EP0074177A2 - Varistance en oxyde métallique à tension de claquage et capacité contrôlables - Google Patents
Varistance en oxyde métallique à tension de claquage et capacité contrôlables Download PDFInfo
- Publication number
- EP0074177A2 EP0074177A2 EP82304111A EP82304111A EP0074177A2 EP 0074177 A2 EP0074177 A2 EP 0074177A2 EP 82304111 A EP82304111 A EP 82304111A EP 82304111 A EP82304111 A EP 82304111A EP 0074177 A2 EP0074177 A2 EP 0074177A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- varistor
- lithium
- varistor material
- breakdown voltage
- capacitance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000015556 catabolic process Effects 0.000 title claims abstract description 28
- 229910044991 metal oxide Inorganic materials 0.000 title abstract description 14
- 150000004706 metal oxides Chemical class 0.000 title abstract description 14
- 239000000463 material Substances 0.000 claims abstract description 42
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 claims abstract description 35
- 229910052744 lithium Inorganic materials 0.000 claims abstract description 35
- 238000009792 diffusion process Methods 0.000 claims abstract description 9
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 29
- 239000011787 zinc oxide Substances 0.000 claims description 13
- IIPYXGDZVMZOAP-UHFFFAOYSA-N lithium nitrate Inorganic materials [Li+].[O-][N+]([O-])=O IIPYXGDZVMZOAP-UHFFFAOYSA-N 0.000 claims description 9
- AYJRCSIUFZENHW-UHFFFAOYSA-L barium carbonate Chemical compound [Ba+2].[O-]C([O-])=O AYJRCSIUFZENHW-UHFFFAOYSA-L 0.000 claims description 8
- 238000010438 heat treatment Methods 0.000 claims description 8
- 239000000203 mixture Substances 0.000 claims description 8
- FUJCRWPEOMXPAD-UHFFFAOYSA-N Li2O Inorganic materials [Li+].[Li+].[O-2] FUJCRWPEOMXPAD-UHFFFAOYSA-N 0.000 claims description 5
- WMWLMWRWZQELOS-UHFFFAOYSA-N bismuth(iii) oxide Chemical compound O=[Bi]O[Bi]=O WMWLMWRWZQELOS-UHFFFAOYSA-N 0.000 claims description 5
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 claims description 5
- GHPGOEFPKIHBNM-UHFFFAOYSA-N antimony(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Sb+3].[Sb+3] GHPGOEFPKIHBNM-UHFFFAOYSA-N 0.000 claims description 3
- NUJOXMJBOLGQSY-UHFFFAOYSA-N manganese dioxide Chemical compound O=[Mn]=O NUJOXMJBOLGQSY-UHFFFAOYSA-N 0.000 claims description 3
- 150000001875 compounds Chemical class 0.000 claims description 2
- 239000000470 constituent Substances 0.000 claims description 2
- 239000002904 solvent Substances 0.000 claims description 2
- 238000000034 method Methods 0.000 claims 10
- 230000007423 decrease Effects 0.000 claims 2
- 238000001704 evaporation Methods 0.000 claims 1
- 239000000654 additive Substances 0.000 description 6
- 239000004973 liquid crystal related substance Substances 0.000 description 5
- 230000003071 parasitic effect Effects 0.000 description 5
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 4
- AMWRITDGCCNYAT-UHFFFAOYSA-L hydroxy(oxo)manganese;manganese Chemical compound [Mn].O[Mn]=O.O[Mn]=O AMWRITDGCCNYAT-UHFFFAOYSA-L 0.000 description 4
- 239000010410 layer Substances 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- ADCOVFLJGNWWNZ-UHFFFAOYSA-N antimony trioxide Chemical compound O=[Sb]O[Sb]=O ADCOVFLJGNWWNZ-UHFFFAOYSA-N 0.000 description 3
- 230000035515 penetration Effects 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- 230000000996 additive effect Effects 0.000 description 2
- JLDSOYXADOWAKB-UHFFFAOYSA-N aluminium nitrate Chemical compound [Al+3].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O JLDSOYXADOWAKB-UHFFFAOYSA-N 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 2
