DK0437280T3 - Fremgangsmåde til behandling af radiografiske billeddata med henblik på detektion af en svejsedefekt - Google Patents

Fremgangsmåde til behandling af radiografiske billeddata med henblik på detektion af en svejsedefekt

Info

Publication number
DK0437280T3
DK0437280T3 DK91100359T DK91100359T DK0437280T3 DK 0437280 T3 DK0437280 T3 DK 0437280T3 DK 91100359 T DK91100359 T DK 91100359T DK 91100359 T DK91100359 T DK 91100359T DK 0437280 T3 DK0437280 T3 DK 0437280T3
Authority
DK
Denmark
Prior art keywords
detection
image data
radiographic image
weld defect
processing radiographic
Prior art date
Application number
DK91100359T
Other languages
Danish (da)
English (en)
Inventor
Shigetomo Matsui
Masahiro Uenishi
Kouji Sugimoto
Sadao Iuchi
Kouyu Itoga
Tetsuzo Harada
Kouji Michiba
Katsuhiro Onda
Takaaki Okumura
Original Assignee
Kawasaki Heavy Ind Ltd
Chubu Electric Power
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP350990A external-priority patent/JPH07119713B2/ja
Priority claimed from JP2003508A external-priority patent/JPH07119714B2/ja
Application filed by Kawasaki Heavy Ind Ltd, Chubu Electric Power filed Critical Kawasaki Heavy Ind Ltd
Application granted granted Critical
Publication of DK0437280T3 publication Critical patent/DK0437280T3/da

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K31/00Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by any single one of main groups B23K1/00 - B23K28/00
    • B23K31/12Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by any single one of main groups B23K1/00 - B23K28/00 relating to investigating the properties, e.g. the weldability, of materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18Investigating the presence of flaws defects or foreign matter
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30136Metal
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S706/00Data processing: artificial intelligence
    • Y10S706/902Application using ai with detail of the ai system
    • Y10S706/911Nonmedical diagnostics
    • Y10S706/912Manufacturing or machine, e.g. agricultural machinery, machine tool

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mechanical Engineering (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DK91100359T 1990-01-12 1991-01-14 Fremgangsmåde til behandling af radiografiske billeddata med henblik på detektion af en svejsedefekt DK0437280T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP350990A JPH07119713B2 (ja) 1990-01-12 1990-01-12 放射線試験での溶接欠陥像の自動抽出処理方法
JP2003508A JPH07119714B2 (ja) 1990-01-12 1990-01-12 溶接欠陥の種類推定方法

Publications (1)

Publication Number Publication Date
DK0437280T3 true DK0437280T3 (da) 1998-10-05

Family

ID=26337100

Family Applications (1)

Application Number Title Priority Date Filing Date
DK91100359T DK0437280T3 (da) 1990-01-12 1991-01-14 Fremgangsmåde til behandling af radiografiske billeddata med henblik på detektion af en svejsedefekt

Country Status (4)

Country Link
US (1) US5182775A (de)
EP (2) EP0437280B1 (de)
DE (1) DE69129275T2 (de)
DK (1) DK0437280T3 (de)

