BRPI1014042A2 - unidade de contato para um aparelho de teste, para testar placas de circuito impresso - Google Patents

unidade de contato para um aparelho de teste, para testar placas de circuito impresso

Info

Publication number
BRPI1014042A2
BRPI1014042A2 BRPI1014042A BRPI1014042A BRPI1014042A2 BR PI1014042 A2 BRPI1014042 A2 BR PI1014042A2 BR PI1014042 A BRPI1014042 A BR PI1014042A BR PI1014042 A BRPI1014042 A BR PI1014042A BR PI1014042 A2 BRPI1014042 A2 BR PI1014042A2
Authority
BR
Brazil
Prior art keywords
tester
printed circuit
circuit boards
contact unit
testing printed
Prior art date
Application number
BRPI1014042A
Other languages
English (en)
Inventor
Andreas Gülzow
Rüdiger Dehmerl
Original Assignee
Dtg Int Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dtg Int Gmbh filed Critical Dtg Int Gmbh
Publication of BRPI1014042A2 publication Critical patent/BRPI1014042A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
BRPI1014042A 2009-04-03 2010-04-01 unidade de contato para um aparelho de teste, para testar placas de circuito impresso BRPI1014042A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE200910016181 DE102009016181A1 (de) 2009-04-03 2009-04-03 Kontaktierungseinheit für eine Testvorrichtung zum Testen von Leiterplatten
PCT/EP2010/054410 WO2010112584A1 (de) 2009-04-03 2010-04-01 Kontaktierungseinheit für eine testvorrichtung zum testen von leiterplatten

Publications (1)

Publication Number Publication Date
BRPI1014042A2 true BRPI1014042A2 (pt) 2016-04-12

Family

ID=42308975

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI1014042A BRPI1014042A2 (pt) 2009-04-03 2010-04-01 unidade de contato para um aparelho de teste, para testar placas de circuito impresso

Country Status (9)

Country Link
US (1) US9013199B2 (pt)
EP (1) EP2414847B1 (pt)
JP (1) JP2012522976A (pt)
KR (1) KR20120007025A (pt)
CN (1) CN102388313A (pt)
BR (1) BRPI1014042A2 (pt)
DE (1) DE102009016181A1 (pt)
TW (1) TWI494569B (pt)
WO (1) WO2010112584A1 (pt)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9274166B2 (en) 2013-08-26 2016-03-01 Fujitsu Limited Pin verification device and method
CN103938256B (zh) * 2014-04-23 2016-03-30 昆山凯盈机械科技有限公司 一种pcb板用的导向板
DE102015113046A1 (de) * 2015-08-07 2017-02-09 Xcerra Corp. Positioniereinrichtung für einen Paralleltester zum Testen von Leiterplatten und Paralleltester zum Testen von Leiterplatten
CN105424984A (zh) * 2015-10-30 2016-03-23 大族激光科技产业集团股份有限公司 通用短针、微针夹具
US9958476B2 (en) * 2015-11-25 2018-05-01 Formfactor, Inc. Floating nest for a test socket
CN113728238A (zh) 2019-04-23 2021-11-30 株式会社友华 接触探针
JPWO2022085483A1 (pt) * 2020-10-22 2022-04-28
DE102020133736B3 (de) * 2020-12-16 2022-04-28 Lisa Dräxlmaier GmbH Einzelkontaktierungseinrichtung für eine prüfvorrichtung zum durchgangsprüfen eines steckverbinders und prüfvorrichtung
TW202349006A (zh) * 2022-06-01 2023-12-16 研鋐精密電子科技股份有限公司 探針頭及包含其之垂直式探針卡
WO2025178269A1 (ko) * 2024-02-20 2025-08-28 엘지이노텍 주식회사 회로 검사장치

