PL396135A1 - Urządzenie do badania defektów służące do badania ukształtowanego arkusza - Google Patents

Urządzenie do badania defektów służące do badania ukształtowanego arkusza

Info

Publication number
PL396135A1
PL396135A1 PL396135A PL39613509A PL396135A1 PL 396135 A1 PL396135 A1 PL 396135A1 PL 396135 A PL396135 A PL 396135A PL 39613509 A PL39613509 A PL 39613509A PL 396135 A1 PL396135 A1 PL 396135A1
Authority
PL
Poland
Prior art keywords
testing
formed sheet
defects used
defects
testing defects
Prior art date
Application number
PL396135A
Other languages
English (en)
Inventor
Osamu Hirose
Original Assignee
Sumitomo Chemical Company, Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Company, Limited filed Critical Sumitomo Chemical Company, Limited
Publication of PL396135A1 publication Critical patent/PL396135A1/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8921—Streaks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
PL396135A 2008-11-21 2009-11-17 Urządzenie do badania defektów służące do badania ukształtowanego arkusza PL396135A1 (pl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008298680A JP5619348B2 (ja) 2008-11-21 2008-11-21 成形シートの欠陥検査装置

Publications (1)

Publication Number Publication Date
PL396135A1 true PL396135A1 (pl) 2011-12-05

Family

ID=42198000

Family Applications (1)

Application Number Title Priority Date Filing Date
PL396135A PL396135A1 (pl) 2008-11-21 2009-11-17 Urządzenie do badania defektów służące do badania ukształtowanego arkusza

Country Status (8)

Country Link
JP (1) JP5619348B2 (pl)
KR (1) KR20110095344A (pl)
CN (1) CN102224412A (pl)
CZ (1) CZ2011295A3 (pl)
PL (1) PL396135A1 (pl)
SK (1) SK50342011A3 (pl)
TW (1) TW201033602A (pl)
WO (1) WO2010058557A1 (pl)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103354781B (zh) * 2010-12-23 2016-03-23 倍耐力轮胎股份公司 在轮胎构建处理中用于控制半成品的生产和供给的方法和设备
WO2014034526A1 (ja) * 2012-08-28 2014-03-06 住友化学株式会社 欠陥検査装置および欠陥検査方法
CN102854193A (zh) * 2012-08-30 2013-01-02 苏州天准精密技术有限公司 一种用于图像瑕疵检测的检测方法和检测系统
KR102110006B1 (ko) * 2013-01-16 2020-05-12 스미또모 가가꾸 가부시키가이샤 화상 생성 장치, 결함 검사 장치 및 결함 검사 방법
WO2014112653A1 (ja) * 2013-01-16 2014-07-24 住友化学株式会社 画像生成装置、欠陥検査装置および欠陥検査方法
WO2014119772A1 (ja) * 2013-01-30 2014-08-07 住友化学株式会社 画像生成装置、欠陥検査装置および欠陥検査方法
TWI451076B (zh) * 2013-02-08 2014-09-01 Benq Materials Corp 光學鏡片髒汙檢測方法
JP6250317B2 (ja) * 2013-07-08 2017-12-20 住友化学株式会社 欠陥検査方法
TWI493177B (zh) * 2013-10-15 2015-07-21 Benq Materials Corp 一種檢測具週期性結構光學薄膜的瑕疵檢測方法及其檢測裝置
WO2015069218A1 (en) * 2013-11-05 2015-05-14 Compagnie Generale Des Etablissements Michelin Method and apparatus for non-destructive detection of tire anomalies
WO2016080401A1 (ja) * 2014-11-18 2016-05-26 三菱レイヨン株式会社 金属板の補修方法、及び鋳型の製造方法
JP6590653B2 (ja) * 2014-11-19 2019-10-16 首都高技術株式会社 点群データ利用システム
CN105785604A (zh) * 2014-12-24 2016-07-20 台湾动力检测科技股份有限公司 显示设备的光学层件的缺陷检测方法
CN107709628B (zh) 2015-06-26 2020-06-16 美泰乐科技(日本)股份有限公司 用于电解硬质金镀敷液的防置换剂和包含其的电解硬质金镀敷液
JP6628185B2 (ja) * 2016-03-11 2020-01-08 パナソニックＩｐマネジメント株式会社 透明体の検査方法
JP2017211325A (ja) * 2016-05-27 2017-11-30 株式会社ニレコ 欠点検査方法及び欠点検査装置
JP2017215277A (ja) * 2016-06-02 2017-12-07 住友化学株式会社 欠陥検査システム、フィルム製造装置及び欠陥検査方法
JP2017217649A (ja) * 2016-06-02 2017-12-14 国立大学法人九州大学 キャッピングシートの破損被疑箇所検出装置、キャッピングシートの破損被疑箇所検出方法、コンピュータプログラム
JP6622679B2 (ja) * 2016-10-26 2019-12-18 川崎重工業株式会社 サークルスクラッチ検査装置
KR102438892B1 (ko) * 2017-03-03 2022-08-31 스미또모 가가꾸 가부시키가이샤 결함 검사 시스템, 필름 제조 장치, 필름 제조 방법, 인자 장치 및 인자 방법
JP7054481B2 (ja) * 2017-08-24 2022-04-14 日本電気硝子株式会社 板ガラスの製造方法
JP7048342B2 (ja) * 2018-02-15 2022-04-05 株式会社島精機製作所 延反方法と延反システム
JP7389321B2 (ja) * 2018-07-31 2023-11-30 住友金属鉱山株式会社 基板の検査装置、基板の検査方法
CN110857920A (zh) * 2018-08-24 2020-03-03 东华大学 一种卷装长丝的成型不良缺陷检测方法
WO2020079567A1 (en) * 2018-10-15 2020-04-23 3M Innovative Properties Company Automated inspection for sheet parts of arbitrary shape from manufactured film
PL3934454T3 (pl) * 2019-03-05 2024-03-11 Philip Morris Products S.A. Stanowisko kontroli i sposób kontroli arkusza materiału
JP2020190441A (ja) * 2019-05-20 2020-11-26 セーレン株式会社 皺検査装置、皺判定装置及び皺検査方法
JP2023032770A (ja) * 2021-08-27 2023-03-09 株式会社東芝 二次電池のための検査システム及び検査方法
WO2023047866A1 (ja) * 2021-09-27 2023-03-30 東レ株式会社 シート状物の凹凸測定装置、シート状物の凹凸測定方法
CN116993719B (zh) * 2023-09-25 2024-10-29 惠州艺都宇正数码科技有限公司 一种oca光学薄膜表面缺陷视觉检测方法及系统
CN121304608A (zh) * 2025-10-15 2026-01-09 杭州安脉盛智能技术有限公司 一种缺陷高度估计方法、装置、设备及可读存储介质

