DK1068516T3 - Fremgangsmåde til kvantitativ analyse af atomare materialebestanddele ved hjælp af LIBS spektroskopi - Google Patents

Fremgangsmåde til kvantitativ analyse af atomare materialebestanddele ved hjælp af LIBS spektroskopi

Info

Publication number
DK1068516T3
DK1068516T3 DK99915670T DK99915670T DK1068516T3 DK 1068516 T3 DK1068516 T3 DK 1068516T3 DK 99915670 T DK99915670 T DK 99915670T DK 99915670 T DK99915670 T DK 99915670T DK 1068516 T3 DK1068516 T3 DK 1068516T3
Authority
DK
Denmark
Prior art keywords
species
concentration
calculating
quantitative analysis
components
Prior art date
Application number
DK99915670T
Other languages
English (en)
Inventor
Vincenzo Palleschi
Alessandro Ciucci
Simone Rastelli
Elisabetta Tognoni
Original Assignee
Consiglio Nazionale Ricerche
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Consiglio Nazionale Ricerche filed Critical Consiglio Nazionale Ricerche
Application granted granted Critical
Publication of DK1068516T3 publication Critical patent/DK1068516T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DK99915670T 1998-03-20 1999-03-18 Fremgangsmåde til kvantitativ analyse af atomare materialebestanddele ved hjælp af LIBS spektroskopi DK1068516T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT1998PI000023A IT1306112B1 (it) 1998-03-20 1998-03-20 Metodo per l'analisi quantitativa dei componenti atomici di materialimediante misure di spettroscopia libs senza calibrazione
PCT/EP1999/001842 WO1999049301A1 (en) 1998-03-20 1999-03-18 Method for quantitative analysis of atomic components of materials by libs spectroscopy measurements

Publications (1)

Publication Number Publication Date
DK1068516T3 true DK1068516T3 (da) 2003-09-15

Family

ID=11394239

Family Applications (1)

Application Number Title Priority Date Filing Date
DK99915670T DK1068516T3 (da) 1998-03-20 1999-03-18 Fremgangsmåde til kvantitativ analyse af atomare materialebestanddele ved hjælp af LIBS spektroskopi

Country Status (10)

