CN111982930A - Method for testing rapid grading of DIN 50602-inclusion K method - Google Patents

Method for testing rapid grading of DIN 50602-inclusion K method Download PDF

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CN111982930A
CN111982930A CN202010871049.XA CN202010871049A CN111982930A CN 111982930 A CN111982930 A CN 111982930A CN 202010871049 A CN202010871049 A CN 202010871049A CN 111982930 A CN111982930 A CN 111982930A
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陈斌
张林平
陈玉宝
王怀伟
后宗保
宋小勇
赵志海
王仲琨
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Maanshan Iron and Steel Co Ltd
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Abstract

The invention discloses a method for testing rapid grading of DIN 50602-inclusion K method, which comprises the following steps: s1, preparing a detection sample; s2, observing and detecting the inclusions in the sample through an optical microscope to obtain the length and width of each chain-shaped inclusion and the diameter of the spherical inclusion; s3, inputting the length and width of each chain inclusion into a chain inclusion grading model of a corresponding type, and inputting all diameters of spherical inclusions into the spherical inclusion grading model; and S4, outputting the grades of various chain inclusions and the grades of spherical inclusions in the detection sample. The atlas does not need to be compared repeatedly, the subjective influence of detection personnel is avoided, the accuracy is improved, the detection speed is accelerated, the staff learning time is shortened, the manpower culture efficiency is improved, and the laboratory is helped to finish the K method detection effectively at a high speed.

Description

一种关于DIN 50602-夹杂物K法级别快速定级的检验方法A kind of inspection method about DIN 50602-Inclusion K method grade fast grading

技术领域technical field

本发明属于金相检验技术领域,更具体地,本发明涉及一种关于DIN 50602-夹杂物K法级别快速定级的检验方法。The invention belongs to the technical field of metallographic inspection, and more particularly, the invention relates to an inspection method for rapid grading of DIN 50602-inclusion K method grades.

背景技术Background technique

由于市场需求增大,目前钢铁行业对非金属夹杂进行K法检验项目日益增多,K法检验使用的是德标DIN 50602检验,与国内通常使用的国标GB/T 10561相比,其检验过程复杂,每报出一个结果需要对6块金相试样整个检验面进行检测,且其检测思路与国标GB/T10561不同,GB/T 10561靠形态长短区分条链状夹杂物(即SS、OA、OS三类夹杂物,以下简称条链状夹杂物)的级别,对球形夹杂物(即OG类球形氧化物,以下简称球形夹杂物)靠颗粒数区分级别,而K法检验对四类夹杂物均依靠面积界限划定夹杂物的级别,目前国内大多数实验室的K法检验人力仍然较弱;随着整体冶炼水平的提高,对钢材的纯净度要求也越来越高,非金属夹杂K法检验由“K4”上升到“K0”,即对较小面积的夹杂也需要进行评估,使得夹杂物K法的检验难度进一步增大;综上原因,使得夹杂物K法的检验周期较长,一套K4试样就要占用一位技术娴熟的检验人员2-3个工作日,K0则更多。因此,K法检测项目成为影响钢材检验周期的一个短板,在一定程度上制约了出口钢铁产品的贸易,因此设法降低检验人员掌握K法检验难度,提高夹杂物K法检验效率的任务已迫在眉睫。Due to the increasing market demand, there are more and more K-method inspection items for non-metallic inclusions in the steel industry. The K-method inspection uses the German standard DIN 50602 inspection. Compared with the national standard GB/T 10561 commonly used in China, the inspection process is complicated. , each time a result is reported, the entire inspection surface of 6 metallographic samples needs to be tested, and the detection idea is different from the national standard GB/T10561. GB/T 10561 distinguishes chain inclusions (ie SS, OA, The grade of OS three types of inclusions, hereinafter referred to as chain inclusions), spherical inclusions (ie OG spherical oxides, hereinafter referred to as spherical inclusions) are classified by the number of particles, and the K method test is for the four types of inclusions. Both rely on the area boundary to delineate the grade of inclusions. At present, the K-method inspection manpower in most domestic laboratories is still weak; with the improvement of the overall smelting level, the requirements for the purity of steel are getting higher and higher. The method inspection has increased from "K4" to "K0", that is, the inclusion of a small area also needs to be evaluated, which further increases the difficulty of the inspection of the inclusion K method. To sum up, the inspection period of the inclusion K method is longer. , a set of K4 samples will take a skilled inspector 2-3 working days, and K0 will take more. Therefore, the K-method inspection project has become a short board affecting the steel inspection cycle, which restricts the trade of exported steel products to a certain extent. Therefore, it is urgent to try to reduce the difficulty for inspectors to master the K-method inspection and improve the efficiency of the K-method inspection of inclusions. .

通常,按照标准,K法检验夹杂物定级时应与标准图谱比较的方法来定级,但标准图谱是按照夹杂物面积划分的不同级别,给出的只是临界值图片,实际工作中难免遇到许多无法简单的通过比较图谱就能定级的视场,因此不可避免会牵涉到夹杂物面积计算,尤其对球状夹杂物的面积计算,往往会耗费检验人员较多时间。此外,通过检验人员来定级,主观性影响较大。Usually, according to the standard, the K method should be compared with the standard atlas when grading the inclusions, but the standard atlas is divided into different levels according to the area of the inclusions, and only the critical value picture is given, which is inevitable in practical work. There are many fields of view that cannot be graded simply by comparing atlases, so the area calculation of inclusions is inevitably involved, especially the area calculation of spherical inclusions, which often consumes a lot of time for inspectors. In addition, grading by inspectors has a greater impact on subjectivity.

发明内容SUMMARY OF THE INVENTION

本发明提供了一种关于DIN 50602-夹杂物K法级别快速定级的检验方法,旨在降低夹杂物K法检验难度,提升实验室K法检验效率、缩短K法检验周期。The invention provides an inspection method for rapid grading of DIN 50602-inclusion K method grades, aiming at reducing the difficulty of inclusion K method inspection, improving laboratory K method inspection efficiency and shortening the K method inspection period.

为了实现上述目的,本发明采取的技术方案为:一种关于DIN 50602-夹杂物K法级别快速定级的检验方法,所述方法具体包括如下步骤:In order to achieve the above purpose, the technical solution adopted by the present invention is: a method for rapid grading of DIN 50602-Inclusion K method grade, the method specifically includes the following steps:

S1、制作的检测样品;S1. The produced test sample;

S2、通过光学显微镜观测检测样品的夹杂物,获取各类条链状夹杂物的长度及宽度,球形夹杂物的直径;S2. Observe and detect the inclusions of the sample through an optical microscope, and obtain the length and width of various chain-shaped inclusions and the diameter of spherical inclusions;

S3、将各条链状夹杂物的长度及宽度输入对应类型的条链夹杂物定级模型,将球状夹杂物的所有直径输入球状夹杂物定级模型中,每类条链状夹杂物对应一个条链夹杂物定级模型;S3. Input the length and width of each chain inclusion into the corresponding type of chain inclusion grading model, and input all diameters of spherical inclusions into the spherical inclusion grading model, each type of chain inclusion corresponds to one Chain inclusion grading model;

S4、输出检测样品中各类条链夹杂物级别及球形夹杂物的级别。S4. Output the levels of various chain inclusions and spherical inclusions in the detected sample.

进一步的,条链状夹杂物包括SS、OA、OS三类夹杂物,OA夹杂物定级模型的构建方法具体包括如下步骤:Further, the chain-shaped inclusions include three types of inclusions: SS, OA, and OS. The construction method of the OA inclusion classification model specifically includes the following steps:

S11、计算各OA夹杂物的面积,即OA夹杂物的宽度与长度的乘积;S11. Calculate the area of each OA inclusion, that is, the product of the width and length of the OA inclusion;

S12、计算所有OA夹杂物的面积总和S;S12. Calculate the total area S of all OA inclusions;

S13、计算面积总和S与OA夹杂物各级别定义的最大面积的差值,最小正差值对应的级别即为该样品中的OA夹杂物级别。S13. Calculate the difference between the sum of areas S and the maximum area defined by each level of OA inclusions, and the level corresponding to the minimum positive difference is the level of OA inclusions in the sample.

