ATE79476T1 - Konfokales laserabtastmikroskop. - Google Patents

Konfokales laserabtastmikroskop.

Info

Publication number
ATE79476T1
ATE79476T1 AT88200452T AT88200452T ATE79476T1 AT E79476 T1 ATE79476 T1 AT E79476T1 AT 88200452 T AT88200452 T AT 88200452T AT 88200452 T AT88200452 T AT 88200452T AT E79476 T1 ATE79476 T1 AT E79476T1
Authority
AT
Austria
Prior art keywords
scanning
point
frame
confocal laser
focused
Prior art date
Application number
AT88200452T
Other languages
English (en)
Inventor
Pieter Marcus Houpt
Arie Draaijer
Original Assignee
Tno
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tno filed Critical Tno
Application granted granted Critical
Publication of ATE79476T1 publication Critical patent/ATE79476T1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0068—Optical details of the image generation arrangements using polarisation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0048—Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G02B21/0084—Details of detection or image processing, including general computer control time-scale detection, e.g. strobed, ultra-fast, heterodyne detection

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
AT88200452T 1987-03-13 1988-03-09 Konfokales laserabtastmikroskop. ATE79476T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL8700612A NL8700612A (nl) 1987-03-13 1987-03-13 Confocale laserscanning microscoop.
EP88200452A EP0284136B1 (de) 1987-03-13 1988-03-09 Konfokales Laserabtastmikroskop

Publications (1)

Publication Number Publication Date
ATE79476T1 true ATE79476T1 (de) 1992-08-15

Family

ID=19849704

Family Applications (1)

Application Number Title Priority Date Filing Date
AT88200452T ATE79476T1 (de) 1987-03-13 1988-03-09 Konfokales laserabtastmikroskop.

Country Status (7)

Country Link
US (1) US4863226A (de)
EP (1) EP0284136B1 (de)
JP (2) JPS63298211A (de)
AT (1) ATE79476T1 (de)
DE (1) DE3873570T2 (de)
ES (1) ES2034154T3 (de)
NL (1) NL8700612A (de)

