ATE75323T1 - Automatische test-einrichtung und methode zum betrieb davon. - Google Patents

Automatische test-einrichtung und methode zum betrieb davon.

Info

Publication number
ATE75323T1
ATE75323T1 AT86301447T AT86301447T ATE75323T1 AT E75323 T1 ATE75323 T1 AT E75323T1 AT 86301447 T AT86301447 T AT 86301447T AT 86301447 T AT86301447 T AT 86301447T AT E75323 T1 ATE75323 T1 AT E75323T1
Authority
AT
Austria
Prior art keywords
guards
guard
circuit
improvement
measurement
Prior art date
Application number
AT86301447T
Other languages
English (en)
Inventor
Lewis Williams
Original Assignee
Schlumberger Technologies Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Schlumberger Technologies Ltd filed Critical Schlumberger Technologies Ltd
Application granted granted Critical
Publication of ATE75323T1 publication Critical patent/ATE75323T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Selective Calling Equipment (AREA)
  • Maintenance And Inspection Apparatuses For Elevators (AREA)
  • Push-Button Switches (AREA)
  • Electroluminescent Light Sources (AREA)
AT86301447T 1985-03-15 1986-02-28 Automatische test-einrichtung und methode zum betrieb davon. ATE75323T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB08506842A GB2172403B (en) 1985-03-15 1985-03-15 Method for operating automatic test equipment
EP86301447A EP0194788B1 (de) 1985-03-15 1986-02-28 Automatische Test-Einrichtung und Methode zum Betrieb davon

Publications (1)

Publication Number Publication Date
ATE75323T1 true ATE75323T1 (de) 1992-05-15

Family

ID=10576092

Family Applications (1)

Application Number Title Priority Date Filing Date
AT86301447T ATE75323T1 (de) 1985-03-15 1986-02-28 Automatische test-einrichtung und methode zum betrieb davon.

Country Status (7)

Country Link
US (1) US4774455A (de)
EP (1) EP0194788B1 (de)
JP (1) JPS61258181A (de)
AT (1) ATE75323T1 (de)
CA (1) CA1244963A (de)
DE (1) DE3684944D1 (de)
GB (1) GB2172403B (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5012180A (en) * 1988-05-17 1991-04-30 Zilog, Inc. System for testing internal nodes
US5127009A (en) * 1989-08-29 1992-06-30 Genrad, Inc. Method and apparatus for circuit board testing with controlled backdrive stress
US5045782A (en) * 1990-01-23 1991-09-03 Hewlett-Packard Company Negative feedback high current driver for in-circuit tester
US5150209A (en) * 1990-05-11 1992-09-22 Picturetel Corporation Hierarchical entropy coded lattice threshold quantization encoding method and apparatus for image and video compression
US5504432A (en) * 1993-08-31 1996-04-02 Hewlett-Packard Company System and method for detecting short, opens and connected pins on a printed circuit board using automatic test equipment

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3931506A (en) * 1974-12-30 1976-01-06 Zehntel, Inc. Programmable tester
US4070565A (en) * 1976-08-18 1978-01-24 Zehntel, Inc. Programmable tester method and apparatus
US4555783A (en) * 1982-04-30 1985-11-26 Genrad, Inc. Method of computerized in-circuit testing of electrical components and the like with automatic spurious signal suppression

Also Published As

Publication number Publication date
EP0194788B1 (de) 1992-04-22
GB2172403B (en) 1988-11-02
EP0194788A3 (en) 1988-01-07
US4774455A (en) 1988-09-27
GB8506842D0 (en) 1985-04-17
CA1244963A (en) 1988-11-15
DE3684944D1 (de) 1992-05-27
GB2172403A (en) 1986-09-17
EP0194788A2 (de) 1986-09-17
JPS61258181A (ja) 1986-11-15

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Legal Events

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