BRPI1014846A8 - "método e sistema de detecção por ressonância plasmônica na superfície" - Google Patents

"método e sistema de detecção por ressonância plasmônica na superfície" Download PDF

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Publication number
BRPI1014846A8
BRPI1014846A8 BRPI1014846A BRPI1014846A BRPI1014846A8 BR PI1014846 A8 BRPI1014846 A8 BR PI1014846A8 BR PI1014846 A BRPI1014846 A BR PI1014846A BR PI1014846 A BRPI1014846 A BR PI1014846A BR PI1014846 A8 BRPI1014846 A8 BR PI1014846A8
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BR
Brazil
Prior art keywords
spr
sensor
light beam
reflected
detection method
Prior art date
Application number
BRPI1014846A
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English (en)
Inventor
Valsesia Andrea
Marabelli Franco
Rossi François
Colpo Pascal
Original Assignee
The European Union Representada Pela European Commission
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by The European Union Representada Pela European Commission filed Critical The European Union Representada Pela European Commission
Publication of BRPI1014846A2 publication Critical patent/BRPI1014846A2/pt
Publication of BRPI1014846A8 publication Critical patent/BRPI1014846A8/pt
Publication of BRPI1014846B1 publication Critical patent/BRPI1014846B1/pt

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection
    • G01N21/553Attenuated total reflection and using surface plasmons
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection
    • G01N21/553Attenuated total reflection and using surface plasmons
    • G01N21/554Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nanotechnology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

método e sistema de detecção por ressonância plasmônica na superfície a invenção se refere a um método de detecção por ressonância plasmônica na superficie (spr) que compreende as seguintes etapas: apresentar um sensor spr compreendendo uma superfície do sensor de suporte spr e contatando uma amostra a ser analisada com a superficie do sensor. pelo menos uma condição de ressonância na superfície do sensor de suporte spr é monitorada pela iluminação da superficie do sensor com um feixe de luz de teste que aciona o spr e pela detecção do feixe de luz de teste refletido ou transmitido. adicionalmente, a superficie do sensor é iluminada com um feixe de luz de referência em condições selecionadas, de modo a não acionar o spr na superficie do sensor e detectar a intensidade do feixe de luz de referência refletido ou transmitido. pelo menos, uma propriedade do feixe de luz de teste refletido ou transmitido é determinada, levando em conta a intensidade detectada do feixe de luz de referência refletido ou transmitido.
BRPI1014846-9A 2009-06-19 2010-06-18 método e sistema de detecção por ressonância plasmônica na superfície BRPI1014846B1 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP09163292A EP2264438A1 (en) 2009-06-19 2009-06-19 A surface plasmon resonance sensing method and sensing system
PCT/EP2010/058647 WO2010146160A1 (en) 2009-06-19 2010-06-18 A surface plasmon resonance sensing method and sensing system

Publications (3)

Publication Number Publication Date
BRPI1014846A2 BRPI1014846A2 (pt) 2016-05-03
BRPI1014846A8 true BRPI1014846A8 (pt) 2019-08-06
BRPI1014846B1 BRPI1014846B1 (pt) 2019-10-29

Family

ID=41566218

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI1014846-9A BRPI1014846B1 (pt) 2009-06-19 2010-06-18 método e sistema de detecção por ressonância plasmônica na superfície

Country Status (8)

