ATE557259T1 - Kontaktloses verfahren zur messung der dichte eines porösen materials unter verwendung einer mittels optischer kohärenztomographie erhaltenen messung des brechungsindex des materials - Google Patents

Kontaktloses verfahren zur messung der dichte eines porösen materials unter verwendung einer mittels optischer kohärenztomographie erhaltenen messung des brechungsindex des materials

Info

Publication number
ATE557259T1
ATE557259T1 AT09781414T AT09781414T ATE557259T1 AT E557259 T1 ATE557259 T1 AT E557259T1 AT 09781414 T AT09781414 T AT 09781414T AT 09781414 T AT09781414 T AT 09781414T AT E557259 T1 ATE557259 T1 AT E557259T1
Authority
AT
Austria
Prior art keywords
refractive index
density
measurement
coherence tomography
optical coherence
Prior art date
Application number
AT09781414T
Other languages
English (en)
Inventor
Laurent Jeannot
Florent Sandras
Original Assignee
Commissariat Energie Atomique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat Energie Atomique filed Critical Commissariat Energie Atomique
Application granted granted Critical
Publication of ATE557259T1 publication Critical patent/ATE557259T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02029—Combination with non-interferometric systems, i.e. for measuring the object
    • G01B9/0203—With imaging systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
AT09781414T 2008-08-05 2009-08-03 Kontaktloses verfahren zur messung der dichte eines porösen materials unter verwendung einer mittels optischer kohärenztomographie erhaltenen messung des brechungsindex des materials ATE557259T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0855426A FR2934901B1 (fr) 2008-08-05 2008-08-05 Procede de mesure sans contact de l'indice de refraction d'un materiau par tomographie par coherence optique, application a la mesure de la masse volumique d'un materiau poreux.
PCT/EP2009/060021 WO2010015594A1 (fr) 2008-08-05 2009-08-03 Procede de mesure sans contact de la masse volumique d'un materiau poreux, utilisant une mesure de l'indice de refraction du materiau par tomographie par coherence optique

Publications (1)

Publication Number Publication Date
ATE557259T1 true ATE557259T1 (de) 2012-05-15

Family

ID=40293628

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09781414T ATE557259T1 (de) 2008-08-05 2009-08-03 Kontaktloses verfahren zur messung der dichte eines porösen materials unter verwendung einer mittels optischer kohärenztomographie erhaltenen messung des brechungsindex des materials

Country Status (9)

Country Link
US (1) US8488112B2 (de)
EP (1) EP2310836B1 (de)
JP (1) JP5537548B2 (de)
CN (1) CN102112865A (de)
AT (1) ATE557259T1 (de)
CA (1) CA2731961A1 (de)
FR (1) FR2934901B1 (de)
RU (1) RU2515189C2 (de)
WO (1) WO2010015594A1 (de)