进一步的,OG类球状夹杂物定级模型的构建方法具体包括如下步骤:Further, the construction method of the OG-like spherical inclusion grading model specifically includes the following steps:

S21、计算各OG夹杂物的面积,即球形夹杂物半径的平方与π的乘积;S21. Calculate the area of each OG inclusion, that is, the product of the square of the radius of the spherical inclusion and π;

S22、计算所有OG夹杂物的面积总和S;S22. Calculate the area sum S of all OG inclusions;

S23、计算面积总和S与OG夹杂物各级别定义的最大面积的差值,最小正差值对应的级别即为该样品中的球形夹杂物级别。S23. Calculate the difference between the sum of the areas S and the maximum area defined by each grade of the OG inclusion, and the grade corresponding to the smallest positive difference is the grade of spherical inclusions in the sample.

进一步的,在步骤S4之后还包括:Further, after step S4, it also includes:

S5、计算样品夹杂物的综合总指数K。S5. Calculate the comprehensive total index K of the inclusions in the sample.

进一步的,综合总指数K计算模型构建方法具体如下:Further, the construction method of the comprehensive total index K calculation model is as follows:

S51、统计单个检测样品视场中各级别的各类夹杂物个数,将其乘以对应的级别系数求和得到第一中间和;S51, count the number of various types of inclusions at each level in the field of view of a single detection sample, multiply it by the corresponding level coefficient and sum up to obtain a first intermediate sum;

S52、计算所有检测样品的第一中间和之和,即为第二中间和s;S52, calculating the sum of the first intermediate sums of all the detection samples, which is the second intermediate sum s;

S53、计算所有检测样品的总面积a,则样品夹杂物的综合总指数K=(s*1000)/a。S53. Calculate the total area a of all the detected samples, then the comprehensive total index K=(s*1000)/a of sample inclusions.

进一步的,检测样品的制备方法具体包括如下步骤:Further, the preparation method of the detection sample specifically includes the following steps:

S11、取样:将待测试样按照标准要求进行截取、切割得到指定数量的测试样品;S11. Sampling: intercept and cut the sample to be tested according to the standard requirements to obtain a specified number of test samples;

S12、制样,在测试样品的表面按照金相法进行磨制、抛光至镜面光滑状态。S12, sample preparation, grinding and polishing the surface of the test sample according to the metallographic method to a mirror-smooth state.

本发明设计出一种快速计算夹杂物面积并转化为其K法级别的检验方法,能够有效地帮助金相评测人员快速进行任一视场内夹杂物级别,不需要进行图谱反复比对,避免检测人员主观影响,不仅提高准确度,加快检测速度,还缩短职工学习时间,提高了人力培养效率,帮助试验室高速有效地完成K法检验。The present invention designs an inspection method for quickly calculating the area of inclusions and converting them into the K-method level, which can effectively help metallographic assessors to quickly determine the level of inclusions in any field of view, without the need for repeated comparison of atlases, avoiding the need for The subjective influence of inspectors not only improves the accuracy and speed of inspection, but also shortens the learning time of employees, improves the efficiency of manpower training, and helps the laboratory to complete the K-method inspection quickly and effectively.

附图说明Description of drawings

图1为本发明实施例提供的关于DIN 50602-夹杂物K法级别快速定级的检验方法流程图。FIG. 1 is a flow chart of an inspection method for rapid grading of DIN 50602-Inclusion K-method grades provided by an embodiment of the present invention.

具体实施方式Detailed ways

下面对照附图,通过对实施例的描述,对本发明的具体实施方式作进一步详细的说明,以帮助本领域的技术人员对本发明的发明构思、技术方案有更完整、准确和深入的理解。The specific embodiments of the present invention will be described in further detail below with reference to the accompanying drawings, through the description of the embodiments, to help those skilled in the art to have a more complete, accurate and in-depth understanding of the inventive concept and technical solutions of the present invention.

