CH468478A - Einrichtung zum Messen der Intensität eines Strahles elektrisch ungeladener Teilchen im Vakuum - Google Patents

Einrichtung zum Messen der Intensität eines Strahles elektrisch ungeladener Teilchen im Vakuum

Info

Publication number
CH468478A
CH468478A CH1795266A CH1795266A CH468478A CH 468478 A CH468478 A CH 468478A CH 1795266 A CH1795266 A CH 1795266A CH 1795266 A CH1795266 A CH 1795266A CH 468478 A CH468478 A CH 468478A
Authority
CH
Switzerland
Prior art keywords
intensity
vacuum
measuring
uncharged particles
electrically uncharged
Prior art date
Application number
CH1795266A
Other languages
English (en)
Inventor
Hugh Hammond Robert
Charles H Mayer Jr
Burce L Gehman
Guy M Kelly
Original Assignee
Gulf General Atomic Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gulf General Atomic Inc filed Critical Gulf General Atomic Inc
Publication of CH468478A publication Critical patent/CH468478A/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J41/00Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas; Discharge tubes for evacuation by diffusion of ions
    • H01J41/02Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas
    • H01J41/04Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas with ionisation by means of thermionic cathodes
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54Controlling or regulating the coating process
    • C23C14/542Controlling the film thickness or evaporation rate
    • C23C14/544Controlling the film thickness or evaporation rate using measurement in the gas phase
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01FMEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F1/00Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G21K1/043Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T74/00Machine element or mechanism
    • Y10T74/21Elements
    • Y10T74/2101Cams
    • Y10T74/2102Adjustable

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Fluid Mechanics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CH1795266A 1965-12-15 1966-12-15 Einrichtung zum Messen der Intensität eines Strahles elektrisch ungeladener Teilchen im Vakuum CH468478A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US513935A US3419718A (en) 1965-12-15 1965-12-15 Apparatus for measuring the flow of electrically neutral particles

Publications (1)

Publication Number Publication Date
CH468478A true CH468478A (de) 1969-02-15

Family

ID=24045167

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1795266A CH468478A (de) 1965-12-15 1966-12-15 Einrichtung zum Messen der Intensität eines Strahles elektrisch ungeladener Teilchen im Vakuum

Country Status (5)

Country Link
US (1) US3419718A (de)
CH (1) CH468478A (de)
DE (2) DE1548978B2 (de)
FR (1) FR1505687A (de)
GB (1) GB1146762A (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5183473A (en) * 1975-01-20 1976-07-22 Hitachi Ltd Fujunbutsuno doopinguhoho
US4068122A (en) * 1976-08-09 1978-01-10 Phillips Petroleum Company Isotope analysis
JPS60225422A (ja) * 1984-04-24 1985-11-09 Hitachi Ltd 薄膜形成方法およびその装置
US4762993A (en) * 1987-01-09 1988-08-09 Moses Kenneth G Directional sensor for neutral particle beams
US4878014A (en) * 1988-06-07 1989-10-31 Oak Ridge Associated Universities Ion beam profile scanner having symmetric detector surface to minimize capacitance noise
KR100614101B1 (ko) * 2005-09-15 2006-08-22 한국과학기술연구원 입자 계수기
JP2011067771A (ja) * 2009-09-25 2011-04-07 Panasonic Electric Works Co Ltd 放電装置
CN107085934B (zh) * 2017-04-10 2020-09-11 中国电力科学研究院 一种用电信息采集设备性能检测方法及系统

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL238481A (de) * 1955-04-12
US3136908A (en) * 1960-07-28 1964-06-09 Weinman James Adolf Plurally charged ion beam generation method
US3211908A (en) * 1961-07-19 1965-10-12 Michael R Liebowitz Spectrum discriminating radiation detector
US3168418A (en) * 1962-03-27 1965-02-02 Alloyd Electronics Device for monitoring and controlling evaporation rate in vacuum deposition

Also Published As

Publication number Publication date
US3419718A (en) 1968-12-31
DE1548978B2 (de) 1976-12-30
FR1505687A (fr) 1967-12-15
DE1548978A1 (de) 1970-04-23
GB1146762A (en) 1969-03-26
DE1789186A1 (de) 1976-12-30

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