CL2016000633A1 - Aparato para preparación de muestra de cargado frontal y métodos para el mismo - Google Patents

Aparato para preparación de muestra de cargado frontal y métodos para el mismo

Info

Publication number
CL2016000633A1
CL2016000633A1 CL2016000633A CL2016000633A CL2016000633A1 CL 2016000633 A1 CL2016000633 A1 CL 2016000633A1 CL 2016000633 A CL2016000633 A CL 2016000633A CL 2016000633 A CL2016000633 A CL 2016000633A CL 2016000633 A1 CL2016000633 A1 CL 2016000633A1
Authority
CL
Chile
Prior art keywords
sample
sample preparation
loading
methods
same
Prior art date
Application number
CL2016000633A
Other languages
English (en)
Inventor
Lukas Bruzenak
Vladimir Meleg
Original Assignee
Smidth As F L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Smidth As F L filed Critical Smidth As F L
Publication of CL2016000633A1 publication Critical patent/CL2016000633A1/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/2005—Preparation of powder samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/286—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/307—Accessories, mechanical or electrical features cuvettes-sample holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/312—Accessories, mechanical or electrical features powder preparation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/616—Specific applications or type of materials earth materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

APARATO DE PREPARACION DE MUESTRA CONFIGURADO PARA PREPARAR UNA MUESTRA DE MATERIAL ADECUADA PARA DIFRACCION POR RAYOS X, QUE COMPRENDE UN FONDO SUJETADOR DE MUESTRA CONCAVO, UN SUJETADOR DE MUESTRA ANULAR, EN DONDE EL FONDO SUJETADOR DE MUESTRA CONCAVO SE PROPORCIONA DENTRO DEL SUJETADOR DE MUESTRA ANULAR Y ESTA CONFIGURADO PARA MOVERSE DENTRO DEL SUJETADOR DE MUESTRA ANULAR A MODO DE PISTON; METODO; DISPOSITIVO.
CL2016000633A 2013-09-19 2016-03-17 Aparato para preparación de muestra de cargado frontal y métodos para el mismo CL2016000633A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201361880094P 2013-09-19 2013-09-19

Publications (1)

Publication Number Publication Date
CL2016000633A1 true CL2016000633A1 (es) 2016-09-02

Family

ID=51786923

Family Applications (1)

Application Number Title Priority Date Filing Date
CL2016000633A CL2016000633A1 (es) 2013-09-19 2016-03-17 Aparato para preparación de muestra de cargado frontal y métodos para el mismo

Country Status (10)

Country Link
US (1) US9739726B2 (es)
EP (1) EP3047260B1 (es)
JP (1) JP2016534323A (es)
CN (1) CN105723210B (es)
AU (1) AU2014323079A1 (es)
CA (1) CA2924225A1 (es)
CL (1) CL2016000633A1 (es)
MX (1) MX2016002363A (es)
RU (1) RU2016114888A (es)
WO (1) WO2015040123A2 (es)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016185023A1 (en) * 2015-05-21 2016-11-24 Flsmidth A/S A method and punch for pressing sticky material samples for x-ray analysis
DE102016111694A1 (de) * 2016-06-27 2017-12-28 Thyssenkrupp Ag Verfahren und Anlage zur Analyse eines Probenmaterials
CN107132243B (zh) * 2017-04-24 2023-07-18 大连理工大学 X射线荧光光谱微量粉末样品的制样设备
JP6772949B2 (ja) * 2017-05-02 2020-10-21 株式会社島津製作所 分析装置
CN110596164A (zh) * 2019-10-10 2019-12-20 新疆烯金石墨烯科技有限公司 一种石墨烯xrd表征用样品的制样方法
US11746642B2 (en) * 2019-11-08 2023-09-05 Halliburton Energy Services, Inc. Electromagnetic imager design
US11549894B2 (en) * 2020-04-06 2023-01-10 Saudi Arabian Oil Company Determination of depositional environments
CN116223103B (zh) * 2023-03-28 2023-12-08 山东恒瑞地矿技术服务有限公司 一种便于卸料的湿地土壤取样设备
CN117664665B (zh) * 2024-02-01 2024-04-12 绵阳师范学院 一种基于热红外的二氧化碳检测装置
CN119915851B (zh) * 2025-04-07 2025-06-24 南京海关工业产品检测中心 一种x射线衍射仪穿孔式粉末反向填充装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09210884A (ja) * 1996-01-30 1997-08-15 Mitsubishi Chem Corp Ｘ線回折装置用サンプルホルダ
JP2002148163A (ja) 2000-11-07 2002-05-22 Rigaku Industrial Co Ｘ線分析用試料の作製方法とその方法に用いるカップ形試料容器
WO2003087796A1 (en) * 2002-04-10 2003-10-23 Bristol-Myers Squibb Company High throughput x-ray diffraction filter sample holder
FR2856793B1 (fr) * 2003-06-24 2006-04-14 Inst Francais Du Petrole Dispositif d'analyse de poudre par diffraction des rayons x
CN2762101Y (zh) * 2004-11-05 2006-03-01 辽宁石油化工大学 可控压力x射线衍射仪用粉末试样压样机
DE102008031359A1 (de) 2008-07-04 2010-02-18 Herzog Maschinenfabrik Gmbh & Co Vorrichtung zum Einpressen pulverförmigen Materials in Hohlkörper
CN102980788B (zh) * 2012-11-14 2014-11-19 厦门钨业股份有限公司 一种可直接用于xrd检测相成分的试样的制备方法

Also Published As

Publication number Publication date
EP3047260A2 (en) 2016-07-27
WO2015040123A2 (en) 2015-03-26
JP2016534323A (ja) 2016-11-04
RU2016114888A3 (es) 2018-03-26
WO2015040123A3 (en) 2015-06-11
US9739726B2 (en) 2017-08-22
RU2016114888A (ru) 2017-10-24
EP3047260B1 (en) 2019-01-09
US20160290938A1 (en) 2016-10-06
AU2014323079A1 (en) 2016-03-10
CN105723210B (zh) 2019-02-22
CA2924225A1 (en) 2015-03-26
AU2014323079A2 (en) 2016-03-31
CN105723210A (zh) 2016-06-29
MX2016002363A (es) 2016-06-02

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