ES2034154T3 - Microscopio de exploracion laser concentrico o de foco central. - Google Patents
Microscopio de exploracion laser concentrico o de foco central.Info
- Publication number
- ES2034154T3 ES2034154T3 ES198888200452T ES88200452T ES2034154T3 ES 2034154 T3 ES2034154 T3 ES 2034154T3 ES 198888200452 T ES198888200452 T ES 198888200452T ES 88200452 T ES88200452 T ES 88200452T ES 2034154 T3 ES2034154 T3 ES 2034154T3
- Authority
- ES
- Spain
- Prior art keywords
- scanning
- point
- microscope
- frame
- focused
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0068—Optical details of the image generation arrangements using polarisation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0036—Scanning details, e.g. scanning stages
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0036—Scanning details, e.g. scanning stages
- G02B21/0048—Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/008—Details of detection or image processing, including general computer control
- G02B21/0084—Details of detection or image processing, including general computer control time-scale detection, e.g. strobed, ultra-fast, heterodyne detection
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Engineering & Computer Science (AREA)
- Microscoopes, Condenser (AREA)
- Mechanical Optical Scanning Systems (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
SE PRESENTA UN MICROSCOPIO DE EXPLORACION POR LASER QUE COMPRENDE UN LASER (1) COMO FUENTE DE LUZ PUNTUAL, UN SISTEMA DE DEFLECCION PARA LA LINEA Y UN SISTEMA DE LENTES, AL MENOS UN OBJETIVO (9) CERCANO AL OBJETO, UN PORTAOBJETOS, UN FILTRO ESPACIAL (14) Y UN DETECTOR (15), Y UN CONTROL ELECTRONICO Y UN SISTEMA DE PROCESAMIENTO DE IMAGEN. EL OBJETO ES EXPLORADO PUNTO POR PUNTO POR EL HAZ DE LUZ Y SE TOMAN MEDIDAS CON EL DETECTOR SOLAMENTE DONDE LA FUENTE DE LUZ PUNTUAL SE ENFOCA DE TAL FORMA QUE LA LUZ FUERA DE FOCO NO SE DETECTA. COMO RESULTADO LA RESOLUCION Y EL CONTRASTE EN TRES DIMENSIONES, EN PARTICULAR, AXIALMENTE AL PLANO DE LA IMAGEN PUEDE MEJORARSE CONSIDERABLEMENTE, Y LA INFORMACION EN TRES DIMENSIONES PUEDE OBTENERSE DEL OBJETO. PARA UNA EXPLORACION DE LINEA MAS RAPIDA, EL SISTEMA DE DEFLECCION DEL PRESENTE INVENTO COMPRENDE UN DEFLECTOR ACUSTOOPTICO (5) Y COMPRENDE PARA LA EXPLORACION DE MANERA MAS LENTA, OTRO DEFLECTOR (7) CONSTRUIDO EN UNA FORMA TAL QUE AL MENOS EL MOVIMIENTO DE EXPLORACION DEL HAZ DE LUZ DE RETORNO SE ELIMINA COMPLETAMENTE, COMO RESULTADO DE LO CUAL LA LUZ DE RETORNO SE ENFOCA SOBRE EL FILTRO ESPACIAL.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL8700612A NL8700612A (nl) | 1987-03-13 | 1987-03-13 | Confocale laserscanning microscoop. |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ES2034154T3 true ES2034154T3 (es) | 1993-04-01 |
Family
ID=19849704
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES198888200452T Expired - Lifetime ES2034154T3 (es) | 1987-03-13 | 1988-03-09 | Microscopio de exploracion laser concentrico o de foco central. |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4863226A (es) |
