DE3676367D1 - Verfahren zur herstellung von halbleiteranordnungen mittels einer mechanischen verbindung von zwei koerpern. - Google Patents

Verfahren zur herstellung von halbleiteranordnungen mittels einer mechanischen verbindung von zwei koerpern.

Info

Publication number
DE3676367D1
DE3676367D1 DE8686201062T DE3676367T DE3676367D1 DE 3676367 D1 DE3676367 D1 DE 3676367D1 DE 8686201062 T DE8686201062 T DE 8686201062T DE 3676367 T DE3676367 T DE 3676367T DE 3676367 D1 DE3676367 D1 DE 3676367D1
Authority
DE
Germany
Prior art keywords
bodies
semiconductor devices
mechanical connection
producing semiconductor
producing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686201062T
Other languages
English (en)
Inventor
Jan Haisma
Theodorus Martinus Michielsen
Jan Albertus Pals
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of DE3676367D1 publication Critical patent/DE3676367D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/02Manufacture or treatment characterised by using material-based technologies
    • H10D84/03Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
    • H10D84/038Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/117Shapes of semiconductor bodies
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D88/00Three-dimensional [3D] integrated devices
    • H10D88/01Manufacture or treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/19Preparing inhomogeneous wafers
    • H10P90/1904Preparing vertically inhomogeneous wafers
    • H10P90/1906Preparing SOI wafers
    • H10P90/1914Preparing SOI wafers using bonding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W10/00Isolation regions in semiconductor bodies between components of integrated devices
    • H10W10/10Isolation regions comprising dielectric materials
    • H10W10/181Semiconductor-on-insulator [SOI] isolation regions, e.g. buried oxide regions of SOI wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/01Manufacture or treatment
    • H10W70/05Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
    • H10W70/093Connecting or disconnecting other interconnections thereto or therefrom, e.g. connecting bond wires or bumps
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/30Die-attach connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/073Connecting or disconnecting of die-attach connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/073Connecting or disconnecting of die-attach connectors
    • H10W72/07331Connecting techniques
    • H10W72/07337Connecting techniques using a polymer adhesive, e.g. an adhesive based on silicone or epoxy
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/834Interconnections on sidewalls of chips
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/20Configurations of stacked chips
    • H10W90/22Configurations of stacked chips the stacked chips being on both top and bottom sides of a package substrate, interposer or RDL
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/012Bonding, e.g. electrostatic for strain gauges
DE8686201062T 1985-06-20 1986-06-18 Verfahren zur herstellung von halbleiteranordnungen mittels einer mechanischen verbindung von zwei koerpern. Expired - Lifetime DE3676367D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8501773A NL8501773A (nl) 1985-06-20 1985-06-20 Werkwijze voor het vervaardigen van halfgeleiderinrichtingen.

Publications (1)

Publication Number Publication Date
DE3676367D1 true DE3676367D1 (de) 1991-02-07

Family

ID=19846169

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686201062T Expired - Lifetime DE3676367D1 (de) 1985-06-20 1986-06-18 Verfahren zur herstellung von halbleiteranordnungen mittels einer mechanischen verbindung von zwei koerpern.

Country Status (9)

Country Link
US (1) US4983251A (de)
EP (1) EP0209173B1 (de)
JP (1) JP2608548B2 (de)
CN (1) CN1004669B (de)
AU (1) AU585355B2 (de)
CA (1) CA1245776A (de)
DE (1) DE3676367D1 (de)
ES (1) ES8707023A1 (de)
NL (1) NL8501773A (de)

Families Citing this family (145)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8700033A (nl) * 1987-01-09 1988-08-01 Philips Nv Werkwijze voor het vervaardigen van een halfgeleiderinrichting van het type halfgeleider op isolator.
JP2542609B2 (ja) * 1987-03-16 1996-10-09 富士通株式会社 半導体装置の製造方法
JPS63306618A (ja) * 1987-06-08 1988-12-14 Sanyo Electric Co Ltd Soi構造の形成方法
JP2703231B2 (ja) * 1987-09-02 1998-01-26 株式会社東芝 シリコン半導体基板の製造方法
JP2685819B2 (ja) * 1988-03-31 1997-12-03 株式会社東芝 誘電体分離半導体基板とその製造方法
NL8800953A (nl) * 1988-04-13 1989-11-01 Philips Nv Werkwijze voor het vervaardigen van een halfgeleiderlichaam.
US5354695A (en) * 1992-04-08 1994-10-11 Leedy Glenn J Membrane dielectric isolation IC fabrication
JPH0237771A (ja) * 1988-07-28 1990-02-07 Fujitsu Ltd Soi基板
NL8802028A (nl) * 1988-08-16 1990-03-16 Philips Nv Werkwijze voor het vervaardigen van een inrichting.
US5846638A (en) * 1988-08-30 1998-12-08 Onyx Optics, Inc. Composite optical and electro-optical devices
US6025060A (en) * 1988-08-30 2000-02-15 Onyx Optics, Inc. Method and apparatus for composite gemstones
US5147808A (en) * 1988-11-02 1992-09-15 Universal Energy Systems, Inc. High energy ion implanted silicon on insulator structure
NL8900388A (nl) * 1989-02-17 1990-09-17 Philips Nv Werkwijze voor het verbinden van twee voorwerpen.
US5383993A (en) * 1989-09-01 1995-01-24 Nippon Soken Inc. Method of bonding semiconductor substrates
US5213993A (en) * 1989-09-13 1993-05-25 Kabushiki Kaisha Tobisha Method of manufacturing semiconductor substrate dielectric isolating structure
JP2825322B2 (ja) * 1989-09-13 1998-11-18 株式会社東芝 誘電体分離構造を有する半導体基板の製造方法
JP2831745B2 (ja) * 1989-10-31 1998-12-02 富士通株式会社 半導体装置及びその製造方法
JP2929651B2 (ja) * 1990-03-14 1999-08-03 株式会社ブリヂストン ゴム系複合材料の製造方法
JP2897055B2 (ja) * 1990-03-14 1999-05-31 株式会社ブリヂストン ゴム系複合材料の製造方法
JPH0636413B2 (ja) * 1990-03-29 1994-05-11 信越半導体株式会社 半導体素子形成用基板の製造方法
USRE36890E (en) * 1990-07-31 2000-10-03 Motorola, Inc. Gradient chuck method for wafer bonding employing a convex pressure
US5131968A (en) * 1990-07-31 1992-07-21 Motorola, Inc. Gradient chuck method for wafer bonding employing a convex pressure
JPH0719738B2 (ja) * 1990-09-06 1995-03-06 信越半導体株式会社 接合ウェーハ及びその製造方法
US6171512B1 (en) 1991-02-15 2001-01-09 Canon Kabushiki Kaisha Etching solution for etching porous silicon, etching method using the etching solution and method of preparing semiconductor member using the etching solution
MY114349A (en) * 1991-02-15 2002-10-31 Canon Kk Etching solution for etching porous silicon, etching method using the etching solution and method of prepa- ring semiconductor member using the etching solution
US5395788A (en) * 1991-03-15 1995-03-07 Shin Etsu Handotai Co., Ltd. Method of producing semiconductor substrate
US5110748A (en) * 1991-03-28 1992-05-05 Honeywell Inc. Method for fabricating high mobility thin film transistors as integrated drivers for active matrix display
JPH0817166B2 (ja) * 1991-04-27 1996-02-21 信越半導体株式会社 超薄膜soi基板の製造方法及び製造装置
US5256581A (en) * 1991-08-28 1993-10-26 Motorola, Inc. Silicon film with improved thickness control
JPH05198739A (ja) * 1991-09-10 1993-08-06 Mitsubishi Electric Corp 積層型半導体装置およびその製造方法
EP0536790B1 (de) * 1991-10-11 2004-03-03 Canon Kabushiki Kaisha Verfahren zur Herstellung von Halbleiter-Produkten
SE469863B (sv) * 1991-10-15 1993-09-27 Asea Brown Boveri Halvledarkomponent, halvledarskiva för framställning av halvledarkomponent samt förfarande för framställning av sådan halvledarskiva
