DK1254384T3 - Spektralt formet röntgenstråleinspektionssystem - Google Patents

Spektralt formet röntgenstråleinspektionssystem

Info

Publication number
DK1254384T3
DK1254384T3 DK01910478T DK01910478T DK1254384T3 DK 1254384 T3 DK1254384 T3 DK 1254384T3 DK 01910478 T DK01910478 T DK 01910478T DK 01910478 T DK01910478 T DK 01910478T DK 1254384 T3 DK1254384 T3 DK 1254384T3
Authority
DK
Denmark
Prior art keywords
ray inspection
inspection system
spectrally shaped
energy component
ambient
Prior art date
Application number
DK01910478T
Other languages
English (en)
Inventor
Peter Rothschild
Lee Grodzins
Original Assignee
American Science & Eng Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Science & Eng Inc filed Critical American Science & Eng Inc
Application granted granted Critical
Publication of DK1254384T3 publication Critical patent/DK1254384T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/224—Multiple energy techniques using one type of radiation, e.g. X-rays of different energies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DK01910478T 2000-02-10 2001-02-09 Spektralt formet röntgenstråleinspektionssystem DK1254384T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/502,093 US6459761B1 (en) 2000-02-10 2000-02-10 Spectrally shaped x-ray inspection system
PCT/US2001/004143 WO2001059485A1 (en) 2000-02-10 2001-02-09 Spectrally shaped x-ray inspection system

Publications (1)

Publication Number Publication Date
DK1254384T3 true DK1254384T3 (da) 2008-06-02

Family

ID=23996306

Family Applications (1)

Application Number Title Priority Date Filing Date
DK01910478T DK1254384T3 (da) 2000-02-10 2001-02-09 Spektralt formet röntgenstråleinspektionssystem

Country Status (9)

Country Link
US (2) US6459761B1 (da)
EP (1) EP1254384B1 (da)
CN (1) CN1268940C (da)
AT (1) ATE384965T1 (da)
DE (1) DE60132556T2 (da)
DK (1) DK1254384T3 (da)
ES (1) ES2298220T3 (da)
PT (1) PT1254384E (da)
WO (1) WO2001059485A1 (da)

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Publication number Publication date
CN1441914A (zh) 2003-09-10
EP1254384B1 (en) 2008-01-23
WO2001059485A9 (en) 2002-10-24
ATE384965T1 (de) 2008-02-15
WO2001059485A1 (en) 2001-08-16
DE60132556D1 (de) 2008-03-13
PT1254384E (pt) 2008-04-30
EP1254384A1 (en) 2002-11-06
CN1268940C (zh) 2006-08-09
DE60132556T2 (de) 2009-01-29
US20020094059A1 (en) 2002-07-18
US6459761B1 (en) 2002-10-01
ES2298220T3 (es) 2008-05-16

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