DK0897524T3 - Anordning til berøringsfri opmåling af en tredimensional objektoverflade - Google Patents

Anordning til berøringsfri opmåling af en tredimensional objektoverflade

Info

Publication number
DK0897524T3
DK0897524T3 DK97923781T DK97923781T DK0897524T3 DK 0897524 T3 DK0897524 T3 DK 0897524T3 DK 97923781 T DK97923781 T DK 97923781T DK 97923781 T DK97923781 T DK 97923781T DK 0897524 T3 DK0897524 T3 DK 0897524T3
Authority
DK
Denmark
Prior art keywords
pct
axis
rotation
strip structure
contact measurement
Prior art date
Application number
DK97923781T
Other languages
English (en)
Inventor
Peter Kuehmstedt
Wolfgang Schreiber
Gunther Notni
Original Assignee
Fraunhofer Ges Forschung
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fraunhofer Ges Forschung filed Critical Fraunhofer Ges Forschung
Application granted granted Critical
Publication of DK0897524T3 publication Critical patent/DK0897524T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504—Calibration devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Media Introduction/Drainage Providing Device (AREA)
DK97923781T 1996-05-06 1997-04-30 Anordning til berøringsfri opmåling af en tredimensional objektoverflade DK0897524T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19618140A DE19618140A1 (de) 1996-05-06 1996-05-06 3D-Meßanordnung zur Ganzkörpererfassung und Einmessung einer entsprechenden Meßanordnung
PCT/DE1997/000896 WO1997042464A1 (de) 1996-05-06 1997-04-30 Vorrichtung zum berührungsfreien vermessen einer dreidimensionalen objektoberfläche

Publications (1)

Publication Number Publication Date
DK0897524T3 true DK0897524T3 (da) 2002-06-24

Family

ID=7793477

Family Applications (1)

Application Number Title Priority Date Filing Date
DK97923781T DK0897524T3 (da) 1996-05-06 1997-04-30 Anordning til berøringsfri opmåling af en tredimensional objektoverflade

Country Status (9)

Country Link
US (1) US6055056A (da)
EP (1) EP0897524B1 (da)
JP (1) JP2000509505A (da)
AT (1) ATE214157T1 (da)
DE (2) DE19618140A1 (da)
DK (1) DK0897524T3 (da)
ES (1) ES2174258T3 (da)
PT (1) PT897524E (da)
WO (1) WO1997042464A1 (da)