EP0547684A3 (en) * 1991-12-18 1996-11-06 Koninkl Philips Electronics Nv Method of manufacturing a semiconductor body comprising a carrier wafer and a monocrystalline semiconducting top layer
JP2602597B2 (ja) * 1991-12-27 1997-04-23 信越半導体株式会社 薄膜soi基板の製造方法
US5290715A (en) * 1991-12-31 1994-03-01 U.S. Philips Corporation Method of making dielectrically isolated metal base transistors and permeable base transistors
JP3191972B2 (ja) * 1992-01-31 2001-07-23 キヤノン株式会社 半導体基板の作製方法及び半導体基板
US5234860A (en) * 1992-03-19 1993-08-10 Eastman Kodak Company Thinning of imaging device processed wafers
US6714625B1 (en) * 1992-04-08 2004-03-30 Elm Technology Corporation Lithography device for semiconductor circuit pattern generation
US5213986A (en) * 1992-04-10 1993-05-25 North American Philips Corporation Process for making thin film silicon-on-insulator wafers employing wafer bonding and wafer thinning
US5407506A (en) * 1992-06-04 1995-04-18 Alliedsignal Inc. Reaction bonding through activation by ion bombardment
US5427638A (en) * 1992-06-04 1995-06-27 Alliedsignal Inc. Low temperature reaction bonding
US5227313A (en) * 1992-07-24 1993-07-13 Eastman Kodak Company Process for making backside illuminated image sensors
JP3192000B2 (ja) * 1992-08-25 2001-07-23 キヤノン株式会社 半導体基板及びその作製方法
US5260233A (en) * 1992-11-06 1993-11-09 International Business Machines Corporation Semiconductor device and wafer structure having a planar buried interconnect by wafer bonding
US5268065A (en) * 1992-12-21 1993-12-07 Motorola, Inc. Method for thinning a semiconductor wafer
JPH06350376A (ja) * 1993-01-25 1994-12-22 Matsushita Electric Ind Co Ltd 気密封止された圧電デバイスおよび気密封止パッケージ
US5647932A (en) * 1993-05-18 1997-07-15 Matsushita Electric Industrial Co., Ltd. Method of processing a piezoelectric device
US5344524A (en) * 1993-06-30 1994-09-06 Honeywell Inc. SOI substrate fabrication
US5580407A (en) * 1993-07-13 1996-12-03 U.S. Philips Corporation Method of bonding two objects, at least one of which comprises organic materials
US5354717A (en) * 1993-07-29 1994-10-11 Motorola, Inc. Method for making a substrate structure with improved heat dissipation
US5310451A (en) * 1993-08-19 1994-05-10 International Business Machines Corporation Method of forming an ultra-uniform silicon-on-insulator layer
US6004865A (en) * 1993-09-06 1999-12-21 Hitachi, Ltd. Method of fabricating multi-layered structure having single crystalline semiconductor film formed on insulator
US5512375A (en) * 1993-10-14 1996-04-30 Intevac, Inc. Pseudomorphic substrates
US5360752A (en) * 1993-10-28 1994-11-01 Loral Federal Systems Company Method to radiation harden the buried oxide in silicon-on-insulator structures
EP0651449B1 (de) * 1993-11-01 2002-02-13 Matsushita Electric Industrial Co., Ltd. Elektronische Anordnung und Verfahren zur Herstellung
DE69409215T2 (de) * 1993-12-06 1998-07-16 Matsushita Electric Ind Co Ltd Hybrid Magnetstruktur und deren Herstellungsverfahren
JP3298291B2 (ja) * 1994-03-07 2002-07-02 富士電機株式会社 複合素子および貼り合わせ基板の製造方法
JP2895743B2 (ja) * 1994-03-25 1999-05-24 信越半導体株式会社 Soi基板の製造方法
US5600130A (en) * 1994-06-17 1997-02-04 The Regents Of The University Of Colorado Two-dimensional optoelectronic array module
DE4427515C1 (de) * 1994-08-03 1995-08-24 Siemens Ag Verfahren zur Herstellung einer dreidimensionalen Schaltungsanordnung
