DK1017996T3 - Ikke-destruktiv prövning af dielektriske materialer - Google Patents

Ikke-destruktiv prövning af dielektriske materialer

Info

Publication number
DK1017996T3
DK1017996T3 DK98947203T DK98947203T DK1017996T3 DK 1017996 T3 DK1017996 T3 DK 1017996T3 DK 98947203 T DK98947203 T DK 98947203T DK 98947203 T DK98947203 T DK 98947203T DK 1017996 T3 DK1017996 T3 DK 1017996T3
Authority
DK
Denmark
Prior art keywords
specimen
changes
interference pattern
microwaves
irregularities
Prior art date
Application number
DK98947203T
Other languages
English (en)
Inventor
Jack R Little Jr
Original Assignee
Jack R Little Jr
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jack R Little Jr filed Critical Jack R Little Jr
Application granted granted Critical
Publication of DK1017996T3 publication Critical patent/DK1017996T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Electromagnetism (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Inorganic Insulating Materials (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
DK98947203T 1997-09-25 1998-09-22 Ikke-destruktiv prövning af dielektriske materialer DK1017996T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US93507497A 1997-09-25 1997-09-25
PCT/US1998/019832 WO1999015883A1 (en) 1997-09-25 1998-09-22 Nondestructive testing of dielectric materials

Publications (1)

Publication Number Publication Date
DK1017996T3 true DK1017996T3 (da) 2008-09-15

Family

ID=25466555

Family Applications (1)

Application Number Title Priority Date Filing Date
DK98947203T DK1017996T3 (da) 1997-09-25 1998-09-22 Ikke-destruktiv prövning af dielektriske materialer

Country Status (9)

Country Link
EP (1) EP1017996B1 (da)
AT (1) ATE397210T1 (da)
AU (1) AU746997B2 (da)
CA (1) CA2304782C (da)
CY (1) CY1108198T1 (da)
DE (1) DE69839567D1 (da)
DK (1) DK1017996T3 (da)
NZ (1) NZ503713A (da)
WO (1) WO1999015883A1 (da)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2384831C (en) * 1999-09-17 2009-05-19 Sik-Institut For Livsmedel Och Bioteknik Ab Apparatus and method for detection of foreign bodies in products
WO2002086474A1 (en) * 2001-04-20 2002-10-31 Commonwealth Scientific And Industrial Research Organisation Probe for non-destructive testing
CA2615685C (en) * 2004-08-05 2015-06-23 Jack R. Little, Jr. High-resolution, nondestructive imaging of dielectric materials
US7520667B2 (en) 2006-05-11 2009-04-21 John Bean Technologies Ab Method and system for determining process parameters
US9046605B2 (en) 2012-11-05 2015-06-02 The Curators Of The University Of Missouri Three-dimensional holographical imaging
WO2014079695A1 (de) * 2012-11-23 2014-05-30 Siemens Ag Österreich Überwachung eines bauteils
EP3779609B1 (fr) 2019-08-13 2022-03-16 Patek Philippe SA Genève Mécanisme d'affichage pour pièce d'horlogerie
SG10202004777YA (en) * 2020-05-21 2021-12-30 Wavescan Tech Pte Ltd System and method for portable microwave instrument for high-resolution, contactless non-destructive imaging

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE564022A (da) * 1957-01-16
US3025463A (en) * 1957-11-22 1962-03-13 Eino J Luoma Apparatus for measurement of complex reflection coefficient
SE8000410L (sv) * 1979-01-20 1980-07-21 Lambda Ind Science Ltd Sprickdetektor
JPS61274209A (ja) * 1985-05-30 1986-12-04 Furuno Electric Co Ltd コンクリ−ト欠損等の検出装置
IT1201375B (it) * 1985-11-08 1989-01-27 Consiglio Nazionale Ricerche Metodo ed apparato per la determinazione della costante dielettrica di materiali e sua applicazione per la determinazione del tasso di carbone incombusto presente nelle ceneri di un combustore
US5103181A (en) * 1988-10-05 1992-04-07 Den Norske Oljeselskap A. S. Composition monitor and monitoring process using impedance measurements
US5216372A (en) * 1991-07-29 1993-06-01 Colorado State University Research Foundation Microwave steel belt location sensor for tires
US5384543A (en) * 1992-11-09 1995-01-24 Martin Marietta Energy Systems, Inc. Portable microwave instrument for non-destructive evaluation of structural characteristics
US5393557A (en) * 1992-12-17 1995-02-28 Northrop Grumman Corporation Method for measuring electromagnetic properties
DE4311103A1 (de) * 1993-04-05 1994-10-06 Komi Koppelberg & Migl Kg Verfahren und Vorrichtung zum Erkennen von Fehlern bei Glaskörpern
DE69609336T2 (de) * 1995-09-11 2001-03-15 Yissum Research Development Company Of The Hebrew University Of Jerusalem, Jerusalem/Jerusalajim Nahfeld-leitfähigkeits-mikroskop

Also Published As

Publication number Publication date
AU9403498A (en) 1999-04-12
CA2304782C (en) 2007-03-27
EP1017996A4 (en) 2003-04-23
ATE397210T1 (de) 2008-06-15
CA2304782A1 (en) 1999-04-01
CY1108198T1 (el) 2014-02-12
AU746997B2 (en) 2002-05-09
NZ503713A (en) 2001-09-28
DE69839567D1 (de) 2008-07-10
WO1999015883A1 (en) 1999-04-01
EP1017996A1 (en) 2000-07-12
EP1017996B1 (en) 2008-05-28

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