CH635686A5 - Verfahren und vorrichtung zur pruefung von elektrischen leiterelementen. - Google Patents
Verfahren und vorrichtung zur pruefung von elektrischen leiterelementen. Download PDFInfo
- Publication number
- CH635686A5 CH635686A5 CH1121678A CH1121678A CH635686A5 CH 635686 A5 CH635686 A5 CH 635686A5 CH 1121678 A CH1121678 A CH 1121678A CH 1121678 A CH1121678 A CH 1121678A CH 635686 A5 CH635686 A5 CH 635686A5
- Authority
- CH
- Switzerland
- Prior art keywords
- conductor element
- current
- voltage
- test
- conductor
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims description 31
- 238000000034 method Methods 0.000 title claims description 24
- 239000004020 conductor Substances 0.000 claims description 49
- 238000012935 Averaging Methods 0.000 claims description 4
- 230000000903 blocking effect Effects 0.000 claims description 4
- 239000003990 capacitor Substances 0.000 claims description 4
- 238000004519 manufacturing process Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 4
- 230000002123 temporal effect Effects 0.000 claims description 4
- 239000000758 substrate Substances 0.000 claims description 2
- 238000011990 functional testing Methods 0.000 claims 1
- 230000002028 premature Effects 0.000 claims 1
- 239000007858 starting material Substances 0.000 claims 1
- 230000009977 dual effect Effects 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 241000220317 Rosa Species 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- AZDRQVAHHNSJOQ-UHFFFAOYSA-N alumane Chemical group [AlH3] AZDRQVAHHNSJOQ-UHFFFAOYSA-N 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000002716 delivery method Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US84721377A | 1977-10-31 | 1977-10-31 | |
| US05/949,578 US4213087A (en) | 1978-10-10 | 1978-10-10 | Method and device for testing electrical conductor elements |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CH635686A5 true CH635686A5 (de) | 1983-04-15 |
Family
ID=27126694
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CH1121678A CH635686A5 (de) | 1977-10-31 | 1978-10-31 | Verfahren und vorrichtung zur pruefung von elektrischen leiterelementen. |
Country Status (12)
| Country | Link |
|---|---|
| JP (1) | JPS5488777A (fr) |
| CA (1) | CA1120545A (fr) |
| CH (1) | CH635686A5 (fr) |
| DE (1) | DE2847074A1 (fr) |
| DK (1) | DK483278A (fr) |
| FR (1) | FR2407483A1 (fr) |
| GB (1) | GB2007850B (fr) |
| HK (1) | HK25584A (fr) |
| IT (1) | IT1099851B (fr) |
| NL (1) | NL7810608A (fr) |
| SE (1) | SE433782B (fr) |
| SG (1) | SG56382G (fr) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4547724A (en) * | 1983-02-07 | 1985-10-15 | Tektronix, Inc. | Method and apparatus for detection of non-linear electrical devices |
| JPH0630444B2 (ja) * | 1985-05-02 | 1994-04-20 | 株式会社日立製作所 | Ａ／ｄ変換器試験方式 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3500188A (en) * | 1966-06-02 | 1970-03-10 | Amp Inc | Method and means for measuring constriction resistance based on nonlinearity |
| GB1221704A (en) * | 1968-09-16 | 1971-02-10 | Dale Electronics | Method for testing the resistance characteristics of self-heated electric resistors |
| US3692987A (en) * | 1970-07-06 | 1972-09-19 | Western Electric Co | Methods and apparatus for allocating the measured noise and resistance of a thin-film resistor between the resistor proper and the contact pads therefor |
| US3803483A (en) * | 1972-05-05 | 1974-04-09 | Ibm | Semiconductor structure for testing of metallization networks on insulative substrates supporting semiconductor chips |
| US3746973A (en) * | 1972-05-05 | 1973-07-17 | Ibm | Testing of metallization networks on insulative substrates supporting semiconductor chips |
| US3974443A (en) * | 1975-01-02 | 1976-08-10 | International Business Machines Corporation | Conductive line width and resistivity measuring system |
-
1978
- 1978-10-23 SE SE7811012A patent/SE433782B/sv unknown
- 1978-10-24 NL NL7810608A patent/NL7810608A/xx not_active Application Discontinuation
- 1978-10-27 FR FR7830633A patent/FR2407483A1/fr active Granted
- 1978-10-28 DE DE19782847074 patent/DE2847074A1/de not_active Withdrawn
- 1978-10-30 DK DK483278A patent/DK483278A/da not_active Application Discontinuation
- 1978-10-30 IT IT29239/78A patent/IT1099851B/it active
- 1978-10-31 GB GB7842658A patent/GB2007850B/en not_active Expired
- 1978-10-31 CH CH1121678A patent/CH635686A5/de not_active IP Right Cessation
- 1978-10-31 JP JP13337178A patent/JPS5488777A/ja active Pending
- 1978-10-31 CA CA000315697A patent/CA1120545A/fr not_active Expired
-
1982
- 1982-11-04 SG SG563/82A patent/SG56382G/en unknown
-
1984
- 1984-03-22 HK HK255/84A patent/HK25584A/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5488777A (en) | 1979-07-14 |
| FR2407483B1 (fr) | 1983-09-16 |
| GB2007850B (en) | 1982-05-12 |
| IT7829239A0 (it) | 1978-10-30 |
| DE2847074A1 (de) | 1979-05-03 |
| SG56382G (en) | 1983-09-02 |
| SE7811012L (sv) | 1979-05-01 |
| GB2007850A (en) | 1979-05-23 |
| CA1120545A (fr) | 1982-03-23 |
| FR2407483A1 (fr) | 1979-05-25 |
| SE433782B (sv) | 1984-06-12 |
| HK25584A (en) | 1984-03-30 |
| IT1099851B (it) | 1985-09-28 |
| DK483278A (da) | 1979-05-01 |
| NL7810608A (nl) | 1979-05-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PL | Patent ceased | ||
| PL | Patent ceased |