Country Link
US (1) US8508744B2 (pt)
EP (2) EP2264438A1 (pt)
AU (1) AU2010261777B2 (pt)
BR (1) BRPI1014846B1 (pt)
CA (1) CA2765972C (pt)
ES (1) ES2543464T3 (pt)
MX (1) MX2012000052A (pt)
WO (1) WO2010146160A1 (pt)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2546635A1 (en) 2011-07-14 2013-01-16 The European Union, represented by the European Commission SPR sensor device with nanostructure
FR2982027B1 (fr) 2011-10-26 2014-01-03 Thibaut Mercey Puce microstructuree pour analyse par resonance des plasmons de surface, dispositif d'analyse comprenant ladite puce microstructuree et utilisation dudit dispositif
FR2982028B1 (fr) * 2011-10-26 2020-02-21 Aryballe Technologies Puce microstructuree comprenant des surfaces convexes pour analyse par resonance des plasmons de surface, dispositif d'analyse contenant ladite puce microstructuree et utilisation dudit dispositif
US10247605B2 (en) * 2012-01-16 2019-04-02 Filmetrics, Inc. Automatic real-time wavelength calibration of fiber-optic-based spectrometers
EP2823287B1 (en) 2012-03-05 2017-08-23 Biosurfit, S.A. Enhanced surface plasmon resonance method
JP6058313B2 (ja) * 2012-08-10 2017-01-11 浜松ホトニクス株式会社 表面増強ラマン散乱ユニット
US9410887B2 (en) 2012-10-05 2016-08-09 California Institute Of Technology Optical sensor for analyte detection
US10633734B2 (en) 2012-10-05 2020-04-28 California Institute Of Technology Optical sensor for analyte detection
US8976359B2 (en) * 2012-12-15 2015-03-10 Board Of Trustees Of The University Of Alabama, For And On Behalf Of The University Of Alabama In Huntsville Nanostructure diffraction gratings for integrated spectroscopy and sensing
TWI582403B (zh) 2015-12-24 2017-05-11 財團法人工業技術研究院 感測晶片
RU2637364C2 (ru) * 2016-05-11 2017-12-04 Федеральное государственное бюджетное образовательное учреждение высшего образования "Московский государственный университет имени М.В. Ломоносова" (МГУ) Сенсорный элемент и способ детектирования изменения состава исследуемой жидкой или газообразной среды
FR3062913B1 (fr) * 2017-02-15 2019-04-05 Commissariat A L'energie Atomique Et Aux Energies Alternatives Procede de detection d'une variation locale d'indice de refraction d'un milieu dielectrique situe a la surface d'un capteur optique
US10605653B1 (en) * 2018-12-11 2020-03-31 FlintLoc Technologies, LLC Ambient light detector dispenser security monitoring system
EP3992616A1 (en) 2020-11-03 2022-05-04 Insplorion Sensor Systems AB An optical measurement device
CN113916838B (zh) * 2021-12-14 2022-03-01 山东省科学院海洋仪器仪表研究所 一种基于双共振效应的海水温盐传感器、测量系统及方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2197065A (en) * 1986-11-03 1988-05-11 Stc Plc Optical sensor device
ES2261009B1 (es) 2004-06-11 2007-11-16 Consejo Superior De Investigaciones Cientificas. Dispositivo y metodo para detectar cambios en el indice de refraccion de un medio dielectrico.
JP4640797B2 (ja) * 2005-05-30 2011-03-02 株式会社日立製作所 生体分子相互作用測定装置及び測定方法
JP2008107320A (ja) * 2006-09-29 2008-05-08 Fujifilm Corp 検出装置、検出方法、及び光透過性部材
US20080316490A1 (en) 2007-06-19 2008-12-25 National Tsing Hua University Planar surface plasmon resonance detector
JP5621983B2 (ja) * 2008-09-01 2014-11-12 日立化成株式会社 Sprセンサー

Also Published As

Publication number Publication date
EP2443438B1 (en) 2015-05-06
ES2543464T3 (es) 2015-08-19
BRPI1014846A2 (pt) 2016-05-03
AU2010261777A1 (en) 2012-02-09
EP2264438A1 (en) 2010-12-22
US8508744B2 (en) 2013-08-13
AU2010261777B2 (en) 2015-07-16
BRPI1014846B1 (pt) 2019-10-29
CA2765972C (en) 2018-03-27
WO2010146160A1 (en) 2010-12-23
US20120120401A1 (en) 2012-05-17
EP2443438A1 (en) 2012-04-25
MX2012000052A (es) 2012-04-19
CA2765972A1 (en) 2010-12-23

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B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B06T Formal requirements before examination [chapter 6.20 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]

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