AU2007248520B2 - System and method for improved field of view X-ray imaging using a non-stationary anode - Google Patents
System and method for improved field of view X-ray imaging using a non-stationary anode Download PDFInfo
- Publication number
- AU2007248520B2 AU2007248520B2 AU2007248520A AU2007248520A AU2007248520B2 AU 2007248520 B2 AU2007248520 B2 AU 2007248520B2 AU 2007248520 A AU2007248520 A AU 2007248520A AU 2007248520 A AU2007248520 A AU 2007248520A AU 2007248520 B2 AU2007248520 B2 AU 2007248520B2
- Authority
- AU
- Australia
- Prior art keywords
- anode
- ray
- dynamic
- collimator
- stationary
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/08—Anodes; Anti cathodes
- H01J35/10—Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
- G21K1/043—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- X-Ray Techniques (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US74648106P | 2006-05-04 | 2006-05-04 | |
| US60/746,481 | 2006-05-04 | ||
| US11/744,115 | 2007-05-03 | ||
| US11/744,115 US7529343B2 (en) | 2006-05-04 | 2007-05-03 | System and method for improved field of view X-ray imaging using a non-stationary anode |
| PCT/US2007/010843 WO2007130576A2 (fr) | 2006-05-04 | 2007-05-04 | Système et procédé pour imagerie à rayons x à champ de vision améliorée utilisant une anode non stationnaire |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| AU2007248520A1 AU2007248520A1 (en) | 2007-11-15 |
| AU2007248520B2 true AU2007248520B2 (en) | 2013-08-29 |
Family
ID=38668332
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU2007248520A Active AU2007248520B2 (en) | 2006-05-04 | 2007-05-04 | System and method for improved field of view X-ray imaging using a non-stationary anode |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US7529343B2 (fr) |
| EP (1) | EP2013643B2 (fr) |
| JP (1) | JP5175841B2 (fr) |
| AT (1) | ATE534921T1 (fr) |
| AU (1) | AU2007248520B2 (fr) |
| CA (1) | CA2650479C (fr) |
| ES (1) | ES2374316T5 (fr) |
| WO (1) | WO2007130576A2 (fr) |
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| US9099279B2 (en) * | 2012-04-26 | 2015-08-04 | American Science And Engineering, Inc. | X-ray tube with rotating anode aperture |
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| US10297359B2 (en) | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
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| US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
| US9594036B2 (en) | 2014-02-28 | 2017-03-14 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
| US9823203B2 (en) | 2014-02-28 | 2017-11-21 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
| US9305344B2 (en) | 2014-04-22 | 2016-04-05 | The Boeing Company | Method for improving linear feature detectability in digital images |
| US9398676B2 (en) | 2014-05-05 | 2016-07-19 | The Boeing Company | System and method for quantifying X-ray backscatter system performance |
| US9851312B2 (en) | 2014-05-07 | 2017-12-26 | The Boeing Company | Backscatter inspection systems, and related methods |
| US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
| US9658173B2 (en) | 2014-07-30 | 2017-05-23 | The Boeing Company | Portable x-ray backscattering imaging system including a radioactive source |
| US10535491B2 (en) | 2015-01-20 | 2020-01-14 | American Science And Engineering, Inc. | Dynamically adjustable focal spot |
| US9739727B2 (en) | 2015-01-21 | 2017-08-22 | The Boeing Company | Systems and methods for aligning an aperture |
| US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
| US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
| US9501838B1 (en) | 2015-08-24 | 2016-11-22 | The Boeing Company | Systems and methods for determining boundaries of features in digital images |
| US10317349B2 (en) | 2015-11-30 | 2019-06-11 | The Boeing Company | X-ray scatter systems and methods for detecting structural variations |
| US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
