ATE59707T1 - Verfahren und schaltung zur schnellen reflektometrischen pruefung passiver komponenten im vhf-bereich. - Google Patents

Verfahren und schaltung zur schnellen reflektometrischen pruefung passiver komponenten im vhf-bereich.

Info

Publication number
ATE59707T1
ATE59707T1 AT86401427T AT86401427T ATE59707T1 AT E59707 T1 ATE59707 T1 AT E59707T1 AT 86401427 T AT86401427 T AT 86401427T AT 86401427 T AT86401427 T AT 86401427T AT E59707 T1 ATE59707 T1 AT E59707T1
Authority
AT
Austria
Prior art keywords
vhf range
line
testing
reflectometric
fast
Prior art date
Application number
AT86401427T
Other languages
English (en)
Inventor
Traon Andre Le
Brahim Haraoubia
Jean-Claude Pilet
Burgat Michel De
Jean-Loic Meury
Traon Flore Le
Original Assignee
Univ Rennes
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Rennes filed Critical Univ Rennes
Application granted granted Critical
Publication of ATE59707T1 publication Critical patent/ATE59707T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/16—Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Amplifiers (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
AT86401427T 1985-07-01 1986-06-27 Verfahren und schaltung zur schnellen reflektometrischen pruefung passiver komponenten im vhf-bereich. ATE59707T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8510007A FR2584196B1 (fr) 1985-07-01 1985-07-01 Procede et dispositif pour le test rapide, par reflectrometrie, dans les gammes v.h.f., de composants passifs
EP86401427A EP0211711B1 (de) 1985-07-01 1986-06-27 Verfahren und Schaltung zur schnellen reflektometrischen Prüfung passiver Komponenten im VHF-Bereich

Publications (1)

Publication Number Publication Date
ATE59707T1 true ATE59707T1 (de) 1991-01-15

Family

ID=9320831

Family Applications (2)

Application Number Title Priority Date Filing Date
AT86401426T ATE68605T1 (de) 1985-07-01 1986-06-27 Verfahren und schaltung zur schnellen reflektometrischen pruefung passiver komponenten im vhf-bereich.
AT86401427T ATE59707T1 (de) 1985-07-01 1986-06-27 Verfahren und schaltung zur schnellen reflektometrischen pruefung passiver komponenten im vhf-bereich.

Family Applications Before (1)

Application Number Title Priority Date Filing Date
AT86401426T ATE68605T1 (de) 1985-07-01 1986-06-27 Verfahren und schaltung zur schnellen reflektometrischen pruefung passiver komponenten im vhf-bereich.

Country Status (6)

Country Link
US (1) US4791351A (de)
EP (2) EP0211711B1 (de)
JP (1) JPS6296868A (de)
AT (2) ATE68605T1 (de)
DE (2) DE3676379D1 (de)
FR (1) FR2584196B1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2263783B (en) * 1992-01-27 1995-12-20 Marconi Instruments Ltd Circuits for use in the detection and location of a fault or faults in a device under test
US5430383A (en) * 1994-03-03 1995-07-04 Vlsi Technology, Inc. Method for measuring capacitive loads
JP3528363B2 (ja) * 1995-10-13 2004-05-17 ヤマハ株式会社 試験用半導体装置の評価方法
FI981990A7 (fi) 1998-09-15 2000-03-16 Nokia Corp Mittausmenetelmä ja mittauslaite
RU2321007C1 (ru) * 2006-08-28 2008-03-27 Федеральное государственное учреждение "Федеральный государственный научно-исследовательский испытательный центр радиоэлектронной борьбы и оценки снижения заметности" Министерства обороны Российской Федерации Способ измерения локальных энергетических частотных спектров и коэффициента отражения радиопоглощающего материала
RU2371736C2 (ru) * 2007-02-28 2009-10-27 Открытое акционерное общество "Головное системное конструкторское бюро Концерна ПВО "Алмаз-Антей" имени академика А.А. Расплетина" (ОАО "ГСКБ "Алмаз-Антей") Способ формирования текущего энергетического спектра выходного сигнала приемника, устройство для его осуществления и способ измерения дальности
RU2353948C1 (ru) * 2007-12-20 2009-04-27 Федеральное государственное учреждение "Федеральный государственный научно-исследовательский испытательный центр радиоэлектронной борьбы и оценки эффективности снижения заметности" Министерства обороны Российской Федерации Устройство для двухпозиционных измерений радиолокационных характеристик радиопоглощающих покрытий
US20090167322A1 (en) * 2007-12-28 2009-07-02 Erik Edmund Magnuson Systems and method for classifying a substance
US8750816B2 (en) * 2011-08-09 2014-06-10 Texas Instruments Incorporated Method to determine RF circuit antenna impedance
US9151795B2 (en) * 2012-11-21 2015-10-06 Avago Technologies General Ip (Singapore) Pte. Ltd. Apparatus for inspecting passive component having signal transmission line

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3479587A (en) * 1967-06-14 1969-11-18 Gen Radio Co Reflection-coefficient measuring apparatus
US4112382A (en) * 1973-11-30 1978-09-05 Ird Mechanalysis, Inc. Digital sweep circuit for generating sawtooth wave form
US4041395A (en) * 1976-08-02 1977-08-09 Integral Engineering & Manufacturing Corporation Transmitter performance monitor and antenna matching system
US4288875A (en) * 1980-02-08 1981-09-08 Rca Corporation Controlled local oscillator with apparatus for extending its frequency range
FR2514902A1 (fr) * 1981-10-20 1983-04-22 Cables De Lyon Geoffroy Delore Procede de mesure de l'impedance d'une prise de terre et dispositif en faisant application
US4506209A (en) * 1982-12-27 1985-03-19 Rockwell International Corporation Tracking impedance measuring system
DE3410730C2 (de) * 1984-03-23 1994-08-18 Deutsche Aerospace Meß-Richtkoppler
FR2564205B1 (fr) * 1984-05-10 1986-10-24 Univ Rennes Procede et dispositif pour le test rapide de condensateurs et de materiaux dielectriques

Also Published As

Publication number Publication date
FR2584196B1 (fr) 1988-04-22
US4791351A (en) 1988-12-13
EP0207860A2 (de) 1987-01-07
FR2584196A1 (fr) 1987-01-02
EP0207860A3 (en) 1988-05-25
EP0207860B1 (de) 1991-10-16
JPS6296868A (ja) 1987-05-06
EP0211711A1 (de) 1987-02-25
DE3676379D1 (de) 1991-02-07
ATE68605T1 (de) 1991-11-15
EP0211711B1 (de) 1991-01-02
DE3681978D1 (de) 1991-11-21

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Legal Events

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RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties