BRPI1007266A2 - aparelhos e métodos para separação, e para separação e transferência de pastilha. - Google Patents
aparelhos e métodos para separação, e para separação e transferência de pastilha.Info
- Publication number
- BRPI1007266A2 BRPI1007266A2 BRPI1007266A BRPI1007266A BRPI1007266A2 BR PI1007266 A2 BRPI1007266 A2 BR PI1007266A2 BR PI1007266 A BRPI1007266 A BR PI1007266A BR PI1007266 A BRPI1007266 A BR PI1007266A BR PI1007266 A2 BRPI1007266 A2 BR PI1007266A2
- Authority
- BR
- Brazil
- Prior art keywords
- separating
- methods
- transferring tablets
- tablets
- transferring
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G59/00—De-stacking of articles
- B65G59/02—De-stacking from the top of the stack
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/10—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H10P70/15—Cleaning before device manufacture, i.e. Begin-Of-Line process by wet cleaning only
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0416—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0428—Apparatus for mechanical treatment or grinding or cutting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/34—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/34—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H10P72/3411—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
- H10P72/3412—Batch transfer of wafers
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Manufacturing & Machinery (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Weting (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009004709 | 2009-01-13 | ||
| PCT/JP2010/050233 WO2010082567A1 (ja) | 2009-01-13 | 2010-01-12 | ウエハ分離装置、ウエハ分離搬送装置、ウエハ分離方法、ウエハ分離搬送方法及び太陽電池用ウエハ分離搬送方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BRPI1007266A2 true BRPI1007266A2 (pt) | 2016-02-10 |
Family
ID=42339821
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BRPI1007266A BRPI1007266A2 (pt) | 2009-01-13 | 2010-01-12 | aparelhos e métodos para separação, e para separação e transferência de pastilha. |
Country Status (10)
| Country | Link |
|---|---|
| US (2) | US8863957B2 (pt) |
| EP (1) | EP2388809A4 (pt) |
| JP (1) | JP5498398B2 (pt) |
| KR (1) | KR101616765B1 (pt) |
| CN (1) | CN102272913A (pt) |
| AU (1) | AU2010205243A1 (pt) |
| BR (1) | BRPI1007266A2 (pt) |
| NZ (1) | NZ593758A (pt) |
| SG (1) | SG172907A1 (pt) |
| WO (1) | WO2010082567A1 (pt) |
Families Citing this family (46)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7651666B2 (en) | 2006-04-20 | 2010-01-26 | S.C. Johnson & Son, Inc. | Air treatment device with reservoir refill |
| JP5646897B2 (ja) * | 2010-07-21 | 2014-12-24 | エア・ウォーター株式会社 | ウエハの枚葉化方法および装置 |
| KR101271917B1 (ko) * | 2011-06-28 | 2013-06-05 | 주식회사 포스코 | 오존 마이크로 버블을 이용한 세척방법 |
| JP2014207250A (ja) * | 2011-08-12 | 2014-10-30 | 株式会社安永 | ウェハ分離装置及びこれを用いたウェハの製造方法 |
| KR101249039B1 (ko) * | 2011-09-21 | 2013-04-01 | 피에스피 주식회사 | 웨이퍼 분리장치 |
| JP2013149703A (ja) * | 2012-01-18 | 2013-08-01 | Nippon Steel & Sumikin Fine Technology Co Ltd | ウエハ搬送装置 |
| JP2013161811A (ja) * | 2012-02-01 | 2013-08-19 | Shin Etsu Chem Co Ltd | 基板洗浄方法及び基板洗浄装置 |
| JP6016174B2 (ja) * | 2012-07-31 | 2016-10-26 | パナソニックIpマネジメント株式会社 | 太陽電池の製造方法 |
| CN103811374B (zh) * | 2012-11-06 | 2016-03-23 | 沈阳芯源微电子设备有限公司 | 一种晶圆浸泡装置 |
| JP5849201B2 (ja) * | 2013-05-28 | 2016-01-27 | パナソニックIpマネジメント株式会社 | 切り残し部除去装置 |
| JP5982650B2 (ja) * | 2013-12-06 | 2016-08-31 | パナソニックIpマネジメント株式会社 | ウエハ剥離装置 |
| US9562291B2 (en) * | 2014-01-14 | 2017-02-07 | Mei, Llc | Metal etch system |
| TWI564951B (zh) * | 2014-10-30 | 2017-01-01 | 台灣茂矽電子股份有限公司 | 蝕刻裝置及蝕刻方法 |
| CN106702496B (zh) * | 2015-07-20 | 2019-01-25 | 有研半导体材料有限公司 | 一种酸腐蚀去除硅晶圆表面损伤的装置及方法 |
| CN105417168A (zh) * | 2015-12-31 | 2016-03-23 | 苏州博阳能源设备有限公司 | 一种用于硅片插片机的供料槽 |
| CN107346753A (zh) * | 2016-05-06 | 2017-11-14 | 亿力鑫系统科技股份有限公司 | 浸泡设备 |
| US11220758B2 (en) * | 2016-06-15 | 2022-01-11 | Seoul Viosys Co., Ltd. | Systems and methods for thermal hydro-synthesis of semiconductor materials by holding a substrate wafer within a chamber in a vertical direction |
| KR101905692B1 (ko) | 2016-11-15 | 2018-10-12 | 한국에너지기술연구원 | 마이크로 버블과 와이어 방전 가공을 이용한 실리콘 잉곳 절단장치, 및 실리콘 잉곳 절단방법 |
| CN106784138B (zh) * | 2016-12-05 | 2018-07-06 | 浙江尚越新能源开发有限公司 | 一种太阳能电池切割系统的切割装置 |
| US10631733B2 (en) * | 2017-03-13 | 2020-04-28 | Go!Foton Holdings, Inc. | Lens combination for an optical probe and assembly thereof |
| CN110416351A (zh) * | 2018-04-27 | 2019-11-05 | 北京创昱科技有限公司 | 晶片加工系统 |
| CN109262869B (zh) * | 2018-10-26 | 2020-11-03 | 晶科能源有限公司 | 一种光伏切片的分片辅助液及分片方法 |
| CN109335707A (zh) * | 2018-11-01 | 2019-02-15 | 浙江中晶新材料研究有限公司 | 一种硅片自分片传送定位系统 |
| KR102101265B1 (ko) * | 2018-11-19 | 2020-04-16 | 이충석 | 슬림로드 디본딩 장치 |
| CN112185841B (zh) * | 2019-07-05 | 2024-11-15 | 弘塑科技股份有限公司 | 卡匣旋转设备和卡匣 |
| TWI740175B (zh) * | 2019-07-05 | 2021-09-21 | 弘塑科技股份有限公司 | 卡匣旋轉設備和卡匣 |
| JP7303689B2 (ja) * | 2019-07-31 | 2023-07-05 | 株式会社ディスコ | エッチング装置およびウェーハ支持具 |
| KR102751035B1 (ko) * | 2019-12-19 | 2025-01-07 | 삼성디스플레이 주식회사 | 박리 장치 및 그를 이용한 표시 장치의 제조 방법 |
| CN111092036B (zh) * | 2020-03-23 | 2020-07-14 | 杭州众硅电子科技有限公司 | 一种晶圆清洗干燥装置 |
| KR102368658B1 (ko) * | 2020-06-01 | 2022-02-28 | 에스케이실트론 주식회사 | Asc 공정 자동화 장치 |
| CN213595397U (zh) * | 2020-07-10 | 2021-07-02 | 深圳市盛利达数控设备有限公司 | 片料分离装置 |
| CN112371562A (zh) * | 2020-10-22 | 2021-02-19 | 广东新一代工业互联网创新技术有限公司 | 一种基于自动化管理的物料筛分方法及装置 |
| TWI835028B (zh) * | 2020-11-30 | 2024-03-11 | 南韓商細美事有限公司 | 用於處理基板之設備 |
| CN112847851A (zh) * | 2020-12-31 | 2021-05-28 | 常州时创能源股份有限公司 | 一种单晶硅棒的加工方法、硅片、电池片和光伏组件 |
| KR102584510B1 (ko) * | 2021-07-29 | 2023-10-06 | 세메스 주식회사 | 기판 처리 장치 |
| JP7720209B2 (ja) * | 2021-09-24 | 2025-08-07 | 株式会社Screenホールディングス | 基板処理方法、および、基板処理装置 |
| KR102624574B1 (ko) * | 2021-09-29 | 2024-01-16 | 세메스 주식회사 | 기판 처리 장치 |
| CN218182182U (zh) * | 2022-08-25 | 2022-12-30 | 内蒙古中环光伏材料有限公司 | 一种可用于传输超薄硅片的黑轮 |
| CN115295470B (zh) * | 2022-10-08 | 2022-12-27 | 四川上特科技有限公司 | 一种晶圆片转移装置及腐蚀方法 |
| JP7733061B2 (ja) * | 2023-06-08 | 2025-09-02 | 株式会社Screenホールディングス | 液中姿勢変換装置及びそれを備えた基板処理装置 |
| JP7796697B2 (ja) * | 2023-06-08 | 2026-01-09 | 株式会社Screenホールディングス | 基板処理装置 |
| JP7733066B2 (ja) * | 2023-06-27 | 2025-09-02 | 株式会社Screenホールディングス | 基板処理システム |
| KR102654953B1 (ko) * | 2023-06-30 | 2024-05-08 | 주식회사 유닉 | 기판 후처리 장치 |
| JP7796703B2 (ja) * | 2023-07-25 | 2026-01-09 | 株式会社Screenホールディングス | 姿勢変換装置及びそれを備えた基板処理装置 |
| CN117283729B (zh) * | 2023-11-14 | 2026-01-30 | 无锡京运通科技有限公司 | 单晶硅片的切削清洗装置及方法 |
| CN118412307B (zh) * | 2024-07-02 | 2024-09-27 | 江苏晟驰微电子有限公司 | 一种自平衡式抗静电晶圆载具 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3160483B2 (ja) * | 1994-11-11 | 2001-04-25 | 株式会社カイジョー | 基板自動処理装置 |
| US5950643A (en) * | 1995-09-06 | 1999-09-14 | Miyazaki; Takeshiro | Wafer processing system |
| JP3377161B2 (ja) | 1995-12-25 | 2003-02-17 | 株式会社日平トヤマ | ウエハの処理システム |
