CN1981202A - 模块化测试系统中的数据日志支持 - Google Patents

模块化测试系统中的数据日志支持 Download PDF

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Publication number: CN1981202A
Authority: CN; China
Prior art keywords: data logging; format; class; data; destination
Prior art date: 2004-05-22
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Pending

Application number

CN 200580015953

Other languages

English (en)

Chinese (zh)

Inventor

马克·埃尔斯顿

安康·普拉马尼克

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Advantest Corp

Original Assignee

Advantest Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2004-05-22

Filing date

2005-05-23

Publication date

2007-06-13

2005-05-23 Application filed by Advantest Corp filed Critical Advantest Corp

2007-06-13 Publication of CN1981202A publication Critical patent/CN1981202A/zh

Status Pending legal-status Critical Current

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Tests Of Electronic Circuits (AREA)
Test And Diagnosis Of Digital Computers (AREA)
Debugging And Monitoring (AREA)
Management, Administration, Business Operations System, And Electronic Commerce (AREA)

CN 200580015953 2004-05-22 2005-05-23 模块化测试系统中的数据日志支持 Pending CN1981202A (zh)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date
US57357704P	2004-05-22	2004-05-22
US60/573,577		2004-05-22
US10/917,821		2004-08-13

Publications (1)

Publication Number	Publication Date
CN1981202A true CN1981202A (zh)	2007-06-13

Family

ID=38131583

Family Applications (6)

Application Number	Title	Priority Date	Filing Date
CN 200580015953 Pending CN1981202A (zh)	2004-05-22	2005-05-23	模块化测试系统中的数据日志支持
CN2005800163968A Expired - Fee Related CN1989417B (zh)	2004-05-22	2005-05-23	开发半导体集成电路测试程序的方法和结构
CN2005800164369A Expired - Fee Related CN1997909B (zh)	2004-05-22	2005-05-23	用于控制模块化测试系统中可互换部件的方法和系统
CNB2005800164373A Expired - Fee Related CN100541218C (zh)	2004-05-22	2005-05-23	开发用于半导体集成电路的测试程序的方法和结构
CN200580016355A Expired - Fee Related CN100580473C (zh)	2004-05-22	2005-05-23	支持开放架构测试系统中的校准和诊断
CN200580016215A Expired - Fee Related CN100585422C (zh)	2004-05-22	2005-05-23	用于对模块化测试系统进行仿真的方法和系统

Family Applications After (5)

Application Number	Title	Priority Date	Filing Date
CN2005800163968A Expired - Fee Related CN1989417B (zh)	2004-05-22	2005-05-23	开发半导体集成电路测试程序的方法和结构
CN2005800164369A Expired - Fee Related CN1997909B (zh)	2004-05-22	2005-05-23	用于控制模块化测试系统中可互换部件的方法和系统
CNB2005800164373A Expired - Fee Related CN100541218C (zh)	2004-05-22	2005-05-23	开发用于半导体集成电路的测试程序的方法和结构
CN200580016355A Expired - Fee Related CN100580473C (zh)	2004-05-22	2005-05-23	支持开放架构测试系统中的校准和诊断
CN200580016215A Expired - Fee Related CN100585422C (zh)	2004-05-22	2005-05-23	用于对模块化测试系统进行仿真的方法和系统

Country Status (4)

Country	Link
JP (1)	JP4332200B2 (de)
CN (6)	CN1981202A (de)
AT (3)	ATE438865T1 (de)
DE (3)	DE602005018204D1 (de)