DE4433846C2 (de) * 1994-09-22 1999-06-02 Fraunhofer Ges Forschung Verfahren zur Herstellung einer vertikalen integrierten Schaltungsstruktur
US5637802A (en) * 1995-02-28 1997-06-10 Rosemount Inc. Capacitive pressure sensor for a pressure transmitted where electric field emanates substantially from back sides of plates
US6484585B1 (en) 1995-02-28 2002-11-26 Rosemount Inc. Pressure sensor for a pressure transmitter
US5681775A (en) * 1995-11-15 1997-10-28 International Business Machines Corporation Soi fabrication process
KR100228719B1 (ko) * 1996-05-27 1999-11-01 윤덕용 전기 화학적 식각방법을 이용하는 soi형 반도체 소자 및 이를 이용한 능동구동 액정표시장치의 제조방법
DE19704546A1 (de) * 1997-02-06 1998-08-13 Wacker Siltronic Halbleitermat Verfahren zur Herstellung einer einseitig beschichteten und mit einem Finish versehenen Halbleiterscheibe
US6551857B2 (en) * 1997-04-04 2003-04-22 Elm Technology Corporation Three dimensional structure integrated circuits
US5915167A (en) * 1997-04-04 1999-06-22 Elm Technology Corporation Three dimensional structure memory
US6191007B1 (en) * 1997-04-28 2001-02-20 Denso Corporation Method for manufacturing a semiconductor substrate
US6033974A (en) 1997-05-12 2000-03-07 Silicon Genesis Corporation Method for controlled cleaving process
US20070122997A1 (en) * 1998-02-19 2007-05-31 Silicon Genesis Corporation Controlled process and resulting device
US6159824A (en) 1997-05-12 2000-12-12 Silicon Genesis Corporation Silicon-on-silicon wafer bonding process using a thin film blister-separation method
US5936984A (en) * 1997-05-21 1999-08-10 Onxy Optics, Inc. Laser rods with undoped, flanged end-caps for end-pumped laser applications
JP3431454B2 (ja) * 1997-06-18 2003-07-28 株式会社東芝 半導体装置の製造方法
US6548382B1 (en) 1997-07-18 2003-04-15 Silicon Genesis Corporation Gettering technique for wafers made using a controlled cleaving process
US6136667A (en) * 1997-10-08 2000-10-24 Lucent Technologies Inc. Method for bonding two crystalline substrates together
US6548878B1 (en) * 1998-02-05 2003-04-15 Integration Associates, Inc. Method for producing a thin distributed photodiode structure
US6458619B1 (en) 1998-02-05 2002-10-01 Integration Associates, Inc. Process for producing an isolated planar high speed pin photodiode with improved capacitance
JPH11251207A (ja) * 1998-03-03 1999-09-17 Canon Inc Soi基板及びその製造方法並びにその製造設備
US6365488B1 (en) * 1998-03-05 2002-04-02 Industrial Technology Research Institute Method of manufacturing SOI wafer with buried layer
US6753586B1 (en) 1998-03-09 2004-06-22 Integration Associates Inc. Distributed photodiode structure having majority dopant gradient and method for making same
US5933750A (en) * 1998-04-03 1999-08-03 Motorola, Inc. Method of fabricating a semiconductor device with a thinned substrate
JP3358550B2 (ja) * 1998-07-07 2002-12-24 信越半導体株式会社 Soiウエーハの製造方法ならびにこの方法で製造されるsoiウエーハ
US6160824A (en) * 1998-11-02 2000-12-12 Maxios Laser Corporation Laser-pumped compound waveguide lasers and amplifiers
EP1041624A1 (de) 1999-04-02 2000-10-04 Interuniversitair Microelektronica Centrum Vzw Transfermethode ultra-dünner Substrate und Anwendung zur Herstellung von Mehrlagen-Dünnschichtstrukturen
EP1939932A1 (de) * 1999-08-10 2008-07-02 Silicon Genesis Corporation Ein Substrat mit einer verspannten Silizium-Germanium Trennschicht
US6263941B1 (en) 1999-08-10 2001-07-24 Silicon Genesis Corporation Nozzle for cleaving substrates
