BRPI0901307A2 - detecção de fuga de corrente por meio de opto-chaves - Google Patents

detecção de fuga de corrente por meio de opto-chaves

Info

Publication number
BRPI0901307A2
BRPI0901307A2 BRPI0901307-5A BRPI0901307A BRPI0901307A2 BR PI0901307 A2 BRPI0901307 A2 BR PI0901307A2 BR PI0901307 A BRPI0901307 A BR PI0901307A BR PI0901307 A2 BRPI0901307 A2 BR PI0901307A2
Authority
BR
Brazil
Prior art keywords
opto
coupled
sensor resistor
test signal
leakage detection
Prior art date
Application number
BRPI0901307-5A
Other languages
English (en)
Inventor
Eitan Meyer
Original Assignee
Biosense Webster Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=40538051&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=BRPI0901307(A2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Biosense Webster Inc filed Critical Biosense Webster Inc
Publication of BRPI0901307A2 publication Critical patent/BRPI0901307A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/025—Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
    • G01R31/275—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements for testing individual semiconductor components within integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)
  • Measuring And Recording Apparatus For Diagnosis (AREA)
  • Keying Circuit Devices (AREA)
  • External Artificial Organs (AREA)

Abstract

DETECçãO DE FUGA DE CORRENTE POR MEIO DE OPTO-CHAVES. A presente invenção refere-se a um aparelho para testar um opto-chave que inclui um primeiro resistor sensor acopíado entre uma fonte de força e uma entrada do opto-chave, e um segundo resistor sensor acopíado a uma saída do opto-chave. Um circuito de teste é acopíado para detectar uma primeira corrente que flui através do primeiro resistor sensor e uma segunda corrente que flui através do segundo resistor sensor e para gerar um sinal de teste em resposta a uma relação entre as primeira e segunda correntes. Um controlador é acoplado para receber o sinal de teste e para realizar uma ação de proteção quando o sinal de teste excede um limite predeterminado.
BRPI0901307-5A 2008-01-21 2009-01-21 detecção de fuga de corrente por meio de opto-chaves BRPI0901307A2 (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/017,137 US7911754B2 (en) 2008-01-21 2008-01-21 Detection of current leakage through opto-switches

Publications (1)

Publication Number Publication Date
BRPI0901307A2 true BRPI0901307A2 (pt) 2009-11-03

Family

ID=40538051

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0901307-5A BRPI0901307A2 (pt) 2008-01-21 2009-01-21 detecção de fuga de corrente por meio de opto-chaves

Country Status (11)

Country Link
US (1) US7911754B2 (pt)
EP (1) EP2081033B1 (pt)
JP (1) JP5755399B2 (pt)
KR (1) KR101527733B1 (pt)
CN (1) CN101515021A (pt)
AU (1) AU2009200189B2 (pt)
BR (1) BRPI0901307A2 (pt)
CA (1) CA2650306C (pt)
ES (1) ES2707821T3 (pt)
IL (1) IL196566A (pt)
MX (1) MX2009000823A (pt)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114607155A (zh) * 2022-03-18 2022-06-10 东莞市简从科技有限公司 一种自动铺料设备

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8386849B2 (en) * 2010-01-29 2013-02-26 Honeywell International Inc. Noisy monitor detection and intermittent fault isolation
US8130032B1 (en) * 2010-09-29 2012-03-06 Texas Instruments Incorporated Systems and methods for high-sensitivity detection of input bias current
US8600334B2 (en) * 2011-07-13 2013-12-03 Biosense Webster (Israel), Ltd. Patient leakage current limitation
WO2013077882A1 (en) * 2011-11-23 2013-05-30 Intel Corporation Current tests for i/o interface connectors
WO2019116449A1 (ja) * 2017-12-12 2019-06-20 オリンパス株式会社 処置システム
CN108183634B (zh) * 2018-01-19 2024-04-19 浙江正泰电器股份有限公司 具有旁路开关故障保护的软起动器
CN113721070B (zh) * 2020-05-26 2024-03-29 天津首瑞智能电气有限公司 一种剩余电流检测装置和剩余电流检测方法
CN114779118B (zh) * 2022-04-20 2024-10-11 中国第一汽车股份有限公司 漏电检测装置、漏电检测方法和汽车充电设备
CN114878945B (zh) * 2022-05-31 2025-07-29 广东奥普特科技股份有限公司 一种检测光耦输出状态的隔离反馈电路
CN115372781B (zh) * 2022-08-31 2025-11-14 长鑫存储技术有限公司 晶体管软击穿检测方法、装置、介质及设备
CN116466149B (zh) * 2023-02-28 2024-01-16 济南铸锻所检验检测科技有限公司 一种光电保护装置响应时间检测的装置
WO2025052827A1 (ja) * 2023-09-07 2025-03-13 ローム株式会社 過電流保護回路、半導体装置、電子機器、車両

