ES2180067T3 - Aparato de medicion de la impedancia de una estructura resonante. - Google Patents

Aparato de medicion de la impedancia de una estructura resonante.

Info

Publication number
ES2180067T3
ES2180067T3 ES97945933T ES97945933T ES2180067T3 ES 2180067 T3 ES2180067 T3 ES 2180067T3 ES 97945933 T ES97945933 T ES 97945933T ES 97945933 T ES97945933 T ES 97945933T ES 2180067 T3 ES2180067 T3 ES 2180067T3
Authority
ES
Spain
Prior art keywords
resonant structure
impedance
source
measurement equipment
physical quantity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES97945933T
Other languages
English (en)
Inventor
Anthony Lonsdale
Bryan Lonsdale
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Application granted granted Critical
Publication of ES2180067T3 publication Critical patent/ES2180067T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S73/00—Measuring and testing
    • Y10S73/04—Piezoelectric

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)

Abstract

ESTE APARATO, DESTINADO A MEDIR EL VALOR DE UNA MAGNITUD FISICA QUE AFECTA A LA IMPEDANCIA DE UNA ESTRUCTURA ELECTRICAMENTE RESONANTE, COMPRENDE UNA ESTRUCTURA ELECTRICAMENTE RESONANTE, UNA FUENTE DE ENERGIA ELECTRICA DE FRECUENCIA RADIOELECTRICA, UNA LINEA DE TRANSMISION BIDIRECCIONAL DE FRECUENCIA RADIOELECTRICA QUE UNE DICHA FUENTE A DICHA ESTRUCTURA, UN ACOPLADOR DIRECCIONAL ASOCIADO A LA LINEA DE TRANSMISION Y SE CARACTERIZA POR QUE LA FUENTE PRODUCE UNA SEÑAL DE EXCITACION DESTINADA A LA ESTRUCTURA, PORQUE EL ACOPLADOR DIRECCIONAL DETECTA LA TENSION O LA FASE DE UNA SEÑAL REFLEJADA Y LA REENVIA A PARTIR DE LA ESTRUCTURA RESONANTE, POR QUE LA ESTRUCTURA RESONANTE NO PRODUCE PRACTICAMENTE UNA ENERGIA RADIANTE, Y PORQUE, A UNA FRECUENCIA DETERMINADA DE LA FUENTE, DICHA ESTRUCTURA TIENE UNA IMPEDANCIA VARIABLE Y CONTINUA EN FUNCION DEL VALOR DE LA MAGNITUD FISICA. GENERALMENTE, ESTA ESTRUCTURA RESONANTE ESTA, AL MENOS PARCIALMENTE, COMPUESTA DE MATERIALES PIEZOELECTRICOS.
ES97945933T 1996-11-13 1997-11-13 Aparato de medicion de la impedancia de una estructura resonante. Expired - Lifetime ES2180067T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AUPO3589A AUPO358996A0 (en) 1996-11-13 1996-11-13 Apparatus for measuring impedance of a resonant structure

Publications (1)

Publication Number Publication Date
ES2180067T3 true ES2180067T3 (es) 2003-02-01

Family

ID=3797900

Family Applications (1)

Application Number Title Priority Date Filing Date
ES97945933T Expired - Lifetime ES2180067T3 (es) 1996-11-13 1997-11-13 Aparato de medicion de la impedancia de una estructura resonante.

Country Status (14)