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US9078007B2 (en) 2008-10-03 2015-07-07 Qualcomm Incorporated Digital video coding with interpolation filters and offsets
CN103175837B (zh) * 2011-12-20 2015-06-03 法国圣戈班玻璃公司 一种检测基质内缺陷的方法及装置
CN102778460A (zh) * 2012-07-31 2012-11-14 法国圣戈班玻璃公司 一种检测基质内缺陷的方法
US9488470B1 (en) * 2013-08-13 2016-11-08 University of Conneticut Method for non-destructive evaluation of ceramic coatings
CN103759680B (zh) * 2013-12-31 2016-02-10 中国石油天然气股份有限公司 一种致密储层微纳米孔喉中油膜赋存厚度的测量方法
CN103940352B (zh) * 2014-04-25 2017-01-04 广州飞拓优视光电科技有限公司 一种超高精度结冰探测装置及其实时探测结冰厚度方法
US9500468B2 (en) * 2014-08-25 2016-11-22 Board Of Trustees Of Michigan State University Scanning interferometry technique for through-thickness evaluation in multi-layered transparent structures
CN104215176B (zh) * 2014-09-17 2017-02-08 中国科学院上海光学精密机械研究所 高精度光学间隔测量装置和测量方法
US9818021B2 (en) * 2014-10-21 2017-11-14 Isra Surface Vision Gmbh Method for determining a local refractive power and device therefor
CN105572072A (zh) * 2015-12-21 2016-05-11 中国科学院长春光学精密机械与物理研究所 一种透明光学材料群折射率测量装置及测量方法
CN107976154B (zh) * 2017-11-16 2020-03-13 北京工业大学 一种基于荧光强度的通道上/下壁面轮廓的测量方法
JP6880513B2 (ja) * 2018-03-13 2021-06-02 オムロン株式会社 光学計測装置及び光学計測方法
CN111213029A (zh) * 2018-09-27 2020-05-29 合刃科技（深圳）有限公司 检测透明/半透明材料缺陷的方法、装置及系统
CN109030418A (zh) * 2018-10-24 2018-12-18 广州医科大学 一种基于oct技术测量液体折射率的方法
CN109444075A (zh) * 2018-11-01 2019-03-08 广州医科大学 一种基于oct技术监测葡萄糖溶液浓度的方法
CN110207801B (zh) * 2019-05-14 2020-12-08 西北工业大学 基于阴影技术的爆震波三维结构重建系统
WO2022003867A1 (en) * 2020-07-01 2022-01-06 Hamamatsu Photonics K.K. Slanted optical coherence tomography imaging for high-speed inspection
CN112710641B (zh) * 2020-10-31 2022-04-01 浙江大学 基于电光调制技术的偏振调制荧光差分显微成像方法和装置
CN112630119A (zh) * 2020-11-27 2021-04-09 北京航天计量测试技术研究所 一种多孔陶瓷材料等效折射率测量装置及孔隙率计算方法
CN114001657B (zh) * 2021-09-26 2023-06-13 河北大学 基于低相干光串联干涉的量块长度校准装置和校准方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6140607U (ja) * 1984-08-16 1986-03-14 富士通株式会社 微小ギヤツプ測定装置
US6725073B1 (en) * 1999-08-17 2004-04-20 Board Of Regents, The University Of Texas System Methods for noninvasive analyte sensing
US7057735B2 (en) * 2002-11-14 2006-06-06 Fitel U.S.A. Corp. Method for measuring the optical and physical thickness of optically transparent objects
FR2852389B1 (fr) * 2003-03-12 2005-05-13 Commissariat Energie Atomique Procede de mesure d'objets tridimensionnels par ombroscopie optique a une seule vue
JP2007523321A (ja) * 2003-12-31 2007-08-16 ユニヴァーシティー オブ サウスカロライナ 気体及び他の流体のための薄層多孔光センサ
FR2875295B1 (fr) * 2004-09-10 2006-11-17 Commissariat Energie Atomique Procede de mesure d'objets tridimensionnels par ombroscopie optique a une seule vue, utilisant les lois optiques de la propagation de la lumiere
RU2303393C1 (ru) * 2005-12-23 2007-07-27 Государственное образовательное учреждение высшего профессионального образования "Саратовский государственный университет имени Н.Г. Чернышевского" Способ оптической когерентной томографии
FR2905170B1 (fr) * 2006-08-23 2009-02-27 Commissariat Energie Atomique Procede de mesure sans contact d'objets tridimensionnels a deux couches par ombroscopie optique a une seule vue

Also Published As

Publication number Publication date
EP2310836B1 (de) 2012-05-09
US8488112B2 (en) 2013-07-16
CA2731961A1 (fr) 2010-02-11
WO2010015594A1 (fr) 2010-02-11
FR2934901B1 (fr) 2012-07-13
EP2310836A1 (de) 2011-04-20
RU2011108577A (ru) 2012-09-10
US20110134414A1 (en) 2011-06-09
FR2934901A1 (fr) 2010-02-12
JP5537548B2 (ja) 2014-07-02
JP2011530075A (ja) 2011-12-15
CN102112865A (zh) 2011-06-29
RU2515189C2 (ru) 2014-05-10

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