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US3963981A (en) 1974-10-09 1976-06-15 J. M. Richards Laboratories Leakage and continuity tester
US4142150A (en) * 1977-06-27 1979-02-27 Western Electric Company, Inc. High-speed measurement of ICEO in transistors and opto-isolators
US4216462A (en) * 1978-03-06 1980-08-05 General Electric Company Patient monitoring and data processing system
JPS62227370A (ja) * 1986-03-29 1987-10-06 理研医療電機株式会社 低周波電気治療器
JPH02183176A (ja) * 1989-01-10 1990-07-17 Yamatake Honeywell Co Ltd ヒーターの断線検出装置
JPH04238272A (ja) * 1991-01-22 1992-08-26 Nippon Inter Electronics Corp 漏洩電流検知機能を備えた電力供給回路
US5323014A (en) 1993-03-01 1994-06-21 Aeg Transportation Systems, Inc. Optocoupler built-in self test for applications requiring isolation
DE19510333C1 (de) * 1995-03-22 1996-10-31 Pilz Gmbh & Co Schaltungsanordnung und Verfahren zum Testen von Optokopplern
JP3452445B2 (ja) * 1996-07-23 2003-09-29 株式会社日立産機システム 漏電遮断器
JP3611783B2 (ja) * 2000-09-25 2005-01-19 シャープ株式会社 半導体装置の選別方法
TW490393B (en) * 2001-02-09 2002-06-11 Ind Tech Res Inst Apparatus for detecting of heating device for optical printing head of hot bubble type printer
DE60319770T2 (de) * 2002-05-29 2009-04-23 Imec Vzw, Interuniversitair Microelectronica Centrum Vzw Gerät und Verfahren, um die Leistung von Mikromaschinen oder mikroelektromechanischen Bauelementen zu bestimmen
JP4082676B2 (ja) * 2003-05-29 2008-04-30 株式会社デンソー 漏電検出装置の検査システム
CN2694288Y (zh) * 2004-03-26 2005-04-20 佛山市创电电源设备有限公司 开关柜漏电流检测报警装置
JP2005279033A (ja) * 2004-03-30 2005-10-13 Niigata Tlo:Kk 電池式低漏洩電流アイソレータ
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DE102006030114B4 (de) * 2006-06-28 2010-09-09 Phoenix Contact Gmbh & Co. Kg Sichere Eingangsschaltung mit einkanaligem Peripherieanschluss für den Eingang eines Busteilnehmers
JP4238272B2 (ja) 2007-05-08 2009-03-18 本田技研工業株式会社 電動ミラー制御装置および電動ミラー制御方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114607155A (zh) * 2022-03-18 2022-06-10 东莞市简从科技有限公司 一种自动铺料设备
CN114607155B (zh) * 2022-03-18 2023-11-24 东莞市简从科技有限公司 一种自动铺料设备

Also Published As

Publication number Publication date
JP2009172375A (ja) 2009-08-06
AU2009200189B2 (en) 2012-08-30
US7911754B2 (en) 2011-03-22
CA2650306A1 (en) 2009-07-21
EP2081033A1 (en) 2009-07-22
US20090185320A1 (en) 2009-07-23
MX2009000823A (es) 2009-08-12
ES2707821T3 (es) 2019-04-05
EP2081033B1 (en) 2018-12-12
KR101527733B1 (ko) 2015-06-10
JP5755399B2 (ja) 2015-07-29
CN101515021A (zh) 2009-08-26
CA2650306C (en) 2016-11-01
AU2009200189A1 (en) 2009-08-06
IL196566A (en) 2012-03-29
KR20090080483A (ko) 2009-07-24
IL196566A0 (en) 2009-09-22

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Legal Events

Date Code Title Description
B03A Publication of a patent application or of a certificate of addition of invention [chapter 3.1 patent gazette]
B06T Formal requirements before examination [chapter 6.20 patent gazette]
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 10A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2497 DE 13-11-2018 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.