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US5200838A (en) * 1988-05-27 1993-04-06 The University Of Connecticut Lateral effect imaging system
JP2525893B2 (ja) * 1989-04-07 1996-08-21 浜松ホトニクス株式会社 螢光特性検査装置
US5225924A (en) * 1989-04-07 1993-07-06 Dainippon Screen Mfg. Co., Ltd. Optical beam scanning system
JP2525894B2 (ja) * 1989-04-07 1996-08-21 浜松ホトニクス株式会社 半導体試料の螢光特性検査装置
US5002348A (en) * 1989-05-24 1991-03-26 E. I. Du Pont De Nemours And Company Scanning beam optical signal processor
EP0418928B1 (de) * 1989-09-22 1996-05-01 Fuji Photo Film Co., Ltd. Rastermikroskop und Rastermechanismus dafür
US5034613A (en) * 1989-11-14 1991-07-23 Cornell Research Foundation, Inc. Two-photon laser microscopy
US5386112A (en) * 1990-06-29 1995-01-31 Dixon; Arthur E. Apparatus and method for transmitted-light and reflected-light imaging
US5260578A (en) * 1991-04-10 1993-11-09 Mayo Foundation For Medical Education And Research Confocal imaging system for visible and ultraviolet light
WO1992018850A1 (en) * 1991-04-10 1992-10-29 Mayo Foundation For Medical Education And Research Confocal imaging system for visible and ultraviolet light
US5306902A (en) * 1992-09-01 1994-04-26 International Business Machines Corporation Confocal method and apparatus for focusing in projection lithography
JP3343276B2 (ja) * 1993-04-15 2002-11-11 興和株式会社 レーザー走査型光学顕微鏡
USH1530H (en) * 1993-06-17 1996-05-07 Ultrapointe Corporation Surface extraction from a three-dimensional data set
US5479252A (en) * 1993-06-17 1995-12-26 Ultrapointe Corporation Laser imaging system for inspection and analysis of sub-micron particles
US5923430A (en) * 1993-06-17 1999-07-13 Ultrapointe Corporation Method for characterizing defects on semiconductor wafers
EP0646768A3 (de) * 1993-09-29 1997-05-14 Ushio Electric Inc Optisches Konfokalmikroskop und Messeinrichtung zur Benutzung dieses Mikroskops.
US5923466A (en) * 1993-10-20 1999-07-13 Biophysica Technologies, Inc. Light modulated confocal optical instruments and method
US5587832A (en) * 1993-10-20 1996-12-24 Biophysica Technologies, Inc. Spatially light modulated confocal microscope and method
GB9408688D0 (en) * 1994-04-30 1994-06-22 Medical Res Council Scanning confocal optical microscope
US5561611A (en) * 1994-10-04 1996-10-01 Noran Instruments, Inc. Method and apparatus for signal restoration without knowledge of the impulse response function of the signal acquisition system
DE19510102C1 (de) * 1995-03-20 1996-10-02 Rainer Dr Uhl Konfokales Fluoreszenzmikroskop
EP0852716B1 (de) 1995-09-19 2005-11-30 Cornell Research Foundation, Inc. Multiphoton lasermikroskopie
US6148114A (en) * 1996-11-27 2000-11-14 Ultrapointe Corporation Ring dilation and erosion techniques for digital image processing
DE19758746C2 (de) * 1997-01-27 2003-07-31 Zeiss Carl Jena Gmbh Laser-Scanning-Mikroskop
DE19733193B4 (de) * 1997-08-01 2005-09-08 Carl Zeiss Jena Gmbh Mikroskop mit adaptiver Optik
US6771417B1 (en) * 1997-08-01 2004-08-03 Carl Zeiss Jena Gmbh Applications of adaptive optics in microscopy
US6098031A (en) * 1998-03-05 2000-08-01 Gsi Lumonics, Inc. Versatile method and system for high speed, 3D imaging of microscopic targets
US6366357B1 (en) * 1998-03-05 2002-04-02 General Scanning, Inc. Method and system for high speed measuring of microscopic targets
US5936728A (en) * 1998-04-14 1999-08-10 Noran Instruments, Inc. Flash photolysis method and apparatus
AU4012500A (en) * 1999-03-18 2000-10-04 Lucid, Inc. System and method for enhancing confocal reflectance images of tissue specimens
US6720547B1 (en) * 1999-03-18 2004-04-13 Lucid, Inc. System and method for enhancing confocal reflectance images of tissue specimens
US6548796B1 (en) 1999-06-23 2003-04-15 Regents Of The University Of Minnesota Confocal macroscope
US6449039B1 (en) 1999-07-28 2002-09-10 Thermo Noran Inc. Laser scanning fluorescence microscopy with compensation for spatial dispersion of fast laser pulses
DE10050529B4 (de) * 2000-10-11 2016-06-09 Leica Microsystems Cms Gmbh Verfahren zur Strahlsteuerung in einem Scanmikroskop, Anordnung zur Strahlsteuerung in einem Scanmikroskop und Scanmikroskop
US7139122B1 (en) * 2000-10-17 2006-11-21 Lucid, Inc. System and method for enhancing confocal reflectance images of tissue specimens
WO2002057811A2 (en) 2000-12-15 2002-07-25 Sloan-Kettering Institute For Cancer Research Beam-steering of multi-chromatic light using acousto-optical deflectors and dispersion-compensatory optics
DE10107210C1 (de) * 2001-02-16 2002-10-10 Evotec Ag Mikroskop
US6750974B2 (en) 2002-04-02 2004-06-15 Gsi Lumonics Corporation Method and system for 3D imaging of target regions
US7706584B2 (en) 2002-10-22 2010-04-27 Baylor College of Medicine and William Marsh Rice University Random access high-speed confocal microscope
GB0308072D0 (en) * 2003-04-08 2003-05-14 Visitech Internat Ltd Fast multi-line laser confocal scanning microscope
JP4987233B2 (ja) * 2005-01-06 2012-07-25 オリンパス株式会社 レーザ走査型顕微鏡
PL1895905T3 (pl) 2005-05-12 2025-07-28 Lucid, Inc. Konfokalny mikroskop skaningowy zawierający układy optyczne i skanujące, które zapewniają ręczną głowicę obrazującą
DE102007021378A1 (de) * 2007-05-04 2008-11-06 Ape Angewandte Physik Und Elektronik Gmbh Verfahren und optische Anordnung zum Erzeugen eines nicht-linearen optischen Signals an einem durch ein Anregungsfeld angeregten Material sowie Verwendung des Verfahrens und der optischen Anordnung
KR101119381B1 (ko) * 2009-06-18 2012-03-07 한국과학기술원 세포 특성 측정 장치 및 시스템과 이를 이용한 세포 특성 측정 방법
CN101904735B (zh) * 2010-07-20 2013-05-08 苏州微清医疗器械有限公司 基于快速倾斜镜的宽视场共焦扫描显微镜
CN102885612A (zh) * 2012-02-14 2013-01-23 苏州微清医疗器械有限公司 一种用于临床诊断的眼底成像设备
CN105486638B (zh) * 2015-11-30 2019-02-05 哈尔滨工业大学 一种超分辨阵列扫描结构光照明成像装置及其成像方法
CN106442335B (zh) * 2016-12-16 2024-04-09 中国科学院工程热物理研究所 一种显微可视化抽运探测热反射系统
CN108519329B (zh) * 2018-03-26 2021-01-15 华中科技大学 一种多路扫描与探测的线共聚焦成像装置
CN112261253B (zh) * 2020-10-15 2022-05-03 浙江大华技术股份有限公司 共焦补偿滤片的控制方法、装置、存储介质以及电子装置
WO2023193480A1 (zh) * 2022-04-08 2023-10-12 南京博视医疗科技有限公司 一种视网膜成像装置及其成像方法

