CA2033096A1 - Methodes de mesure et de controle de formations et appareil utilisant cette methode de mesure - Google Patents

Methodes de mesure et de controle de formations et appareil utilisant cette methode de mesure

Info

Publication number
CA2033096A1
CA2033096A1 CA2033096A CA2033096A CA2033096A1 CA 2033096 A1 CA2033096 A1 CA 2033096A1 CA 2033096 A CA2033096 A CA 2033096A CA 2033096 A CA2033096 A CA 2033096A CA 2033096 A1 CA2033096 A1 CA 2033096A1
Authority
CA
Canada
Prior art keywords
formation
measuring method
image
display
control method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2033096A
Other languages
English (en)
Other versions
CA2033096C (fr
Inventor
Masahiro Yakabe
Satoshi Suzuki
Sadao Degawa
Shigeki Murayama
Koichi Ishibashi
Ikuo Nakashima
Koji Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IHI Corp
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP13843989A external-priority patent/JP2751410B2/ja
Priority claimed from JP1176576A external-priority patent/JP2797474B2/ja
Priority claimed from JP26990689A external-priority patent/JP2692299B2/ja
Priority claimed from JP26990789A external-priority patent/JP2738066B2/ja
Application filed by Individual filed Critical Individual
Publication of CA2033096A1 publication Critical patent/CA2033096A1/fr
Application granted granted Critical
Publication of CA2033096C publication Critical patent/CA2033096C/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/40—Analysis of texture
    • G06T7/41—Analysis of texture based on statistical description of texture
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
    • G06V10/993—Evaluation of the quality of the acquired pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8663—Paper, e.g. gloss, moisture content
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20021—Dividing image into blocks, subimages or windows
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Textile Engineering (AREA)
  • Probability & Statistics with Applications (AREA)
  • Paper (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CA002033096A 1989-05-31 1990-05-30 Methodes de mesure et de controle de formations et appareil utilisant cette methode de mesure Expired - Fee Related CA2033096C (fr)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
JP1-138439 1989-05-31
JP13843989A JP2751410B2 (ja) 1989-05-31 1989-05-31 地合計測方法及び該地合計測方法を用いた地合制御方法
JP1176576A JP2797474B2 (ja) 1989-07-07 1989-07-07 地合計測方法及び該地合計測方法を用いた地合制御方法
JP1-176576 1989-07-07
JP26990689A JP2692299B2 (ja) 1989-10-17 1989-10-17 地合計測方法
JP1-269906 1989-10-17
JP26990789A JP2738066B2 (ja) 1989-10-17 1989-10-17 抄紙機における地合制御方法及び装置
JP1-269907 1989-10-17
PCT/JP1990/000705 WO1990015322A1 (fr) 1989-05-31 1990-05-30 Procede de mesure de textures et procede et appareil de commande de textures utilisant ce procede

Publications (2)

Publication Number Publication Date
CA2033096A1 true CA2033096A1 (fr) 1990-12-01
CA2033096C CA2033096C (fr) 2000-07-18

Family

ID=27472141

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002033096A Expired - Fee Related CA2033096C (fr) 1989-05-31 1990-05-30 Methodes de mesure et de controle de formations et appareil utilisant cette methode de mesure

Country Status (4)

Country Link
EP (1) EP0428751B1 (fr)
CA (1) CA2033096C (fr)
DE (1) DE69029461T2 (fr)
WO (1) WO1990015322A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113888747A (zh) * 2021-09-18 2022-01-04 武汉工程大学 一种基于环向局部三值模式的图像纹理特征提取方法

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0519255A3 (en) * 1991-05-31 1993-07-21 Fuji Photo Film Co., Ltd. Defect inspection system and inspection process
SE9601800D0 (sv) * 1996-05-13 1996-05-13 Svante Bjoerk Ab Anordning och metod för detektering av defekter
JP4230566B2 (ja) 1998-07-21 2009-02-25 東芝ソリューション株式会社 欠陥統合処理装置および欠陥統合処理方法
JP2000036033A (ja) * 1998-07-21 2000-02-02 Toshiba Eng Co Ltd 明暗検査装置および明暗検査方法
JP4165932B2 (ja) * 1998-07-21 2008-10-15 東芝ソリューション株式会社 明暗検査装置および明暗検査方法
DE979995T1 (de) * 1998-08-12 2003-08-14 Honeywell Oy, Jyvaeskylae Verfahren und System zum Überwachen einer Papierbahn, von Zellstoff, oder eines Drahtes, die in einer Papiermaschine laufen
EP1598662A1 (fr) * 2004-05-17 2005-11-23 Total Petrochemicals Research Feluy Méthode pour mesurer les propriétés optiques d'objet en matière plastique moulé
CN113963110B (zh) * 2021-10-11 2022-10-25 北京百度网讯科技有限公司 纹理图生成方法、装置、电子设备及存储介质

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6026877B2 (ja) * 1977-04-27 1985-06-26 石川島播磨重工業株式会社 スライスリツプの計算機による制御方法
US4240110A (en) * 1978-09-18 1980-12-16 Eastman Kodak Company Inspection of elongated material
FR2513779B1 (fr) * 1981-09-25 1986-07-25 Sopelem Dispositif automatique d'analyse statistique d'un objet
JPS58173456A (ja) * 1982-04-05 1983-10-12 Showa Electric Wire & Cable Co Ltd 異物自動検査装置
US4760271A (en) * 1986-03-25 1988-07-26 Champion International Corporation Apparatus and process for measuring formation and roughness of a paper web
US4857747A (en) * 1988-02-24 1989-08-15 Albany International Corporation Method and apparatus for analyzing the formation of a web of material via generating a formation index
JPH07122616B2 (ja) * 1988-09-28 1995-12-25 三菱重工業株式会社 紙の品質モニタリング装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113888747A (zh) * 2021-09-18 2022-01-04 武汉工程大学 一种基于环向局部三值模式的图像纹理特征提取方法
CN113888747B (zh) * 2021-09-18 2024-12-20 武汉工程大学 一种基于环向局部三值模式的图像纹理特征提取方法

Also Published As

Publication number Publication date
CA2033096C (fr) 2000-07-18
DE69029461D1 (de) 1997-01-30
EP0428751A4 (en) 1992-05-06
EP0428751B1 (fr) 1996-12-18
WO1990015322A1 (fr) 1990-12-13
DE69029461T2 (de) 1997-04-03
EP0428751A1 (fr) 1991-05-29

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Legal Events

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