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CN104298590B (zh) *	2013-07-16	2019-05-10	爱德万测试公司	用于按管脚apg的快速语义处理器
CN103413003B (zh) *	2013-08-21	2016-07-06	浪潮(北京)电子信息产业有限公司	一种序列传输、接收装置及方法
KR102147172B1 (ko) *	2014-04-09	2020-08-31	삼성전자주식회사	시스템 온 칩 및 그것의 검증 방법
US9672020B2 (en)	2014-09-19	2017-06-06	Microsoft Technology Licensing, Llc	Selectively loading precompiled header(s) and/or portion(s) thereof
WO2016095993A1 (de)	2014-12-17	2016-06-23	Siemens Aktiengesellschaft	Überprüfen eines funktionsmoduls einer automatisierungsanlage
CN107454124B (zh) *	2016-05-31	2020-11-03	创新先进技术有限公司	设备自动化方法及装置
CN106507098B (zh) *	2016-10-09	2018-10-19	珠海市魅族科技有限公司	数据处理的方法和装置
CN106603074A (zh) *	2016-11-03	2017-04-26	武汉新芯集成电路制造有限公司	一种dac电路并行测试系统及并行测试方法
CN109324956B (zh) *	2018-08-20	2021-11-05	深圳前海微众银行股份有限公司	系统测试方法、设备及计算机可读存储介质
CN109508290A (zh) *	2018-10-25	2019-03-22	深圳点猫科技有限公司	一种基于教育系统的自动化测试方法及电子设备
CN109884923A (zh) *	2019-02-21	2019-06-14	苏州天准科技股份有限公司	一种自动化设备控制模块化可配置系统
CN109975650B (zh) *	2019-04-30	2024-07-12	珠海市运泰利自动化设备有限公司	一种TypeC接头连板多通道测试平台
CN110954804B (zh) *	2019-12-19	2021-11-02	上海御渡半导体科技有限公司	一种批量精确诊断cBit阵列故障的装置和方法
WO2022120159A1 (en) *	2020-12-03	2022-06-09	Synopsys, Inc.	Automatic sequential retry on hardware design compilation failure
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CN113050952B (zh) *	2021-04-19	2024-07-05	杭州至千哩科技有限公司	伪指令编译方法、装置、计算机设备及存储介质
CN113238834B (zh) *	2021-05-31	2023-08-08	北京世冠金洋科技发展有限公司	仿真模型文件的处理方法、装置及电子设备
CN113342649B (zh) *	2021-05-31	2023-11-14	上海创景信息科技有限公司	基于真实目标机实现单元测试的方法、介质和设备
KR102314419B1 (ko) *	2021-07-27	2021-10-19	(주) 에이블리	반도체 테스트 패턴 발생 장치 및 방법
CN113740077B (zh) *	2021-09-13	2024-08-16	广州文远知行科技有限公司	车辆底盘测试方法、装置、设备及存储介质
CN114252758B (zh) *	2021-12-03	2024-12-06	杭州至千哩科技有限公司	Ate测试通道资源配置方法、装置、设备及存储介质
CN114646867B (zh) *	2022-05-18	2022-10-28	南京宏泰半导体科技有限公司	一种集成电路并发测试装置及方法
CN115630594B (zh) *	2022-12-19	2023-03-21	杭州加速科技有限公司	一种芯片设计仿真文件到Pattern文件的转换方法及其系统
CN116257037B (zh) *	2023-05-15	2023-08-11	通达电磁能股份有限公司	控制器测试程序的生成方法、系统、电子设备及存储介质
CN116520754B (zh) *	2023-06-27	2023-09-22	厦门芯泰达集成电路有限公司	基于预加载模式的dps模块控制方法、系统
CN117539700A (zh) *	2023-11-13	2024-02-09	宁畅信息产业(北京)有限公司	一种测试管理方法、装置、设备及介质
CN119381283B (zh) *	2024-12-31	2025-03-21	合肥晶合集成电路股份有限公司	半导体量测方法和量测主站点

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2005
- 2005-05-23 AT AT05743357T patent/ATE438865T1/de not_active IP Right Cessation
- 2005-05-23 CN CN 200580015953 patent/CN1981202A/zh active Pending
- 2005-05-23 AT AT05743262T patent/ATE451625T1/de not_active IP Right Cessation
- 2005-05-23 CN CN2005800163968A patent/CN1989417B/zh not_active Expired - Fee Related
- 2005-05-23 AT AT05743229T patent/ATE451624T1/de not_active IP Right Cessation
- 2005-05-23 DE DE602005018204T patent/DE602005018204D1/de not_active Expired - Lifetime
- 2005-05-23 CN CN2005800164369A patent/CN1997909B/zh not_active Expired - Fee Related
- 2005-05-23 CN CNB2005800164373A patent/CN100541218C/zh not_active Expired - Fee Related
- 2005-05-23 CN CN200580016355A patent/CN100580473C/zh not_active Expired - Fee Related
- 2005-05-23 DE DE602005015848T patent/DE602005015848D1/de not_active Expired - Lifetime
- 2005-05-23 DE DE602005018205T patent/DE602005018205D1/de not_active Expired - Lifetime
- 2005-05-23 CN CN200580016215A patent/CN100585422C/zh not_active Expired - Fee Related
2008
- 2008-07-11 JP JP2008180843A patent/JP4332200B2/ja not_active Expired - Fee Related