Families Citing this family (48)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3123146B2 (ja) * 1991-09-11 2001-01-09 トヨタ自動車株式会社 溶接ビードの品質検査装置
US5345514A (en) * 1991-09-16 1994-09-06 General Electric Company Method for inspecting components having complex geometric shapes
US5991435A (en) * 1992-06-30 1999-11-23 Matsushita Electric Industrial Co., Ltd. Inspecting apparatus of mounting state of component or printing state of cream solder in mounting line of electronic component
US5555316A (en) * 1992-06-30 1996-09-10 Matsushita Electric Industrial Co., Ltd. Inspecting apparatus of mounting state of component or printing state of cream solder in mounting line of electronic component
CN1133633A (zh) * 1993-10-26 1996-10-16 旭化成工业株式会社 光泽不均匀、印刷不均匀的测定方法及装置
JP3363735B2 (ja) * 1996-06-26 2003-01-08 松下電器産業株式会社 X線画像装置
FR2763686B1 (fr) * 1997-05-22 1999-07-02 Commissariat Energie Atomique Procede et dispositif de traitement de radiogrammes de soudure pour la detection de defauts de soudure
EP1105717A4 (de) * 1998-08-18 2006-08-16 Lockheed Corp Digitales röntqeuenitersuchungsvorrichtung zur prüfen von schweissstellen
EP1126729A1 (de) * 2000-02-18 2001-08-22 STMicroelectronics S.r.l. Verfahren zur Schätzung des Rauschpegels in Bildsequenzen und Vorrichtung dafür
AU2001286261A1 (en) * 2000-09-18 2002-03-26 Olympus Optical Co., Ltd. System and method for managing image data file
WO2003062809A1 (en) * 2002-01-23 2003-07-31 Marena Systems Corporation Infrared thermography for defect detection and analysis
FR2862803B1 (fr) * 2003-11-24 2007-12-07 Franco Belge Combustibles Procede de controle non destructif d'un element pour reacteur nucleaire
JP3972941B2 (ja) * 2004-06-30 2007-09-05 オムロン株式会社 部品実装基板用のはんだ印刷検査方法およびはんだ印刷検査用の検査機
US7436992B2 (en) * 2004-07-30 2008-10-14 General Electric Company Methods and apparatus for testing a component
US8013599B2 (en) * 2004-11-19 2011-09-06 General Electric Company Methods and apparatus for testing a component
US7233867B2 (en) 2005-04-06 2007-06-19 General Electric Company Eddy current inspection method and system
US7873237B2 (en) * 2006-02-17 2011-01-18 Dassault Systèmes Degrading 3D information
US20080088621A1 (en) * 2006-10-11 2008-04-17 Jean-Jacques Grimaud Follower method for three dimensional images
US7529336B2 (en) 2007-05-31 2009-05-05 Test Research, Inc. System and method for laminography inspection
US10352902B2 (en) 2012-09-27 2019-07-16 Kinder Morgan, Inc. System, method and computer medium having computer program to determine presence of stress corrosion cracking in pipelines with pattern recognition
CA2643219C (en) * 2007-12-21 2017-08-22 Knight, Inc. System, method and program product to screen for longitudinal-seam anomalies
US10546372B2 (en) 2007-12-21 2020-01-28 Kinder Morgan, Inc. Method, machine, and computer medium having computer program to detect and evaluate structural anomalies in circumferentially welded pipelines
WO2010077240A1 (en) 2008-12-30 2010-07-08 Sikorsky Aircraft Corporation Non-destructive inspection method with objective evaluation
US20100169053A1 (en) * 2008-12-30 2010-07-01 Caterpillar Inc. Method for creating weldment inspection documents
CN102175700B (zh) * 2011-01-20 2012-07-25 山东大学 数字x射线图像焊缝分割和缺陷检测方法
JP6031339B2 (ja) * 2012-11-21 2016-11-24 富士フイルム株式会社 透視画像濃度補正方法、非破壊検査方法、及び画像処理装置
US9180552B2 (en) * 2013-05-27 2015-11-10 ThinkSmart IT Solutions Private Limited System and method for identifying defects in welds by processing X-ray images
CN104749184B (zh) * 2013-12-31 2018-08-21 研祥智能科技股份有限公司 自动光学检测方法和系统
CN104897701A (zh) * 2015-06-19 2015-09-09 国核电站运行服务技术有限公司 阀门阀体局部减薄的射线检测方法
JP2017054337A (ja) * 2015-09-10 2017-03-16 ソニー株式会社 画像処理装置および方法
CN105486702B (zh) * 2015-12-07 2018-06-26 苏州科耐视智能科技有限公司 一种基于x射线的目标缺陷检测系统
KR102018330B1 (ko) * 2017-04-11 2019-09-05 한국전자통신연구원 다중 메타학습을 이용한 플랜트 배관 이상 감지 장치 및 방법
CN108956617A (zh) * 2018-06-04 2018-12-07 温州大学 一种基于微形变智能分类器的电子器件焊点热循环失效的检测方法
US11448604B2 (en) * 2019-07-08 2022-09-20 Worldwide Nondestructive Testing, Inc. System and method for inspecting fused plastic pipes
US12203873B2 (en) * 2019-07-08 2025-01-21 Worldwide Nondestructive Testing, Inc. System and method for inspecting fused plastic pipes
FR3111703B1 (fr) * 2020-06-18 2022-05-20 Skf Svenska Kullagerfab Ab Procédé de détection d’un défaut critique pour élément roulant en matériau céramique
US11668660B2 (en) * 2020-09-29 2023-06-06 Varex Imaging Corporation Radiographic inspection system for pipes and other structures and material loss estimation
CN113808094A (zh) * 2021-09-10 2021-12-17 武汉联开检测科技有限公司 一种射线检测焊接缺陷图像评级系统及方法
KR102390004B1 (ko) 2021-09-16 2022-04-25 라이트브라더스 주식회사 스케일 변화량 분석 기반의 자전거 비파괴 검사 장치, 방법, 및 컴퓨터 판독 가능한 기록 매체
CN113763294B (zh) * 2021-09-26 2023-08-08 上海航天精密机械研究所 基于动态clahe的焊缝图像快速预处理方法及系统
CN114593871A (zh) * 2022-02-28 2022-06-07 陕西省天然气股份有限公司 基于数字射线的管道阀门内漏检测装置及检测方法
CN114663365A (zh) * 2022-03-04 2022-06-24 重庆中科云从科技有限公司 缺陷检测方法、装置及计算机存储介质
CN115063422B (zh) * 2022-08-18 2022-11-08 建首(山东)钢材加工有限公司 一种用于集装箱焊接质量智能检测方法
CN116433669B (zh) * 2023-06-14 2023-08-18 山东兴华钢结构有限公司 基于机器视觉的抗震结构钢架焊缝质量检测方法
CN117086465B (zh) * 2023-09-27 2024-10-11 盐城工学院 一种基于ai技术的搅拌摩擦焊接机器人控制方法及系统
CN118096753B (zh) * 2024-04-26 2024-08-06 陕西正鑫工程材料股份有限公司 基于图像处理的梯护笼成型组装缺陷识别方法
CN118357814B (zh) * 2024-06-19 2024-09-10 风凯换热器制造(常州)有限公司 一种焊缝打磨平整度检测方法及系统
CN120318605B (zh) * 2025-06-16 2025-09-09 深圳市信润富联数字科技有限公司 焊接参数的调整方法及装置、存储介质、电子装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4939477A (de) * 1972-08-12 1974-04-12
JPS5981544A (ja) * 1982-11-01 1984-05-11 Nireko:Kk 内部欠陥の検出方法
HU190197B (en) * 1983-12-05 1986-08-28 Kohaszati Gyarepitoe Vallalat,Hu Method and device for testing quality of the welds by videoradiography
DE3533913A1 (de) * 1985-09-23 1987-04-02 Muenchener Apparatebau Fuer El Anordnung zur zerstoerungsfreien pruefung von schweissnaehten
US4809308A (en) * 1986-02-20 1989-02-28 Irt Corporation Method and apparatus for performing automated circuit board solder quality inspections
US4926452A (en) * 1987-10-30 1990-05-15 Four Pi Systems Corporation Automated laminography system for inspection of electronics
US4896278A (en) * 1988-07-11 1990-01-23 Northrop Corporation Automated defect recognition system
JPH02148180A (ja) * 1988-11-29 1990-06-07 Nippon Seiko Kk パターン検査方法及び装置
US5058178A (en) * 1989-12-21 1991-10-15 At&T Bell Laboratories Method and apparatus for inspection of specular, three-dimensional features

