CA2089664A1 - Methode et appareil electrique de mesure pour analyser l'impedance de la source d'une tension alternative - Google Patents

Methode et appareil electrique de mesure pour analyser l'impedance de la source d'une tension alternative

Info

Publication number
CA2089664A1
CA2089664A1 CA2089664A CA2089664A CA2089664A1 CA 2089664 A1 CA2089664 A1 CA 2089664A1 CA 2089664 A CA2089664 A CA 2089664A CA 2089664 A CA2089664 A CA 2089664A CA 2089664 A1 CA2089664 A1 CA 2089664A1
Authority
CA
Canada
Prior art keywords
series
elements
alternating voltage
source
impedance source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2089664A
Other languages
English (en)
Other versions
CA2089664C (fr
Inventor
Guy Ross
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hydro-Québec
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2089664A1 publication Critical patent/CA2089664A1/fr
Application granted granted Critical
Publication of CA2089664C publication Critical patent/CA2089664C/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/145—Indicating the presence of current or voltage
    • G01R19/155—Indicating the presence of voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06766—Input circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
CA002089664A 1990-08-17 1991-08-08 Methode et appareil electrique de mesure pour analyser l'impedance de la source d'une tension alternative Expired - Fee Related CA2089664C (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US568,713 1990-08-17
US07/568,713 US5105181A (en) 1990-08-17 1990-08-17 Method and electrical measuring apparatus for analyzing the impedance of the source of an actual alternating voltage

Publications (2)

Publication Number Publication Date
CA2089664A1 true CA2089664A1 (fr) 1992-02-18
CA2089664C CA2089664C (fr) 1997-02-04

Family

ID=24272421

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002089664A Expired - Fee Related CA2089664C (fr) 1990-08-17 1991-08-08 Methode et appareil electrique de mesure pour analyser l'impedance de la source d'une tension alternative

Country Status (11)

Country Link
US (1) US5105181A (fr)
EP (1) EP0543877A1 (fr)
JP (1) JPH05509406A (fr)
KR (1) KR960006867B1 (fr)
CN (1) CN1030800C (fr)
AR (1) AR243684A1 (fr)
BR (1) BR9106766A (fr)
CA (1) CA2089664C (fr)
HU (1) HU211049B (fr)
MX (1) MX9100697A (fr)
WO (1) WO1992003743A1 (fr)

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6583115B1 (en) 1989-10-12 2003-06-24 Ohio University/Edison Biotechnology Institute Methods for treating acromegaly and giantism with growth hormone antagonists
US5350836A (en) * 1989-10-12 1994-09-27 Ohio University Growth hormone antagonists
US5958879A (en) * 1989-10-12 1999-09-28 Ohio University/Edison Biotechnology Institute Growth hormone receptor antagonists and methods of reducing growth hormone activity in a mammal
US6787336B1 (en) 1989-10-12 2004-09-07 Ohio University/Edison Biotechnology Institute DNA encoding growth hormone antagonists
DE4134695A1 (de) * 1991-10-21 1993-04-22 Beha C Gmbh Pruefgeraet zur anzeige elektrischer spannung
DE4211944A1 (de) * 1992-04-09 1993-10-14 Philips Patentverwaltung Hochspannungseinheit mit einer Meßteiler-Widerstandsanordnung
US5293122A (en) * 1992-06-08 1994-03-08 Lecroy Corporation Signal probe with remote control function
US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US5503007A (en) * 1992-10-05 1996-04-02 Motorola, Inc. Misfire detection method and apparatus therefor
US5387253A (en) * 1992-12-28 1995-02-07 Motorola, Inc. Spectral misfire detection system and method therefor
DE69423095T2 (de) * 1993-09-07 2000-09-28 Motorola, Inc. System zur bestimmung von fehlzündungen bei einer brennkraftmaschine
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
US6100679A (en) * 1996-09-17 2000-08-08 Tasco, Inc. Voltage indicating instrument
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6259243B1 (en) 1999-06-04 2001-07-10 Lynn C. Lundquist Method for electromagnetically shielding inductive voltage detectors
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
CA2348799A1 (fr) * 2001-05-22 2002-11-22 Marcel Blais Appareil d'essai de composants electroniques
WO2003020467A1 (fr) 2001-08-31 2003-03-13 Cascade Microtech, Inc. Appareil de test optique
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
JP2008502167A (ja) 2004-06-07 2008-01-24 カスケード マイクロテック インコーポレイテッド 熱光学チャック
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
CN101539598B (zh) * 2009-04-14 2011-12-28 江苏工业学院 交流毫欧表的二端对测试方法
KR101430564B1 (ko) * 2010-06-02 2014-08-14 오티스 엘리베이터 컴파니 스위치 검출 시스템
CN102998520B (zh) * 2012-12-25 2015-01-21 黄石供电公司变电运行中心 伸缩杆数字显示高压验电器
CN103219719B (zh) * 2013-03-21 2015-11-11 国家电网公司 一种利用线路出串运行限制短路电流的分析方法
US20250341551A1 (en) * 2022-07-27 2025-11-06 Pwr Nukleus Technologies Private Limited A voltage tester device/system for safety application in electrical panel and method thereof
CN115426547A (zh) * 2022-08-30 2022-12-02 广东电网有限责任公司 一种变电站告警上传系统及方法
CN119986221B (zh) * 2025-04-14 2025-06-24 崂山国家实验室 一种自动识别信号源接口类型的模拟信号采集电路及方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3956697A (en) * 1972-04-17 1976-05-11 Ipa Internationale Patent - Und Lizenz-Anstalt Voltage detector for detecting different voltage levels in conductors of an electrical power line
US3868569A (en) * 1973-05-08 1975-02-25 Carl H Faust Apparatus and method for distinguishing between energized and induced voltages on high voltage power lines
US4225817A (en) * 1978-10-10 1980-09-30 Kahlden Gerald D Combined continuity and voltage test instrument
DE3513247A1 (de) * 1985-04-13 1986-10-16 Brown, Boveri & Cie Ag, 6800 Mannheim Messverfahren zur bestimmung des schleifen- oder innenwiderstandes eines wechselstromnetzes und vorrichtung zur anwendung des verfahrens
DE3521633A1 (de) * 1985-06-15 1986-12-18 Philips Patentverwaltung Gmbh, 2000 Hamburg Schaltungsanordnung zur ermittlung des kleinsignal-innenwiderstandes einer nichtlinearen impulssignalquelle

Also Published As

Publication number Publication date
KR960006867B1 (ko) 1996-05-23
CN1030800C (zh) 1996-01-24
JPH05509406A (ja) 1993-12-22
CA2089664C (fr) 1997-02-04
HU9300419D0 (en) 1993-05-28
EP0543877A1 (fr) 1993-06-02
BR9106766A (pt) 1993-06-15
HUT65316A (en) 1994-05-02
WO1992003743A1 (fr) 1992-03-05
MX9100697A (es) 1992-04-01
HU211049B (en) 1995-10-30
AR243684A1 (es) 1993-08-31
KR930701752A (ko) 1993-06-12
US5105181A (en) 1992-04-14
CN1059407A (zh) 1992-03-11

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