图1为本发明实施例提供的关于DIN 50602-夹杂物K法级别快速定级的检验方法流程图,该方法包括:1 is a flowchart of an inspection method for rapid grading of DIN 50602-inclusion K method grades provided by an embodiment of the present invention, and the method includes:

S1、制定指定数量的检测样品;S1. Formulate a specified number of test samples;

在本发明实施例中,检测样品的制备方法具体包括如下步骤:In the embodiment of the present invention, the preparation method of the detection sample specifically includes the following steps:

S11、取样:将待测试样按照标准要求进行截取、切割得到试样,依照DIN50602标准,一般每套K法检测取6块检测样品进行检测,若有特殊协议,以协议内容为准;S11. Sampling: The sample to be tested is intercepted and cut according to the standard requirements to obtain the sample. According to the DIN50602 standard, generally 6 test samples are taken for each set of K method for testing. If there is a special agreement, the content of the agreement shall prevail;

S12、制样,在检测样品的表面按照金相法进行磨制、抛光至镜面光滑状态;检验平行于加工方向的检验面(纵截面),试样经80#、240#、1000#三道金相砂纸打磨,7μm、2.5μm抛光剂和清水抛光,确保检测样品的检测面达到镜面光滑,显微镜下无脏污,以免干扰检验准确性。S12, sample preparation, grind and polish the surface of the test sample according to the metallographic method to a mirror-smooth state; test the inspection surface (longitudinal section) parallel to the processing direction, and the sample is subjected to three metallographic processes of 80#, 240# and 1000#. Sandpaper polishing, 7μm, 2.5μm polishing agent and water polishing ensure that the detection surface of the test sample is mirror-smooth, and there is no dirt under the microscope, so as not to interfere with the inspection accuracy.

S2、通过光学显微镜观测检测样品的夹杂物,获取各类条链状夹杂物的长度及宽度(该夹杂物的最大宽度视为该串(条)状夹杂物的宽度),球形夹杂物的直径;S2. Observe and detect the inclusions of the sample through an optical microscope, and obtain the length and width of various chain-shaped inclusions (the maximum width of the inclusions is regarded as the width of the string (strip)-shaped inclusions), and the diameter of spherical inclusions ;

S3、将各条链状夹杂物的长度及宽度输入对应类型的条链夹杂物定级模型,将球状夹杂物的所有直径输入球状夹杂物定级模型中,每类条链状夹杂物对应一个条链夹杂物定级模型;S3. Input the length and width of each chain inclusion into the corresponding type of chain inclusion grading model, and input all diameters of spherical inclusions into the spherical inclusion grading model, each type of chain inclusion corresponds to one Chain inclusion grading model;

在本发明实施例中,各类条链状夹杂物包括SS、OA、OS三类夹杂物,OA夹杂物定级模型的构建方法具体包括如下步骤:In the embodiment of the present invention, various types of chain-shaped inclusions include three types of inclusions: SS, OA, and OS, and the method for constructing a grading model for OA inclusions specifically includes the following steps:

S11、计算各OA夹杂物的面积,即OA夹杂物的宽度与长度的乘积;S11. Calculate the area of each OA inclusion, that is, the product of the width and length of the OA inclusion;

S12、计算所有OA夹杂物的面积总和S;S12. Calculate the area sum S of all OA inclusions;

S13、计算面积总和S与条链状夹杂物中各级别定义的最大面积的差值,最小正差值对应的级别即为该样品中的OA夹杂物级别。S13. Calculate the difference between the sum of areas S and the maximum area defined by each level in the chain-like inclusions, and the level corresponding to the minimum positive difference is the level of OA inclusions in the sample.