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JPS5118136B1 (de) * 1970-11-25 1976-06-08
US4044363A (en) * 1974-12-23 1977-08-23 Dymo Industries, Inc. Laser photocomposition system and method
US4634880A (en) * 1982-04-19 1987-01-06 Siscan Systems, Inc. Confocal optical imaging system with improved signal-to-noise ratio
GB2152697B (en) * 1983-10-25 1987-03-25 Atomic Energy Authority Uk Improvements in or relating to scanning optical microscopes
DE3427611A1 (de) * 1984-07-26 1988-06-09 Bille Josef Laserstrahl-lithograph
US4640626A (en) * 1984-09-13 1987-02-03 Siemens Aktiengesellschaft Method and apparatus for localizing weak points within an electrical circuit
JPS61118710A (ja) * 1984-11-15 1986-06-06 Nippon Jido Seigyo Kk 走査型顕微鏡撮像装置
JPS61121022A (ja) * 1984-11-19 1986-06-09 Nippon Jido Seigyo Kk 走査型顕微鏡撮像装置
JPS61140914A (ja) * 1984-12-14 1986-06-28 Hitachi Ltd 共焦点顕微鏡
JP2524574B2 (ja) * 1985-03-27 1996-08-14 オリンパス光学工業株式会社 走査型光学顕微鏡

Also Published As

Publication number Publication date
JPH11135U (ja) 1999-11-09
ES2034154T3 (es) 1993-04-01
EP0284136A1 (de) 1988-09-28
DE3873570D1 (de) 1992-09-17
DE3873570T2 (de) 1994-01-05
US4863226A (en) 1989-09-05
JP2607804Y2 (ja) 2003-03-31
EP0284136B1 (de) 1992-08-12
JPS63298211A (ja) 1988-12-06
NL8700612A (nl) 1988-10-03

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Legal Events

Date Code Title Description
EEIH Change in the person of patent owner
EELA Cancelled due to lapse of time