Country Link
US (1) US6237417B1 (es)
EP (1) EP0938682B1 (es)
JP (1) JP3883211B2 (es)
KR (1) KR100532355B1 (es)
CN (1) CN1204406C (es)
AT (1) ATE220461T1 (es)
AU (1) AUPO358996A0 (es)
BR (1) BR9715005A (es)
CA (1) CA2272079A1 (es)
DE (1) DE69713897T2 (es)
DK (1) DK0938682T3 (es)
ES (1) ES2180067T3 (es)
PT (1) PT938682E (es)
WO (1) WO1998021598A1 (es)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100385072B1 (ko) * 2000-12-21 2003-05-22 삼성전기주식회사 다기능 액츄에이터용 공진주파수 검출시스템
US6854322B2 (en) * 2002-06-10 2005-02-15 The Procter & Gamble Company Directional coupler sensor
DE10239303B4 (de) * 2002-08-27 2006-08-03 Siemens Ag Energieautark modulierter Backscatter-Transponder
BRPI0510256A (pt) * 2004-04-26 2007-10-23 Procter & Gamble métodos para avaliação de caracterìsticas de substratos fibrosos e para tratamento de substratos fibrosos
GB0509113D0 (en) * 2005-05-04 2005-06-08 Sensor Technology Ltd Measuring physical quantities resonant structures
JP5221527B2 (ja) * 2006-06-30 2013-06-26 ザ プロクター アンド ギャンブル カンパニー マイクロストリップ方向性結合器のオーバレイ（毛髪様）の湿分を測定する装置
EP1923674A1 (en) * 2006-11-14 2008-05-21 Infineon Technologies SensoNor AS Backscatter sensor
US7855564B2 (en) * 2008-02-14 2010-12-21 Delaware Capital Formation, Inc. Acoustic wave device physical parameter sensor
US8150314B2 (en) * 2008-12-09 2012-04-03 Keng Kuei Su Remote antijamming transmission device and method for the same
US8085156B2 (en) * 2009-04-08 2011-12-27 Rosemount Inc. RF cavity-based process fluid sensor
KR101143645B1 (ko) * 2009-07-29 2012-05-09 주세은 경두개 저강도 초음파 전달장치 및 이를 이용한 비침습적 뇌기능 조절방법
CN101957403B (zh) * 2010-09-10 2012-08-15 浙江大学 石英晶体振荡器激励的非接触电导测量装置和方法
DK2630479T3 (da) 2010-10-20 2020-07-20 Qorvo Us Inc Anordning og fremgangsmåde til måling af bindingskinetik og koncentration med en resonanssensor
US9506953B2 (en) * 2012-01-18 2016-11-29 Ut-Battelle, Llc High speed high dynamic range high accuracy measurement system
WO2014190238A1 (en) 2013-05-23 2014-11-27 Rapid Diagnostek Resonator sensor module system and method
US11476605B2 (en) 2013-05-23 2022-10-18 Qorvo Biotechnologies, Llc Interconnect device and module using same
US9274075B2 (en) * 2014-01-30 2016-03-01 Mitsubishi Electric Research Laboratories, Inc. Proximity sensor detecting metallic and non-metallic objects
JP6614786B2 (ja) * 2015-04-01 2019-12-04 キヤノン株式会社 共振器
NO338884B1 (en) * 2015-06-15 2016-10-31 Roxar Flow Measurement As Fluid measuring system
CN107983666A (zh) * 2017-11-22 2018-05-04 铜陵日兴电子有限公司 一种基于多次检测的石英谐振器合格筛选装置
WO2019198162A1 (ja) 2018-04-10 2019-10-17 日本たばこ産業株式会社 霧化ユニット
US11573205B2 (en) * 2019-04-12 2023-02-07 Awe Technologies Llc Multimodal characterization of a fluid using a single droplet

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3031615A (en) 1959-11-18 1962-04-24 Walter M Chase Direct voltage standing wave ratio measurement
US4524620A (en) * 1983-02-07 1985-06-25 Hughes Helicopters, Inc. In-flight monitoring of composite structural components such as helicopter rotor blades
GB2143326B (en) * 1983-07-14 1986-08-13 Standard Telephones Cables Ltd Surface acoustic wave accelerometer
US4668909A (en) * 1984-05-04 1987-05-26 The United States Of America As Represented By The Secretary Of The Air Force Piezoelectric material testing method and apparatus
US4691714A (en) * 1984-10-15 1987-09-08 Adamtek Corporation Rheological testing apparatus and method
US4932255A (en) * 1988-12-16 1990-06-12 Johnson Service Company Flow sensing using surface acoustic waves

Also Published As

Publication number Publication date
US6237417B1 (en) 2001-05-29
CN1204406C (zh) 2005-06-01
CA2272079A1 (en) 1998-05-22
KR100532355B1 (ko) 2005-12-02
DK0938682T3 (da) 2002-11-04
AUPO358996A0 (en) 1996-12-05
CN1244922A (zh) 2000-02-16
EP0938682A1 (en) 1999-09-01
WO1998021598A1 (en) 1998-05-22
PT938682E (pt) 2002-11-29
EP0938682B1 (en) 2002-07-10
ATE220461T1 (de) 2002-07-15
DE69713897T2 (de) 2003-03-13
DE69713897D1 (de) 2002-08-14
JP2001504223A (ja) 2001-03-27
JP3883211B2 (ja) 2007-02-21
KR20000053214A (ko) 2000-08-25
BR9715005A (pt) 2002-03-05

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