CN114709295A - Method and device for reducing attenuation of perc battery piece - Google Patents

Method and device for reducing attenuation of perc battery piece Download PDF

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Publication number
CN114709295A
CN114709295A CN202210627572.7A CN202210627572A CN114709295A CN 114709295 A CN114709295 A CN 114709295A CN 202210627572 A CN202210627572 A CN 202210627572A CN 114709295 A CN114709295 A CN 114709295A
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temperature
silicon substrate
gas
attenuation
outlet
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CN114709295B (en
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刘涛
章康平
王建明
舒华富
朴松源
刘勇
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Yidao New Energy Technology Co ltd
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Das Solar Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/121The active layers comprising only Group IV materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/128Annealing
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/30Coatings
    • H10F77/306Coatings for devices having potential barriers
    • H10F77/311Coatings for devices having potential barriers for photovoltaic cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

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Abstract

本发明涉及一种降低perc电池片衰减的方法及装置,步骤如下:将硅基体置于放电等离子反应器电离出口下方,硅基体放置于密封腔体中,利用等离子羽辉在1000w‑2000w的功率下将硅基体表面温度升高第一表面温度;向等离子反应器中通入甲烷和硅烷,并在2500w‑3500w的功率下控制在时间t1内将硅基体表面升温至第二表面温度,甲烷和硅烷的气体通入速率v=Q*h/t1;当腔体内压力至达到0.1mbar时,停止通入甲烷和硅烷气体,并将功率调至1000w‑2000w,反应时间3‑5min后,抽真空;向等离子反应器中通入氨气,并控制在5s内使得腔体压力再次达到0.1mbar时,停止通气,并在功率1000w‑2000w下,反应时间3‑5min,恢复常压,将硅基体取出。本发明优化了硅基体的镀膜工艺,从而形成了耐衰减的perc电池片结构,且整体良品率好,效果增加。The invention relates to a method and a device for reducing the attenuation of perc cell sheets. The steps are as follows: placing a silicon substrate under the ionization outlet of a discharge plasma reactor, placing the silicon substrate in a sealed cavity, and utilizing the plasma plume at a power of 1000w-2000w The surface temperature of the silicon substrate is raised to the first surface temperature; methane and silane are fed into the plasma reactor, and the silicon substrate surface is heated to the second surface temperature within the time t1 under the power of 2500w-3500w, methane and The gas feeding rate of silane is v=Q*h/t1; when the pressure in the chamber reaches 0.1mbar, stop feeding methane and silane gas, and adjust the power to 1000w-2000w, after the reaction time is 3-5min, vacuumize ; Pour ammonia gas into the plasma reactor, and control it to make the cavity pressure reach 0.1mbar again within 5s, stop the ventilation, and under the power of 1000w-2000w, the reaction time is 3-5min, return to normal pressure, and the silicon matrix take out. The invention optimizes the coating process of the silicon substrate, thereby forming a decay-resistant perc cell structure, with good overall yield and increased effect.

Description

Method and device for reducing attenuation of perc battery piece
Technical Field
The invention relates to the technical field of perc batteries, in particular to a method and a device for reducing attenuation of a perc battery piece.
Background
Although perc cells have a higher conversion efficiency, perc cells have a higher attenuation than other crystalline silicon cells, and processes and devices for suppressing attenuation for mono-poly perc cells have also been successively introduced for this purpose. It is considered that attenuation can be suppressed by using low-temperature slurry and by using a means such as gettering, high-temperature annealing, and laser rapid annealing. Factors leading to degradation are still under investigation and, in addition to the conventional B-O pair, there are still unknown factors under investigation that may be associated with higher metal impurity levels in polysilicon.
The invention adopts a new method and a new device to prepare the perc battery with better anti-attenuation effect.
Disclosure of Invention
The present invention is directed to a method for reducing attenuation of perc cells to solve the above problems.
