CN1829910B - 实现xanes分析的方法和设备 - Google Patents

实现xanes分析的方法和设备 Download PDF

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Publication number
CN1829910B
CN1829910B CN2004800219329A CN200480021932A CN1829910B CN 1829910 B CN1829910 B CN 1829910B CN 2004800219329 A CN2004800219329 A CN 2004800219329A CN 200480021932 A CN200480021932 A CN 200480021932A CN 1829910 B CN1829910 B CN 1829910B
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ray
sample
energy
rays
optics
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Chinese (zh)
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CN1829910A (zh
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陈泽武
沃尔特·吉布森
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X Ray Optical Systems Inc
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X Ray Optical Systems Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN2004800219329A 2003-06-02 2004-06-02 实现xanes分析的方法和设备 Expired - Fee Related CN1829910B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US47514803P 2003-06-02 2003-06-02
US60/475,148 2003-06-02
PCT/US2004/017454 WO2004111624A2 (fr) 2003-06-02 2004-06-02 Procede et appareil de mise en oeuvre d'une analyse

Publications (2)

Publication Number Publication Date
CN1829910A CN1829910A (zh) 2006-09-06
CN1829910B true CN1829910B (zh) 2012-05-23

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US (1) US7206375B2 (fr)
EP (1) EP1634065A2 (fr)
JP (1) JP4723487B2 (fr)
CN (1) CN1829910B (fr)
WO (1) WO2004111624A2 (fr)

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US8693626B2 (en) * 2011-06-17 2014-04-08 Uop Llc Solid material characterization with X-ray spectra in both transmission and fluoresence modes
CN105806863B (zh) 2011-11-04 2019-03-15 住友橡胶工业株式会社 劣化分析方法
US9364191B2 (en) 2013-02-11 2016-06-14 University Of Rochester Method and apparatus of spectral differential phase-contrast cone-beam CT and hybrid cone-beam CT
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CN104267055B (zh) * 2014-10-10 2016-12-07 中国科学院高能物理研究所 同步辐射能量稳定装置及方法
JP6069609B2 (ja) * 2015-03-26 2017-02-01 株式会社リガク 二重湾曲ｘ線集光素子およびその構成体、二重湾曲ｘ線分光素子およびその構成体の製造方法
US9494536B1 (en) 2015-06-01 2016-11-15 Chevron U.S.A. Inc. Methods for predicting corrosion rate of crude oil derived samples using X-ray absorption spectroscopy
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US10677744B1 (en) * 2016-06-03 2020-06-09 U.S. Department Of Energy Multi-cone x-ray imaging Bragg crystal spectrometer
CN105891246B (zh) * 2016-06-23 2018-11-16 北京至一恒盛技术服务有限公司 一种x射线荧光探测装置
JP7418208B2 (ja) 2016-09-15 2024-01-19 ユニバーシティ オブ ワシントン Ｘ線分光計及びその使用方法
WO2018102792A1 (fr) * 2016-12-02 2018-06-07 Ningbo Infinite Materials Technology Co., Ltd Procédé de diffractométrie et de spectroscopie des rayons x et appareil associé
CN106770392B (zh) * 2016-12-16 2020-04-10 中国科学院长春光学精密机械与物理研究所 一种近边x射线吸收谱仪
CN110621986B (zh) * 2017-03-22 2022-05-17 斯格瑞公司 执行x射线光谱分析的方法和x射线吸收光谱仪系统
CN108132484B (zh) * 2017-12-12 2020-02-14 中国计量科学研究院 一种可调节单晶单色器的调节方法
US11193884B2 (en) 2018-07-02 2021-12-07 The Research Foundation For The State University Of New York System and method for structural characterization of materials by supervised machine learning-based analysis of their spectra
US11614414B2 (en) * 2018-10-19 2023-03-28 Commonwealth Scientific And Industrial Research Organisation Energy-dispersive X-ray diffraction analyser comprising a substantially X-ray transparent member having an improved reflection geometry
CN110793982B (zh) * 2019-11-21 2022-03-04 山东建筑大学 一种纳米晶化动力学过程的高能x射线表征方法
JP7395775B2 (ja) 2020-05-18 2023-12-11 シグレイ、インコーポレイテッド 結晶解析装置及び複数の検出器素子を使用するｘ線吸収分光法のためのシステム及び方法
CN111650226B (zh) * 2020-05-27 2023-08-25 中国科学院上海应用物理研究所 一种基于实验室x射线源的中能x射线吸收谱仪
WO2022061347A1 (fr) 2020-09-17 2022-03-24 Sigray, Inc. Système et procédé utilisant des rayons x pour métrologie et analyse de résolution de profondeur
KR20260030946A (ko) 2020-12-07 2026-03-06 시그레이, 아이엔씨. 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템
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CN121013975A (zh) 2023-02-16 2025-11-25 斯格瑞公司 具有至少两个堆叠的平面布拉格衍射器的x射线探测器系统
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Also Published As

Publication number Publication date
US7206375B2 (en) 2007-04-17
WO2004111624A3 (fr) 2005-03-10
CN1829910A (zh) 2006-09-06
US20060120508A1 (en) 2006-06-08
JP2006526789A (ja) 2006-11-24
WO2004111624A2 (fr) 2004-12-23
EP1634065A2 (fr) 2006-03-15
JP4723487B2 (ja) 2011-07-13

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