CA2002752C - Slab surface contour monitor - Google Patents

Slab surface contour monitor Download PDF

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Publication number
CA2002752C
CA2002752C CA002002752A CA2002752A CA2002752C CA 2002752 C CA2002752 C CA 2002752C CA 002002752 A CA002002752 A CA 002002752A CA 2002752 A CA2002752 A CA 2002752A CA 2002752 C CA2002752 C CA 2002752C
Authority
CA
Canada
Prior art keywords
workpiece
image
slab
electrical signals
edge surfaces
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CA002002752A
Other languages
English (en)
French (fr)
Other versions
CA2002752A1 (en
Inventor
David Lawrence Burk
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Allegheny Ludlum Corp
Original Assignee
Allegheny Ludlum Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Allegheny Ludlum Corp filed Critical Allegheny Ludlum Corp
Publication of CA2002752A1 publication Critical patent/CA2002752A1/en
Application granted granted Critical
Publication of CA2002752C publication Critical patent/CA2002752C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Continuous Casting (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Laser Beam Processing (AREA)
  • Coating With Molten Metal (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Road Signs Or Road Markings (AREA)
  • Electrochromic Elements, Electrophoresis, Or Variable Reflection Or Absorption Elements (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
CA002002752A 1988-11-28 1989-11-10 Slab surface contour monitor Expired - Lifetime CA2002752C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US276,717 1988-11-28
US07/276,717 US5083867A (en) 1988-11-28 1988-11-28 Slab surface contour monitor

Publications (2)

Publication Number Publication Date
CA2002752A1 CA2002752A1 (en) 1990-05-28
CA2002752C true CA2002752C (en) 2002-05-14

Family

ID=23057807

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002002752A Expired - Lifetime CA2002752C (en) 1988-11-28 1989-11-10 Slab surface contour monitor

Country Status (12)

Country Link
US (2) US5083867A (de)
EP (1) EP0371650B1 (de)
JP (1) JPH02187609A (de)
KR (1) KR900008245A (de)
AT (1) ATE100191T1 (de)
AU (1) AU628396B2 (de)
BR (1) BR8905675A (de)
CA (1) CA2002752C (de)
DE (1) DE68912285T2 (de)
ES (1) ES2049336T3 (de)
HU (1) HUT62085A (de)
PL (1) PL165123B1 (de)

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US6122065A (en) * 1996-08-12 2000-09-19 Centre De Recherche Industrielle Du Quebec Apparatus and method for detecting surface defects
JPH1134187A (ja) * 1997-07-15 1999-02-09 Mitsubishi Heavy Ind Ltd 製函用シート材の接合部判定方法及び製函用シート材の接合部判定装置
US6335757B1 (en) 1997-09-02 2002-01-01 Bojko Vodanovic CCD imaging device for high speed profiling
US6094269A (en) * 1997-12-31 2000-07-25 Metroptic Technologies, Ltd. Apparatus and method for optically measuring an object surface contour
DE69926885T2 (de) * 1998-06-10 2006-03-30 Landrex Technologies Co., Ltd. Messung und kompensation der durchbiegung bei der inspektion von bestückten leiterplatten
US6222630B1 (en) 1998-08-26 2001-04-24 Teradyne, Inc. Measuring and compensating for warp in the inspection of printed circuit board assemblies
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KR100523099B1 (ko) * 2001-12-20 2005-10-19 주식회사 포스코 선재압연소재의 단면형상 측정방법
US6948347B2 (en) * 2003-01-24 2005-09-27 Isg Technologies Inc. Graphical rolled steel sheet flatness display and method of using same
PT1524047E (pt) * 2003-10-16 2007-05-31 Concast Ag Processo e dispositivo para a leitura automática de produtos semi-acabados
DE102005023270A1 (de) * 2005-05-20 2006-11-23 Sms Demag Ag Verfahren und Vorrichtung zur Herstellung eines Metallbandes
ZA200902052B (en) 2006-10-16 2010-07-28 Strandex Corp Puller speed control device for monitoring the dimension of an extruded synthetic wood composition
JP5488953B2 (ja) * 2008-09-17 2014-05-14 新日鐵住金株式会社 凹凸疵検査方法及び装置
JP5312144B2 (ja) * 2009-03-30 2013-10-09 トヨタ自動車株式会社 自動車ボディ表面欠陥検査方法、及び自動車ボディ表面欠陥検査装置
CN101655464B (zh) * 2009-09-16 2011-06-08 重庆大学 高温连铸坯表面缺陷形态及深度在线无损检测方法
FR2973110B1 (fr) * 2011-03-25 2013-04-26 Snecma Procede d'inspection des impacts observes dans des carters de soufflante
JP6156253B2 (ja) * 2014-05-20 2017-07-05 Jfeスチール株式会社 金属帯エッジ部撮像装置
CN104020177B (zh) * 2014-06-26 2016-06-15 重庆大学 连铸坯表面缺陷双ccd扫描成像检测方法
KR102866743B1 (ko) 2016-01-26 2025-09-29 심보틱 캐나다, 유엘씨 케이스 물품 검사 시스템 및 방법
US10031087B2 (en) 2016-09-22 2018-07-24 SSAB Enterprises, LLC Methods and systems for the quantitative measurement of internal defects in as-cast steel products
WO2024167800A1 (en) * 2023-02-06 2024-08-15 Lam Research Corporation Biaxial optical sensor system
EP4650081A1 (de) * 2024-05-14 2025-11-19 Dubai Aluminium PJSC Anlage zur überwachung von repräsentativen parametern eines gussstranges, insbesondere dessen oberflächenzustand, automatisiertes überwachungsverfahren mit dieser anlage und giessereianlage mit dieser anlage

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GB1449044A (en) * 1972-11-14 1976-09-08 Kongsberg Vapenfab As Procedures and apparatuses for determining the shapes of surfaces
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CA1014638A (en) * 1974-04-16 1977-07-26 Domtar Limited Measuring the surface roughness of a moving sheet material
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US4202612A (en) * 1976-12-28 1980-05-13 Solid Photography Inc. Arrangement for sensing the geometric characteristics of an object
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JPS6057004B2 (ja) * 1977-03-26 1985-12-12 佐藤 寿芳 2次元表面粗さ計測法
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US4628469A (en) * 1982-09-29 1986-12-09 Technical Arts Corporation Method and apparatus for locating center of reference pulse in a measurement system
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DE3639329C1 (de) * 1986-11-18 1988-02-25 Heesemann Karl Masch Bandschleifmaschine

Also Published As

Publication number Publication date
DE68912285D1 (de) 1994-02-24
AU4270889A (en) 1990-05-31
PL165123B1 (pl) 1994-11-30
US5083867A (en) 1992-01-28
DE68912285T2 (de) 1994-05-19
JPH02187609A (ja) 1990-07-23
CA2002752A1 (en) 1990-05-28
ATE100191T1 (de) 1994-01-15
US5162873A (en) 1992-11-10
EP0371650B1 (de) 1994-01-12
HUT62085A (en) 1993-03-29
EP0371650A1 (de) 1990-06-06
HU896224D0 (en) 1990-02-28
AU628396B2 (en) 1992-09-17
BR8905675A (pt) 1990-06-05
ES2049336T3 (es) 1994-04-16
KR900008245A (ko) 1990-06-02

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