To achieve the above object, in one aspect, the present invention provides a method for reducing attenuation of a perc cell, comprising the steps of:
(1) placing a silicon substrate with an aluminum oxide film deposited on the back surface below an ionization outlet of a discharge plasma reactor, placing the silicon substrate in a sealed cavity, and raising the surface temperature of the silicon substrate to a first surface temperature by using plasma plume under the power of 1000-2000 w;
(2) introducing methane and silane into the plasma reactor, and heating the surface of the silicon substrate to a second surface temperature within time t1 under the power of 2500w-3500w, wherein the gas introduction rate v = Q x h/t1 x D of the methane and the silane is the heating power, and h is a correlation coefficient; t1 is less than or equal to 20s, and D is the caliber of the outlet;
(3) when the pressure in the cavity reaches 0.1mbar, stopping introducing methane and silane gas, adjusting the power to 1000w-2000w, reacting for 3-5min, and vacuumizing;
(4) and (3) introducing ammonia gas into the plasma reactor, controlling the pressure of the cavity to reach 0.1mbar within 5s, stopping introducing the gas, reacting for 3-5min under the power of 1000w-2000w, recovering the normal pressure, and taking out the silicon substrate.
The method ionizes the introduced gas into active plasma by using a plasma reactor, and simultaneously heats the surface of the silicon substrate by using the temperature of plasma plume to reach a proper reaction condition; the invention establishes a relational expression by the gas speed, the power, the heating time and the outlet caliber, so that the reaction temperature and the reaction time are kept at the optimal conditions, and the conditions of low yield and unstable product performance caused by uncertain factors in the reaction are avoided.
In a preferred embodiment of the present invention, the silicon substrate is taken out and left standing for 30min at a third surface temperature, and then is placed in a room temperature environment, wherein the third surface temperature is 1/2 of the second surface temperature.
And (3) slowly cooling the silicon substrate taken out for 30min instead of directly and rapidly cooling the silicon substrate, wherein the cooling temperature is half of the highest temperature so as to stabilize the performance of the silicon substrate after reaction.
In a preferred embodiment of the invention, the discharge is pulsed at a frequency of 30 Hz.
Because the temperature at the outlet of the reactor is higher and can reach 2000 ℃ at most, the continuous discharge can not only increase the temperature too fast and be unfavorable for producing active particles, but also can influence the service life of the electrode, and the pulse discharge can be adopted to prevent the phenomenon. The high-efficiency active particle generation rate is realized through 30Hz, and the overhigh temperature is avoided.
In a preferred embodiment of the present invention, the ratio of the introduced contents of the methane gas and the silane gas is in the range of 15 to 20: 1.
The thickness of the silicon nitride is adjusted by the ratio of the introduced mixed gas, wherein the ratio of the introduced contents of the methane gas and the silane gas is in a range of 15-20:1, which is a preferable ratio.
In a preferred embodiment of the present invention, the first surface temperature is 600-700 ℃, and the second surface temperature is 900-1100 ℃.
In a preferred embodiment of the present invention, the outlet of the plasma reactor has a ceramic tubular structure.
The ceramic has good high temperature resistance, and the outlet of the ceramic is made of ceramic materials, so that the effective working time of the reactor can be prolonged, and the efficiency is improved.
In a preferred embodiment of the present invention, the outlet of the reactor is located at a distance of 10cm to 20cm from the surface of the silicon substrate.
The outlet distance of the reactor is controlled in a reasonable range, so that heat can be quickly transferred, and good reaction of active particles can be ensured.
In a preferred embodiment of the present invention, the distance between the outlet of the reactor and the surface of the silicon substrate is adjustable by a motor, and the motor is configured to ensure that the temperature of the surface of the silicon substrate is kept constant after reaching a specified value under a fixed power condition according to the temperature value and the gas content in the cavity.
The reaction temperature is maintained at an optimum temperature in real time by adaptively adjusting the distance according to the temperature value and the gas content by controlling the motor due to the variation of the reaction voltage, the current and the gas content, which inevitably affects the stability of the reaction conditions.