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
CN107959981A (zh) *	2017-10-30	2018-04-24	捷开通讯(深圳)有限公司	一种通信终端和通信测试方法
CN107959981B (zh) *	2017-10-30	2020-07-10	捷开通讯(深圳)有限公司	一种通信终端和通信测试方法

Also Published As

Publication number	Publication date
DE602005018205D1 (de)	2010-01-21
ATE451625T1 (de)	2009-12-15
CN100585422C (zh)	2010-01-27
CN100541218C (zh)	2009-09-16
CN1997909A (zh)	2007-07-11
CN1981203A (zh)	2007-06-13
DE602005015848D1 (de)	2009-09-17
ATE451624T1 (de)	2009-12-15
CN1997909B (zh)	2010-11-10
CN1989417A (zh)	2007-06-27
DE602005018204D1 (de)	2010-01-21
JP4332200B2 (ja)	2009-09-16
JP2009008683A (ja)	2009-01-15
CN1997908A (zh)	2007-07-11
CN1981200A (zh)	2007-06-13
CN100580473C (zh)	2010-01-13
ATE438865T1 (de)	2009-08-15
CN1989417B (zh)	2011-03-16

Legal Events

Date	Code	Title
2007-06-13	C06	Publication
2007-06-13	PB01	Publication
2007-08-08	C10	Entry into substantive examination
2007-08-08	SE01	Entry into force of request for substantive examination
2009-12-02	C02	Deemed withdrawal of patent application after publication (patent law 2001)
2009-12-02	WD01	Invention patent application deemed withdrawn after publication

Publication	Publication Date	Title
CN1981202A (zh)	2007-06-13	模块化测试系统中的数据日志支持
JP4608517B2 (ja)	2011-01-12	モジュール式試験システム
US7437261B2 (en)	2008-10-14	Method and apparatus for testing integrated circuits
US20050022087A1 (en)	2005-01-27	Method and system for controlling interchangeable components in a modular test system
JP3954639B2 (ja)	2007-08-08	集積回路をテストする方法および装置
US7210087B2 (en)	2007-04-24	Method and system for simulating a modular test system
EP1610136B1 (de)	2007-07-11	Testemulationseinrichtung
JP4608516B2 (ja)	2011-01-12	モジュール式試験システムに試験モジュールを統合する方法およびモジュール式試験システム
JP2006518460A5 (de)	2006-09-21
US20020073374A1 (en)	2002-06-13	Method,system and program product for testing and/or diagnosing circuits using embedded test controller access data
US20090119542A1 (en)	2009-05-07	System, method, and program product for simulating test equipment
CN111290941B (zh)	2025-04-15	多个接口的测试方法、装置、计算设备和介质
US7496467B2 (en)	2009-02-24	Automatic test equipment operating architecture
JP2009116878A (ja)	2009-05-28	試験装置のシミュレーションシステム、方法、及びプログラム製品
CN100456043C (zh)	2009-01-28	检测集成电路的方法和装置
TWI287639B (en)	2007-10-01	A distributed operating system for a semiconductor test system for testing at least one device under test
JP2007057541A (ja)	2007-03-08	試験エミュレート装置
KR20070017535A (ko)	2007-02-12	모듈식 테스트 시스템의 데이터로그 지원
Rajsuman et al.	2004	Open architecture test system: System architecture and design
JP2005285092A (ja)	2005-10-13	試験エミュレート装置