BRPI1014846A2 - "método e sistema de detecção por ressonância plasmônica na superfície" - Google Patents

"método e sistema de detecção por ressonância plasmônica na superfície"

Info

Publication number
BRPI1014846A2
BRPI1014846A2 BRPI1014846A BRPI1014846A BRPI1014846A2 BR PI1014846 A2 BRPI1014846 A2 BR PI1014846A2 BR PI1014846 A BRPI1014846 A BR PI1014846A BR PI1014846 A BRPI1014846 A BR PI1014846A BR PI1014846 A2 BRPI1014846 A2 BR PI1014846A2
Authority
BR
Brazil
Prior art keywords
detection method
surface plasmon
plasmon resonance
resonance detection
resonance
Prior art date
Application number
BRPI1014846A
Other languages
English (en)
Inventor
Andrea Valsesia
Franco Marabelli
François Rossi
Pascal Colpo
Original Assignee
Europ Union
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Europ Union filed Critical Europ Union
Publication of BRPI1014846A2 publication Critical patent/BRPI1014846A2/pt
Publication of BRPI1014846A8 publication Critical patent/BRPI1014846A8/pt
Publication of BRPI1014846B1 publication Critical patent/BRPI1014846B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
BRPI1014846-9A 2009-06-19 2010-06-18 método e sistema de detecção por ressonância plasmônica na superfície BRPI1014846B1 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP09163292A EP2264438A1 (en) 2009-06-19 2009-06-19 A surface plasmon resonance sensing method and sensing system
PCT/EP2010/058647 WO2010146160A1 (en) 2009-06-19 2010-06-18 A surface plasmon resonance sensing method and sensing system

Publications (3)

Publication Number Publication Date
BRPI1014846A2 true BRPI1014846A2 (pt) 2016-05-03
BRPI1014846A8 BRPI1014846A8 (pt) 2019-08-06
BRPI1014846B1 BRPI1014846B1 (pt) 2019-10-29

Family

ID=41566218

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI1014846-9A BRPI1014846B1 (pt) 2009-06-19 2010-06-18 método e sistema de detecção por ressonância plasmônica na superfície

Country Status (8)

Country Link
US (1) US8508744B2 (pt)
EP (2) EP2264438A1 (pt)
AU (1) AU2010261777B2 (pt)
BR (1) BRPI1014846B1 (pt)
CA (1) CA2765972C (pt)
ES (1) ES2543464T3 (pt)
MX (1) MX2012000052A (pt)
WO (1) WO2010146160A1 (pt)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2546635A1 (en) * 2011-07-14 2013-01-16 The European Union, represented by the European Commission SPR sensor device with nanostructure
FR2982028B1 (fr) * 2011-10-26 2020-02-21 Aryballe Technologies Puce microstructuree comprenant des surfaces convexes pour analyse par resonance des plasmons de surface, dispositif d'analyse contenant ladite puce microstructuree et utilisation dudit dispositif
FR2982027B1 (fr) * 2011-10-26 2014-01-03 Thibaut Mercey Puce microstructuree pour analyse par resonance des plasmons de surface, dispositif d'analyse comprenant ladite puce microstructuree et utilisation dudit dispositif
US10247605B2 (en) * 2012-01-16 2019-04-02 Filmetrics, Inc. Automatic real-time wavelength calibration of fiber-optic-based spectrometers
WO2013131928A1 (en) 2012-03-05 2013-09-12 Biosurfit S.A. Enhanced surface plasmon resonance method
JP6058313B2 (ja) * 2012-08-10 2017-01-11 浜松ホトニクス株式会社 表面増強ラマン散乱ユニット
US10633734B2 (en) 2012-10-05 2020-04-28 California Institute Of Technology Optical sensor for analyte detection
WO2014055951A1 (en) 2012-10-05 2014-04-10 California Institute Of Technology Optical sensor for analyte detection
US8976359B2 (en) * 2012-12-15 2015-03-10 Board Of Trustees Of The University Of Alabama, For And On Behalf Of The University Of Alabama In Huntsville Nanostructure diffraction gratings for integrated spectroscopy and sensing
TWI582403B (zh) 2015-12-24 2017-05-11 財團法人工業技術研究院 感測晶片
RU2637364C2 (ru) * 2016-05-11 2017-12-04 Федеральное государственное бюджетное образовательное учреждение высшего образования "Московский государственный университет имени М.В. Ломоносова" (МГУ) Сенсорный элемент и способ детектирования изменения состава исследуемой жидкой или газообразной среды
FR3062913B1 (fr) * 2017-02-15 2019-04-05 Commissariat A L'energie Atomique Et Aux Energies Alternatives Procede de detection d'une variation locale d'indice de refraction d'un milieu dielectrique situe a la surface d'un capteur optique
US10605653B1 (en) * 2018-12-11 2020-03-31 FlintLoc Technologies, LLC Ambient light detector dispenser security monitoring system
EP3992616A1 (en) * 2020-11-03 2022-05-04 Insplorion Sensor Systems AB An optical measurement device
CN113916838B (zh) * 2021-12-14 2022-03-01 山东省科学院海洋仪器仪表研究所 一种基于双共振效应的海水温盐传感器、测量系统及方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2197065A (en) * 1986-11-03 1988-05-11 Stc Plc Optical sensor device
ES2261009B1 (es) 2004-06-11 2007-11-16 Consejo Superior De Investigaciones Cientificas. Dispositivo y metodo para detectar cambios en el indice de refraccion de un medio dielectrico.
JP4640797B2 (ja) * 2005-05-30 2011-03-02 株式会社日立製作所 生体分子相互作用測定装置及び測定方法
JP2008107320A (ja) * 2006-09-29 2008-05-08 Fujifilm Corp 検出装置、検出方法、及び光透過性部材
US20080316490A1 (en) 2007-06-19 2008-12-25 National Tsing Hua University Planar surface plasmon resonance detector
US8564781B2 (en) * 2008-09-01 2013-10-22 Hitachi Chemical Company, Ltd. SPR sensor

Also Published As

Publication number Publication date
MX2012000052A (es) 2012-04-19
US8508744B2 (en) 2013-08-13
AU2010261777B2 (en) 2015-07-16
EP2443438B1 (en) 2015-05-06
BRPI1014846B1 (pt) 2019-10-29
CA2765972C (en) 2018-03-27
BRPI1014846A8 (pt) 2019-08-06
ES2543464T3 (es) 2015-08-19
AU2010261777A1 (en) 2012-02-09
CA2765972A1 (en) 2010-12-23
EP2443438A1 (en) 2012-04-25
US20120120401A1 (en) 2012-05-17
EP2264438A1 (en) 2010-12-22
WO2010146160A1 (en) 2010-12-23

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Legal Events

Date Code Title Description
B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B06T Formal requirements before examination [chapter 6.20 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]

Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 18/06/2010, OBSERVADAS AS CONDICOES LEGAIS. (CO) 20 (VINTE) ANOS CONTADOS A PARTIR DE 18/06/2010, OBSERVADAS AS CONDICOES LEGAIS