Country Link
US (1) US6657721B1 (da)
EP (1) EP1068516B9 (da)
JP (1) JP2002507741A (da)
AT (1) ATE241134T1 (da)
DE (1) DE69908113T2 (da)
DK (1) DK1068516T3 (da)
ES (1) ES2200517T3 (da)
IT (1) IT1306112B1 (da)
PT (1) PT1068516E (da)
WO (1) WO1999049301A1 (da)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002001191A2 (en) * 2000-06-29 2002-01-03 Pharma Laser Inc. System and method for performing a laser-induced breakdown spectroscopy analysis
AT409553B (de) * 2000-09-28 2002-09-25 Voest Alpine Ind Anlagen Vorrichtung zur chemischen analyse von materialproben sowie metallurgisches gefäss hierfür
US7663122B2 (en) * 2004-07-14 2010-02-16 Ryugo Hayano Laser analytical instrument, laser analytical method, and gas leak inspection instrument
DE102005000840B4 (de) * 2005-01-05 2007-12-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und Vorrichtung zur Elementanalyse mittels Laser-Emissionsspektrometrie
FR2882593B1 (fr) 2005-02-28 2007-05-04 Commissariat Energie Atomique Procede et systeme d'analyse physicochimique a l'aide d'une ablation par pulse laser
EP1902300A2 (en) * 2005-07-14 2008-03-26 Chemimage Corporation System and method for robot mounted sensor
US7440097B2 (en) 2006-06-27 2008-10-21 General Electric Company Laser plasma spectroscopy apparatus and method for in situ depth profiling
CN100526859C (zh) * 2006-08-23 2009-08-12 太原市海通自动化技术有限公司 基于激光感生光谱和神经网络技术的煤质分析方法和设备
US7692789B1 (en) * 2007-04-13 2010-04-06 The United States Of America As Represented By The United States Department Of Energy High resolution analysis of soil elements with laser-induced breakdown
US7663749B2 (en) * 2007-10-04 2010-02-16 Institut National D'optique Method and system to measure the concentration of constituent elements in an inhomogeneous material using LIBS
FR2938066B1 (fr) * 2008-11-06 2010-12-17 Centre Nat Rech Scient Systeme et procede d'analyse quantitative de la composition elementaire de la matiere par spectroscopie du plasma induit par laser (libs)
JP5412896B2 (ja) * 2009-03-13 2014-02-12 株式会社明電舎 化学種定量方法及び化学種定量装置
WO2012168938A1 (en) * 2011-06-09 2012-12-13 Laser Distance Spectrometry Ltd. Method and apparatus for quantitative analysis of samples by laser induced plasma (lip)
RU2548584C2 (ru) * 2013-09-04 2015-04-20 Арнольд Митрофанович Скрипкин Способ лазерно-искрового эмиссионного определения лантана, церия, празеодима, неодима в металлических сплавах и порошках
WO2015104049A1 (en) 2014-01-08 2015-07-16 Universidad Publica De Navarra Quantitative analysis method for analyzing the elemental composition of materials by means of libs technique
RU2558632C1 (ru) * 2014-04-28 2015-08-10 Нина Валерьевна Молчан Способ контроля структуры магниевого сплава
US9956609B1 (en) 2014-06-24 2018-05-01 Melt Cognition, LLC Metal sorting, melting and fabrication apparatus and methods
US9678015B2 (en) 2014-09-26 2017-06-13 Frito-Lay North America, Inc. Method for elemental analysis of a snack food product in a dynamic production line
CN105092540B (zh) * 2015-06-16 2017-09-19 江西农业大学 一种食用油中重金属铅含量的快速高精度检测方法
US11243190B2 (en) 2015-09-24 2022-02-08 Frito-Lay North America, Inc. Quantitative liquid texture measurement method
US10598648B2 (en) 2015-09-24 2020-03-24 Frito-Lay North America, Inc. Quantitative texture measurement apparatus and method
US10107785B2 (en) 2015-09-24 2018-10-23 Frito-Lay North America, Inc. Quantitative liquid texture measurement apparatus and method
US10070661B2 (en) * 2015-09-24 2018-09-11 Frito-Lay North America, Inc. Feedback control of food texture system and method
US10969316B2 (en) 2015-09-24 2021-04-06 Frito-Lay North America, Inc. Quantitative in-situ texture measurement apparatus and method
US9541537B1 (en) 2015-09-24 2017-01-10 Frito-Lay North America, Inc. Quantitative texture measurement apparatus and method
CN106770070B (zh) * 2016-11-11 2018-01-16 清华大学深圳研究生院 一种绝缘子表面等值盐密测量方法及装置
CN108414475B (zh) * 2018-01-30 2020-06-26 中国科学院上海技术物理研究所 基于光学层析同时迭代重建的libs分析方法
CN114509426B (zh) * 2022-02-23 2024-04-26 西北师范大学 Libs-gd联用检测液体中重金属元素的装置及方法
CN115541563B (zh) * 2022-10-31 2026-03-31 东莞理工学院 一种基于激光诱导击穿光谱的元素定量分析方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5715053A (en) 1995-10-23 1998-02-03 Loge; Gary W. Method for determining the concentration of atomic species in gases and solids

Also Published As

Publication number Publication date
ITPI980023A1 (it) 1998-06-20
WO1999049301A1 (en) 1999-09-30
ATE241134T1 (de) 2003-06-15
ES2200517T3 (es) 2004-03-01
DE69908113T2 (de) 2004-03-18
EP1068516B9 (en) 2004-01-07
DE69908113D1 (de) 2003-06-26
JP2002507741A (ja) 2002-03-12
US6657721B1 (en) 2003-12-02
PT1068516E (pt) 2003-10-31
EP1068516A1 (en) 2001-01-17
EP1068516B1 (en) 2003-05-21
IT1306112B1 (it) 2001-05-29

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