| EP (1) | EP0284136B1 (es) |
| JP (2) | JPS63298211A (es) |
| AT (1) | ATE79476T1 (es) |
| DE (1) | DE3873570T2 (es) |
| ES (1) | ES2034154T3 (es) |
| NL (1) | NL8700612A (es) |
Families Citing this family (51)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5200838A (en) * | 1988-05-27 | 1993-04-06 | The University Of Connecticut | Lateral effect imaging system |
| US5225924A (en) * | 1989-04-07 | 1993-07-06 | Dainippon Screen Mfg. Co., Ltd. | Optical beam scanning system |
| JP2525894B2 (ja) * | 1989-04-07 | 1996-08-21 | 浜松ホトニクス株式会社 | 半導体試料の螢光特性検査装置 |
| JP2525893B2 (ja) * | 1989-04-07 | 1996-08-21 | 浜松ホトニクス株式会社 | 螢光特性検査装置 |
| US5002348A (en) * | 1989-05-24 | 1991-03-26 | E. I. Du Pont De Nemours And Company | Scanning beam optical signal processor |
| EP0418928B1 (en) * | 1989-09-22 | 1996-05-01 | Fuji Photo Film Co., Ltd. | Scanning microscope and scanning mechanism for the same |
| US5034613A (en) * | 1989-11-14 | 1991-07-23 | Cornell Research Foundation, Inc. | Two-photon laser microscopy |
| US5386112A (en) * | 1990-06-29 | 1995-01-31 | Dixon; Arthur E. | Apparatus and method for transmitted-light and reflected-light imaging |
| JP3280969B2 (ja) * | 1991-04-10 | 2002-05-13 | メイヨ ファンデーション フォー メディカル エデュケーション アンド リサーチ | 可視光および紫外光の共焦点結像装置 |
| US5260578A (en) * | 1991-04-10 | 1993-11-09 | Mayo Foundation For Medical Education And Research | Confocal imaging system for visible and ultraviolet light |
| US5306902A (en) * | 1992-09-01 | 1994-04-26 | International Business Machines Corporation | Confocal method and apparatus for focusing in projection lithography |
| JP3343276B2 (ja) * | 1993-04-15 | 2002-11-11 | 興和株式会社 | レーザー走査型光学顕微鏡 |
| US5923430A (en) * | 1993-06-17 | 1999-07-13 | Ultrapointe Corporation | Method for characterizing defects on semiconductor wafers |
| US5479252A (en) * | 1993-06-17 | 1995-12-26 | Ultrapointe Corporation | Laser imaging system for inspection and analysis of sub-micron particles |
| USH1530H (en) * | 1993-06-17 | 1996-05-07 | Ultrapointe Corporation | Surface extraction from a three-dimensional data set |
| KR950009292A (ko) * | 1993-09-29 | 1995-04-21 | 유모토 다이죠 | 공초점형 광학현미경 및 이 현미경을 사용한 측정장치 |
| US5923466A (en) * | 1993-10-20 | 1999-07-13 | Biophysica Technologies, Inc. | Light modulated confocal optical instruments and method |
| US5587832A (en) * | 1993-10-20 | 1996-12-24 | Biophysica Technologies, Inc. | Spatially light modulated confocal microscope and method |
| GB9408688D0 (en) * | 1994-04-30 | 1994-06-22 | Medical Res Council | Scanning confocal optical microscope |
| US5561611A (en) * | 1994-10-04 | 1996-10-01 | Noran Instruments, Inc. | Method and apparatus for signal restoration without knowledge of the impulse response function of the signal acquisition system |
| DE19510102C1 (de) * | 1995-03-20 | 1996-10-02 | Rainer Dr Uhl | Konfokales Fluoreszenzmikroskop |
| WO1997011355A1 (en) * | 1995-09-19 | 1997-03-27 | Cornell Research Foundation, Inc. | Multi-photon laser microscopy |