US6500732B1 (en) 1999-08-10 2002-12-31 Silicon Genesis Corporation Cleaving process to fabricate multilayered substrates using low implantation doses
US6984571B1 (en) * 1999-10-01 2006-01-10 Ziptronix, Inc. Three dimensional device integration method and integrated device
US6500694B1 (en) * 2000-03-22 2002-12-31 Ziptronix, Inc. Three dimensional device integration method and integrated device
US6622757B2 (en) 1999-11-30 2003-09-23 Veeder-Root Company Fueling system vapor recovery and containment performance monitor and method of operation thereof
US6505516B1 (en) 2000-01-06 2003-01-14 Rosemount Inc. Capacitive pressure sensing with moving dielectric
US6508129B1 (en) 2000-01-06 2003-01-21 Rosemount Inc. Pressure sensor capsule with improved isolation
US6520020B1 (en) 2000-01-06 2003-02-18 Rosemount Inc. Method and apparatus for a direct bonded isolated pressure sensor
US6561038B2 (en) 2000-01-06 2003-05-13 Rosemount Inc. Sensor with fluid isolation barrier
AU2629901A (en) 2000-01-06 2001-07-16 Rosemount Inc. Grain growth of electrical interconnection for microelectromechanical systems (mems)
US6544862B1 (en) 2000-01-14 2003-04-08 Silicon Genesis Corporation Particle distribution method and resulting structure for a layer transfer process
CA2397760A1 (en) * 2000-01-18 2001-07-26 Timothy G. Slater Wafer bonding techniques to minimize built-in stress of silicon microstructures and micro-mirrors
US6902987B1 (en) 2000-02-16 2005-06-07 Ziptronix, Inc. Method for low temperature bonding and bonded structure
US6563133B1 (en) * 2000-08-09 2003-05-13 Ziptronix, Inc. Method of epitaxial-like wafer bonding at low temperature and bonded structure
FR2817395B1 (fr) * 2000-11-27 2003-10-31 Soitec Silicon On Insulator Procede de fabrication d'un substrat notamment pour l'optique, l'electronique ou l'optoelectronique et substrat obtenu par ce procede
US7407869B2 (en) * 2000-11-27 2008-08-05 S.O.I.Tec Silicon On Insulator Technologies Method for manufacturing a free-standing substrate made of monocrystalline semiconductor material
US6748994B2 (en) * 2001-04-11 2004-06-15 Avery Dennison Corporation Label applicator, method and label therefor
US20030037874A1 (en) * 2001-07-26 2003-02-27 Massachusetts Institute Of Technology Semiconductor substrate bonding by mass transport growth fusion
SG139508A1 (en) * 2001-09-10 2008-02-29 Micron Technology Inc Wafer dicing device and method
SG102639A1 (en) * 2001-10-08 2004-03-26 Micron Technology Inc Apparatus and method for packing circuits
US6848316B2 (en) * 2002-05-08 2005-02-01 Rosemount Inc. Pressure sensor assembly
US6927073B2 (en) * 2002-05-16 2005-08-09 Nova Research, Inc. Methods of fabricating magnetoresistive memory devices
SG142115A1 (en) * 2002-06-14 2008-05-28 Micron Technology Inc Wafer level packaging
WO2004015764A2 (en) * 2002-08-08 2004-02-19 Leedy Glenn J Vertical system integration
US8187377B2 (en) * 2002-10-04 2012-05-29 Silicon Genesis Corporation Non-contact etch annealing of strained layers
JP4794810B2 (ja) * 2003-03-20 2011-10-19 シャープ株式会社 半導体装置の製造方法
SG119185A1 (en) * 2003-05-06 2006-02-28 Micron Technology Inc Method for packaging circuits and packaged circuits
US7109092B2 (en) 2003-05-19 2006-09-19 Ziptronix, Inc. Method of room temperature covalent bonding
US7354815B2 (en) * 2003-11-18 2008-04-08 Silicon Genesis Corporation Method for fabricating semiconductor devices using strained silicon bearing material