在本发明实施例中,OS夹杂物定级模型的构建方法具体包括如下步骤:In the embodiment of the present invention, the method for constructing the OS inclusion grading model specifically includes the following steps:

S21、计算各OS夹杂物的面积,即OS杂物的宽度与长度的乘积;S21. Calculate the area of each OS inclusion, that is, the product of the width and length of the OS inclusion;

S22、计算所有OS夹杂物的面积总和S;S22. Calculate the area sum S of all OS inclusions;

S23、计算面积总和S与条链状夹杂物中各级别定义的最大面积的差值,最小正差值对应的级别即为该样品中的OS夹杂物级别。S23. Calculate the difference between the sum of the areas S and the maximum area defined by each level in the chain-like inclusions, and the level corresponding to the smallest positive difference is the OS inclusion level in the sample.

在本发明实施例中,SS夹杂物定级模型的构建方法具体包括如下步骤:In the embodiment of the present invention, the method for constructing the SS inclusion grading model specifically includes the following steps:

S31、计算各SS夹杂物的面积,即SS杂物的宽度与长度的乘积;S31. Calculate the area of each SS inclusion, that is, the product of the width and length of the SS inclusion;

S32、计算所有SS夹杂物的面积总和S;S32. Calculate the total area S of all SS inclusions;

S33、计算面积总和S与条链状夹杂物中各级别定义的最大面积的差值,最小正差值对应的级别即为该样品中的SS夹杂物级别。S33. Calculate the difference between the sum of the areas S and the maximum area defined by each level in the chain-like inclusions, and the level corresponding to the smallest positive difference is the level of the SS inclusions in the sample.

SS夹杂物定级模型及OS杂物定级模型的构建方法与OA杂物定级模型的构建方法相同。The construction methods of the SS inclusion grading model and the OS inclusion grading model are the same as those of the OA inclusion grading model.

在本发明实施例中,OG球状夹杂物定级模型的构建方法具体包括如下步骤:In the embodiment of the present invention, the construction method of the OG spherical inclusion grading model specifically includes the following steps:

S21、计算各OG夹杂物的面积,即球形夹杂物半径的平方与π的乘积;S21. Calculate the area of each OG inclusion, that is, the product of the square of the radius of the spherical inclusion and π;

S22、计算所有OG夹杂物的面积总和S;S22. Calculate the area sum S of all OG inclusions;

S23、计算面积总和S与OG夹杂物中各级别定义的最大面积的差值,最小正差值对应的级别即为该样品中的球形夹杂物级别。S23. Calculate the difference between the sum of the areas S and the maximum area defined by each grade in the OG inclusion, and the grade corresponding to the smallest positive difference is the grade of spherical inclusions in the sample.

S4、各类条链夹杂物定级模型及球状夹杂物定级模型输出检测样品中各类夹杂物的级别。S4. Various types of chain inclusion grading models and spherical inclusion grading models output the grades of various types of inclusions in the detected samples.

在本发明实施例中,在步骤S4之后还包括:In this embodiment of the present invention, after step S4, it further includes:

S5、计算样品夹杂物的综合总指数K,综合总指数K计算模型构建方法具体如下:S5. Calculate the comprehensive total index K of the inclusions in the sample. The calculation model of the comprehensive total index K is constructed as follows:

S41、统计单个检测样品视场中各级别各类夹杂物的个数,将其乘以对应的级别系数求和得到第一中间和;S41, count the number of various types of inclusions at each level in the field of view of a single detection sample, multiply it by the corresponding level coefficient and sum up to obtain a first intermediate sum;

S42、计算所有检测样品的第一中间和之和,即为第二中间和s;S42, calculating the sum of the first intermediate sums of all the detection samples, which is the second intermediate sum s;

S43、计算所有检测样品的总面积a,则综合总指数K=(s*1000)/a。S43. Calculate the total area a of all the tested samples, then the comprehensive total index K=(s*1000)/a.