Also Published As

Publication number Publication date
EP0742433A2 (de) 1996-11-13
EP0437280A2 (de) 1991-07-17
US5182775A (en) 1993-01-26
DE69129275T2 (de) 1998-10-08
EP0437280A3 (en) 1993-07-07
EP0437280B1 (de) 1998-04-22
EP0742433A3 (de) 1997-09-17
DE69129275D1 (de) 1998-05-28

Similar Documents

Publication Publication Date Title
DK0437280T3 (da) Fremgangsmåde til behandling af radiografiske billeddata med henblik på detektion af en svejsedefekt
DE59501702D1 (de) Verfahren zum Entwickeln bestrahlter strahlungsempfindlicher Aufzeichnungsmaterialien
DE69120521D1 (de) Verfahren und vorrichtung zum aufzeichen digitaler bilder
DE69013186D1 (de) Verfahren zur röntgenologischen Bildverarbeitung und photographisches Bildverarbeitungsgerät dafür.
DE69626744D1 (de) Bildverarbeitungsverfahren für photographische Kopien
DE69119949D1 (de) Bildsignalkorrekturverfahren
KR960700483A (ko) 무 필름 3 차원사진형성 방법 및 장치(filmless method and apparatus for reproducing 3d photographs)
DE69332674D1 (de) Verfahren zur automatischer Verfolgung für digitale Röntgenbilder
DE69227058D1 (de) Tonermengen-Nachweissystem für ein Bildaufzeichnungsgerät, Verfahren zum Nachweis der Tonermenge und eine Entwicklungsvorrichtung für ein Bildaufzeichnungsgerät
DE69224110D1 (de) Verarbeitungsverfahren für Aufzeichnungssysteme von Strahlungsbildern
FI945743A7 (fi) Menetelmä kuvankäsittelyjärjestelmän kalibroimiseksi
DE69130135D1 (de) Bildanalyseverfahren
IT1208666B (it) Apparecchio e metodo per aumentare la risoluzione di immagini
GB2110499B (en) Method and apparatus for detecting focussing error signal of objective lens
DE68911634D1 (de) Verfahren und Schaltungsanordnung zum Verarbeiten eines Bildsignals.
DE69132285D1 (de) Verfahren und Gerät zur Bilddateninspektion
DE3219990A1 (de) Verfahren zum entwickeln elektrostatisch latenter bilder
DK316583D0 (da) Fremgangsmade og apparat til elektrostatisk udskilning af stoev
IT1152992B (it) Apparecchio rivelatore di difetti per nastri larghi
DE69117692D1 (de) Gerät und Verfahren zum Verarbeiten von Röntgenbilddaten
DE69033845D1 (de) Bildaufnahmevorrichtung und Verfahren zu deren Belichtungszeitsteuerung
DK0477796T3 (da) Fremgangsmåde og apparat til beregning af termisk følsomhed
DE69432915T2 (de) Verfahren und Vorrichtung zum automatischen Zusammenbau von fotografischen Filmkassetten
DK0476692T3 (da) Fremgangsmåde og apparat til beregning af forudbestemt middeltermisk sensitivitet
DK0502882T3 (da) Fremgangsmåde og apparatur til rensning af borestøv