US7545481B2 (en) * 2003-11-24 2009-06-09 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
WO2005054953A2 (en) * 2003-11-24 2005-06-16 Carl-Zeiss Smt Ag Holding device for an optical element in an objective
FR2863405B1 (fr) * 2003-12-08 2006-02-03 Commissariat Energie Atomique Collage moleculaire de composants microelectroniques sur un film polymere
JP2005203685A (ja) * 2004-01-19 2005-07-28 Oki Electric Ind Co Ltd 半導体装置,及び半導体装置の製造方法
US7198549B2 (en) * 2004-06-16 2007-04-03 Cabot Microelectronics Corporation Continuous contour polishing of a multi-material surface
US7601649B2 (en) * 2004-08-02 2009-10-13 Micron Technology, Inc. Zirconium-doped tantalum oxide films
JP2006156950A (ja) * 2004-10-29 2006-06-15 Sharp Corp 半導体発光素子の製造方法
JP2006294957A (ja) * 2005-04-13 2006-10-26 Shin Etsu Handotai Co Ltd 貼り合わせsoiウエーハの製造方法及び貼り合わせsoiウエーハ
JP5124931B2 (ja) * 2005-10-14 2013-01-23 信越半導体株式会社 多層soiウエーハの製造方法
JP5130621B2 (ja) * 2005-11-24 2013-01-30 ソニー株式会社 半導体基板の製造方法
US7909069B2 (en) * 2006-05-04 2011-03-22 Veeder-Root Company System and method for automatically adjusting an ORVR compatible stage II vapor recovery system to maintain a desired air-to-liquid (A/L) ratio
US8993410B2 (en) 2006-09-08 2015-03-31 Silicon Genesis Corporation Substrate cleaving under controlled stress conditions
US8293619B2 (en) 2008-08-28 2012-10-23 Silicon Genesis Corporation Layer transfer of films utilizing controlled propagation
US7811900B2 (en) * 2006-09-08 2010-10-12 Silicon Genesis Corporation Method and structure for fabricating solar cells using a thick layer transfer process
US9362439B2 (en) 2008-05-07 2016-06-07 Silicon Genesis Corporation Layer transfer of films utilizing controlled shear region
JP5138244B2 (ja) * 2007-03-20 2013-02-06 日本電信電話株式会社 電子デバイス用基板の製造方法
US8598700B2 (en) * 2008-06-27 2013-12-03 Qualcomm Incorporated Active thermal control for stacked IC devices
US8330126B2 (en) * 2008-08-25 2012-12-11 Silicon Genesis Corporation Race track configuration and method for wafering silicon solar substrates
KR101548173B1 (ko) * 2008-09-18 2015-08-31 삼성전자주식회사 실리콘 다이렉트 본딩(sdb)을 이용한 임시 웨이퍼 임시 본딩 방법, 및 그 본딩 방법을 이용한 반도체 소자 및 반도체 소자 제조 방법
DE102008060275B4 (de) * 2008-12-03 2012-10-31 Austriamicrosystems Ag Verfahren zum Strukturieren eines gebondeten Wafers
US8329557B2 (en) * 2009-05-13 2012-12-11 Silicon Genesis Corporation Techniques for forming thin films by implantation with reduced channeling
CN103560105A (zh) * 2013-11-22 2014-02-05 上海新傲科技股份有限公司 边缘光滑的半导体衬底的制备方法
US9583525B2 (en) 2015-06-02 2017-02-28 Semiconductor Components Industries, Llc Die stacked image sensors and related methods
JP6632462B2 (ja) * 2016-04-28 2020-01-22 信越化学工業株式会社 複合ウェーハの製造方法
CN106784073A (zh) * 2016-12-29 2017-05-31 苏州爱彼光电材料有限公司 电光器件
FR3079661B1 (fr) * 2018-03-29 2026-01-02 Soitec Silicon On Insulator Procede de fabrication d'un substrat pour filtre radiofrequence
US10978508B2 (en) 2018-10-16 2021-04-13 L3 Cincinnati Electronics Corporation Infrared detector having a directly bonded silicon substrate present on top thereof
US11347001B2 (en) * 2020-04-01 2022-05-31 Taiwan Semiconductor Manufacturing Company, Ltd. Semiconductor structure and method of fabricating the same
US11340512B2 (en) * 2020-04-27 2022-05-24 Raytheon Bbn Technologies Corp. Integration of electronics with Lithium Niobate photonics
WO2022094587A1 (en) 2020-10-29 2022-05-05 Invensas Bonding Technologies, Inc. Direct bonding methods and structures

