CN1251183A - 集成电路及该集成电路的测试方法 - Google Patents

集成电路及该集成电路的测试方法 Download PDF

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Publication number
CN1251183A
CN1251183A CN98803503A CN98803503A CN1251183A CN 1251183 A CN1251183 A CN 1251183A CN 98803503 A CN98803503 A CN 98803503A CN 98803503 A CN98803503 A CN 98803503A CN 1251183 A CN1251183 A CN 1251183A
Authority
CN
China
Prior art keywords
test
rom
cpu
integrated circuit
bus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN98803503A
Other languages
English (en)
Chinese (zh)
Inventor
J·诺勒斯
H·H·菲曼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Corp
Original Assignee
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Corp filed Critical Siemens Corp
Publication of CN1251183A publication Critical patent/CN1251183A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
    • G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
    • G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
    • G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Microcomputers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Storage Device Security (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
CN98803503A 1997-03-19 1998-03-02 集成电路及该集成电路的测试方法 Pending CN1251183A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19711478.4 1997-03-19
DE19711478A DE19711478A1 (de) 1997-03-19 1997-03-19 Integrierte Schaltung und Verfahren zum Testen der integrierten Schaltung

Publications (1)

Publication Number Publication Date
CN1251183A true CN1251183A (zh) 2000-04-19

Family

ID=7823916

Family Applications (1)

Application Number Title Priority Date Filing Date
CN98803503A Pending CN1251183A (zh) 1997-03-19 1998-03-02 集成电路及该集成电路的测试方法

Country Status (7)

Country Link
EP (1) EP0968436A2 (fr)
JP (1) JP2001527669A (fr)
KR (1) KR20000076351A (fr)
CN (1) CN1251183A (fr)
BR (1) BR9808381A (fr)
DE (1) DE19711478A1 (fr)
WO (1) WO1998041880A2 (fr)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1829127B (zh) * 2006-04-20 2011-06-29 北京星河亮点通信软件有限责任公司 一种基于微内核的通信终端测试仪表控制平台的构建方法
CN102592683A (zh) * 2012-02-23 2012-07-18 苏州华芯微电子股份有限公司 一种芯片测试模式的进入方法及相关装置
CN103021471A (zh) * 2012-12-24 2013-04-03 上海新储集成电路有限公司 一种存储器及其存储方法
CN112912958A (zh) * 2018-10-29 2021-06-04 德州仪器公司 使用内置自测控制器测试只读存储器

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3198997B2 (ja) * 1997-08-28 2001-08-13 日本電気株式会社 マイクロコンピュータ及びそのバーンインテスト方法
EP0992809A1 (fr) 1998-09-28 2000-04-12 Siemens Aktiengesellschaft Circuit avec trajet d'analyse désactivable
RU2174692C1 (ru) * 2000-06-27 2001-10-10 Ульяновский государственный технический университет Устройство для измерения теплового сопротивления переход-корпус цифровых интегральных микросхем
DE10101234A1 (de) * 2001-01-11 2002-07-18 Giesecke & Devrient Gmbh Verfahren zum Text eines nichtflüchtigen Speichers und Verwendung eines solchen Verfahrens
JP2004259273A (ja) * 2003-02-24 2004-09-16 Stmicroelectronics Sa 集積回路の動作モードを選択する方法および装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0758502B2 (ja) * 1988-06-30 1995-06-21 三菱電機株式会社 Ｉｃカード
JP3125070B2 (ja) * 1990-12-14 2001-01-15 三菱電機株式会社 Ｉｃカード
JPH06236447A (ja) * 1993-02-09 1994-08-23 Mitsubishi Electric Corp Ｉｃカード用マイクロコンピュータ

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1829127B (zh) * 2006-04-20 2011-06-29 北京星河亮点通信软件有限责任公司 一种基于微内核的通信终端测试仪表控制平台的构建方法
CN102592683A (zh) * 2012-02-23 2012-07-18 苏州华芯微电子股份有限公司 一种芯片测试模式的进入方法及相关装置
CN102592683B (zh) * 2012-02-23 2014-12-10 苏州华芯微电子股份有限公司 一种芯片测试模式的进入方法及相关装置
CN103021471A (zh) * 2012-12-24 2013-04-03 上海新储集成电路有限公司 一种存储器及其存储方法
CN112912958A (zh) * 2018-10-29 2021-06-04 德州仪器公司 使用内置自测控制器测试只读存储器

Also Published As

Publication number Publication date
WO1998041880A2 (fr) 1998-09-24
DE19711478A1 (de) 1998-10-01
KR20000076351A (ko) 2000-12-26
WO1998041880A3 (fr) 1999-01-14
EP0968436A2 (fr) 2000-01-05
BR9808381A (pt) 2000-05-23
JP2001527669A (ja) 2001-12-25

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C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication