BR8600965A - Conjunto de medida do perfil transversal de espessura de um produto - Google Patents

Conjunto de medida do perfil transversal de espessura de um produto

Info

Publication number
BR8600965A
BR8600965A BR8600965A BR8600965A BR8600965A BR 8600965 A BR8600965 A BR 8600965A BR 8600965 A BR8600965 A BR 8600965A BR 8600965 A BR8600965 A BR 8600965A BR 8600965 A BR8600965 A BR 8600965A
Authority
BR
Brazil
Prior art keywords
product
measurement set
cross profile
thickness cross
thickness
Prior art date
Application number
BR8600965A
Other languages
English (en)
Portuguese (pt)
Inventor
Gerard Tourscher
Maurice Wanin
Original Assignee
Siderurgie Fse Inst Rech
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siderurgie Fse Inst Rech filed Critical Siderurgie Fse Inst Rech
Publication of BR8600965A publication Critical patent/BR8600965A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Paper (AREA)
BR8600965A 1985-03-07 1986-03-06 Conjunto de medida do perfil transversal de espessura de um produto BR8600965A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8503380A FR2578643B1 (fr) 1985-03-07 1985-03-07 Ensemble de mesure du profil transversal d'epaisseur d'un produit

Publications (1)

Publication Number Publication Date
BR8600965A true BR8600965A (pt) 1986-11-18

Family

ID=9316972

Family Applications (1)

Application Number Title Priority Date Filing Date
BR8600965A BR8600965A (pt) 1985-03-07 1986-03-06 Conjunto de medida do perfil transversal de espessura de um produto

Country Status (9)

Country Link
JP (1) JPS61207912A (fr)
KR (1) KR860007534A (fr)
BE (1) BE904362A (fr)
BR (1) BR8600965A (fr)
DE (1) DE3607593A1 (fr)
ES (1) ES8706258A1 (fr)
FR (1) FR2578643B1 (fr)
LU (1) LU86332A1 (fr)
NL (1) NL8600456A (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2704643B1 (fr) * 1993-04-26 1995-06-23 Lorraine Laminage Procede et dispositf d'etalonnage pour un ensemble de mesure du profil transversal d'epaisseur d'un produit plat.
DE19913929A1 (de) 1999-03-26 2000-09-28 Voith Sulzer Papiertech Patent Vorrichtung und Verfahren zum Bestimmen von Eigenschaften einer Materialbahn
DE102006054716A1 (de) * 2006-11-19 2008-05-29 Heraeus Kulzer Gmbh Anordnung zur Erfassung von Oberflächenkonturen an Objekten, insbesondere im zahnmedizinischen Bereich

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7705788A (nl) * 1977-05-26 1978-11-28 Philips Nv Inrichting voor computer-tomografie.
DE3140714A1 (de) * 1981-10-14 1983-04-28 Paul Ing.(Grad.) Flormann Vorrichtung zur dickenmessung von flachprofilen
JPS5890112A (ja) * 1981-11-26 1983-05-28 Toshiba Corp 放射線厚さ計

Also Published As

Publication number Publication date
LU86332A1 (fr) 1986-06-10
ES552718A0 (es) 1987-06-01
FR2578643A1 (fr) 1986-09-12
NL8600456A (nl) 1986-10-01
BE904362A (fr) 1986-06-30
KR860007534A (ko) 1986-10-13
ES8706258A1 (es) 1987-06-01
DE3607593A1 (de) 1986-09-11
FR2578643B1 (fr) 1990-03-09
JPS61207912A (ja) 1986-09-16

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Legal Events

Date Code Title Description
B21A Expiry acc. art. 78, item i of ipl- expiry of the term of protection

Free format text: PATENTE EXTINTA EM 06/03/2001