In another aspect of the invention, the invention provides a device for reducing attenuation of perc battery pieces, which comprises a cavity, a plasma reactor, a gas supply unit and a controller;
the outlet of the plasma reactor is communicated with the cavity;
the gas supply unit is communicated with the inlet of the plasma reactor;
the cavity is also provided with a backflow port capable of controlling flow, and the backflow port is communicated with an inlet pipeline of the plasma reactor;
a temperature sensor, a gas concentration sensor and a silicon substrate opposite to the outlet of the reactor are arranged in the cavity;
the controller is electrically connected with the plasma reactor, the gas supply unit and the temperature sensor so as to control the power of the reactor, the gas inflow of the gas supply unit and the flow of the reflux port according to the temperature value and the gas content.
The device can automatically control parameters of the reactor, gas supply flow, circulating gas flow and power through the controller, and realizes accurate control of reaction conditions.
Wherein the design through the backward flow mouth makes to constitute the air current circulation between reactor and the cavity, lets in the secondary ionization in the reactor again at unreacted active particle to promote the effective active ingredient in the cavity fast, improve reaction efficiency.
In a preferred embodiment of the present invention, the outlet of the reactor is a telescopic structure, and the telescopic structure is driven by a motor;
the controller is also configured to control the motor to drive the outlet to stretch under the condition of fixed power according to the temperature value and the gas content, and the temperature of the surface of the silicon substrate is guaranteed to be constant after reaching a specified value.
The reaction temperature is maintained at the optimum temperature in real time by controlling the motor to adaptively adjust the distance according to the temperature value and the gas content.
Compared with the prior art, the invention has the beneficial effects that:
1. the method ionizes the introduced gas into active plasma by using a plasma reactor, and simultaneously heats the surface of the silicon substrate by using the temperature of plasma plume to reach a proper reaction condition; the method establishes a relational expression by the gas speed, the power and the heating time so as to keep the reaction temperature and the reaction time at the optimal conditions, and avoids the conditions of low yield and unstable product performance caused by uncertain factors in the reaction.
2. Because the temperature at the outlet of the reactor is higher and can reach 2000 ℃ at most, the continuous discharge can not only increase the temperature too fast and be unfavorable for producing active particles, but also can influence the service life of the electrode, and the pulse discharge can be adopted to prevent the phenomenon. The high-efficiency active particle generation rate is realized through 30Hz, and the overhigh temperature is avoided.
3. The reaction temperature is maintained at the optimum temperature in real time by controlling the motor to adaptively adjust the distance according to the temperature value and the gas content.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely below, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example 1:
a method of reducing attenuation in a perc cell, comprising the steps of:
(1) placing a silicon substrate with an aluminum oxide film deposited on the back surface below an ionization outlet of a discharge plasma reactor, placing the silicon substrate in a sealed cavity, and raising the surface temperature of the silicon substrate to a first surface temperature by using plasma plume under the power of 1000-2000 w;
(2) introducing methane and silane into the plasma reactor, and heating the surface of the silicon substrate to a second surface temperature within time t1 under the power of 2500w-3500w, wherein the gas introduction rate of the methane and the silane is v = Q x h/t1 x D, wherein Q is the heating power, and h is a correlation coefficient; t1 is less than or equal to 20s, and D is the caliber of the outlet;
(3) when the pressure in the cavity reaches 0.1mbar, stopping introducing methane and silane gas, adjusting the power to 1000w-2000w, reacting for 3-5min, and vacuumizing;
(4) and (3) introducing ammonia gas into the plasma reactor, controlling the pressure of the cavity within 5s to reach 0.1mbar again, stopping introducing the gas, reacting for 3-5min under the power of 1000w-2000w, recovering the normal pressure, and taking out the silicon substrate.
Specifically, the value of the coefficient h is 15 to 20.
The method ionizes the introduced gas into active plasma by using a plasma reactor, and simultaneously heats the surface of the silicon substrate by using the temperature of plasma plume to reach a proper reaction condition; the method establishes a relational expression by the gas speed, the power and the heating time so as to keep the reaction temperature and the reaction time at the optimal conditions, and avoids the conditions of low yield and unstable product performance caused by uncertain factors in the reaction.
In a preferred embodiment of the present invention, the silicon substrate is taken out and left standing for 30min at a third surface temperature, and then is placed in a room temperature environment, wherein the third surface temperature is 1/2 of the second surface temperature.
And (3) slowly cooling the silicon substrate taken out for 30min instead of directly and rapidly cooling the silicon substrate, wherein the cooling temperature is half of the highest temperature so as to stabilize the performance of the silicon substrate after reaction.
