies filed Critical Rigaku Innovative Technologies
Application granted granted Critical
Publication of ATE556333T1 publication Critical patent/ATE556333T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • X-Ray Techniques (AREA)
AT08844141T 2007-10-30 2008-10-10 Szintillationsdetektor mit erhitzbarem eingangsfenster ATE556333T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/928,638 US7684545B2 (en) 2007-10-30 2007-10-30 X-ray window and resistive heater
PCT/US2008/079623 WO2009058542A1 (en) 2007-10-30 2008-10-10 Scintillation detector with heatable entrance window

Publications (1)

Publication Number Publication Date
ATE556333T1 true ATE556333T1 (de) 2012-05-15

Family

ID=40219283

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08844141T ATE556333T1 (de) 2007-10-30 2008-10-10 Szintillationsdetektor mit erhitzbarem eingangsfenster

Country Status (6)

Country Link
US (1) US7684545B2 (de)
EP (1) EP2205992B1 (de)
JP (1) JP2011502262A (de)
AT (1) ATE556333T1 (de)
CA (1) CA2704351A1 (de)
WO (1) WO2009058542A1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9305735B2 (en) 2007-09-28 2016-04-05 Brigham Young University Reinforced polymer x-ray window
US8498381B2 (en) 2010-10-07 2013-07-30 Moxtek, Inc. Polymer layer on X-ray window
US8080791B2 (en) * 2008-12-12 2011-12-20 Fei Company X-ray detector for electron microscope
US8929515B2 (en) 2011-02-23 2015-01-06 Moxtek, Inc. Multiple-size support for X-ray window
US8989354B2 (en) * 2011-05-16 2015-03-24 Brigham Young University Carbon composite support structure
US9076628B2 (en) 2011-05-16 2015-07-07 Brigham Young University Variable radius taper x-ray window support structure
US9174412B2 (en) 2011-05-16 2015-11-03 Brigham Young University High strength carbon fiber composite wafers for microfabrication
JP5807589B2 (ja) * 2012-02-29 2015-11-10 株式会社大真空 シンチレータ素子保持モジュールおよび当該シンチレータ素子保持モジュールを用いた放射光発生装置
US10588178B1 (en) 2015-06-25 2020-03-10 Amazon Technologies, Inc. Window heater system
US10365671B1 (en) * 2015-06-25 2019-07-30 Amazon Technologies, Inc. Sensor window heating apparatus
US20180061608A1 (en) * 2017-09-28 2018-03-01 Oxford Instruments X-ray Technology Inc. Window member for an x-ray device
US11432375B2 (en) * 2017-10-31 2022-08-30 Adasky, Ltd. Protective window for resistive heating
JP7046698B2 (ja) * 2018-04-24 2022-04-04 浜松ホトニクス株式会社 放射線検出器、放射線検出器の製造方法、及び画像処理方法

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3676671A (en) * 1968-10-01 1972-07-11 Sheldon Edward E Devices of fiberoptic and vacuum tube construction
US4604649A (en) * 1981-11-24 1986-08-05 Vought Corporation Radiographic inspection means and method
US4672207A (en) 1985-08-21 1987-06-09 The United States Of America As Represented By The United States Department Of Energy Readout system for multi-crystal gamma cameras
US4879465A (en) 1986-09-30 1989-11-07 Siemens Gammasonics, Inc. Detector module for scintillation cameras
US4810885A (en) 1986-09-30 1989-03-07 Siemens Gammasonics, Inc. Heated scintillator
US4825078A (en) * 1987-10-22 1989-04-25 Atlas Electric Devices Co. Radiation sensor
JPH0312582A (ja) * 1989-06-09 1991-01-21 Jeol Ltd X線分光検出器の窓部結露防止装置
JPH04287580A (ja) * 1991-03-18 1992-10-13 Hitachi Ltd X線撮像方法とその装置並びに蛍光板および冷却型ccdカメラ
JP3187581B2 (ja) * 1992-02-10 2001-07-11 キヤノン株式会社 X線装置、x線露光装置及び半導体デバイス製造方法
JP2930466B2 (ja) * 1992-02-14 1999-08-03 三菱重工業株式会社 2次元像放射線検出器
FI93680C (fi) * 1992-05-07 1995-05-10 Outokumpu Instr Oy Ohutkalvon tukirakenne ja menetelmä sen valmistamiseksi
US5329569A (en) * 1993-02-18 1994-07-12 Sandia Corporation X-ray transmissive debris shield
US5519752A (en) * 1994-10-13 1996-05-21 Sandia Corporation X-ray transmissive debris shield
JPH09229877A (ja) * 1996-02-20 1997-09-05 Konica Corp X線−光変換部材用粒状度測定方法及び装置
AU1173099A (en) * 1997-11-19 1999-06-07 Hamamatsu Photonics K.K. Photodetector and image pickup device employing it
US6448544B1 (en) * 1998-06-08 2002-09-10 Brandeis University Low noise, high resolution image detection system and method
GB2387435B (en) 2000-06-15 2005-01-05 Schlumberger Technology Corp Nuclear detector for multiphase fluid sensing
JP2003014860A (ja) * 2001-06-29 2003-01-15 Toshiba Corp 放射線検出器および放射線検査装置
JP2004163272A (ja) * 2002-11-13 2004-06-10 Hamamatsu Photonics Kk 冷却式光検出装置
FR2848677B1 (fr) * 2002-12-17 2005-04-15 Trixell Sas Detecteur de rayonnement x a l'etat solide
JP2005003411A (ja) * 2003-06-10 2005-01-06 Sii Nanotechnology Inc 超伝導放射線検出器
US7199369B1 (en) * 2003-07-16 2007-04-03 Met One Instruments, Inc. Low threshold level radiation detector
US7378664B1 (en) * 2006-05-12 2008-05-27 Thermo Electron Scientific Instruments Llc Deicing of radiation detectors in analytical instruments
US7916834B2 (en) * 2007-02-12 2011-03-29 Thermo Niton Analyzers Llc Small spot X-ray fluorescence (XRF) analyzer

Also Published As

Publication number Publication date
WO2009058542A1 (en) 2009-05-07
EP2205992A1 (de) 2010-07-14
US7684545B2 (en) 2010-03-23
JP2011502262A (ja) 2011-01-20
CA2704351A1 (en) 2009-05-07
US20090110151A1 (en) 2009-04-30
EP2205992B1 (de) 2012-05-02

Similar Documents

Publication Publication Date Title
US7684545B2 (en) X-ray window and resistive heater
KR101577490B1 (ko) 교정 광원
WO2011088003A3 (en) Transparent thermally conductive polymer composites for light source thermal management
WO2009044716A1 (ja) 発光装置
US8974097B2 (en) Method for controlling an aircraft light
MY156583A (en) Indoor environment regulating system
US8581202B2 (en) Radiation detection apparatus
WO2015005167A1 (ja) 光源装置及び光源用熱処理装置
JP2015519546A5 (de)
JP2015104667A5 (de)
RU2017106095A (ru) Определение температуры одеяла для фототерапии
US10378748B2 (en) Luminaire and method for temperature determination
US10935425B2 (en) Spectroscopic detector
KR101334698B1 (ko) 열전모듈을 이용한 냉각수단을 갖는 엘이디 광원 장치
WO2012011957A3 (en) Thermal management of environmentally-sealed electronics enclosure
ES2548015T3 (es) Instalación de vídeo portero con una estación exterior, que detecta personas por medio de una cámara
KR101266387B1 (ko) 발광다이오드의 효율 측정장치 및 방법
US10317286B2 (en) Luminaire and method for temperature control
TWI607192B (zh) Energy-saving and heat-reducing device combining solar thermal separation, thermochromism and battery management system
JP5692612B2 (ja) 半導体光源ユニットおよびシート状対象物測定装置
RU2572362C2 (ru) Светодиодное устройство
CN209419188U (zh) 一种散热测温保护壳
TW201526301A (zh) 非可見光發射裝置
Mou et al. Optical and thermal performance of a remote phosphor plate
Perera et al. Measuring the temperature of high-luminous exitance surfaces with infrared thermography in LED applications