CA1193709A - Appareil d'inspection programmable par l'operateur - Google Patents

Appareil d'inspection programmable par l'operateur

Info

Publication number
CA1193709A
CA1193709A CA000386515A CA386515A CA1193709A CA 1193709 A CA1193709 A CA 1193709A CA 000386515 A CA000386515 A CA 000386515A CA 386515 A CA386515 A CA 386515A CA 1193709 A CA1193709 A CA 1193709A
Authority
CA
Canada
Prior art keywords
pixels
window
test
operator
monitor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000386515A
Other languages
English (en)
Inventor
Gary G. Wagner
Lawrence F. Berridge, Jr.
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Inspection Technology Inc
Original Assignee
Inspection Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inspection Technology Inc filed Critical Inspection Technology Inc
Application granted granted Critical
Publication of CA1193709A publication Critical patent/CA1193709A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
    • G06V10/987—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns with the intervention of an operator
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
CA000386515A 1980-11-17 1981-09-23 Appareil d'inspection programmable par l'operateur Expired CA1193709A (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US20774880A 1980-11-17 1980-11-17
US207,748 1980-11-17

Publications (1)

Publication Number Publication Date
CA1193709A true CA1193709A (fr) 1985-09-17

Family

ID=22771840

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000386515A Expired CA1193709A (fr) 1980-11-17 1981-09-23 Appareil d'inspection programmable par l'operateur

Country Status (5)

Country Link
JP (1) JPS57146378A (fr)
CA (1) CA1193709A (fr)
DE (1) DE3145832A1 (fr)
IT (1) IT1139710B (fr)
MX (1) MX150612A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6479960B2 (en) 2000-07-10 2002-11-12 Mitsubishi Denki Kabushiki Kaisha Machine tool

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4519041A (en) * 1982-05-03 1985-05-21 Honeywell Inc. Real time automated inspection
FR2559581B1 (fr) * 1984-02-10 1986-07-11 Siderurgie Fse Inst Rech Procede et installation de detection de defauts de surface sur une bande en cours de defilement
US4696047A (en) * 1985-02-28 1987-09-22 Texas Instruments Incorporated Apparatus for automatically inspecting electrical connecting pins
DE3612256C2 (de) * 1986-04-11 1998-05-14 Twi Tech Wissenschaftliche Ind Verfahren und Einrichtung zur optoelektronischen Qualitätskontrolle
DE19646678A1 (de) * 1996-11-12 1998-05-14 Heuft Systemtechnik Gmbh Verfahren zum Testen der Zuverlässigkeit eines Prüfgerätes, insbesondere eines Leerflascheninspektors
DE19646694A1 (de) 1996-11-12 1998-05-14 Heuft Systemtechnik Gmbh Verfahren zum Testen der Zuverlässigkeit eines Prüfgerätes, insbesondere eines Leerflascheninspektors

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4025202A (en) * 1975-08-07 1977-05-24 Ball Brothers Service Corporation Method and apparatus for inspecting the bottoms of hollow glass articles
JPS5399731A (en) * 1977-02-14 1978-08-31 Barry Wehmiller Co Method of and device for electronically analyzing image of article to be illuminated
JPS6037949B2 (ja) * 1978-06-14 1985-08-29 株式会社東芝 画像表示装置
JPS55119782A (en) * 1979-03-09 1980-09-13 Daihen Corp Pattern automatic inspection method
DE2916159C2 (de) * 1979-04-20 1987-04-23 Hajime Industries, Ltd., Tokio/Tokyo Inspektionseinrichtung

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6479960B2 (en) 2000-07-10 2002-11-12 Mitsubishi Denki Kabushiki Kaisha Machine tool

Also Published As

Publication number Publication date
IT8125038A0 (it) 1981-11-12
DE3145832A1 (de) 1982-09-23
IT1139710B (it) 1986-09-24
MX150612A (es) 1984-05-30
JPS57146378A (en) 1982-09-09

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Legal Events

Date Code Title Description
MKEX Expiry