In a preferred embodiment of the invention, the discharge is pulsed at a frequency of 30 Hz.
Because the temperature at the outlet of the reactor is higher and can reach 2000 ℃ at most, the continuous discharge can not only increase the temperature too fast and be unfavorable for producing active particles, but also can influence the service life of the electrode, and the pulse discharge can be adopted to prevent the phenomenon. The high-efficiency active particle generation rate is realized through 30Hz, and the overhigh temperature is avoided.
In a preferred embodiment of the present invention, the ratio of the introduced contents of the methane gas and the silane gas is in the range of 15 to 20: 1.
The thickness of the silicon nitride is adjusted by the ratio of the introduced mixed gas, wherein the ratio of the introduced contents of the methane gas and the silane gas is in a range of 15-20:1, which is a preferable ratio.
In a preferred embodiment of the present invention, the first surface temperature is 600-700 ℃, and the second surface temperature is 900-1100 ℃.
In a preferred embodiment of the present invention, the outlet of the plasma reactor has a ceramic tubular structure.
The ceramic has good high temperature resistance, and the outlet of the ceramic is made of ceramic materials, so that the effective working time of the reactor can be prolonged, and the efficiency is improved.
In a preferred embodiment of the present invention, the outlet of the reactor is located at a distance of 10cm to 20cm from the surface of the silicon substrate.
The outlet distance of the reactor is controlled in a reasonable range, so that heat can be quickly transferred, and good reaction of active particles can be ensured.
In a preferred embodiment of the present invention, the distance between the outlet of the reactor and the surface of the silicon substrate is adjustable by a motor, and the motor is configured to ensure that the temperature of the surface of the silicon substrate is kept constant after reaching a specified value under a fixed power condition according to the temperature value and the gas content in the cavity.
The reaction temperature is maintained at an optimum temperature in real time by adaptively adjusting the distance according to the temperature value and the gas content by controlling the motor due to the variation of the reaction voltage, the current and the gas content, which inevitably affects the stability of the reaction conditions.
Example 2
The invention provides a device for reducing attenuation of perc battery pieces, which comprises a cavity, a plasma reactor, an air supply unit and a controller, wherein the plasma reactor is arranged in the cavity;
the outlet of the plasma reactor is communicated with the cavity;
the gas supply unit is communicated with the inlet of the plasma reactor;
the cavity is also provided with a backflow port capable of controlling flow, and the backflow port is communicated with an inlet pipeline of the plasma reactor;
a temperature sensor, a gas concentration sensor and a silicon substrate opposite to the outlet of the reactor are arranged in the cavity;
the controller is electrically connected with the plasma reactor, the gas supply unit and the temperature sensor so as to control the power of the reactor, the gas inflow of the gas supply unit and the flow of the reflux port according to the temperature value and the gas content.
The device can automatically control parameters of the reactor, gas supply flow, circulating gas flow and power through the controller, and realizes accurate control of reaction conditions.
Wherein through the design of backward flow mouth make between reactor and the cavity constitute the air current circulation, let in the secondary ionization in the reactor again at unreacted active particle to promote the effective active ingredient in the cavity fast, improve reaction efficiency.
In a preferred embodiment of the present invention, the outlet of the reactor is a telescopic structure, and the telescopic structure is driven by a motor;
the controller is also configured to control the motor to drive the outlet to stretch under the condition of fixed power according to the temperature value and the gas content, and the temperature of the surface of the silicon substrate is guaranteed to be constant after reaching a specified value.
The reaction temperature is maintained at the optimum temperature in real time by controlling the motor to adaptively adjust the distance according to the temperature value and the gas content.
The foregoing shows and describes the general principles, essential features, and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, and the preferred embodiments of the present invention are described in the above embodiments and the description, and are not intended to limit the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims (10)

1.一种降低perc电池片衰减的方法,其特征在于,包括如下步骤:1. a method for reducing attenuation of perc cell, is characterized in that, comprises the steps: (1)将背面沉积有氧化铝薄膜的硅基体置于放电等离子反应器电离出口下方,所述硅基体放置于密封腔体中,利用等离子羽辉在1000w-2000w的功率下将硅基体表面温度升高第一表面温度;(1) The silicon substrate with the aluminum oxide film deposited on the back is placed under the ionization outlet of the discharge plasma reactor, and the silicon substrate is placed in a sealed cavity. increasing the first surface temperature; (2)向等离子反应器中通入甲烷和硅烷,并在2500w-3500w的功率下控制在时间t1内将硅基体表面升温至第二表面温度,所述甲烷和硅烷的气体通入速率v=Q*h/t1*D;其中Q为升温功率,h为关联系数;所述t1小于等于20s,D为出口的口径;(2) Pour methane and silane into the plasma reactor, and control the temperature of the silicon substrate surface to the second surface temperature within the time t1 under the power of 2500w-3500w, and the gas introduction rate of the methane and silane v= Q*h/t1*D; wherein Q is the heating power, h is the correlation coefficient; the t1 is less than or equal to 20s, and D is the diameter of the outlet; (3)当腔体内压力至达到0.1mbar时,停止通入甲烷和硅烷气体,并将功率调至1000w-2000w,反应时间3-5min后,抽真空;(3) When the pressure in the chamber reaches 0.1mbar, stop feeding methane and silane gas, adjust the power to 1000w-2000w, and vacuumize after the reaction time is 3-5min; (4)向等离子反应器中通入氨气,并控制在5s内使得腔体压力再次达到0.1mbar时,停止通气,并在功率1000w-2000w下,反应时间3-5min,恢复常压,将硅基体取出。(4) Pour ammonia gas into the plasma reactor, and control it within 5s to make the cavity pressure reach 0.1mbar again, stop the ventilation, and under the power of 1000w-2000w, the reaction time is 3-5min, return to normal pressure, and put The silicon substrate is taken out. 2.如权利要求1所述的降低perc电池片衰减的方法,其特征在于,所述硅基体取出以第三表面温度静置30min后置于室温环境中,所述第三表面温度为1/2的第二表面温度。2. The method for reducing the attenuation of a perc cell according to claim 1, wherein the silicon substrate is taken out and placed in a room temperature environment after being left at a third surface temperature for 30 minutes, and the third surface temperature is 1/1/2. 2 for the second surface temperature. 3.如权利要求1所述的降低perc电池片衰减的方法,其特征在于,所述放电采用脉冲形式,脉冲频率为30Hz。3 . The method for reducing the attenuation of perc cells according to claim 1 , wherein the discharge is in the form of pulses, and the pulse frequency is 30 Hz. 4 . 4.如权利要求1所述的降低perc电池片衰减的方法,其特征在于,所述甲烷和硅烷气体的通入含量比值范围为15-20:1。4 . The method for reducing the attenuation of a perc cell according to claim 1 , wherein the ratio of the methane and silane gas introduced is in the range of 15-20:1. 5 . 5.如权利要求1所述的降低perc电池片衰减的方法,其特征在于,所述第一表面温度600-700℃,第二表面温度为900-1100℃。5 . The method for reducing the attenuation of a perc cell according to claim 1 , wherein the temperature of the first surface is 600-700° C., and the temperature of the second surface is 900-1100° C. 6 . 6.如权利要求1所述的降低perc电池片衰减的方法,其特征在于,所述等离子反应器的出口为陶瓷管状结构。6 . The method for reducing the attenuation of perc cells according to claim 1 , wherein the outlet of the plasma reactor is a ceramic tubular structure. 7 . 7.如权利要求6所述的降低perc电池片衰减的方法,其特征在于,所述反应器的出口距离硅基体的表面距离为10cm-20cm。7 . The method for reducing the attenuation of a perc cell according to claim 6 , wherein the distance between the outlet of the reactor and the surface of the silicon substrate is 10 cm-20 cm. 8 . 8.如权利要求7所述的降低perc电池片衰减的方法,其特征在于,所述反应器的出口与硅基体的表面距离通过电机可调,所述电机被配置为根据腔体内的温度值和气体含量,在固定的功率情况下保证硅基体表面的温度到达规定值后保持温度恒定。8 . The method for reducing the attenuation of perc cells according to claim 7 , wherein the distance between the outlet of the reactor and the surface of the silicon substrate is adjustable by a motor, and the motor is configured according to the temperature value in the cavity. 9 . and gas content, under the condition of fixed power, to ensure that the temperature of the silicon substrate surface reaches the specified value and keeps the temperature constant. 9.一种降低perc电池片衰减的装置,其特征在于,包括腔体、等离子体反应器、供气单元和控制器;9. A device for reducing the attenuation of perc cells, comprising a cavity, a plasma reactor, a gas supply unit and a controller; 所述等离子体反应器出口与所述腔体连通;The plasma reactor outlet is communicated with the cavity; 所述供气单元与所述等离子体反应器的入口连通;the gas supply unit communicates with the inlet of the plasma reactor; 所述腔体还设置有可控制流量的回流口,所述回流口与等离子体反应器的入口管路连通;The cavity is also provided with a flow-controllable return port, and the return port is communicated with the inlet pipeline of the plasma reactor; 所述腔体内设置有温度传感器、气体浓度传感器,以及与所述反应器出口相对的硅基体;The cavity is provided with a temperature sensor, a gas concentration sensor, and a silicon substrate opposite to the reactor outlet; 所述控制器与所述等离子体反应器、供气单元和温度传感器电连接,以根据温度值和气体含量控制反应器的功率、供气单元的气体流入和回流口的流量。The controller is electrically connected with the plasma reactor, the gas supply unit and the temperature sensor to control the power of the reactor, the gas inflow and the flow rate of the return port of the gas supply unit according to the temperature value and the gas content. 10.如权利要求9所述的降低perc电池片衰减的装置,其特征在于,所述反应器的出口为伸缩结构,所述伸缩结构通过电机驱动;10 . The device for reducing the attenuation of perc cells according to claim 9 , wherein the outlet of the reactor is a telescopic structure, and the telescopic structure is driven by a motor; 11 . 所述控制器还被配置为根据温度值和气体含量,在固定的功率情况下控制电机驱动出口的伸缩,保证硅基体表面的温度到达规定值后保持温度恒定。The controller is also configured to control the expansion and contraction of the motor-driven outlet under a fixed power condition according to the temperature value and the gas content, so as to ensure that the temperature of the surface of the silicon substrate is kept constant after the temperature reaches a specified value.
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Citations (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4631198A (en) * 1983-05-16 1986-12-23 Oki Electric Industry Co., Ltd. Method of manufacturing thin amorphous silicon film
JPH03252390A (en) * 1990-03-02 1991-11-11 Mitsubishi Kasei Polytec Co Condition setting method for analyzing heat fluid in furnace
US5154795A (en) * 1989-06-12 1992-10-13 Mitsubishi Kasei Polytec Company System for setting analysis condition for a thermal analysis of a fluid inside an apparatus
JPH05343329A (en) * 1991-08-28 1993-12-24 Fuji Electric Co Ltd Microwave plasma processor and procedure
JPH10172793A (en) * 1996-12-17 1998-06-26 Mitsubishi Heavy Ind Ltd Plasma generator
US20030041650A1 (en) * 2001-03-22 2003-03-06 Marino Dimarzo Sensor probe for measuring temperature and liquid volumetric fraction of a liquid droplet laden hot gas and method of using same
CN1798697A (en) * 2003-04-15 2006-07-05 布莱克光电有限公司 Plasma reactor and process for producing lower-energy hydrogen species.