- 239000002019 doping agent Substances 0.000 description 2
- 230000001747 exhibiting effect Effects 0.000 description 2
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910052700 potassium Inorganic materials 0.000 description 2
- 239000011591 potassium Substances 0.000 description 2
- BWHMMNNQKKPAPP-UHFFFAOYSA-L potassium carbonate Chemical compound [K+].[K+].[O-]C([O-])=O BWHMMNNQKKPAPP-UHFFFAOYSA-L 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- BNGXYYYYKUGPPF-UHFFFAOYSA-M (3-methylphenyl)methyl-triphenylphosphanium;chloride Chemical compound [Cl-].CC1=CC=CC(C[P+](C=2C=CC=CC=2)(C=2C=CC=CC=2)C=2C=CC=CC=2)=C1 BNGXYYYYKUGPPF-UHFFFAOYSA-M 0.000 description 1
- 229910000416 bismuth oxide Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229910000428 cobalt oxide Inorganic materials 0.000 description 1
- KAGOZRSGIYZEKW-UHFFFAOYSA-N cobalt(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Co+3].[Co+3] KAGOZRSGIYZEKW-UHFFFAOYSA-N 0.000 description 1
- 230000002301 combined effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- TYIXMATWDRGMPF-UHFFFAOYSA-N dibismuth;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Bi+3].[Bi+3] TYIXMATWDRGMPF-UHFFFAOYSA-N 0.000 description 1
- QDOXWKRWXJOMAK-UHFFFAOYSA-N dichromium trioxide Chemical compound O=[Cr]O[Cr]=O QDOXWKRWXJOMAK-UHFFFAOYSA-N 0.000 description 1
- XUCJHNOBJLKZNU-UHFFFAOYSA-M dilithium;hydroxide Chemical compound [Li+].[Li+].[OH-] XUCJHNOBJLKZNU-UHFFFAOYSA-M 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 229910052808 lithium carbonate Inorganic materials 0.000 description 1
- 229910001947 lithium oxide Inorganic materials 0.000 description 1
- 239000000395 magnesium oxide Substances 0.000 description 1
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 1
- 229910000480 nickel oxide Inorganic materials 0.000 description 1
- DBJLJFTWODWSOF-UHFFFAOYSA-L nickel(ii) fluoride Chemical compound F[Ni]F DBJLJFTWODWSOF-UHFFFAOYSA-L 0.000 description 1
- GNRSAWUEBMWBQH-UHFFFAOYSA-N oxonickel Chemical compound [Ni]=O GNRSAWUEBMWBQH-UHFFFAOYSA-N 0.000 description 1
- 229910000027 potassium carbonate Inorganic materials 0.000 description 1
- NOTVAPJNGZMVSD-UHFFFAOYSA-N potassium monoxide Inorganic materials [K]O[K] NOTVAPJNGZMVSD-UHFFFAOYSA-N 0.000 description 1
- CHWRSCGUEQEHOH-UHFFFAOYSA-N potassium oxide Chemical compound [O-2].[K+].[K+] CHWRSCGUEQEHOH-UHFFFAOYSA-N 0.000 description 1
- 230000002028 premature Effects 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- YEAUATLBSVJFOY-UHFFFAOYSA-N tetraantimony hexaoxide Chemical compound O1[Sb](O2)O[Sb]3O[Sb]1O[Sb]2O3 YEAUATLBSVJFOY-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/10—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material voltage responsive, i.e. varistors
- H01C7/105—Varistor cores
- H01C7/108—Metal oxide
- H01C7/112—ZnO type
Definitions
- This invention relates to metal oxide varistors and, in particular, to lithium-doped zinc oxide based varistors with control able breakdown voltage and capacitance.
- the voltage applied to the varistor is less than the varistor breakdown voltage, only a small leakage current will flow between the electrodes and the device is essentially an insulator having a resistance of many megohms.
- the varistor resistance drops to low values permitting large currents to flow through the varistor.
- the current through the varistor varies greatly for small changes in applied voltage so that the voltage across the varistor is effectively limited to a narrow range of values. The voltage limiting or clamping action is enhanced at higher values of a.
- Metal oxide varistors have been widely employed as surge arresters for protecting electrical equipment from transients on AC power lines created by lightning strikes or switching of electrical apparatus. Such applications require the use of varistors having breakdown voltages slightly greater than the maximum input voltage of the system to be protected. Thus, for example, a typical system powered from 170 volts peak voltage (120 volts nns) AC power mains would require the use of a varistor having a breakdown voltage somewhat greater than 170 volts.
- Varistor device behavior may be approximately modeled by a variable resistor in parallel with a capacitor.
- the parasitic capacitance modeled by the capacitor is an intrinsic property associated with the particular varistor composition, and is generally undesirable as it may affect varistor performance in surge-protective or switching applications, for example.
- the variste- is subjected to a continuously applied voltage. Although the applied voltage is lower than the varistor breakdown voltage, an undesirable current, due predominantly to the parasitic capacitance, flows through the varistor. In high frequency circuits this current flow may be large enough to affect normal operation of the circuit.
- the upper varistors therefore are required to dissipate greater power, resulting in higher operating temperature, inferior stability, and concomittantly shorter useful life due to premature failure.
- discrete, low dissipation capacitors are connected in parallel with the varistors to achieve a more uniform voltage and power distribution throughout the stacked varistors.
- Use of capacitors with graded intrinsic capacitances, as described'in the aforementioned patent, is a more effective solution.
- Varistor elements may also be used as switching elements for multiplexing, for example, liquid crystal displays.
- the parasitic capacitance is also a problem, since it appears in series with the capacitance of the liquid crystal material forming a capacitive voltage divider. A lower electric field than would otherwise be available is thus used to maintain the liquid crystal material in its active state.
- the varistor capacitance is too high, nonselected elements in the liquid crystal array may be inadvertently activated by pulses applied to the display.
- Aforementioned U.S. Patent 4,276,578 discloses the inclusion of antimony oxide (Sb 2 0 3 ) in the varistor for the purpose of decreasing intrinsic capacitance.
- the present invention provides varistors with high breakdown voltage and low capacitance by controlled diffusion of lithium into conventional zinc oxide varistor material.
- a zinc oxide based varistor exhibiting a high breakdown voltage and low capacitance is fabricated by diffusing lithium into conventional metal oxide varistor material at elevated temperatures.
- the diffusion of lithium must be carefully controlled, otherwise the varistor becomes insulating for applied voltages even as high as ten or more times the normal breakdown voltage.
- Lithium may be diffused into the varistor material by placing a solution containing LiN0 3 or Liz0 on the varistor surface. Solvents such as alcohol or acetone may be air dried while aqueous solutions should be heated in air to remove the water. Following the drying step, lithium surface concentration should not exceed approximately 2 mg/cm 2 .
- the varistor material is then heated at, for instance, 800°C for approximately one hour.
- the present invention attempts to provide a metal oxide varistor exhibiting high breakdown voltage and low capacitance characteristics which are both controllable.
- the invention also attempts to provide a zinc oxide varistor containing diffused lithium and which has high breakdown voltage, low capacitance, and low leakage current.
- high-resistance surface layers containing lithium and potassium have been produced by diffusion of Li 2 C0 3 or Li 2 O and K 2 CO 3 or K 2 O into zinc oxide varistor materials.
- the lithium and potassium are diffused into the sides of the varistor disk or rod, for example, while the electrodes are affixed to the flat end portions.
- the non-linearity of the varistor is unaffected in the undoped varistor material portions, while the doped regions provide a high-resistance.
- the doped layer has a high resistance, it does not appear to have a nonohmic voltage characteristic, typical of varistor behavior. In fact, by virtue of its high resistance, the doped layer could aid in avoiding voltage flashover between the electrodes from occurring along the sides of the varistor disk or rod.
- the quantity of lithium diffused into the varistor material is carefully controlled to preserve the nonohmic voltage characteristics associated with the varistor material. If relatively large amounts of lithium (described hereinafter) are diffused, the varistor material becomes insulating for applied voltages even as high as ten or more times the normal breakdown voltage. Such highly doped varistor materials do not exhibit varistor breakdown conduction. If the applied voltage is increased sufficiently, catastrophic conduction results. For smaller amounts of lithium dopant, however, a varistor having a high a, increased breakdown voltage, and lower capacitance than that obtained with similar undoped varistor material is realized.
- lithium may be diffused into any conventional zinc oxide varistor material.
- varistor materials may conveniently comprise any of the standard compositions employed in fabricating metal oxide varistors by conventional methods.
- such varistors have zinc oxide (Zn0) as the primary constituent (typically, 90 mole percent or more) and include smaller quantities of other metal oxide additives, such as bismuth oxide (Bi 2 0 3 ), cobalt oxide (Co 2 O 3 ), chromium oxide (Cr 2 O 3 ) as well as other additives which may include additional metal oxides.
- additives examples include manganese oxide (MnO 2 ), antimony trioxide (Sb 2 O 3 ), silicon dioxide (Si0 2 ), nickel oxide (Ni0), magnesium oxide (M g 0), aluminum nitrate (Al(NO 3 ) 3 9(H 2 O)), tin oxide (Sn0 2 ), titanium oxide (Ti0 2 ), nickel fluoride (NiF 2 ), barium carbonate (BaC03), and boric acid (H 3 BO 3 ).
- MnO 2 manganese oxide
- Sb 2 O 3 silicon dioxide
- Ni0 nickel oxide
- magnesium oxide M g 0
- Al(NO 3 ) 3 9(H 2 O) aluminum nitrate
- titanium oxide Ti0 2
- NiF 2 nickel fluoride
- barium carbonate BaC03
- boric acid H 3 BO 3 BO 3
- a varistor material suitable for practicing the invention may comprise 0.5 mole percent each of Bi 2 O 3 , Co 2 O 3 , Mn0 2 , and Sn0 2 , 0.1 mole percent each of H 3 BO 3 and BaCO 3 , 1 mole percent Sb 2 O 3 , the remainder being ZnO.
- the additive elements may be added to the unfired varistor mixture as any convenient salt of the additive element since upon sintering these compounds decompose into oxides of the element.
- Lithium may be diffused into varistor material by placing thereon a suitable paste or a solution of lithium nitrate (LiN0 3 ) or lithium oxide (Li 2 0). Solutions using alcohol (such as, methanol) or acetone may be air dried. If an aqueous solution is used, the varistor is initially heated at a low temperature such as 100°C to evaporate the water. Resulting surface concentration of LiN0 3 or Li 2 0 on the varistor should not exceed approximately 2 mg/an 2 . The varistor material is then heated in air at temperatures as high as 1100°C. The usual time versus temperature tradeoffs apply and the penetration of lithium into the varistor is determined by the time and temperature of the diffusion step.
- a suitable paste or a solution of lithium nitrate (LiN0 3 ) or lithium oxide (Li 2 0). Solutions using alcohol (such as, methanol) or acetone may be air dried. If an aqueous solution is used, the varistor is initially heated at a low temperature such
- lithium penetration is in the order of a few mils, while at 900°C it is on the order of a few millimeters. If sufficient time is allowed, the lithium can be made to completely penetrate the varistor.
- electrodes may be attached adjacent to one another on the doped side of the varistor material.
- the Figure illustrates voltage-current characteristics of lithium doped.and undoped varistor material having the aforedescribed exemplary composition into which lithium has been diffused by heating in air at 800°C for one hour, and on which surface electrodes were positioned 1 mm apart.
- Varistor breakdown voltage is indicated on the vertical axis, while corresponding current values.are shown on the horizontal axis.
- Curves A, B, and C depict varistor characteristics of a lithium-doped varistor surface corresponding to depths of 2, 7.5, and 15 thousandths of an inch, respectively.
- Curves A, B, and C represent progressively lower lithium concentrations.