| US6148114A (en) * | 1996-11-27 | 2000-11-14 | Ultrapointe Corporation | Ring dilation and erosion techniques for digital image processing |
| DE19758744C2 (de) * | 1997-01-27 | 2003-08-07 | Zeiss Carl Jena Gmbh | Laser-Scanning-Mikroskop |
| US6771417B1 (en) * | 1997-08-01 | 2004-08-03 | Carl Zeiss Jena Gmbh | Applications of adaptive optics in microscopy |
| DE19733193B4 (de) * | 1997-08-01 | 2005-09-08 | Carl Zeiss Jena Gmbh | Mikroskop mit adaptiver Optik |
| US6366357B1 (en) | 1998-03-05 | 2002-04-02 | General Scanning, Inc. | Method and system for high speed measuring of microscopic targets |
| US6098031A (en) * | 1998-03-05 | 2000-08-01 | Gsi Lumonics, Inc. | Versatile method and system for high speed, 3D imaging of microscopic targets |
| US5936728A (en) * | 1998-04-14 | 1999-08-10 | Noran Instruments, Inc. | Flash photolysis method and apparatus |
| US6720547B1 (en) * | 1999-03-18 | 2004-04-13 | Lucid, Inc. | System and method for enhancing confocal reflectance images of tissue specimens |
| WO2000055669A1 (en) * | 1999-03-18 | 2000-09-21 | Lucid, Inc. | System and method for enhancing confocal reflectance images of tissue specimens |
| US6548796B1 (en) * | 1999-06-23 | 2003-04-15 | Regents Of The University Of Minnesota | Confocal macroscope |
| US6449039B1 (en) | 1999-07-28 | 2002-09-10 | Thermo Noran Inc. | Laser scanning fluorescence microscopy with compensation for spatial dispersion of fast laser pulses |
| DE10050529B4 (de) * | 2000-10-11 | 2016-06-09 | Leica Microsystems Cms Gmbh | Verfahren zur Strahlsteuerung in einem Scanmikroskop, Anordnung zur Strahlsteuerung in einem Scanmikroskop und Scanmikroskop |
| US7139122B1 (en) * | 2000-10-17 | 2006-11-21 | Lucid, Inc. | System and method for enhancing confocal reflectance images of tissue specimens |
| AU2002245119A1 (en) | 2000-12-15 | 2002-07-30 | Sloan-Kettering Institute For Cancer Research | Beam-steering of multi-chromatic light using acousto-optical deflectors and dispersion-compensatory optics |
| DE10107210C1 (de) * | 2001-02-16 | 2002-10-10 | Evotec Ag | Mikroskop |
| US6750974B2 (en) | 2002-04-02 | 2004-06-15 | Gsi Lumonics Corporation | Method and system for 3D imaging of target regions |
| WO2004038461A2 (en) * | 2002-10-22 | 2004-05-06 | William Marsh Rice University | Random access high-speed confocal microscope |
| GB0308072D0 (en) * | 2003-04-08 | 2003-05-14 | Visitech Internat Ltd | Fast multi-line laser confocal scanning microscope |
| JP4987233B2 (ja) * | 2005-01-06 | 2012-07-25 | オリンパス株式会社 | レーザ走査型顕微鏡 |
| US9055867B2 (en) * | 2005-05-12 | 2015-06-16 | Caliber Imaging & Diagnostics, Inc. | Confocal scanning microscope having optical and scanning systems which provide a handheld imaging head |
| DE102007021378A1 (de) * | 2007-05-04 | 2008-11-06 | Ape Angewandte Physik Und Elektronik Gmbh | Verfahren und optische Anordnung zum Erzeugen eines nicht-linearen optischen Signals an einem durch ein Anregungsfeld angeregten Material sowie Verwendung des Verfahrens und der optischen Anordnung |
| KR101119381B1 (ko) * | 2009-06-18 | 2012-03-07 | 한국과학기술원 | 세포 특성 측정 장치 및 시스템과 이를 이용한 세포 특성 측정 방법 |
| CN101904735B (zh) * | 2010-07-20 | 2013-05-08 | 苏州微清医疗器械有限公司 | 基于快速倾斜镜的宽视场共焦扫描显微镜 |
| CN102885612A (zh) * | 2012-02-14 | 2013-01-23 | 苏州微清医疗器械有限公司 | 一种用于临床诊断的眼底成像设备 |
| CN105486638B (zh) * | 2015-11-30 | 2019-02-05 | 哈尔滨工业大学 | 一种超分辨阵列扫描结构光照明成像装置及其成像方法 |
| CN106442335B (zh) * | 2016-12-16 | 2024-04-09 | 中国科学院工程热物理研究所 | 一种显微可视化抽运探测热反射系统 |
| CN108519329B (zh) * | 2018-03-26 | 2021-01-15 | 华中科技大学 | 一种多路扫描与探测的线共聚焦成像装置 |
| CN112261253B (zh) * | 2020-10-15 | 2022-05-03 | 浙江大华技术股份有限公司 | 共焦补偿滤片的控制方法、装置、存储介质以及电子装置 |
| WO2023193480A1 (zh) * | 2022-04-08 | 2023-10-12 | 南京博视医疗科技有限公司 | 一种视网膜成像装置及其成像方法 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5118136B1 (es) * | 1970-11-25 | 1976-06-08 | ||
| US4044363A (en) * | 1974-12-23 | 1977-08-23 | Dymo Industries, Inc. | Laser photocomposition system and method |
| US4634880A (en) * | 1982-04-19 | 1987-01-06 | Siscan Systems, Inc. | Confocal optical imaging system with improved signal-to-noise ratio |
| GB2152697B (en) * | 1983-10-25 | 1987-03-25 | Atomic Energy Authority Uk | Improvements in or relating to scanning optical microscopes |
| DE3427611A1 (de) * | 1984-07-26 | 1988-06-09 | Bille Josef | Laserstrahl-lithograph |
| US4640626A (en) * | 1984-09-13 | 1987-02-03 | Siemens Aktiengesellschaft | Method and apparatus for localizing weak points within an electrical circuit |
| JPS61118710A (ja) * | 1984-11-15 | 1986-06-06 | Nippon Jido Seigyo Kk | 走査型顕微鏡撮像装置 |
| JPS61121022A (ja) * | 1984-11-19 | 1986-06-09 | Nippon Jido Seigyo Kk | 走査型顕微鏡撮像装置 |
| JPS61140914A (ja) * | 1984-12-14 | 1986-06-28 | Hitachi Ltd | 共焦点顕微鏡 |
| JP2524574B2 (ja) * | 1985-03-27 | 1996-08-14 | オリンパス光学工業株式会社 | 走査型光学顕微鏡 |
-
1987
- 1987-03-13 NL NL8700612A patent/NL8700612A/nl not_active Application Discontinuation
-
1988
- 1988-03-09 EP EP88200452A patent/EP0284136B1/en not_active Expired - Lifetime
- 1988-03-09 AT AT88200452T patent/ATE79476T1/de not_active IP Right Cessation
- 1988-03-09 DE DE88200452T patent/DE3873570T2/de not_active Expired - Lifetime
- 1988-03-09 ES ES198888200452T patent/ES2034154T3/es not_active Expired - Lifetime
- 1988-03-10 US US07/166,226 patent/US4863226A/en not_active Expired - Lifetime
- 1988-03-12 JP JP63059205A patent/JPS63298211A/ja active Pending
-
1999
- 1999-02-22 JP JP1999000819U patent/JP2607804Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP2607804Y2 (ja) | 2003-03-31 |
| DE3873570D1 (de) | 1992-09-17 |
| DE3873570T2 (de) | 1994-01-05 |
| JPS63298211A (ja) | 1988-12-06 |
| EP0284136B1 (en) | 1992-08-12 |
| NL8700612A (nl) | 1988-10-03 |
| ATE79476T1 (de) | 1992-08-15 |
| JPH11135U (ja) | 1999-11-09 |
| US4863226A (en) | 1989-09-05 |
| EP0284136A1 (en) | 1988-09-28 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FG2A | Definitive protection |
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