| US5983907A (en) * | 1997-08-05 | 1999-11-16 | Seh America, Inc. | Method of drying semiconductor wafers using hot deionized water and infrared drying |
| JPH11214336A (ja) | 1998-01-21 | 1999-08-06 | Sugino Mach Ltd | 半導体ウエハ洗浄方法及び装置 |
| JPH11233461A (ja) | 1998-02-12 | 1999-08-27 | Sugino Mach Ltd | 半導体ウエハ洗浄装置 |
| DE19904834A1 (de) * | 1999-02-07 | 2000-08-10 | Acr Automation In Cleanroom | Vorrichtung zum Ablösen, Vereinzeln und Einlagern von dünnen, bruchempfindlichen scheibenförmigen Substraten |
| JP2000311877A (ja) * | 1999-04-26 | 2000-11-07 | Nippon Electric Glass Co Ltd | 板状体の洗浄方法及び洗浄装置 |
| JP2003100703A (ja) * | 2001-09-26 | 2003-04-04 | Seiko Epson Corp | 液体処理方法、液体処理装置、及び、フラットパネル表示装置の製造方法 |
| TW200303581A (en) * | 2002-02-28 | 2003-09-01 | Tech Ltd A | Method and apparatus for cleaning and drying semiconductor wafer |
| US6875289B2 (en) * | 2002-09-13 | 2005-04-05 | Fsi International, Inc. | Semiconductor wafer cleaning systems and methods |
| US20040050408A1 (en) * | 2002-09-13 | 2004-03-18 | Christenson Kurt K. | Treatment systems and methods |
| JP2006310456A (ja) * | 2005-04-27 | 2006-11-09 | Dainippon Screen Mfg Co Ltd | パーティクル除去方法および基板処理装置 |
| EP1926580B1 (en) * | 2005-07-01 | 2010-03-24 | Rec Scanwafer AS | Reduction of attraction forces between silicon wafers |
| DE102006011870B4 (de) * | 2006-03-15 | 2010-06-10 | Rena Gmbh | Vereinzelungsvorrichtung und Verfahren zur stückweisen Bereitstellung plattenförmiger Gegenstände |
| JP2007258512A (ja) * | 2006-03-24 | 2007-10-04 | Dainippon Screen Mfg Co Ltd | 基板処理装置および基板処理方法 |
| US20080146003A1 (en) | 2006-12-19 | 2008-06-19 | Rec Scanwafer As | Method and device for separating silicon wafers |
-
2010
- 2010-01-12 AU AU2010205243A patent/AU2010205243A1/en not_active Abandoned
- 2010-01-12 KR KR1020117018739A patent/KR101616765B1/ko not_active Expired - Fee Related
- 2010-01-12 SG SG2011049798A patent/SG172907A1/en unknown
- 2010-01-12 EP EP20100731236 patent/EP2388809A4/en not_active Withdrawn
- 2010-01-12 BR BRPI1007266A patent/BRPI1007266A2/pt not_active IP Right Cessation
- 2010-01-12 JP JP2010546622A patent/JP5498398B2/ja not_active Expired - Fee Related
- 2010-01-12 WO PCT/JP2010/050233 patent/WO2010082567A1/ja not_active Ceased
- 2010-01-12 CN CN201080004280.3A patent/CN102272913A/zh active Pending
- 2010-01-12 NZ NZ593758A patent/NZ593758A/xx not_active IP Right Cessation
- 2010-01-12 US US13/144,198 patent/US8863957B2/en not_active Expired - Fee Related
-
2014
- 2014-09-16 US US14/487,398 patent/US20150004741A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| EP2388809A1 (en) | 2011-11-23 |
| JP5498398B2 (ja) | 2014-05-21 |
| EP2388809A4 (en) | 2014-07-09 |
| WO2010082567A1 (ja) | 2010-07-22 |
| JPWO2010082567A1 (ja) | 2012-07-05 |
| CN102272913A (zh) | 2011-12-07 |
| US8863957B2 (en) | 2014-10-21 |
| KR101616765B1 (ko) | 2016-05-02 |
| NZ593758A (en) | 2012-11-30 |
| AU2010205243A1 (en) | 2011-07-21 |
| US20150004741A1 (en) | 2015-01-01 |
| KR20110104994A (ko) | 2011-09-23 |
| SG172907A1 (en) | 2011-08-29 |
| US20120006726A1 (en) | 2012-01-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| B25A | Requested transfer of rights approved |
Owner name: KABUSHIKI KAISHA WATANABE SHOKO (JP) |
|
| B08F | Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette] |
Free format text: REFERENTE A 7A ANUIDADE. |
|
| B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] | ||
| B350 | Update of information on the portal [chapter 15.35 patent gazette] |