- Curve D depicts the charcteristics of an undoped varistor surface. It will be observed that for curves A, B, and C, capacitance values are 20 pf, 40 pf, and 70 pf, respectively, while breakdown voltages are 840, 410, and 155 volts, respectively. For undoped varistor material the capacitance and breakdown voltage are 100 pf-and 115 volts, resepctively. It is apparent, therefore, that near the varistor surface (Curve A, highest lithium doping), the breakdown voltage is approximately eight times larger and the capacitance approximately five times smaller than the undoped surface (Curve D).
- the present invention provides a metal oxide based varistor with a controllable breakdown voltage and capacitance. More specifically, the invention provides a zinc oxide varistor containing lithium and which has high breakdown voltage, low capacitance, and low leakage current.
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Thermistors And Varistors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US29590181A | 1981-08-24 | 1981-08-24 | |
| US295901 | 1981-08-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP0074177A2 true EP0074177A2 (fr) | 1983-03-16 |
| EP0074177A3 EP0074177A3 (fr) | 1983-08-31 |
Family
ID=23139706
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP82304111A Withdrawn EP0074177A3 (fr) | 1981-08-24 | 1982-08-04 | Varistance en oxyde métallique à tension de claquage et capacité contrôlables |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP0074177A3 (fr) |
| JP (1) | JPS5866304A (fr) |
| BR (1) | BR8204971A (fr) |
| CA (1) | CA1186806A (fr) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1992000593A1 (fr) * | 1990-06-28 | 1992-01-09 | Asea Brown Boveri Ab | Procede de fabrication d'un varistor d'oxyde metallique a capacite energetique amelioree |
| DE10350343B4 (de) * | 2002-10-29 | 2016-10-06 | Tdk Corp. | Chipförmiger Varistor und Verfahren zu dessen Herstellung |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3723175A (en) * | 1967-10-09 | 1973-03-27 | Matsushita Electric Industrial Co Ltd | Nonlinear resistors of bulk type |
| CA970476A (en) * | 1971-08-27 | 1975-07-01 | Matsushita Electric Industrial Co., Ltd. | Process for making a voltage dependent resistor |
| DE2345753C3 (de) * | 1972-09-11 | 1978-03-09 | Tokyo Shibaura Electric Co., Ltd., Kawasaki, Kanagawa (Japan) | Metalloxid-Varistor |
| US4147670A (en) * | 1975-12-04 | 1979-04-03 | Nippon Electric Co., Ltd. | Nonohmic ZnO ceramics including Bi2 O3, CoO, MnO, Sb2 O.sub.3 |
| FR2373497A1 (fr) * | 1976-12-10 | 1978-07-07 | Europ Composants Electron | Corps ceramique a resistance dependant de la tension appliquee |
-
1982
- 1982-08-04 EP EP82304111A patent/EP0074177A3/fr not_active Withdrawn
- 1982-08-06 CA CA000408962A patent/CA1186806A/fr not_active Expired
- 1982-08-18 JP JP57142243A patent/JPS5866304A/ja active Pending
- 1982-08-23 BR BR8204971A patent/BR8204971A/pt unknown
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1992000593A1 (fr) * | 1990-06-28 | 1992-01-09 | Asea Brown Boveri Ab | Procede de fabrication d'un varistor d'oxyde metallique a capacite energetique amelioree |
| DE10350343B4 (de) * | 2002-10-29 | 2016-10-06 | Tdk Corp. | Chipförmiger Varistor und Verfahren zu dessen Herstellung |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5866304A (ja) | 1983-04-20 |
| BR8204971A (pt) | 1983-08-02 |
| CA1186806A (fr) | 1985-05-07 |
| EP0074177A3 (fr) | 1983-08-31 |
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| Date | Code | Title | Description |
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| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
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| AK | Designated contracting states |
Designated state(s): CH GB LI SE |
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| 17P | Request for examination filed |
Effective date: 19830309 |
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| PUAL | Search report despatched |
Free format text: ORIGINAL CODE: 0009013 |
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| AK | Designated contracting states |
Designated state(s): CH GB LI SE |
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| STAA | Information on the status of an ep patent application or granted ep patent |
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| 18D | Application deemed to be withdrawn |
Effective date: 19841113 |
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| RIN1 | Information on inventor provided before grant (corrected) |
Inventor name: PHILIPP, HERBERT REYNOLD |