JP2006221061A (en) * 2005-02-14 2006-08-24 Canon Inc Fixing apparatus and image forming apparatus
JP2008004861A (en) * 2006-06-26 2008-01-10 Nippon Avionics Co Ltd Semiconductor chip ultrasonic bonding method and ultrasonic bonding apparatus therefor
US20150221787A1 (en) * 2012-09-03 2015-08-06 Dongfang Electric (Yixing) Magi Solar Power Technology Co., Ltd. Method for fabricating anti-reflection film with anti-pid effect
CN107464857A (en) * 2017-08-18 2017-12-12 常州亿晶光电科技有限公司 A kind of coating process method of reduction PERC cell pieces decay
CN108713243A (en) * 2016-03-11 2018-10-26 大阳日酸株式会社 The manufacturing method and silicon nitride film of silicon nitride film
CN110965044A (en) * 2019-09-09 2020-04-07 浙江爱旭太阳能科技有限公司 Dielectric passivation film for reducing electric attenuation of PERC battery and preparation method thereof
JP2020077882A (en) * 2020-01-31 2020-05-21 株式会社日立ハイテク Plasma processing device
WO2021036798A1 (en) * 2019-08-29 2021-03-04 通威太阳能(成都)有限公司 Perc battery assembly with high pid resistance and preparation method therefor
US20220072679A1 (en) * 2018-12-28 2022-03-10 Ebara Corporation Pad-temperature regulating apparatus, method of regulating pad-temperature, polishing apparatus, and polishing system
CN216161746U (en) * 2021-03-09 2022-04-01 一道新能源科技(衢州)有限公司 Film structure of solar cell

Patent Citations (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4631198A (en) * 1983-05-16 1986-12-23 Oki Electric Industry Co., Ltd. Method of manufacturing thin amorphous silicon film
US5154795A (en) * 1989-06-12 1992-10-13 Mitsubishi Kasei Polytec Company System for setting analysis condition for a thermal analysis of a fluid inside an apparatus
JPH03252390A (en) * 1990-03-02 1991-11-11 Mitsubishi Kasei Polytec Co Condition setting method for analyzing heat fluid in furnace
JPH05343329A (en) * 1991-08-28 1993-12-24 Fuji Electric Co Ltd Microwave plasma processor and procedure
JPH10172793A (en) * 1996-12-17 1998-06-26 Mitsubishi Heavy Ind Ltd Plasma generator
US20030041650A1 (en) * 2001-03-22 2003-03-06 Marino Dimarzo Sensor probe for measuring temperature and liquid volumetric fraction of a liquid droplet laden hot gas and method of using same
CN1798697A (en) * 2003-04-15 2006-07-05 布莱克光电有限公司 Plasma reactor and process for producing lower-energy hydrogen species.
JP2006221061A (en) * 2005-02-14 2006-08-24 Canon Inc Fixing apparatus and image forming apparatus
JP2008004861A (en) * 2006-06-26 2008-01-10 Nippon Avionics Co Ltd Semiconductor chip ultrasonic bonding method and ultrasonic bonding apparatus therefor
US20150221787A1 (en) * 2012-09-03 2015-08-06 Dongfang Electric (Yixing) Magi Solar Power Technology Co., Ltd. Method for fabricating anti-reflection film with anti-pid effect
CN108713243A (en) * 2016-03-11 2018-10-26 大阳日酸株式会社 The manufacturing method and silicon nitride film of silicon nitride film
CN107464857A (en) * 2017-08-18 2017-12-12 常州亿晶光电科技有限公司 A kind of coating process method of reduction PERC cell pieces decay
US20220072679A1 (en) * 2018-12-28 2022-03-10 Ebara Corporation Pad-temperature regulating apparatus, method of regulating pad-temperature, polishing apparatus, and polishing system
WO2021036798A1 (en) * 2019-08-29 2021-03-04 通威太阳能(成都)有限公司 Perc battery assembly with high pid resistance and preparation method therefor
CN110965044A (en) * 2019-09-09 2020-04-07 浙江爱旭太阳能科技有限公司 Dielectric passivation film for reducing electric attenuation of PERC battery and preparation method thereof
JP2020077882A (en) * 2020-01-31 2020-05-21 株式会社日立ハイテク Plasma processing device
CN216161746U (en) * 2021-03-09 2022-04-01 一道新能源科技(衢州)有限公司 Film structure of solar cell

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
J.GAO ET AL: "Improvement of a-Si:H solar cell performance by SiH4 purging treatment", 《VACUUM》 *
张华: "基于甲烷的中空对称双阴极固体氧化物燃料电池的发电性能研究", 《中国硕士学位论文电子期刊》 *
邱胜桦等: "PECVD法低温制备纳米晶硅薄膜晶化特性的Raman分析", 《材料研究与应用》 *

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