DD210130A5 - Lichtelektronisches festspaltmikroskop - Google Patents
Lichtelektronisches festspaltmikroskop Download PDFInfo
- Publication number
- DD210130A5 DD210130A5 DD83253413A DD25341383A DD210130A5 DD 210130 A5 DD210130 A5 DD 210130A5 DD 83253413 A DD83253413 A DD 83253413A DD 25341383 A DD25341383 A DD 25341383A DD 210130 A5 DD210130 A5 DD 210130A5
- Authority
- DD
- German Democratic Republic
- Prior art keywords
- light
- polarized light
- bar pattern
- pair
- optical
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 claims abstract description 25
- 230000010287 polarization Effects 0.000 claims abstract description 25
- 238000003776 cleavage reaction Methods 0.000 claims abstract description 5
- 230000007017 scission Effects 0.000 claims abstract description 5
- 230000001678 irradiating effect Effects 0.000 claims abstract description 3
- 238000005286 illumination Methods 0.000 claims description 8
- 230000001360 synchronised effect Effects 0.000 claims description 4
- 238000006243 chemical reaction Methods 0.000 claims 3
- 241000607479 Yersinia pestis Species 0.000 claims 1
- 230000004907 flux Effects 0.000 description 9
- 238000001514 detection method Methods 0.000 description 6
- 230000007246 mechanism Effects 0.000 description 5
- 238000006073 displacement reaction Methods 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 229920000742 Cotton Polymers 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 230000035939 shock Effects 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000003467 diminishing effect Effects 0.000 description 1
- ZPWVASYFFYYZEW-UHFFFAOYSA-L dipotassium hydrogen phosphate Chemical compound [K+].[K+].OP([O-])([O-])=O ZPWVASYFFYYZEW-UHFFFAOYSA-L 0.000 description 1
- 229910000396 dipotassium phosphate Inorganic materials 0.000 description 1
- 235000019797 dipotassium phosphate Nutrition 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000002372 labelling Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000001393 microlithography Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/04—Measuring microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/02—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the intensity of light
- G02B26/04—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the intensity of light by periodically varying the intensity of light, e.g. using choppers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Microscoopes, Condenser (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57147054A JPS5936220A (ja) | 1982-08-25 | 1982-08-25 | 固定スリット型光電顕微鏡 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DD210130A5 true DD210130A5 (de) | 1984-05-30 |
Family
ID=15421454
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DD83253413A DD210130A5 (de) | 1982-08-25 | 1983-07-26 | Lichtelektronisches festspaltmikroskop |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4560278A (fr) |
| EP (1) | EP0102714B1 (fr) |
| JP (1) | JPS5936220A (fr) |
| DD (1) | DD210130A5 (fr) |
| DE (1) | DE3377011D1 (fr) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62247319A (ja) * | 1986-04-01 | 1987-10-28 | Hamamatsu Photonics Kk | 光学活性を示す物質の像形成方法及び装置 |
| US5841577A (en) * | 1996-02-16 | 1998-11-24 | Carnegie Mellon University | Light microscope having acousto-optic tunable filters |
| JP5189301B2 (ja) * | 2007-03-12 | 2013-04-24 | オリンパス株式会社 | レーザー走査型顕微鏡 |
| JP7195525B2 (ja) * | 2018-08-24 | 2022-12-26 | 国立研究開発法人理化学研究所 | 光切替器および観察装置 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE378834C (de) * | 1922-04-05 | 1923-08-03 | Heinrich Hanemann | Metallmikroskop |
| DE1296396B (de) * | 1965-07-24 | 1969-05-29 | Leitz Ernst Gmbh | Optisches Mehrzweckmessgeraet |
| FR1532660A (fr) * | 1967-06-09 | 1968-07-12 | Genevoise Instr Physique | Microscope photoélectrique |
| DE1915680B2 (de) * | 1969-03-27 | 1973-03-08 | Ernst Leitz Gmbh, 6330 Wetzlar | Fotometer fuer beobachtungsinstrumente, insbesondere mikroskope |
| JPS503355A (fr) * | 1973-05-11 | 1975-01-14 | ||
| US3943359A (en) * | 1973-06-15 | 1976-03-09 | Hitachi, Ltd. | Apparatus for relatively positioning a plurality of objects by the use of a scanning optoelectric microscope |
| US3990798A (en) * | 1975-03-07 | 1976-11-09 | Bell Telephone Laboratories, Incorporated | Method and apparatus for aligning mask and wafer |
| NL7606548A (nl) * | 1976-06-17 | 1977-12-20 | Philips Nv | Werkwijze en inrichting voor het uitrichten van een i.c.-patroon ten opzichte van een halfgelei- dend substraat. |
| JPS5311385A (en) * | 1976-07-19 | 1978-02-01 | Brother Ind Ltd | Process for cutting paper |
| DD139902A1 (de) * | 1978-12-19 | 1980-01-23 | Hermann Beyer | Doppelbrechendes bauelement fuer polarisierende interferenzapparate |
-
1982
- 1982-08-25 JP JP57147054A patent/JPS5936220A/ja active Granted
-
1983
- 1983-07-12 DE DE8383304052T patent/DE3377011D1/de not_active Expired
- 1983-07-12 EP EP83304052A patent/EP0102714B1/fr not_active Expired
- 1983-07-13 US US06/513,452 patent/US4560278A/en not_active Expired - Lifetime
- 1983-07-26 DD DD83253413A patent/DD210130A5/de not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6325282B2 (fr) | 1988-05-25 |
| JPS5936220A (ja) | 1984-02-28 |
| DE3377011D1 (en) | 1988-07-14 |
| US4560278A (en) | 1985-12-24 |
| EP0102714B1 (fr) | 1988-06-08 |
| EP0102714A2 (fr) | 1984-03-14 |
| EP0102714A3 (en) | 1986-02-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ENJ | Ceased due to non-payment of renewal fee |