AU2001237346A1 - Objective lens for a charged particle beam device - Google Patents

Objective lens for a charged particle beam device

Info

Publication number
AU2001237346A1
AU2001237346A1 AU2001237346A AU3734601A AU2001237346A1 AU 2001237346 A1 AU2001237346 A1 AU 2001237346A1 AU 2001237346 A AU2001237346 A AU 2001237346A AU 3734601 A AU3734601 A AU 3734601A AU 2001237346 A1 AU2001237346 A1 AU 2001237346A1
Authority
AU
Australia
Prior art keywords
objective lens
charged particle
particle beam
beam device
charged
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001237346A
Inventor
Pavel Adamec
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ICT Integrated Circuit Testing Gesellschaft fuer Halbleiterprueftechnik mbH
Original Assignee
ICT Integrated Circuit Testing Gesellschaft fuer Halbleiterprueftechnik mbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ICT Integrated Circuit Testing Gesellschaft fuer Halbleiterprueftechnik mbH filed Critical ICT Integrated Circuit Testing Gesellschaft fuer Halbleiterprueftechnik mbH
Publication of AU2001237346A1 publication Critical patent/AU2001237346A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/10—Lenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
    • H01J37/1471—Arrangements for directing or deflecting the discharge along a desired path for centering, aligning or positioning of ray or beam
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/10—Lenses
    • H01J37/14—Lenses magnetic
    • H01J37/141—Electromagnetic lenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Electron Beam Exposure (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AU2001237346A 2000-01-27 2001-01-26 Objective lens for a charged particle beam device Abandoned AU2001237346A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP00101708A EP1120809B1 (en) 2000-01-27 2000-01-27 Objective lens for a charged particle beam device
EP00101708 2000-01-27
PCT/EP2001/000857 WO2001056056A2 (en) 2000-01-27 2001-01-26 Objective lens for a charged particle beam device

Publications (1)

Publication Number Publication Date
AU2001237346A1 true AU2001237346A1 (en) 2001-08-07

Family

ID=8167712

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001237346A Abandoned AU2001237346A1 (en) 2000-01-27 2001-01-26 Objective lens for a charged particle beam device

Country Status (7)

Country Link
US (1) US6747279B2 (en)
EP (1) EP1120809B1 (en)
JP (2) JP3786875B2 (en)
KR (1) KR100499427B1 (en)
CN (1) CN1222011C (en)
AU (1) AU2001237346A1 (en)
WO (1) WO2001056056A2 (en)

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US6787772B2 (en) * 2000-01-25 2004-09-07 Hitachi, Ltd. Scanning electron microscope
EP1120809B1 (en) * 2000-01-27 2012-02-22 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Objective lens for a charged particle beam device
KR100813210B1 (en) * 2002-03-21 2008-03-13 헤르메스-마이크로비전 인코포레이티드 System and Method for Electro-optical Focusing, Detection and Signal Acquisition of Vibration Delay Immersion Objective Lens
US6825475B2 (en) 2002-09-19 2004-11-30 Applied Materials Israel, Ltd. Deflection method and system for use in a charged particle beam column
CN102709143B (en) 2003-09-05 2016-03-09 卡尔蔡司Smt有限责任公司 Electron optics arrangement, polyelectron beam splitting checking system and method
JP4316394B2 (en) * 2004-01-21 2009-08-19 株式会社東芝 Charged beam equipment
DE102004019833B4 (en) * 2004-04-23 2007-03-01 Leica Microsystems Lithography Gmbh Objective lens for a charged particle beam and its use
US7112803B2 (en) 2004-07-23 2006-09-26 Applied Materials, Israel, Ltd. Beam directing system and method for use in a charged particle beam column
JP4759733B2 (en) * 2005-09-15 2011-08-31 国立大学法人東北大学 electronic microscope
CN102103966B (en) * 2005-11-28 2013-02-06 卡尔蔡司Smt有限责任公司 Particle-optical component
EP1883094B1 (en) * 2006-07-24 2012-05-02 ICT, Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Charged particle beam device and method for inspecting specimen
CZ298912B6 (en) * 2006-11-16 2008-03-12 Tescan, S. R. O. Scanning electron microscope
US7851755B2 (en) * 2006-12-20 2010-12-14 Jeol Ltd. Apparatus for detecting backscattered electrons in a beam apparatus
US7755042B1 (en) * 2008-04-18 2010-07-13 Kla-Tencor Corporation Auger electron spectrometer with applied magnetic field at target surface
JP5210088B2 (en) * 2008-08-19 2013-06-12 日本電子株式会社 Electron beam equipment
WO2011055520A1 (en) * 2009-11-06 2011-05-12 株式会社日立ハイテクノロジーズ Electron microscope
CN102315065B (en) * 2010-07-09 2014-04-30 上海凯世通半导体有限公司 Beam current transmission system and method
CN103038855B (en) 2010-10-27 2016-02-03 株式会社Param Electron lens and electron beam device
JP6002428B2 (en) 2012-04-24 2016-10-05 株式会社日立ハイテクノロジーズ Charged particle beam equipment
JP6138454B2 (en) * 2012-10-29 2017-05-31 株式会社日立ハイテクノロジーズ Charged particle beam equipment
EP2779205B1 (en) * 2013-03-15 2017-10-18 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH High throughput scan deflector and method of manufacturing thereof
KR101524215B1 (en) * 2013-11-29 2015-05-29 (주)코셈 Electron microscope
KR101554594B1 (en) * 2013-12-02 2015-09-22 한국표준과학연구원 Apparatus for forming charged particle beam probe and method for using thereof
TWI502616B (en) * 2014-08-08 2015-10-01 Nat Univ Tsing Hua Desktop electron microscope and wide range tunable magnetic lens thereof
JP2016051534A (en) * 2014-08-29 2016-04-11 株式会社日立ハイテクノロジーズ Charged particle beam equipment
US9583306B2 (en) 2014-12-09 2017-02-28 Hermes Microvision Inc. Swing objective lens
JP6470124B2 (en) * 2015-06-19 2019-02-13 株式会社東芝 Particle beam control electromagnet and irradiation treatment apparatus provided with the same
CZ306807B6 (en) * 2016-05-21 2017-07-12 Tescan Brno, S.R.O. A scanning electron microscope and the method of its operation
CN106920723A (en) * 2017-03-06 2017-07-04 聚束科技（北京）有限公司 A kind of scanning focused system and electron beam control method
JP6814282B2 (en) * 2017-03-29 2021-01-13 株式会社日立ハイテク Charged particle beam device
CN107204267A (en) * 2017-06-09 2017-09-26 中国科学院西安光学精密机械研究所 Charged particle circular magnetic lens
CN111033676B (en) * 2017-09-04 2022-08-30 株式会社日立高新技术 Charged particle beam device
WO2019043946A1 (en) * 2017-09-04 2019-03-07 株式会社日立ハイテクノロジーズ Charged particle beam device
JP2019212766A (en) * 2018-06-05 2019-12-12 株式会社ニューフレアテクノロジー Charged particle beam drawing device and charged particle beam drawing method
US10504684B1 (en) * 2018-07-12 2019-12-10 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH High performance inspection scanning electron microscope device and method of operating the same
US20240021404A1 (en) * 2020-12-10 2024-01-18 Asml Netherlands B.V. Charged-particle beam apparatus with beam-tilt and methods thereof
CN112718289B (en) * 2020-12-15 2022-04-15 中国人民解放军空军工程大学 Laser Assisted Vacuum Electroscanning Supersonic Deposition Gun
CN112718283B (en) * 2020-12-15 2023-07-04 中国人民解放军空军工程大学 Vacuum electric-sweeping multi-field energized supersonic deposition spray gun
US20240014000A1 (en) * 2022-07-11 2024-01-11 Kla Corporation Miniature electron optical column with a large field of view

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3872305A (en) * 1972-12-06 1975-03-18 Jeol Ltd Convertible scanning electron microscope
JPS5277573A (en) * 1975-12-24 1977-06-30 Hitachi Ltd Magnetic field generating device
JPS54128679A (en) * 1978-03-29 1979-10-05 Hitachi Ltd Electron lens with deflector
JPS54137977A (en) * 1978-04-19 1979-10-26 Hitachi Ltd Electron-beam exposure unit
JPS5715421A (en) * 1980-07-03 1982-01-26 Fujitsu Ltd Electron beam exposing device
JPS57118357A (en) * 1981-01-14 1982-07-23 Jeol Ltd Objective lens for scan type electron microscope
JPS57147856A (en) * 1981-03-06 1982-09-11 Koichi Kanetani Deflecting device of automatic astigmation compensation type
US4912405A (en) * 1985-08-16 1990-03-27 Schlumberger Technology Corporation Magnetic lens and electron beam deflection system
JPH0218847A (en) * 1988-07-06 1990-01-23 Jeol Ltd Charged particle beam device
JP3372138B2 (en) * 1995-06-26 2003-01-27 株式会社日立製作所 Scanning electron microscope
EP0821393B1 (en) * 1996-07-25 1999-06-16 ACT Advanced Circuit Testing Gesellschaft für Testsystementwicklung mbH Detector objective lens
DE69806897T2 (en) * 1998-04-24 2002-11-28 Advantest Corp., Tokio/Tokyo Dynamically compensated objective lens detector device and method
EP0969493A1 (en) * 1998-07-03 2000-01-05 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Apparatus and method for examining specimen with a charged particle beam
US6380546B1 (en) * 2000-01-01 2002-04-30 Applied Materials, Inc. Focusing assembly and method for a charged particle beam column
EP1120809B1 (en) * 2000-01-27 2012-02-22 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Objective lens for a charged particle beam device
WO2001097245A2 (en) * 2000-06-15 2001-12-20 Kla-Tencor, Inc. Sectored magnetic lens and method of use

Also Published As

Publication number Publication date
JP2003521096A (en) 2003-07-08
KR100499427B1 (en) 2005-07-07
US6747279B2 (en) 2004-06-08
JP3786875B2 (en) 2006-06-14
EP1120809A1 (en) 2001-08-01
EP1120809B1 (en) 2012-02-22
CN1222011C (en) 2005-10-05
US20030089859A1 (en) 2003-05-15
WO2001056056A3 (en) 2002-01-31
JP2005276819A (en) 2005-10-06
KR20020070386A (en) 2002-09-06
WO2001056056A2 (en) 2001-08-02
CN1404617A (en) 2003-03-19

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