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DE19642293C2 (de) * 1996-10-14 1998-07-16 Zeiss Carl Jena Gmbh Koordinatenmeßgerät
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FR2796458B1 (fr) * 1999-07-12 2001-09-21 Cogema Procede et installation de mesure de relief sur une face d'une piece axisymetrique
DE10001429A1 (de) * 2000-01-15 2001-07-19 Volkswagen Ag Vorrichtung zur Kalibrierung optischer Meßsysteme und Verfahren zur Herstellung der Vorrichtung
US6369879B1 (en) 2000-10-24 2002-04-09 The Regents Of The University Of California Method and apparatus for determining the coordinates of an object
US6504605B1 (en) 2000-10-24 2003-01-07 The Regents Of The University Of California Method and apparatus for determining the coordinates of an object
JP5103697B2 (ja) * 2001-04-19 2012-12-19 株式会社島津製作所 ３次元光学カメラ
CN1437000A (zh) * 2002-02-09 2003-08-20 沈阳同联集团高新技术有限公司 投影栅线测量物体三维表面形状的方法和装置
DE10219054B4 (de) * 2002-04-24 2004-08-26 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und Vorrichtung zur Bestimmung der räumlichen Koordinaten eines Gegenstandes
EP1420264B1 (de) * 2002-11-15 2011-01-05 Leica Geosystems AG Verfahren und Vorrichtung zur Kalibrierung eines Messsystems
WO2005017450A1 (en) * 2003-08-11 2005-02-24 Multi-Dimension Technology, Llc Calibration block and calibration system for 3d scanner
US7342668B2 (en) * 2003-09-17 2008-03-11 D4D Technologies, Llc High speed multiple line three-dimensional digitalization
DE102005006069A1 (de) * 2005-02-10 2006-08-24 Hubert Kammer Verfahren und Vorrichtung zum dreidimensionalen Scannen von Objekten
JP4786923B2 (ja) * 2005-03-31 2011-10-05 富士フイルム株式会社 縞計測装置の変換係数較正方法および装置ならびに該変換係数較正装置を備えた縞計測装置
JP4230525B2 (ja) * 2005-05-12 2009-02-25 有限会社テクノドリーム二十一 ３次元形状計測方法およびその装置
US7701564B2 (en) 2005-05-18 2010-04-20 Hitachi Global Storage Technologies Netherlands B.V. System and method for angular measurement
JP4372759B2 (ja) * 2006-02-10 2009-11-25 株式会社ミツトヨ 形状測定装置、形状測定方法及び形状測定プログラム
GB0615956D0 (en) * 2006-08-11 2006-09-20 Univ Heriot Watt Optical imaging of physical objects
JP4924042B2 (ja) * 2007-01-11 2012-04-25 オムロン株式会社 三次元形状計測装置及びその校正方法、プログラム、並びにコンピュータ読み取り可能な記録媒体
JP4802134B2 (ja) * 2007-03-29 2011-10-26 富士フイルム株式会社 姿勢変化測定方法および装置
CN101821579B (zh) * 2007-08-17 2013-01-23 瑞尼斯豪公司 相位分析测量装置和方法
JP4922905B2 (ja) * 2007-12-05 2012-04-25 富士フイルム株式会社 回転中心線の位置変動測定方法および装置
DE102009017694B3 (de) * 2009-04-15 2010-12-02 Göpel electronic GmbH Anordnung einer rotatorischen Bildaufnahmeeinheit für die Abbildung von Objekten auf Leiterplatten unter einem polaren Betrachtungswinkel von 45°
GB0915904D0 (en) 2009-09-11 2009-10-14 Renishaw Plc Non-contact object inspection
JP5273091B2 (ja) * 2010-05-14 2013-08-28 パルステック工業株式会社 ３次元形状測定装置及び３次元形状測定方法
DE102010050445B4 (de) * 2010-11-04 2014-02-20 Göpel electronic GmbH Anordnung und Verfahren zur Korrektur von Messpositionen von zur Inspektion elektronischer Flachbaugruppen aufgenommener Messbilder
US20130208278A1 (en) * 2012-02-14 2013-08-15 Sahag DARDARIAN Alignment apparatus and method
DE102012220048B4 (de) * 2012-11-02 2018-09-20 Sirona Dental Systems Gmbh Kalibrierungsvorrichtung und Verfahren zur Kalibrierung einer dentalen Kamera
TWI485361B (zh) * 2013-09-11 2015-05-21 Univ Nat Taiwan 三維形貌輪廓量測裝置及其方法
US10145670B2 (en) 2016-01-12 2018-12-04 The Boeing Company Systems and methods for projected grid-based location tracking
CN106289071B (zh) * 2016-08-18 2018-10-19 温州大学 一种结构三维位移单目摄像测量方法
IT201700032323U1 (it) * 2017-03-23 2018-09-23 V Ger S R L Apparato per scannerizzare un rispettivo oggetto tridimensionale.
CN108225218A (zh) * 2018-02-07 2018-06-29 苏州镭图光电科技有限公司 基于光学微机电系统的三维扫描成像方法及成像装置
FR3082934B1 (fr) * 2018-06-26 2021-10-08 Safran Nacelles Dispositif et procede de projection laser pour fabrication de pieces en materiau composite par drapage
JP7650597B2 (ja) * 2021-06-15 2025-03-25 株式会社ディスコ 測定治具、動作精度測定システム、及び動作精度測定方法
CN113432551A (zh) * 2021-06-25 2021-09-24 哈尔滨工业大学 基于多轴精密运动机构的微小零件三维形貌测量方法
CN114236585B (zh) * 2021-12-09 2023-04-14 国网思极位置服务有限公司 基于北斗导航卫星系统的目标运动监测方法及存储介质

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DE4416108C2 (de) * 1994-05-06 2000-05-11 Fraunhofer Ges Forschung Vorrichtung zum berührungsfreien Vermessen einer Objektoberfläche
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US5838428A (en) * 1997-02-28 1998-11-17 United States Of America As Represented By The Secretary Of The Navy System and method for high resolution range imaging with split light source and pattern mask

Also Published As

Publication number Publication date
ATE214157T1 (de) 2002-03-15
EP0897524B1 (de) 2002-03-06
WO1997042464A1 (de) 1997-11-13
DE59706560D1 (de) 2002-04-11
US6055056A (en) 2000-04-25
EP0897524A1 (de) 1999-02-24
DE19618140A1 (de) 1997-11-13
JP2000509505A (ja) 2000-07-25
PT897524E (pt) 2002-08-30
ES2174258T3 (es) 2002-11-01

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