BRPI0600265A - métodos e sistema para a inspeção de componentes fabricados - Google Patents

métodos e sistema para a inspeção de componentes fabricados

Info

Publication number
BRPI0600265A
BRPI0600265A BRPI0600265-0A BRPI0600265A BRPI0600265A BR PI0600265 A BRPI0600265 A BR PI0600265A BR PI0600265 A BRPI0600265 A BR PI0600265A BR PI0600265 A BRPI0600265 A BR PI0600265A
Authority
BR
Brazil
Prior art keywords
inspection
methods
manufactured components
component
point data
Prior art date
Application number
BRPI0600265-0A
Other languages
English (en)
Inventor
Douglas Edward Ingram
Francis Howard Little
Melvin Howard Wilkins
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of BRPI0600265A publication Critical patent/BRPI0600265A/pt
Publication of BRPI0600265B1 publication Critical patent/BRPI0600265B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G01B7/293—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures for measuring radius of curvature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Image Processing (AREA)

Abstract

"MéTODO E SISTEMAS PARA A INSPEçãO DE COMPONENTES FABRICADOS". São fornecidos métodos e dispositivos para a inspeção de um componente (29). O método compreende receber (408) uma pluralidade de dados de pontos os quais definem o formato do componente, ajustar (410) os dados de pontos recebidos a uma curva a qual define um formato modelo predeterminado, e comparar (412) os dados de pontos recebidos com a curva que define o formato modelo predeterminado para determinar o raio de abertura do componente.
BRPI0600265-0A 2005-01-18 2006-01-18 Methods and system for the inspection of manufactured components BRPI0600265B1 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/037,798 2005-01-18
US11/037,798 US7346999B2 (en) 2005-01-18 2005-01-18 Methods and system for inspection of fabricated components

Publications (2)

Publication Number Publication Date
BRPI0600265A true BRPI0600265A (pt) 2006-10-03
BRPI0600265B1 BRPI0600265B1 (pt) 2017-11-14

Family

ID=36258367

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0600265-0A BRPI0600265B1 (pt) 2005-01-18 2006-01-18 Methods and system for the inspection of manufactured components

Country Status (6)

Country Link
US (1) US7346999B2 (pt)
EP (1) EP1681532B1 (pt)
JP (1) JP5265082B2 (pt)
BR (1) BRPI0600265B1 (pt)
CA (1) CA2532935C (pt)
SG (1) SG124371A1 (pt)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI274847B (en) * 2005-09-23 2007-03-01 Fu-Kue Chang Measuring apparatus for a bottom surface of an object
US7925075B2 (en) * 2007-05-07 2011-04-12 General Electric Company Inspection system and methods with autocompensation for edge break gauging orientation
US8010315B2 (en) * 2007-11-27 2011-08-30 General Electric Company Multi-modality inspection method with data validation and data fusion
US7840367B2 (en) * 2007-11-28 2010-11-23 General Electric Company Multi-modality inspection system
JP5218957B2 (ja) * 2007-12-21 2013-06-26 株式会社ミツトヨ 形状測定装置、形状測定方法、及び形状測定プログラム
US7784195B1 (en) * 2009-02-20 2010-08-31 Gm Global Technology Operations, Inc. Method of displaying contours of a surface of a bearing
US8526705B2 (en) * 2009-06-10 2013-09-03 Apple Inc. Driven scanning alignment for complex shapes
GB201104410D0 (en) 2011-03-16 2011-04-27 Rolls Royce Plc A method of measuring a component
EP2998696B1 (en) * 2014-09-18 2021-01-06 Hexagon Technology Center GmbH Method for compensating lobing behaviour of a CMM touch probe
CN108981526B (zh) * 2018-05-30 2020-02-11 中国航发动力股份有限公司 一种用于测量航空发动机叶片燕尾型榫头直线度的夹具

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US5345514A (en) * 1991-09-16 1994-09-06 General Electric Company Method for inspecting components having complex geometric shapes
DE4223483C2 (de) 1992-07-14 1997-12-11 Thyssen Industrie Verfahren zur Bestimmung der Form- und Lageabweichungen von Fertigungsteilen
JP2572936B2 (ja) * 1992-10-15 1997-01-16 株式会社ミツトヨ 形状測定機
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JP2701141B2 (ja) * 1995-05-23 1998-01-21 株式会社ミツトヨ 真円度測定装置
JP2727067B2 (ja) * 1995-06-13 1998-03-11 株式会社ミツトヨ 形状測定機
JP3078733B2 (ja) * 1995-10-04 2000-08-21 科学技術振興事業団 三次元曲率の測定方法
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AU7079198A (en) * 1997-04-25 1998-11-24 Amada Metrecs Company, Limited Method of discriminating shape errors of free-form curved surface
US6094269A (en) * 1997-12-31 2000-07-25 Metroptic Technologies, Ltd. Apparatus and method for optically measuring an object surface contour
JPH11211452A (ja) * 1998-01-29 1999-08-06 Mazda Motor Corp 構造体の形状誤差評価装置及び評価方法及びコンピュータ読み取りが可能な記憶媒体
US6714679B1 (en) * 1998-02-05 2004-03-30 Cognex Corporation Boundary analyzer
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JP3821739B2 (ja) * 2002-03-22 2006-09-13 株式会社ミツトヨ 測定データ整形方法
US6907358B2 (en) * 2003-01-30 2005-06-14 General Electric Company Eddy current inspection method
US7327857B2 (en) 2004-03-09 2008-02-05 General Electric Company Non-contact measurement method and apparatus
US7317992B2 (en) * 2004-06-16 2008-01-08 General Electric Company Method and apparatus for inspecting dovetail edgebreak contour

Also Published As

Publication number Publication date
BRPI0600265B1 (pt) 2017-11-14
EP1681532B1 (en) 2012-12-19
EP1681532A3 (en) 2009-06-17
EP1681532A2 (en) 2006-07-19
US20060156566A1 (en) 2006-07-20
CA2532935A1 (en) 2006-07-18
JP5265082B2 (ja) 2013-08-14
SG124371A1 (en) 2006-08-30
JP2006201164A (ja) 2006-08-03
US7346999B2 (en) 2008-03-25
CA2532935C (en) 2014-08-26

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Legal Events

Date Code Title Description
B06A Patent application procedure suspended [chapter 6.1 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]
B21F Lapse acc. art. 78, item iv - on non-payment of the annual fees in time

Free format text: REFERENTE A 16A ANUIDADE.

B24J Lapse because of non-payment of annual fees (definitively: art 78 iv lpi, resolution 113/2013 art. 12)

Free format text: EM VIRTUDE DA EXTINCAO PUBLICADA NA RPI 2653 DE 09-11-2021 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDA A EXTINCAO DA PATENTE E SEUS CERTIFICADOS, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.