BE904362A - Ensemble de mesure du profil transversal d'epaisseur d'un produit. - Google Patents

Ensemble de mesure du profil transversal d'epaisseur d'un produit.

Info

Publication number
BE904362A
BE904362A BE6/48197A BE6048197A BE904362A BE 904362 A BE904362 A BE 904362A BE 6/48197 A BE6/48197 A BE 6/48197A BE 6048197 A BE6048197 A BE 6048197A BE 904362 A BE904362 A BE 904362A
Authority
BE
Belgium
Prior art keywords
product
measuring
assembly
cross
section thickness
Prior art date
Application number
BE6/48197A
Other languages
English (en)
Inventor
Tourscher Gerard
Wanin Maurice
Original Assignee
Siderurgie Fse Inst Rech
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siderurgie Fse Inst Rech filed Critical Siderurgie Fse Inst Rech
Publication of BE904362A publication Critical patent/BE904362A/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Paper (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Une source de rayonnement (10) fixe est située d'un coté du produit avec un faisceau divergent en direction transversale par rapport au produit, pour intercepter celui-ci sur la partie de profil à mesurer, et un dispositif de détection (20) s'étend transversalement par rapport au produit, de l'autre coté de celui-ci et comporte au moins une rangée de détecteurs élémentaires juxtaposés qui produisent chacun un signal fonction de la quantité de rayonnement reçu, un cirucuit de traitement élaborant une information représentative du profil recherché.
BE6/48197A 1985-03-07 1986-03-06 Ensemble de mesure du profil transversal d'epaisseur d'un produit. BE904362A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8503380A FR2578643B1 (fr) 1985-03-07 1985-03-07 Ensemble de mesure du profil transversal d'epaisseur d'un produit

Publications (1)

Publication Number Publication Date
BE904362A true BE904362A (fr) 1986-06-30

Family

ID=9316972

Family Applications (1)

Application Number Title Priority Date Filing Date
BE6/48197A BE904362A (fr) 1985-03-07 1986-03-06 Ensemble de mesure du profil transversal d'epaisseur d'un produit.

Country Status (9)

Country Link
JP (1) JPS61207912A (fr)
KR (1) KR860007534A (fr)
BE (1) BE904362A (fr)
BR (1) BR8600965A (fr)
DE (1) DE3607593A1 (fr)
ES (1) ES8706258A1 (fr)
FR (1) FR2578643B1 (fr)
LU (1) LU86332A1 (fr)
NL (1) NL8600456A (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2704643B1 (fr) * 1993-04-26 1995-06-23 Lorraine Laminage Procede et dispositf d'etalonnage pour un ensemble de mesure du profil transversal d'epaisseur d'un produit plat.
DE19913929A1 (de) * 1999-03-26 2000-09-28 Voith Sulzer Papiertech Patent Vorrichtung und Verfahren zum Bestimmen von Eigenschaften einer Materialbahn
DE102006054716A1 (de) * 2006-11-19 2008-05-29 Heraeus Kulzer Gmbh Anordnung zur Erfassung von Oberflächenkonturen an Objekten, insbesondere im zahnmedizinischen Bereich

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7705788A (nl) * 1977-05-26 1978-11-28 Philips Nv Inrichting voor computer-tomografie.
DE3140714A1 (de) * 1981-10-14 1983-04-28 Paul Ing.(Grad.) Flormann Vorrichtung zur dickenmessung von flachprofilen
JPS5890112A (ja) * 1981-11-26 1983-05-28 Toshiba Corp 放射線厚さ計

Also Published As

Publication number Publication date
KR860007534A (ko) 1986-10-13
FR2578643B1 (fr) 1990-03-09
NL8600456A (nl) 1986-10-01
ES8706258A1 (es) 1987-06-01
FR2578643A1 (fr) 1986-09-12
ES552718A0 (es) 1987-06-01
LU86332A1 (fr) 1986-06-10
DE3607593A1 (de) 1986-09-11
BR8600965A (pt) 1986-11-18
JPS61207912A (ja) 1986-09-16

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Legal Events

Date Code Title Description
RE Patent lapsed

Owner name: INSTITUT DE RECHERCHES DE LA SIDERURGIE FRANCAISE

Effective date: 20020331