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE34621T1 (de) 1983-12-08 1988-06-15 Martin Maelzer Adapter fuer ein leiterplattenpruefgeraet.
FR2565737B3 (fr) * 1984-06-12 1986-09-19 Feinmetall Gmbh Element de contact pour adaptateur de controle pour effectuer des controles electriques de pieces a controler notamment de circuits imprimes
US4866375A (en) * 1984-06-22 1989-09-12 Malloy James T Universal test fixture
CA1270339A (en) 1985-06-24 1990-06-12 Katsuya Nakagawa System for determining a truth of software in an information processing apparatus
ATE36197T1 (de) * 1985-09-16 1988-08-15 Mania Gmbh Vorrichtung zum elektronischen pruefen von leiterplatten oder dergleichen.
US4884024A (en) 1985-11-19 1989-11-28 Teradyne, Inc. Test pin assembly for circuit board tester
JPS62225961A (ja) * 1986-03-26 1987-10-03 Sanko Giken Kogyo Kk コンタクトプロ−ブ植設方法
DE3630548A1 (de) 1986-09-08 1988-03-10 Mania Gmbh Vorrichtung zum elektronischen pruefen von leiterplatten mit kontaktpunkten im 1/20 zoll-raster
US4935696A (en) 1987-04-16 1990-06-19 Teradyne, Inc. Test pin assembly for circuit board tester
ATE75319T1 (de) 1987-11-09 1992-05-15 Mania Gmbh Adapter fuer eine vorrichtung zur elektronischen pruefung von leiterplatten.
DE3906691A1 (de) * 1988-03-04 1989-09-14 Manfred Prokopp Kontaktiervorrichtung fuer pruefvorrichtungen zum pruefen von leiterplatten oder dgl.
EP0331163A1 (de) 1988-03-04 1989-09-06 Manfred Prokopp Kontaktiervorrichtung für Prüfvorrichtungen zum Prüfen von Leiterplatten oder dgl.
DE4035978A1 (de) * 1990-02-16 1991-08-22 Luther Erich Verfahren und vorrichtung zum laden eines adapters fuer ein leiterplattenpruefgeraet
JP3134518B2 (ja) * 1992-07-02 2001-02-13 イビデン株式会社 プリント配線板の検査治具
US5307560A (en) 1992-07-30 1994-05-03 Allen Aksu Automated test pin loading method
US5311120A (en) * 1993-01-06 1994-05-10 Bartholomew Mark R Test fixture with test function feature
US5450017A (en) * 1993-12-03 1995-09-12 Everett Charles Technologies, Inc. Test fixture having translator for grid interface
US5493230A (en) * 1994-02-25 1996-02-20 Everett Charles Technologies, Inc. Retention of test probes in translator fixtures
TW360790B (en) 1996-10-28 1999-06-11 Atg Test Systems Gmbh Printed circuit board test apparatus and method
DE19644725C1 (de) 1996-10-28 1998-04-02 Atg Test Systems Gmbh Vorrichtung und Verfahren zum Prüfen von Leiterplatten
US6066957A (en) 1997-09-11 2000-05-23 Delaware Capital Formation, Inc. Floating spring probe wireless test fixture
US5975958A (en) * 1997-10-14 1999-11-02 The Whitaker Corporation Capactive coupling adapter for an electrical connector
DE19939955A1 (de) 1999-08-23 2001-03-01 Atg Test Systems Gmbh Prüfnadel für einen Rasteranpassungsadapter einer Vorrichtung zum Testen von Leiterplatten
DE10049301A1 (de) 2000-10-04 2002-05-02 Atg Test Systems Gmbh Modul für eine Prüfvorrichtung zum Testen von Leiterplatten
US6781390B2 (en) * 2001-07-20 2004-08-24 Nhk Spring Co., Ltd. Conductive coil contact member
US7009381B2 (en) * 2002-03-21 2006-03-07 Agilent Technologies, Inc. Adapter method and apparatus for interfacing a tester with a device under test
JP2004163364A (ja) * 2002-11-15 2004-06-10 Toyo Denshi Giken Kk プローブとそれを用いたコンタクト装置
US20060261831A1 (en) * 2005-05-20 2006-11-23 Wan-Chuan Chou Integral probe and method of transmitting signal therethrough
FR2887034A1 (fr) 2005-06-08 2006-12-15 Wan Chuan Chou Sonde integree et procede de transmission d'un signal au travers
JP2007322136A (ja) * 2006-05-30 2007-12-13 Inoue Shoji Kk プリント配線板の導通検査治具
DE102006059429A1 (de) 2006-12-15 2008-06-26 Atg Luther & Maelzer Gmbh Modul für eine Prüfvorrichtung zum Testen von Leiterplatten
DE102007047269A1 (de) * 2007-10-02 2009-04-09 Atg Luther & Maelzer Gmbh Vollrasterkassette für einen Paralleltester zum Testen einer unbestückten Leiterplatte, Federkontaktstift für eine solche Vollrasterkassette sowie Adapter für einen Paralleltester zum Testen einer unbestückten Leiterplatte

Also Published As

Publication number Publication date
JP2012522976A (ja) 2012-09-27
EP2414847B1 (de) 2013-06-26
WO2010112584A1 (de) 2010-10-07
US9013199B2 (en) 2015-04-21
US20120019275A1 (en) 2012-01-26
DE102009016181A1 (de) 2010-10-14
EP2414847A1 (de) 2012-02-08
HK1163821A1 (en) 2012-09-14
CN102388313A (zh) 2012-03-21
TWI494569B (zh) 2015-08-01
KR20120007025A (ko) 2012-01-19
TW201111800A (en) 2011-04-01

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Legal Events

Date Code Title Description
B11A Dismissal acc. art.33 of ipl - examination not requested within 36 months of filing
B11Y Definitive dismissal acc. article 33 of ipl - extension of time limit for request of examination expired