本发明设计出一种快速计算夹杂物面积并转化为其K法级别的检验方法,能够有效地帮助金相评测人员快速进行任一视场内夹杂物级别,不需要进行图谱反复比对,避免检测人员主观影响,不仅提高准确度,加快检测速度,还缩短职工学习时间,提高了人力培养效率,帮助试验室高速有效地完成K法检验。The present invention designs an inspection method for quickly calculating the area of inclusions and converting them into the K-method level, which can effectively help metallographic assessors to quickly determine the level of inclusions in any field of view, without the need for repeated comparison of atlases, avoiding the need for The subjective influence of inspectors not only improves the accuracy and speed of inspection, but also shortens the learning time of employees, improves the efficiency of manpower training, and helps the laboratory to complete the K-method inspection quickly and effectively.

上面结合附图对本发明进行了示例性描述,显然本发明具体实现并不受上述方式的限制,只要采用了本发明的方法构思和技术方案进行的各种非实质性的改进,或未经改进将本发明的构思和技术方案直接应用于其它场合的,均在本发明的保护范围之内。The present invention has been exemplarily described above in conjunction with the accompanying drawings. Obviously, the specific implementation of the present invention is not limited by the above methods, as long as various insubstantial improvements made by the method concept and technical solutions of the present invention are adopted, or no improvement is made. It is within the protection scope of the present invention to directly apply the concepts and technical solutions of the present invention to other occasions.

Claims (6)

1. An inspection method for rapid grading of DIN 50602-inclusion K method grade, which is characterized by comprising the following steps:
s1, preparing a detection sample;
s2, observing and detecting the inclusions in the sample through an optical microscope to obtain the length and width of each chain-shaped inclusion and the diameter of the spherical inclusion;
s3, inputting the length and width of each chain inclusion into a chain inclusion grading model of a corresponding type, and inputting all the diameters of the spherical inclusions into the spherical inclusion grading model, wherein each type of chain inclusion corresponds to one chain inclusion grading model;
and S4, outputting the grades of various chain inclusions and the grades of spherical inclusions in the detection sample.
2. The method for testing DIN 50602-inclusion K-process grade rapid grading according to claim 1, wherein the chain-like inclusions comprise inclusions of three types of SS, OA and OS, and the construction method of the OA inclusion grading model comprises the following steps:
s11, calculating the area of each OA inclusion, namely the product of the width and the length of each OA inclusion;
s12, calculating the area sum S of all OA inclusions;
and S13, calculating the difference between the sum of the areas S and the maximum area defined by each level of the OA inclusion, wherein the level corresponding to the minimum positive difference is the level of the OA inclusion in the sample.
3. The method for testing DIN 50602-inclusion K-process grade rapid grading according to claim 1, wherein the construction method of the grading model for OG spheroidal inclusions comprises the following steps:
s21, calculating the area of each OG inclusion, namely the product of the square of the radius of the spherical inclusion and pi;
s22, calculating the area sum S of all OG inclusions;
and S23, calculating the difference between the area sum S and the maximum area defined by each level of OG inclusions, wherein the level corresponding to the minimum positive difference is the level of the spherical inclusions in the sample.
4. The method of claim 1 for testing DIN 50602-inclusion K process grade rapid grading, further comprising after step S4:
and S5, calculating the comprehensive total index K of the inclusions in the sample.
5. The method of claim 4 for testing DIN 50602-inclusion K-process grade rapid grading, wherein the overall index K calculation model is constructed by the following specific steps:
s51, counting the number of various inclusions at each level in a single detection sample view field, and multiplying the number of various inclusions by corresponding level coefficients to obtain a first intermediate sum;
s52, calculating the sum of the first intermediate sums of all the detection samples, namely the second intermediate sum S;
and S53, calculating the total area a of all the detected samples, and then obtaining the total index K of the sample inclusions, which is (S1000)/a.
6. The test method for DIN 50602-inclusion K process grade rapid grading according to claim 1, wherein the preparation method of the test specimen comprises the following steps:
s11, sampling: intercepting and cutting a to-be-tested sample according to standard requirements to obtain a specified number of test samples;
and S12, preparing a sample, and grinding and polishing the surface of the test sample to a mirror surface smooth state according to a metallographic method.
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