CH396446A - Röntgenbeugungsgerät zur Bestimmung der vom reziproken Gitter einer Kristallstruktur bedingten jeweiligen Reflexionsrichtung - Google Patents

Röntgenbeugungsgerät zur Bestimmung der vom reziproken Gitter einer Kristallstruktur bedingten jeweiligen Reflexionsrichtung

Info

Publication number
CH396446A
CH396446A CH345160A CH345160A CH396446A CH 396446 A CH396446 A CH 396446A CH 345160 A CH345160 A CH 345160A CH 345160 A CH345160 A CH 345160A CH 396446 A CH396446 A CH 396446A
Authority
CH
Switzerland
Prior art keywords
determining
ray diffraction
crystal structure
respective direction
diffraction device
Prior art date
Application number
CH345160A
Other languages
English (en)
Inventor
Ladell Joshua
Lowitzsch Kurt
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Publication of CH396446A publication Critical patent/CH396446A/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CH345160A 1959-03-30 1960-03-28 Röntgenbeugungsgerät zur Bestimmung der vom reziproken Gitter einer Kristallstruktur bedingten jeweiligen Reflexionsrichtung CH396446A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US803008A US3105901A (en) 1959-03-30 1959-03-30 X-ray diffraction device with 360 rotatable specimen holder

Publications (1)

Publication Number Publication Date
CH396446A true CH396446A (de) 1965-07-31

Family

ID=25185320

Family Applications (1)

Application Number Title Priority Date Filing Date
CH345160A CH396446A (de) 1959-03-30 1960-03-28 Röntgenbeugungsgerät zur Bestimmung der vom reziproken Gitter einer Kristallstruktur bedingten jeweiligen Reflexionsrichtung

Country Status (4)

Country Link
US (1) US3105901A (de)
CH (1) CH396446A (de)
DE (1) DE1197245B (de)
GB (1) GB953535A (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3189741A (en) * 1963-09-06 1965-06-15 Picker X Ray Corp Goniostat
US3311746A (en) * 1964-06-03 1967-03-28 Melpar Inc Electron beam device for measuring the displacement of one body relative to another
US3333099A (en) * 1964-07-06 1967-07-25 Philips Corp Single crystal x-ray diffractometer with a total-circle-of-reflection sensor
US3394255A (en) * 1965-06-28 1968-07-23 Picker Corp Diffraction mechanism in which a monochromator diffracts the X-ray beam in planes transverse to an axis of specimen rotation
US3555275A (en) * 1968-11-04 1971-01-12 Avco Corp Specimen positioning apparatus for use with a back reflection x-ray camera
US3702933A (en) * 1970-07-31 1972-11-14 Nasa Device and method for determining x-ray reflection efficiency of optical surfaces
US4074132A (en) * 1976-08-24 1978-02-14 North American Philips Corporation Automatic single crystal diffractometer
US4178513A (en) * 1978-01-17 1979-12-11 Nuclear Semiconductor Art object analyzer
DE2933047C2 (de) * 1979-08-16 1982-12-30 Stoe & Cie. GmbH, 6100 Darmstadt Verfahren und Vorrichtung der Röntgendiffraktion
JPS60131900A (ja) * 1983-12-16 1985-07-13 Sumitomo Electric Ind Ltd 単結晶の製造方法
GB9122085D0 (en) * 1991-10-17 1991-11-27 Cambridge Surface Analytics X-ray diffractometer
JP4316611B2 (ja) * 2003-03-20 2009-08-19 コーネル・リサーチ・ファンデーション・インコーポレイテッド 微結晶構造解析用サンプルマウント
WO2020051708A1 (en) * 2018-09-14 2020-03-19 Proto Patents Ltd. Ball-mapping system and method of operating the same

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2332391A (en) * 1942-11-28 1943-10-19 American Cyanamid Co Projectometer
NL74667C (de) * 1949-04-19
US2648011A (en) * 1951-08-16 1953-08-04 Good James Nathan Apparatus for electronic spectrometric analysis of back-reflection diffraction
US2819405A (en) * 1954-03-26 1958-01-07 Bell Telephone Labor Inc Automatic recording diffractometer and plotter
US2805342A (en) * 1954-07-12 1957-09-03 Andrew R Lang Diffractometer
GB906091A (en) * 1957-10-04 1962-09-19 Nat Res Dev Improvements relating to diffractometers
US3005098A (en) * 1958-03-31 1961-10-17 Gen Electric X-ray emission analysis

Also Published As

Publication number Publication date
DE1197245B (de) 1965-07-22
GB953535A (en) 1964-03-25
US3105901A (en) 1963-10-01

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