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3577044A (en) * 1966-03-08 1971-05-04 Ibm Integrated semiconductor devices and fabrication methods therefor
US3909332A (en) * 1973-06-04 1975-09-30 Gen Electric Bonding process for dielectric isolation of single crystal semiconductor structures
US3997381A (en) * 1975-01-10 1976-12-14 Intel Corporation Method of manufacture of an epitaxial semiconductor layer on an insulating substrate
US3974006A (en) * 1975-03-21 1976-08-10 Valentin Rodriguez Method of obtaining high temperature resistant assemblies comprising isolated silicon islands bonded to a substrate
JPS5320872A (en) * 1976-08-11 1978-02-25 Nippon Telegr & Teleph Corp <Ntt> Production of impatt diode
DE2738614A1 (de) * 1976-09-01 1978-03-02 Hitachi Ltd Verfahren zum herstellen von halbleitersubstraten fuer integrierte halbleiterschaltkreise
JPS5810869B2 (ja) * 1977-11-05 1983-02-28 三菱電機株式会社 可変容量ダイオ−ドの製造方法
DE2842492C2 (de) * 1978-09-29 1986-04-17 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren zur Herstellung einer aus einem Halbleiter-Glas-Verbundwerkstoff bestehenden Photokathode
JPS5730374A (en) * 1980-07-29 1982-02-18 Fujitsu Ltd Semiconductor device and manufacture thereof
JPS5769523A (en) * 1980-10-17 1982-04-28 Matsushita Electric Ind Co Ltd Manufacture of magnetic head
JPS5884458A (ja) * 1981-11-13 1983-05-20 Toshiba Corp 半導体基板の製造方法
JPS58123770A (ja) * 1982-01-18 1983-07-23 Semiconductor Energy Lab Co Ltd 絶縁ゲイト型半導体装置およびその作製方法
DE3311553C2 (de) * 1983-03-30 1985-11-14 Kernforschungsanlage Jülich GmbH, 5170 Jülich Verfahren zum Verbinden von Formteilen mit Siliziumkarbidoberfläche
JPS6051700A (ja) * 1983-08-31 1985-03-23 Toshiba Corp シリコン結晶体の接合方法
US4465547A (en) * 1983-09-29 1984-08-14 General Electric Company Method of bonding a poly (vinylidene fluoride) solid to a solid substrate
JPH0616537B2 (ja) * 1983-10-31 1994-03-02 株式会社東芝 半導体基体の製造方法
JPS60120577A (ja) * 1983-12-05 1985-06-28 Semiconductor Energy Lab Co Ltd 半導体装置用電極の作製方法
JPS61191038A (ja) * 1985-02-20 1986-08-25 Toshiba Corp 薄膜部を有するSiキヤビテイ構造の製造方法
US4714517A (en) * 1986-05-08 1987-12-22 National Semiconductor Corporation Copper cleaning and passivating for tape automated bonding
US4689111A (en) * 1986-10-28 1987-08-25 International Business Machines Corp. Process for promoting the interlaminate adhesion of polymeric materials to metal surfaces

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EP0209173A1 (de) 1987-01-21
CN1004669B (zh) 1989-06-28
US4983251A (en) 1991-01-08
JP2608548B2 (ja) 1997-05-07
AU585355B2 (en) 1989-06-15
EP0209173B1 (de) 1991-01-02
CN86105660A (zh) 1987-02-25
ES8707023A1 (es) 1987-07-01
JPS61294846A (ja) 1986-12-25
NL8501773A (nl) 1987-01-16
AU5885486A (en) 1986-12-24
ES556144A0 (es) 1987-07-01
CA1245776A (en) 1988-11-29

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