| WO2018175570A1 (fr) | 2017-03-22 | 2018-09-27 | Sigray, Inc. | Procédé de réalisation d'une spectroscopie des rayons x et système de spectromètre d'absorption de rayons x |
| US10983074B2 (en) | 2017-05-11 | 2021-04-20 | The Boeing Company | Visual light calibrator for an x-ray backscattering imaging system |
| US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
| CN108419356B (zh) * | 2018-05-16 | 2023-09-22 | 中国工程物理研究院流体物理研究所 | 用于提升回旋加速器内离子源寿命的方法及离子源设备 |
| US10845491B2 (en) | 2018-06-04 | 2020-11-24 | Sigray, Inc. | Energy-resolving x-ray detection system |
| GB2591630B (en) | 2018-07-26 | 2023-05-24 | Sigray Inc | High brightness x-ray reflection source |
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| US10962491B2 (en) | 2018-09-04 | 2021-03-30 | Sigray, Inc. | System and method for x-ray fluorescence with filtering |
| DE112019004478T5 (de) | 2018-09-07 | 2021-07-08 | Sigray, Inc. | System und verfahren zur röntgenanalyse mit wählbarer tiefe |
| US11315751B2 (en) * | 2019-04-25 | 2022-04-26 | The Boeing Company | Electromagnetic X-ray control |
| US11152183B2 (en) | 2019-07-15 | 2021-10-19 | Sigray, Inc. | X-ray source with rotating anode at atmospheric pressure |
| US11554544B2 (en) * | 2019-09-20 | 2023-01-17 | The Boeing Company | Additive manufacturing system with x-ray backscatter imaging system and method of inspecting a structure during additive manufacturing of the structure |
| US11293884B2 (en) | 2020-01-07 | 2022-04-05 | The Boeing Company | Multi source backscattering |
| US11257653B2 (en) * | 2020-03-27 | 2022-02-22 | The Boeing Company | Integrated aperture shield for x-ray tubes |
| US11169098B2 (en) | 2020-04-02 | 2021-11-09 | The Boeing Company | System, method, and apparatus for x-ray backscatter inspection of parts |
| US12163903B2 (en) | 2021-05-12 | 2024-12-10 | The Boeing Company | System, method, and apparatus for x-ray backscatter inspection of parts |
| US12253479B1 (en) * | 2021-12-08 | 2025-03-18 | Jaywant Philip Parmar | Space-based x-ray imaging system |
| CN118541772A (zh) | 2022-01-13 | 2024-08-23 | 斯格瑞公司 | 用于生成高通量低能量x射线的微焦x射线源 |
| US12360067B2 (en) | 2022-03-02 | 2025-07-15 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| WO2024173256A1 (fr) | 2023-02-16 | 2024-08-22 | Sigray, Inc. | Système détecteur de rayons x avec au moins deux diffracteurs de bragg plats empilés |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4107563A (en) * | 1976-04-28 | 1978-08-15 | Emi Limited | X-ray generating tubes |
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-
2007
- 2007-05-03 US US11/744,115 patent/US7529343B2/en active Active
- 2007-05-04 ES ES07756210.6T patent/ES2374316T5/es active Active
- 2007-05-04 CA CA2650479A patent/CA2650479C/fr active Active
- 2007-05-04 AU AU2007248520A patent/AU2007248520B2/en active Active
- 2007-05-04 JP JP2009509743A patent/JP5175841B2/ja active Active
- 2007-05-04 EP EP07756210.6A patent/EP2013643B2/fr active Active
- 2007-05-04 WO PCT/US2007/010843 patent/WO2007130576A2/fr not_active Ceased
- 2007-05-04 AT AT07756210T patent/ATE534921T1/de active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4107563A (en) * | 1976-04-28 | 1978-08-15 | Emi Limited | X-ray generating tubes |
Also Published As
| Publication number | Publication date |
|---|---|
| CA2650479C (fr) | 2017-01-10 |
| CA2650479A1 (fr) | 2007-11-15 |
| EP2013643B1 (fr) | 2011-11-23 |
| ATE534921T1 (de) | 2011-12-15 |
| US20070269014A1 (en) | 2007-11-22 |
| EP2013643B2 (fr) | 2015-08-26 |
| ES2374316T5 (es) | 2015-10-22 |
| JP2009535788A (ja) | 2009-10-01 |
| US7529343B2 (en) | 2009-05-05 |
| JP5175841B2 (ja) | 2013-04-03 |
| WO2007130576A2 (fr) | 2007-11-15 |
| WO2007130576A3 (fr) | 2008-02-07 |
| AU2007248520A1 (en) | 2007-11-15 |
| ES2374316T3 (es) | 2012-02-15 |
| EP2013643A2 (fr) | 2009-01-14 |
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| FGA | Letters patent sealed or granted (standard patent) |