DK0594478T3 - Applikationsspecifikt integreret kredsløb med mikroprocessor og testmidler - Google Patents

Applikationsspecifikt integreret kredsløb med mikroprocessor og testmidler

Info

Publication number
DK0594478T3
DK0594478T3 DK93402518T DK93402518T DK0594478T3 DK 0594478 T3 DK0594478 T3 DK 0594478T3 DK 93402518 T DK93402518 T DK 93402518T DK 93402518 T DK93402518 T DK 93402518T DK 0594478 T3 DK0594478 T3 DK 0594478T3
Authority
DK
Denmark
Prior art keywords
microprocessor
asic
output
functional
application
Prior art date
Application number
DK93402518T
Other languages
English (en)
Inventor
Patrick Darnault
Original Assignee
Sagem
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sagem filed Critical Sagem
Application granted granted Critical
Publication of DK0594478T3 publication Critical patent/DK0594478T3/da

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Microcomputers (AREA)
  • Storage Device Security (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Communication Control (AREA)
DK93402518T 1992-10-22 1993-10-13 Applikationsspecifikt integreret kredsløb med mikroprocessor og testmidler DK0594478T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9212647A FR2697356B1 (fr) 1992-10-22 1992-10-22 Circuit intégré à la demande à microprocesseur.

Publications (1)

Publication Number Publication Date
DK0594478T3 true DK0594478T3 (da) 1998-09-23

Family

ID=9434781

Family Applications (1)

Application Number Title Priority Date Filing Date
DK93402518T DK0594478T3 (da) 1992-10-22 1993-10-13 Applikationsspecifikt integreret kredsløb med mikroprocessor og testmidler

Country Status (9)

Country Link
EP (1) EP0594478B1 (da)
JP (1) JPH06208478A (da)
AT (1) ATE163100T1 (da)
CA (1) CA2108824A1 (da)
DE (1) DE69316823T2 (da)
DK (1) DK0594478T3 (da)
ES (1) ES2115036T3 (da)
FR (1) FR2697356B1 (da)
GR (1) GR3026763T3 (da)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5724502A (en) * 1995-08-07 1998-03-03 International Business Machines Corporation Test mode matrix circuit for an embedded microprocessor core

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1990013043A1 (en) * 1989-04-18 1990-11-01 Vlsi Technology, Inc. Method for automatic isolation of functional blocks within integrated circuits
DE9000825U1 (de) * 1990-01-25 1990-03-29 Siemens AG, 1000 Berlin und 8000 München Integrierter Schaltkreis
JP2619112B2 (ja) * 1990-05-16 1997-06-11 株式会社東芝 情報処理装置のテスト容易化回路

Also Published As

Publication number Publication date
GR3026763T3 (en) 1998-07-31
ES2115036T3 (es) 1998-06-16
JPH06208478A (ja) 1994-07-26
EP0594478A1 (fr) 1994-04-27
CA2108824A1 (fr) 1994-04-23
DE69316823D1 (de) 1998-03-12
FR2697356A1 (fr) 1994-04-29
EP0594478B1 (fr) 1998-02-04
DE69316823T2 (de) 1998-09-10
ATE163100T1 (de) 1998-02-15
FR2697356B1 (fr) 1994-12-09

Similar Documents

Publication Publication Date Title
DE69121871D1 (de) CMOS-Ausgangspufferschaltung mit reduzierten Prellen auf den Masseleitungen
ATE56825T1 (de) Schaltungsanordnung fuer einen integrierten schaltkreis mit eingebauter selbsttestkonfiguration.
EP0492609A3 (en) Semiconductor device with voltage stress testing pads
KR880008518A (ko) 필터장치
BG99627A (en) Reswitching device
KR930015892A (ko) 윤곽보정장치
DK0594478T3 (da) Applikationsspecifikt integreret kredsløb med mikroprocessor og testmidler
KR960012859A (ko) 푸시풀 브리지 증폭기를 포함하는 전압 신호 선로 구동기
KR910017734A (ko) 전자기기장치
KR880006850A (ko) 3스테이트 부설 상보형 mos집적회로
ATE145746T1 (de) Sicherheitsschaltgerät
DE69104642D1 (de) Ein-/Ausgangsschutzschaltung und Halbleiterbauelement mit dieser Schaltung.
CA2072426A1 (en) Signal generating device
DE59407118D1 (de) Gegentaktendstufe mit einer Einstellung des Querstroms der Gegentaktendstufe
DE60026093D1 (de) Halbleitervorrichtung mit Makros und Prüfverfahren dafür
JPS5470736A (en) Decoder circuit
KR840000825A (ko) 전자복사기의 출력 체크장치
DE68919557D1 (de) Integrierte Halbleiterschaltung mit Ausgangspuffer.
SE8107496L (sv) Kretsanordning for modifiering av en insignals dynamikomrade
SE9402206L (sv) Elektronisk styranordning
EP0545604A3 (en) High-withstand voltage integrated circuit
ATE105951T1 (de) Schaltungsanordnung zum auswählen und/oder ausrichten von dateneinheiten in datenverarbeitungsanlagen.
JPS57179989A (en) Sense circuit
JPH0323710A (ja) 遅延回路
KR970049123A (ko) 이미지센서의 구동회로