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09159622A (ja) * 1995-12-05 1997-06-20 Kawasaki Steel Corp 表面欠陥検査装置
JP4507533B2 (ja) * 2003-08-29 2010-07-21 凸版印刷株式会社 周期性パターンにおけるスジ状ムラの検査方法
JP4882204B2 (ja) * 2004-03-05 2012-02-22 凸版印刷株式会社 周期性パターンにおけるスジ状ムラの検査方法
JP5006551B2 (ja) * 2006-02-14 2012-08-22 住友化学株式会社 欠陥検査装置及び欠陥検査方法
JP5367292B2 (ja) * 2008-03-31 2013-12-11 古河電気工業株式会社 表面検査装置および表面検査方法

Also Published As

Publication number Publication date
CZ2011295A3 (cs) 2011-11-09
CN102224412A (zh) 2011-10-19
JP5619348B2 (ja) 2014-11-05
KR20110095344A (ko) 2011-08-24
JP2010122192A (ja) 2010-06-03
TW201033602A (en) 2010-09-16
SK50342011A3 (sk) 2011-09-05
WO2010058557A1 (ja) 2010-05-27

Similar Documents

Publication Publication Date Title
GB2461138B (en) Environmental mechanical test apparatus
GB0811307D0 (en) Test apparatus
GB2494723B (en) Visual inspection device
GB2482438B (en) Surface inspecting device
GB2475006B (en) Inspection device
GB0804764D0 (en) Test apparatus
IL209000A0 (en) Inspection apparatus for lithography
PL2103928T3 (pl) Urządzenie do kontroli struktur typu plaster miodu
GB0813749D0 (en) Device for measuring air quality
GB0907605D0 (en) Apparatus for testing the quality of a fluid sample
GB2472454B (en) An apparaus for treating a test sample
GB2458777B (en) Method for the commisioning and operation of a measuring device
GB0812759D0 (en) Inspection probe
KR20080003329U (ko) 메모리모듈의 테스트용 지그
GB0808118D0 (en) Engine testing apparatus
GB0819532D0 (en) Inspection device
EP2341837A4 (en) ANALYSIS NEEDLE DEVICE
TWM345241U (en) Device for spot test
TWI346025B (en) Positioning apparatus for testing device
GB2475450B (en) Apparatus for testing swellable materials
EP2248332A4 (en) TEST DEVICE
GB2475072B (en) Alignment device for run out measurement apparatus
TWI346570B (en) Filter leak inspection apparatus
SI2141074T1 (sl) Kontrolna naprava za vsebnike
SI2078963T1 (sl) Testna naprava