JPS5488777A - Method of and device for testing conductive element - Google Patents

Method of and device for testing conductive element

Info

Publication number
JPS5488777A
JPS5488777A JP13337178A JP13337178A JPS5488777A JP S5488777 A JPS5488777 A JP S5488777A JP 13337178 A JP13337178 A JP 13337178A JP 13337178 A JP13337178 A JP 13337178A JP S5488777 A JPS5488777 A JP S5488777A
Authority
JP
Japan
Prior art keywords
conductive element
testing conductive
testing
conductive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13337178A
Other languages
English (en)
Japanese (ja)
Inventor
Teiraa Inguritsushiyu Aran
Rorimaa Miraa Gaburieru
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/949,578 external-priority patent/US4213087A/en
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Publication of JPS5488777A publication Critical patent/JPS5488777A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP13337178A 1977-10-31 1978-10-31 Method of and device for testing conductive element Pending JPS5488777A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US84721377A 1977-10-31 1977-10-31
US05/949,578 US4213087A (en) 1978-10-10 1978-10-10 Method and device for testing electrical conductor elements

Publications (1)

Publication Number Publication Date
JPS5488777A true JPS5488777A (en) 1979-07-14

Family

ID=27126694

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13337178A Pending JPS5488777A (en) 1977-10-31 1978-10-31 Method of and device for testing conductive element

Country Status (12)

Country Link
JP (1) JPS5488777A (fr)
CA (1) CA1120545A (fr)
CH (1) CH635686A5 (fr)
DE (1) DE2847074A1 (fr)
DK (1) DK483278A (fr)
FR (1) FR2407483A1 (fr)
GB (1) GB2007850B (fr)
HK (1) HK25584A (fr)
IT (1) IT1099851B (fr)
NL (1) NL7810608A (fr)
SE (1) SE433782B (fr)
SG (1) SG56382G (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59171869A (ja) * 1983-02-07 1984-09-28 テクトロニツクス・インコーポレイテツド 電気素子の直線性及び非直線性の検出方法
JPS61252718A (ja) * 1985-05-02 1986-11-10 Hitachi Ltd Ａ／ｄ変換器試験方式

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3500188A (en) * 1966-06-02 1970-03-10 Amp Inc Method and means for measuring constriction resistance based on nonlinearity
GB1221704A (en) * 1968-09-16 1971-02-10 Dale Electronics Method for testing the resistance characteristics of self-heated electric resistors
US3692987A (en) * 1970-07-06 1972-09-19 Western Electric Co Methods and apparatus for allocating the measured noise and resistance of a thin-film resistor between the resistor proper and the contact pads therefor
US3803483A (en) * 1972-05-05 1974-04-09 Ibm Semiconductor structure for testing of metallization networks on insulative substrates supporting semiconductor chips
US3746973A (en) * 1972-05-05 1973-07-17 Ibm Testing of metallization networks on insulative substrates supporting semiconductor chips
US3974443A (en) * 1975-01-02 1976-08-10 International Business Machines Corporation Conductive line width and resistivity measuring system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59171869A (ja) * 1983-02-07 1984-09-28 テクトロニツクス・インコーポレイテツド 電気素子の直線性及び非直線性の検出方法
JPS61252718A (ja) * 1985-05-02 1986-11-10 Hitachi Ltd Ａ／ｄ変換器試験方式

Also Published As

Publication number Publication date
SE7811012L (sv) 1979-05-01
CH635686A5 (de) 1983-04-15
CA1120545A (fr) 1982-03-23
FR2407483B1 (fr) 1983-09-16
FR2407483A1 (fr) 1979-05-25
SG56382G (en) 1983-09-02
DK483278A (da) 1979-05-01
GB2007850B (en) 1982-05-12
SE433782B (sv) 1984-06-12
DE2847074A1 (de) 1979-05-03
IT7829239A0 (it) 1978-10-30
GB2007850A (en) 1979-05-23
HK25584A (en) 1984-03-30
NL7810608A (nl) 1979-05-02
IT1099851B (it) 1985-09-28

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